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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1973

Energy transfer from a pulsed thermal source to He II below 0.3 K.

Results of measurements of the angular distribution of the energy flux radiated from a pulsed heater immersed in He II at low temperatures (around 230 mK). It is shown that the energy transfer from a pulsed carbon heater at a relatively high temperature to ambient liquid helium maintained at low temperature cannot be adequately described by the phonon-coupling models. The experimental data on the velocity and angular distribution of the energy flux radiated from the plane of the heater indicate that the energy from the heater is transferred to a layer of hot helium adjacent to the surface of the heater and that this layer acts as the effective source of excitations radiated into the ambient liquid helium. The extent and shape of this source depend on the total energy flux produced by the heater.

Pfeifer, C. D.↗
NASA NTRS1982

Evidence for inhomogeneous thermal sources of two similar solar spike event of 1978, May 5 and December 4

Two short duration single spike events of 1978 May 5 and December 4 exhibit similar time profiles in the microwave and hard X-ray ranges, indicating emission from compact sources. Microwave spectral observations exhibit inhomogeneities present in the source parameters. The existence of fine time structures in the microwave time profiles at 10.4 GHz from Berne are interpreted as a signature of the dynamics of a disturbance travelling through the souce at the ion-sound speed. Stereoscopic observations with the hard X-ray detector on the solar orbiter, Helios-2, and the Berne microwave antennae do not indicate any time lag or differences in the time profiles during the impulsive phase. This is taken as evidence for the absence of directionality of emission making beam models unlikely for short duration single spike events.

Wiehl, H. J.↗
NASA NTRS1983

Evidence for inhomogeneous thermal sources of two similar solar spike events of 1978 May 5 and December 4

Two short duration single spike solar events of 1978 May 5 and December 4 exhibit similar time profiles in the microwave and hard X-ray ranges, indicating emission from compact sources. Microwave spectral observations exhibit inhomogeneities present in the source parameters. The existence of fine time structures in the microwave time profiles at 10.4 GHz from Berne are interpreted as a signature of the dynamics of a disturbance traveling through the source at the ion-sound speed. Stereoscopic observations with the hard X-ray detector on the solar orbiter, Helios-2, and the Berne microwave antenna do not indicate any time lag or differences in the time profiles during the impulsive phase. This is taken as evidence for the absence of directionality of emission making beam models unlikely for short duration single spike events. Previously announced in STAR as N83-13047

Desai, U.↗
NASA NTRS1971

Plasma model for thermal X-ray sources

Thermal X ray sources associated with rotating collapsed stars with surrounding plasma shells, discussing plasma density profile and electron distribution in stellar magnetosphere

Coppi, B.↗
NASA NTRS1990

Electron temperature and concentration in a thermal atomic oxygen source

A thermal atomic oxygen source for materials screening was built for NASA by Boeing Aerospace. The objective here was to use a microwave interferometer and Langmuir probe to characterize the electron concentration in this thermal atomic oxygen source. Typical operating conditions in the thermal atomic oxygen source were found to produce electron concentrations that were well below the detection threshold of the interferometer (10(exp 8) cm (sup -3)). The researchers calibrated (with the interferometer) the Langmuir probe at an artificially high plasma density and then used the circular and the square Langmuir probes to measure the low electron concentrations that exist during materials exposure tests. Electron concentration was measured as a function of power and position. The electrons were lost to the walls through ambipolar diffusion, and their concentration was accurately described by an equation. The electron concentration was proportional to power squared and decayed exponentially with distance.

Pedrow, Patrick Dennis↗
DOE OSTI2015

Thermal evaporation sources for wide-area deposition

A thermal evaporation source includes: a crucible configured to contain a volume of evaporant and a vapor space above the evaporant; a manifold body having within it a hollow expansion chamber that is flowably connected to the vapor space via one or more restriction orifices; one or more effusion nozzles flowably connected to the expansion chamber and exiting an outer surface of the thermal evaporation source, the nozzle(s) oriented to direct an evaporant vapor flow out of the source vertically downward, in one or more horizontal directions, or in one or more directions intermediate between horizontal and vertically downward; and a heater capable of heating some or all of the thermal evaporation source to a temperature sufficient to produce the one or more evaporant vapor flows when a vacuum is applied to the thermal evaporation source.

Birkmire, Robert W.↗
NASA NTRS2024

Thermal Inspection of Low Emissivity Surfaces Using a Pulsed Light Emitting Diodes (PLED) Heat Source

Thermal inspections of a structure typically utilize a flash or quartz lamp heat source located on the same side of an infrared camera. The heat source provides light energy for heating while the infrared camera measures the surface transient temperature response. The inspection can be difficult for low emissivity surfaces for several reasons. First, the high intensity light can reflect off the surface and cause “burn-in” to the camera’s detector. The “burn-in” can take time for the sensors to recover and potentially damage the detector. Secondly, the heat source after pulsing, has a transient cool down component. The cool down component can be reflected and therefore superimposed over the structure’s thermal response which can cause an error (false defect indications) in the inspection. Lastly, the heat source is spectrally broad and therefore while heating, infrared components of the heat source can produce non-uniformity in the measured temperature field. Typically for the inspection of reflective surfaces, paint or other emissivity enhancing coatings are applied before inspection. In this paper, a pulsed light emitting diodes (PLED) heat source is used. The PLED heat source is spectrally narrow, contained within the visible band, and therefore not detectable by the infrared camera. The PLED heat source is configured to reduce any transient cool down components that could produce false defect indications. The PLED thermal inspections are compared to commercially available flash thermography inspections on unpainted aluminum samples with simulated corrosion and additively manufactured Ti-6AL-4V metal specimens.

thermal nondestructive evaluation↗
NASA NTRS2024

Thermal Inspection of Low Emissivity Surfaces Using a Pulsed Light Emitting Diodes (PLED) Heat Source

Thermal inspections of a structure typically utilize a flash or quartz lamp heat source located on the same side of an infrared camera. The heat source provides light energy for heating while the infrared camera measures the surface transient temperature response. The inspection can be difficult for low emissivity surfaces for several reasons. First, the high intensity light can reflect off the surface and cause “burn-in” to the camera’s detector. The “burn-in” can take time for the sensors to recover and potentially damage the detector. Secondly, the heat source after pulsing, has a transient cool down component. The cool down component can be reflected and therefore superimposed over the structure’s thermal response which can cause an error (false defect indications) in the inspection. Lastly, the heat source is spectrally broad and therefore while heating, infrared components of the heat source can produce non-uniformity in the measured temperature field. Typically for the inspection of reflective surfaces, paint or other emissivity enhancing coatings are applied before inspection. In this paper, a pulsed light emitting diodes (PLED) heat source is used. The PLED heat source is spectrally narrow, contained within the visible band, and therefore not detectable by the infrared camera. The PLED heat source is configured to reduce any transient cool down components that could produce false defect indications. The PLED thermal inspections are compared to commercially available flash thermography inspections on unpainted aluminum samples with simulated corrosion and additively manufactured Ti-6AL-4V metal specimens.

thermal nondestructive evaluation↗
NASA NTRS1986

Infrared point sources aligned with the SgrA(asterisk) non-thermal radio source

Assembled 0.7-5.0 micron observational data for two point sources approximately aligned with the compact nonthermal radio source SgrA(asterisk) in the Galactic center, thus far interpreted as being from the same object on the basis of their position and spectral continuity, are presently given alternative interpretations. While the object must be a hot star surrounded by a circumstellar dust cloud if it is a foreground star, a Galactic center position calls for an unorthodox extinction curve which suggests that the IR emission may be the Rayleigh-Jeans tail of a hot star or star cluster, or perhaps a thermal accretion disk.

Stein, W. A.↗
DOE OSTI2021

INGENIOUS Thermal Conductivity Measurement Source Categorization

Thermal conductivity (TC) data taken for different wells at a specified drill depth. This is an abridged version of the complete SMU heat flow database, downloaded from the SMU node of the NGDS at the beginning of INGENIOUS (approximately April 2021), and filtered to the INGENIOUS study area. This National Geothermal Data System (NGDS) project aggregates geothermal data collected and curated by the SMU Geothermal Laboratory and its partner organizations. All columns in this database are the same as the SMU database, except for 2 additions associated with this project. Repeated columns are for data correlation purposes. Column descriptions and data types are the same as previous iterations of the SMU database. The new values that are the addition are two new columns developed as part of the INGENIOUS project: INGENIOUS TC Value | INGENIOUS notes INGENIOUS notes are individual notes that were written for specific data points during the analysis process. There are not always notes associated with each input value. INGENIOUS TC Value includes 4 values: 1. Assumed Measured These are values that are assumed to be measured thermal conductivity values, either within a specific well or within the same study region. Many of these have either a published reference, a reported standard deviation, or a unique thermal conductivity value. 2. Data release - assumed measured These are values in the SMU database that are from proprietary data that were added to the SMU database and are labeled as data release for their reference. These values were searched for in person at the SMU Geothermal Laboratory as well as virtual examination of data available on the NGDS. For many of these, there are reported thermal conductivity values associated with the heat flow data in the database, but no specific table or reference to measurements in the original data release files. 3. Known measured These are values that have a reported measurement, either as an original file in the SMU data files on the NGDS or a reported table in a publication. In the rare circumstances, Maria Richards or David Blackwell confirmed measurement. Confirmation of measurement would be written in the INGENIOUS notes column. 4. Unmeasured Unmeasured values are those that are known to be unmeasured, either estimated from another report or no information given. In the SMU database, there are wells that have a heat flow but no thermal conductivity. These are categorized as unmeasured. There are also heat flow values that are stated to have estimated or generalized average thermal conductivity values for the region and rock type. Because these are known to be unmeasured, they are categorized as such. 5. Blank Blank values are either A quality or X quality. These quality values are stated in the INGENIOUS notes. These values were not going to change associated with the heat flow analysis, so these were not examined.

15 GEOTHERMAL ENERGY↗