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Radiation Requirements and Requirements Flowdown: Single Event Effects (SEEs) and Requirements

This short course session provides: (1) an overview of the single particle-induced hazard for space system as they apply in the natural space environment. This shall focus on the implementation of a single event effect hardness assurance (SEEHA) program for systems including system engineering approach and mitigation of effects. (2) The final portion of this session shell provide relevant real-life examples of in-flight performance of systems.

LaBel, Kenneth A.

Medical Proton Test Facilities (MPTFs) Lessons Learned on the Unique Aspects for Single Event Effects (SEE) Testing of Electronics in the 200 MeV Regime

Ever since the closure of the Indiana University Cyclotron Facility (IUCF) in 2014, there has been an increasing use of medical proton therapy facilities (MPTF) for SEE testing with protons in the 200 MeV or greater regime. This talk covers some of the unique features and considerations for utilizing MPTFs including both logistical and technical aspects. This presentation provides an overview of lessons learned for SEE testing at MPTFs.

Medical Proton Test Facilities (MPTFs)

Single Event Effects (SEE) Testing: Practical Approach to Test Plans

While standards and guidelines for performing SEE testing have existed for several decades, guidance for developing SEE test plans has not been as easy to find. In this presentation, the variety of areas that need to be considered ranging from resource issues (funds, personnel, schedule) to extremely technical challenges (particle interaction and circuit application), shall be discussed. Note: we consider the approach outlined here as a "living" document: Mission-specific constraints and new technology related issues always need to be taken into account.

Single Event Effects (SEE)

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines

Considerations for a Proton Single Event Effects (SEE) Guideline

The intent of this document is to provide guidance on when and what type of SEE tests should be performed on a device under test (DUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.

LaBel, Kenneth A.

Considerations for a Proton Single Event Effects (SEE) Guideline

The intent of this document is to provide guidance on when and what type of -SEE tests should be performed on a device under test (OUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.

LaBel, Kenneth A.