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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2

Reliability Assessment of Cooling Fans for PV Inverters: Testing, Modeling, and Case Studies

The reliability of photovoltaic (PV) inverters is critical for long-term solar system performance, with cooling fan failures frequently leading to costly downtime. While much research exists on general cooling fan reliability, little attention has been given to fans operating within PV inverters and their unique environmental challenges. Here, this article proposes a comprehensive methodology to address this gap. First, a failure mode and effects analysis is performed on fans to identify the key failure mechanisms in PV applications, their corresponding stressors, and the models necessary for lifetime prediction. Second, an accelerated life test is designed and conducted to collect valuable experimental data for PV inverter fans in a reasonable amount of time. Third, a mathematical conversion of dynamic mission profiles into effective constant stress levels is derived. Fourth, case studies are given, showcasing lifetime estimates that account for geographic variations in mission profile data. The results demonstrate that this integrated approach leads to an accurate reliability assessment for PV inverter cooling fans.

accelerated life testing (ALT)↗

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗

Ball Grid Array Reliability Assessment for Aerospace Applications

Reliability of Ball Grid Array(BGAs) was evaluated with special emphasis on space applications. This work was performed as part of a consortium led by the Jet Propulsion Laboratory (JPL) to help build the infrastructure necessary for implementation of this technology. Nearly 200 test vehicles, each with four packages, were assembled and tested using an experimental design.

Aerospace↗

Independent Reliability Assessment of the Laser Transmitter for the ESA-NASA Laser Interferometer Space Antenna (LISA) Program

As part of the laser development process, NASA’s Goddard Space Flight Center (GSFC) requested support from the NASA Engineering and Safety Center (NESC) to independently assess the Technology Readiness Level (TRL) of the LISA Laser System (LS). The independent assessment included the following tasks: (a) assess the design for weaknesses and suggest improvements to mitigate risks, (b) assess the laser reliability plan for weaknesses and suggest improvements to mitigate risks and improve effectiveness, and (c) assess the current redundancy plan on laser subsystems for weaknesses and suggest improvements to mitigate risks and improve effectiveness. The presentation will focus on the assessment findings and the current development progress of the LISA laser to meet the mission requirements with a delivery of a form, fit, and functional TRL6 laser to the LISA mission by late 2023.

Laser Interferometry↗

Data-Driven Digital Twin for Reliability Assessment of DC/DC Buck Converter

In commercial applications, the operation of DC/DC converters significantly impacts overall system performance and long-term reliability. This study introduces a data-driven digital twin (DT) approach for estimating critical degradation parameters of DC/DC BUCK converter under steady-state condition. Initially, a circuit-level MATLAB/Simulink digital model (DM C ) is refined against a hardware prototype’s switching model dataset using offline particle swarm optimization. The optimized digital model’s steady-state response is then verified with its average model response while varying the duty and load. Subsequently, degradation profiles are imposed on the inductor, capacitor, MOSFET in the DMC. A large dataset is generated from this model, allowing training, validation, and testing of machine learning (ML) models for component health regression tasks. The proposed method employs random forest ML models, achieving impressive regression results with a squared R value as high as 0.99978 and a root mean square error of 4.2× 10 –6 . The method is further validated on a medium power level DC/DC BUCK prototype with varying load conditions, and includes the analysis of MOSFET’s on-resistance under degradation conditions. This data-driven DT method shows promise for identifying parasitic degradation and ohmic loss parameters, enhancing converter reliability assessments in a non-invasive, generalized, and computationally efficient manner.

14 SOLAR ENERGY↗

Structural reliability assessment capability in NESSUS

The principal capabilities of NESSUS (Numerical Evaluation of Stochastic Structures Under Stress), an advanced computer code developed for probabilistic structural response analysis, are reviewed, and its structural reliability assessed. The code combines flexible structural modeling tools with advanced probabilistic algorithms in order to compute probabilistic structural response and resistance, component reliability and risk, and system reliability and risk. An illustrative numerical example is presented.

Millwater, H.↗

Reliability Assessment Approach for Stirling Convertors and Generators

Stirling power conversion is being considered for use in a Radioisotope Power System for deep-space science missions because it offers a multifold increase in the conversion efficiency of heat to electric power. Quantifying the reliability of a Radioisotope Power System that utilizes Stirling power conversion technology is important in developing and demonstrating the capability for long-term success. A description of the Stirling power convertor is provided, along with a discussion about some of the key components. Ongoing efforts to understand component life, design variables at the component and system levels, related sources, and the nature of uncertainties is discussed. The requirement for reliability also is discussed, and some of the critical areas of concern are identified. A section on the objectives of the performance model development and a computation of reliability is included to highlight the goals of this effort. Also, a viable physics-based reliability plan to model the design-level variable uncertainties at the component and system levels is outlined, and potential benefits are elucidated. The plan involves the interaction of different disciplines, maintaining the physical and probabilistic correlations at all the levels, and a verification process based on rational short-term tests. In addition, both top-down and bottom-up coherency were maintained to follow the physics-based design process and mission requirements. The outlined reliability assessment approach provides guidelines to improve the design and identifies governing variables to achieve high reliability in the Stirling Radioisotope Generator design.

Shah, Ashwin R.↗

Application of PoF Based Virtual Qualification Methods for Reliability Assessment of Mission Critical PCBs

Reliability is the ability of a product to perform the function for which it was intended for a specified period of time (or cycles) for a given set of life cycle conditions. In today's compressed mission development cycles where designing, building and testing the physical models has to occur in a matter of months not years, Projects don't have the luxury of iteratively building and testing those models. Physics of failure (PoF) is an engineering-based approach to reliability that begins with an understanding of materials, processes, physical interactions, degradation and failure mechanisms, as well as identifying failure models. The PoF approach uses modeling and simulation to qualify a design and manufacturing process, with the ultimate intent of eliminating failures early in the design process by addressing the root cause. The physics-of-failure analysis proactively incorporates reliability into the design process by establishing a scientific basis for evaluating new materials, structures and technologies. Virtual physics-of-failure modeling allows engineers to determine if new technological node can be added to an existing system. This presentation will illustrate an application of a PoF based tool during the initial phases of a printed circuit board assembly development and how the NASA GSFC team was able to dynamically study the effects of electronics parts and printed circuit board material configuration changes under simulated thermal and vibrational stresses

Electronics packaging↗

Application of PoF Based Virtual Qualification Methods for Reliability Assessment of Mission Critical PCBs

Reliability is the ability of a product to perform the function for which it was intended for a specified period of time (or cycles) for a given set of life cycle conditions. In today's compressed mission development cycles where designing, building and testing the physical models has to occur in a matter of months not years, Projects don't have the luxury of iteratively building and testing those models. Physics of failure (PoF) is an engineering-based approach to reliability that begins with an understanding of materials, processes, physical interactions, degradation and failure mechanisms, as well as identifying failure models. The PoF approach uses modeling and simulation to qualify a design and manufacturing process, with the ultimate intent of eliminating failures early in the design process by addressing the root cause. The physics-of-failure analysis proactively incorporates reliability into the design process by establishing a scientific basis for evaluating new materials, structures and technologies. Virtual physics-of-failure modeling allows engineers to determine if new technological node can be added to an existing system. This presentation will illustrate an application of a PoF based tool during the initial phases of a printed circuit board assembly development and how the NASA GSFC team was able to dynamically study the effects of electronics parts and printed circuit board material configuration changes under simulated thermal and vibrational stresses.

Physics of Failure↗

Photovoltaic Inverter Failure Mechanism Estimation Using Unsupervised Machine Learning and Reliability Assessment

This article introduces a data-driven approach to assessing failure mechanisms and reliability degradation in outdoor photovoltaic (PV) string inverters. The manufacturer's stated PV inverter lifetime can vary due to the impact of operating site conditions. To address limitations in degradation estimation through accelerated testing, condition monitoring, or degradation modeling, we propose a machine learning (ML) oriented approach. Utilizing data from a 1.4 MW PV power plant operational since 2016, with 46 string PV inverters tied to the grid, we employ the unsupervised one-class support vector machine ML technique to analyze inverter and sensor data, capable of classifying humidity cycling and temperature fluctuations as dominant failure mechanisms. Utilizing the anomaly alert relationship and alert details specific to the inverter, the level of PV inverter output is considered as its availability or available reliability. Subsequently, a continuous Markov model is applied to six-month alert data, revealing an average stated reliability of 20% after 20 years of continuous operation. These results support recommendations for time-bound preventive measures to enhance PV inverter reliability under diverse outdoor conditions. Furthermore, the approach provides a nondestructive, top–down, and generalized method for analyzing any commercial PV inverter exposed to outdoor conditions, contingent on the availability of relevant data.

14 SOLAR ENERGY↗

The 20 GHz solid state transmitter design, impatt diode development and reliability assessment

A single drift gallium arsenide (GaAs) Schottky barrier IMPATT diode and related components were developed. The IMPATT diode reliability was assessed. A proof of concept solid state transmitter design and a technology assessment study were performed. The transmitter design utilizes technology which, upon implementation, will demonstrate readiness for development of a POC model within the 1982 time frame and will provide an information base for flight hardware capable of deployment in a 1985 to 1990 demonstrational 30/20 GHz satellite communication system. Life test data for Schottky barrier GaAs diodes and grown junction GaAs diodes are described. The results demonstrate the viability of GaAs IMPATTs as high performance, reliable RF power sources which, based on the recommendation made herein, will surpass device reliability requirements consistent with a ten year spaceborne solid state power amplifier mission.

Picone, S.↗