Small Molecule Docking of DNA Repair Proteins Associated with Cancer Survival Following PCNA Metagene Adjustment: A Potential Novel Class of Repair Inhibitors
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Leif E. Peterson↗
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Lower Level Repair Can Easily Fail Due to High Complexity
The International Space Station (ISS) uses Orbital Replacement Units (ORU’s) to repair failures on orbit. Using ORU’s reduces the crew time required to repair failures, but several copies of each ORU must be stored on ISS to ensure system availability. A typical ORU contains many components and has significant mass, but each ORU can repair only a single component failure. A full set of the ORU internal components could repair many different failures. Lower level assembly or component repair should reduce total spares mass. Successful electronics repair experiments were conducted on ISS. However, implementing component level repair would require a significant effort. The systems must be designed so they can be repaired during a mission, considering component layout and accessibility. The repair procedures must be developed and repair facilities, tools, and diagnostic and test instruments provided. Tracing a fault to a component is much more difficult than isolating it to an ORU. Replacing a component is much more difficult than replacing an ORU. Some problems with lower level repair are discussed. The mass savings of lower level repair will not save as much launch cost as before since launch cost has recently been reduced by an order of magnitude. Most system failures are not component failures that can be fixed by replacing a component but are due to system level problems. Repair and maintenance should be planned as part of an overall maintainability design. The risk that a lower level repair will fail is considerably greater than when using ORUs. With modern high reliability packaged systems, failure diagnosis and repair has become a lost art. However, diagnosis and repair data from the 1960’s show that increasing complexity often causes much longer diagnosis and repair times and may prevent successful repair. Increasing complexity by using lower level repair directly increases system cost, failure rate, crew time for repair, and the risk of an unrepairable system failure.
Harry W Jones↗
A generalized linear-quadratic model incorporating reciprocal time pattern of radiation damage repair
Purpose: It has been conventionally assumed that the repair rate for sublethal damage (SLD) remains constant during the entire radiation course. However, increasing evidence from animal studies suggest that this may not the case. Rather, it appears that the repair rate for radiation-induced SLD slows down with increasing time. Such a slowdown in repair would suggest that the exponential repair pattern would not necessarily accurately predict repair process. As a result, the purpose of this study was to investigate a new generalized linear-quadratic (LQ) model incorporating a repair pattern with reciprocal time. The new formulas were tested with published experimental data. Methods: The LQ model has been widely used in radiation therapy, and the parameter G in the surviving fraction represents the repair process of sublethal damage with T{sub r} as the repair half-time. When a reciprocal pattern of repair process was adopted, a closed form of G was derived analytically for arbitrary radiation schemes. The published animal data adopted to test the reciprocal formulas. Results: A generalized LQ model to describe the repair process in a reciprocal pattern was obtained. Subsequently, formulas for special cases were derived from this general form. The reciprocal model showed a better fit to the animal data than the exponential model, particularly for the ED50 data (reduced {chi}{sup 2}{sub min} of 2.0 vs 4.3, p = 0.11 vs 0.006), with the following gLQ parameters: {alpha}/{beta} = 2.6-4.8 Gy, T{sub r} = 3.2-3.9 h for rat feet skin, and {alpha}/{beta} = 0.9 Gy, T{sub r} = 1.1 h for rat spinal cord. Conclusions: These results of repair process following a reciprocal time suggest that the generalized LQ model incorporating the reciprocal time of sublethal damage repair shows a better fit than the exponential repair model. These formulas can be used to analyze the experimental and clinical data, where a slowing-down repair process appears during the course of radiation therapy.
63 RADIATION, THERMAL, AND OTHER ENVIRON. POLLUTAN↗
Cytogenetic Response to Ionizing Radiation Exposure in Human Fibroblasts with Suppressed Expression of Non-DSB Repair Genes
Changes of gene expression profile are one of the most important biological responses in living cells after ionizing radiation (IR) exposure. Although some studies have shown that genes up-regulated by IR may play important roles in DNA damage repair, the relationship between the regulation of gene expression by IR, particularly genes not known for their roles in double-strand break (DSB) repair, and its impact on cytogenetic responses has not been well studied. The purpose of this study is to identify new roles of IR inducible genes in radiation-induced chromosome aberrations and micronuclei formation. In the study, the expression of 25 genes selected on the basis of their transcriptional changes in response to IR was individually knocked down by small interfering RNA in human fibroblast cells. Frequencies of micronuclei (MN) formation and chromosome aberrations were measured to determine the efficiency of cytogenetic repair, and the fraction of bi-nucleated cells in the MN analysis was used as a marker for cell cycle progression. In response to gamma radiation, the formation of MN was significantly increased by suppressed expression of five genes: Ku70 (DSB repair pathway), XPA (nucleotide excision repair pathway), RPA1 (mismatch repair pathway), RAD17 and RBBP8 (cell cycle control). Knocked-down expression of four genes (MRE11A, RAD51 in the DSB pathway, SESN1, and SUMO1) significantly inhibited cell cycle progression, possibly because of severe impairment of DNA damage repair. Moreover, decreased XPA, p21, or MLH1 expression resulted in both significantly enhanced cell cycle progression and increased yields of chromosome aberrations, indicating that these gene products modulate both cell cycle control and DNA damage repair. Nine of these eleven genes, whose knock-down expression affected cytogenetic repair, were up-regulated in cells exposed to gamma radiation, suggesting that genes transcriptionally modulated by IR were critical to regulate IR-induced biological consequences. Furthermore, eight non-DBS repair genes showed involvement in regulating DSB repair, indicating that successful DSB repair requires both DSB repair mechanisms and non-DSB repair systems.
Zhang, Ye↗
Shuttle Repair Tools Automate Vehicle Maintenance
Successfully building, flying, and maintaining the space shuttles was an immensely complex job that required a high level of detailed, precise engineering. After each shuttle landed, it entered a maintenance, repair, and overhaul (MRO) phase. Each system was thoroughly checked and tested, and worn or damaged parts replaced, before the shuttle was rolled out for its next mission. During the MRO period, workers needed to record exactly what needed replacing and why, as well as follow precise guidelines and procedures in making their repairs. That meant traceability, and with it lots of paperwork. In 2007, the number of reports generated during electrical system repairs was getting out of hand-placing among the top three systems in terms of paperwork volume. Repair specialists at Kennedy Space Center were unhappy spending so much time at a desk and so little time actually working on the shuttle. "Engineers weren't spending their time doing technical work," says Joseph Schuh, an electrical engineer at Kennedy. "Instead, they were busy with repetitive, time-consuming processes that, while important in their own right, provided a low return on time invested." The strain of such inefficiency was bad enough that slow electrical repairs jeopardized rollout on several occasions. Knowing there had to be a way to streamline operations, Kennedy asked Martin Belson, a project manager with 30 years experience as an aerospace contractor, to co-lead a team in developing software that would reduce the effort required to document shuttle repairs. The result was System Maintenance Automated Repair Tasks (SMART) software. SMART is a tool for aggregating and applying information on every aspect of repairs, from procedures and instructions to a vehicle s troubleshooting history. Drawing on that data, SMART largely automates the processes of generating repair instructions and post-repair paperwork. In the case of the space shuttle, this meant that SMART had 30 years worth of operations that it could apply to ongoing maintenance work. According to Schuh, "SMART standardized and streamlined many shuttle repair processes, saving time and money while increasing safety and the quality of repairs." Maintenance technicians and engineers now had a tool that kept them in the field, and because SMART is capable of continually evolving, each time an engineer put it to use, it would enrich the Agency-wide knowledge base. "If an engineer sees something in the work environment that they could improve, a repair process or a procedure, SMART can incorporate that data for use in future operations," says Belson.
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Assessment of Crew Time for Maintenance and Repairs Activities for Lunar Surface Missions
NASA is currently evaluating different methods to predict how much time crewmembers will spend conducting repair and maintenance activities on future space missions. As mission scope and spacecraft architectures change, it will be necessary to understand how crew repair and maintenance timelines are impacted by mission operations and technology changes. Past work has been done using historical ISS data to accurately predict crew habitation and operation timelines, resulting in the development of NASA’s Exploration Crew Time Model (ECTM). However, understanding crew maintenance and repair requirements has posed a unique challenge due to the complexity of available datasets, the probabilistic nature of sub-system failures, and the impacts of reliability growth on failure rates. This paper presents a methodology to collect and condition empirical repair and maintenance time data from available data sets, to extrapolate from that data to estimate projected maintenance and repair times for a lunar Surface Habitat, and to assess how uncertainty in repair time could impact utilization time on the lunar surface. NASA International Space Station (ISS) maintenance and crew time data are logged into two central databases, the Maintenance Data Collection (MDC) and the Operations Planning Timeline Integration System (OPTimIS) respectively. Separately, each of these two datasets capture only portions of the complete set of data required to generate an accurate assessment of crew time spent on maintenance activities at a sub-system level. MDC provides a detailed catalog of failure events and an overview of the failure’s required maintenance and OPTimIS provides a description of crew activities and crew time durations dedicated to maintenance. To create a more useful crew time estimate for maintenance timelines, the authors developed a methodology to capture relevant data from each set and combine and utilize that data by linking crew time requirements to specific components. The authors compare the failure logs in the MDC to crew activity logs pulled from OPTimIS and then process the data to estimate required repair times for each failure event. Data is also classified by the outcome of each repair event, whether the failed component was replaced or whether it was repaired in place. The entire maintenance activity dataset is then categorized based on the class of failed component to allow for a statistically significant sample size for each class and to provide accurate crew time estimates for any components lacking relevant data. This resultant component repair time data can be used in the future to generate Mean Time To Repair (MTTR) estimates and confidence intervals for each class of component based on a probabilistic distribution of documented maintenance events. These improved MTTR values can then be applied to candidate element sub-system architectures, along with component Mean Time Between Failure (MTBF) data to generate distributions for potential required system crew repair time estimates for a given mission. Repair time distributions can then be used to develop more accurate crew schedules and to assess potential available utilization time.
Crew Time↗
A Probabilistic Tool that Aids Logistics Engineers in the Establishment of High Confidence Repair Need-Dates at the NASA Shuttle Logistics Depot
The NASA Shuttle Logistics Depot (NSLD) is tasked with the responsibility for repair and manufacture of Line Replaceable Unit (LRU) hardware and components to support the Space Shuttle Orbiter. Due to shrinking budgets, cost effective repair of LRU's becomes a primary objective. To achieve this objective, is imperative that resources be assigned to those LRU's which have the greatest expectation of being needed as a spare. Forecasting the times at which spares are needed requires consideration of many significant factors including: failure rate, flight rate, spares availability, and desired level of support, among others. This paper summarizes the results of the research and development work that has been accomplished in producing an automated tool that assists in the assignment of effective repair start-times for LRU's at the NSLD. This system, called the Repair Start-time Assessment System (RSAS), uses probabilistic modeling technology to calculate a need date for a repair that considers the current repair pipeline status, as well as, serviceable spares and projections of future demands. The output from the system is a date for beginning the repair that has significantly greater confidence (in the sense that a desired probability of support is ensured) than times produced using other techniques. Since an important output of RSAS is the longest repair turn-around time that will ensure a desired probability of support, RSAS has the potential for being applied to operations at any repair depot where spares are on-hand and repair start-times are of interest. In addition, RSAS incorporates tenants of Just-in-Time (JIT) techniques in that the latest repair start-time (i.e., the latest time at which repair resources must be committed) may be calculated for every failed unit This could reduce the spares inventory for certain items, without significantly increasing the risk of unsatisfied demand.
Bullington, J. V.↗
Repair of Electronics for Long Duration Spaceflight
To reduce mission risk, long duration spaceflight and exploration activities will require greater degrees of self-sufficiency with regards to repair capability than have ever been employed before in space exploration. The current repair paradigm of replacing Orbital Replacement Units (ORUs) of malfunctioning avionics and electronic hardware will be impractical, since carrying all of the spares that could possibly be needed for a long duration mission would require upmass and volume at unprecedented and unacceptable levels. A strategy of component-level repair for electronics, however, could significantly reduce the mass and volume necessary for spares and enhance mission safety via a generic contingency capability. This approach is already used to varying degrees by the U.S. Navy, where vessels at sea experience some similar constraints such as the need for self sufficiency for moderately long time periods, and restrictions on volume of repair spares and infrastructure. The concept of conducting component-level repairs of electronics in spacecraft requires the development of design guidelines for future avionics (to enable repair), development of diagnostic techniques to allow an astronaut to pinpoint the faulty component aboard a vastly complex vehicle, and development of tools and methodologies for dealing with the physical processes of replacing the component. This physical process includes tasks such as conformal coating removal and replacement, component removal, replacement, and alignment--all in the difficulty of a reduced gravity environment. Further, the gravitational effects on the soldering process must be characterized and accounted for to ensure reliability of the newly repaired components. The Component-Level Electronics-Assembly Repair (CLEAR) project under the NASA Supportability program was established to develop and demonstrate the practicality of this repair approach. CLEAR involves collaborative efforts between NASA s Glenn Research Center, Langley Research Center, Johnson Space Center, the National Center for Space Exploration Research, and the U.S. Navy. The project goals are 1) develop and demonstrate a manually-operated electronics repair capability to be conducted in a spacecraft environment; and 2) develop guidelines for designs of electronics that facilitates component-level repair for future space exploration efforts. This multi-faceted program utilizes a cross-disciplinary approach to examine pre- and post-repair diagnostics, conformal coating removal and replacement, component soldering, and electronics design for supportability. These areas are investigated by a combination of trade studies, ground based testing, reduced gravity aircraft testing, and actual spaceflight testing on the International Space Station (ISS) in multiple experiments. This paper details the efforts of this program, with emphasis on early trade study results, ground-based efforts, and two upcoming ISS experiments.
Pettegrew, Richard D.↗
Assessment of Crew Time for Maintenance and Repair Activities for Lunar Surface Missions
NASA is currently evaluating different methods to predict how much time crewmembers will spend conducting repair and maintenance activities on future space missions. As mission scope and spacecraft architectures change, understanding how crew repair and maintenance timelines are impacted by mission operations and technology changes is vital for future mission planning. Past work has been done using historical International Space Station (ISS) data to accurately predict crew habitation and operation timelines, resulting in the development of NASA’s Exploration Crew Time Model (ECTM). However, understanding crew maintenance and repair requirements has posed a unique challenge due to the complexity of available datasets, the probabilistic nature of sub-system failures, and the impacts of reliability growth on failure rates. This paper presents a methodology to collect and condition empirical repair and maintenance time data from available datasets, to extrapolate from that data to estimate projected maintenance and repair times for a lunar Surface Habitat (SH), and to assess how uncertainty in repair time could impact utilization time on the lunar surface. NASA ISS maintenance and crew time data are logged into two central databases: the Maintenance Data Collection (MDC) and the Operations Planning Timeline Integration System (OPTimIS). Separately, each of these two datasets capture only portions of the complete set of data required to generate an accurate assessment of crew time spent on maintenance activities at a sub-system level. To create a more useful crew time estimate for maintenance timelines, the authors developed a methodology to capture relevant data from each set and combine and utilize that data by linking crew time requirements to specific components. The authors compare the failure logs in the MDC to crew activity logs pulled from OPTimIS and then process the data to estimate required repair time for each failure and repair event. The entire maintenance activity dataset is then categorized based on the class of failed component to ensure a significant sample size for each class and accurate crew time estimates for any components lacking relevant data. This resultant component repair time data can be used in the future to generate Mean Time to Repair (MTTR) estimates and confidence intervals for each class of component based on a probabilistic distribution of documented maintenance events. These improved MTTR values can then be applied to candidate element sub-system architectures, along with component Mean Time Between Failure (MTBF) data to generate distributions for potential required system crew repair time estimates for a given mission. The authors applied these modeling methods to a case study of a crewed mission to the planned SH and produced expected corrective maintenance crew time distributions. The results produced an expected corrective maintenance crew time at over 24 hours per mission, and a maintenance crew time distribution that reflects the importance of planning for sufficient maintenance requirements each mission. Repair time distributions can then be used to develop more accurate crew schedules and to assess potential available utilization time.
Crew Time↗
Dynamic properties of 316l stainless steel repaired using electron beam additive manufacturing
Additive manufacturing has the potential to be used for repair of high-value parts, but the strength and integrity of such repaired parts, especially under dynamic loading, in still unknown. This work presents the results of high strain-rate dynamic testing of additively repaired stainless steel samples. The 316L samples were intentionally damaged and subsequently repaired with 308L stainless steel wire using electron beam additive manufacturing. The repaired samples were subjected to gas-gun impact testing to induce incipient damage and determine the role played by the repaired region in dictating damage and failure. The results show the following: 1) the equation of state of the repaired region is comparable to the original material as shown by the unchanged spall plane location, 2) the deformation behavior is similar to the original material as shown by the similar Hugoniot Elastic limit, 3) the spall strength of the repaired region is slightly higher than the original material due to varying grain size, and 4) the damage morphology in the repaired region is different and involves a high rate of void coalescence. In conclusion, despite these minor differences in the spall strength and the damage morphology, the overall dynamic response of the original material and repaired samples is similar suggesting that AM is a promising approach for repairing high-value components.
36 MATERIALS SCIENCE↗
Shuttle orbiter TPS flight repair kit development
The design and application of a TPS repair kit is presented. The repair kit is designed for on orbit use by a crew member working in the manned maneuvering unit (MMU). The kit includes the necessary equipment and materials to accomplish the repair tasks which include the following: HRSI emittance coating repair, damaged tile repair, missing tile repair, and multiple tile repair. Two types of repair materials required to do the small area repair and the large area repair are described. The materials area cure in place, silicone base ablator for small damaged areas and precured ablator tile for repair of larger damaged areas is examined. The cure in place ablator is also used as an adhesive to bond the precured tiles in place. An applicator for the cure in place ablator, designed to contain a two-part silicon compound, mix the two components at correct ratio, and dispense the materials at rates compatible with mission timelines established for the EVA is described.
Source record↗
Semi-Automated Diagnosis, Repair, and Rework of Spacecraft Electronics
NASA's Constellation Program for Exploration of the Moon and Mars places human crews in extreme isolation in resource scarce environments. Near Earth, the discontinuation of Space Shuttle flights after 2010 will alter the up- and down-mass capacity for the International Space Station (ISS). NASA is considering new options for logistics support strategies for future missions. Aerospace systems are often composed of replaceable modular blocks that minimize the need for complex service operations in the field. Such a strategy however, implies a robust and responsive logistics infrastructure with relatively low transportation costs. The modular Orbital Replacement Units (ORU) used for ISS requires relatively large blocks of replacement hardware even though the actual failed component may really be three orders of magnitude smaller. The ability to perform in-situ repair of electronics circuits at the component level can dramatically reduce the scale of spares and related logistics cost. This ability also reduces mission risk, increases crew independence and improves the overall supportability of the program. The Component-Level Electronics Assembly Repair (CLEAR) task under the NASA Supportability program was established to demonstrate the practicality of repair by first investigating widely used soldering materials and processes (M&P) performed by modest manual means. The work will result in program guidelines for performing manual repairs along with design guidance for circuit reparability. The next phase of CLEAR recognizes that manual repair has its limitations and some highly integrated devices are extremely difficult to handle and demand semi-automated equipment. Further, electronics repairs require a broad range of diagnostic capability to isolate the faulty components. Finally repairs must pass functional tests to determine that the repairs are successful and the circuit can be returned to service. To prevent equipment demands from exceeding spacecraft volume capacity and skill demands from exceeding crew time and training limits, the CLEAR project is examining options provided by non-real time tele-operations, robotics, and a new generation of diagnostic equipment. This paper outlines a strategy to create an effective repair environment where, with the support of ground based engineers, crewmembers can diagnose, repair and test flight electronics in-situ. This paper also discusses the implications of successful tele-robotic repairs when expanded to rework and reconfiguration of used flight assets for building Constellation infrastructure elements.
Struk, Peter M.↗
Development of Guidelines for In-Situ Repair of SLS-Class Composite Flight Hardware
The purpose of composite repair development at KSC (John F. Kennedy Space Center) is to provide support to the CTE (Composite Technology for Exploration) project. This is a multi-space center effort with the goal of developing bonded joint technology for SLS (Space Launch System) -scale composite hardware. At KSC, effective and efficient repair processes need to be developed to allow for any potential damage to composite components during transport or launch preparation. The focus of the composite repair development internship during the spring of 2018 was on the documentation of repair processes and requirements for process controls based on techniques developed through hands-on work with composite test panels. Three composite test panels were fabricated for the purpose of repair and surface preparation testing. The first panel included a bonded doubler and was fabricated to be damaged and repaired. The second and third panels were both fabricated to be cut into lap-shear samples to test the strength of bond of different surface preparation techniques. Additionally, jointed composite test panels were impacted at MSFC (Marshall Space Flight Center) and analyzed for damage patterns. The observations after the impact tests guided the repair procedure at KSC to focus on three repair methods. With a finalized repair plan in place, future work will include the strength testing of different surface preparation techniques, demonstration of repair methods, and repair of jointed composite test panels being impacted at MSFC.
Weber, Thomas P., Jr.↗
Escherichia coli single-stranded DNA binding protein SSB promotes AlkB-mediated DNA dealkylation repair
Highlights: • E. coli single stranded DNA binding protein (SSB) wraps single-stranded DNA (ssDNA). • SSB is known to be involved in base excision repair and recombination repair but not in DNA dealkylation repair. • The alkyl-adduct positioned at the 5′ of ssDNA is more accessible to AlkB compared to the internally located alkyl-adducts. • The presence of SSB lowers the K{sub M} of AlkB-catalyzed reaction and promote repair of the longer substrate. • AlkB-mediated repair of methyl adducts from very short ssDNA is rather efficient and SSB-independent. Repair of alkylation damage in DNA is essential for maintaining genome integrity. Escherichia coli (E.coli) protein AlkB removes various alkyl DNA adducts including N1-methyladenine (N{sup 1}meA) and N3-methylcytosine (N{sup 3}meC) by oxidative demethylation. Previous studies showed that AlkB preferentially removes N{sup 1}meA and N{sup 3}meC from single-stranded DNA (ssDNA). It can also remove N{sup 1}meA and N{sup 3}meC from double-stranded DNA by base-flipping. Notably, ssDNA produced during DNA replication and recombination, remains bound to E. coli single-stranded DNA binding protein SSB and it is not known whether AlkB can repair methyl adduct present in SSB-coated DNA. Here we have studied AlkB-mediated DNA repair using SSB-bound DNA as substrate. In vitro repair reaction revealed that AlkB could efficiently remove N{sup 3}meC adducts inasmuch as DNA length is shorter than 20 nucleotides. However, when longer N{sup 3}meC-containing oligonuleotides were used as the substrate, efficiency of AlkB catalyzed reaction was abated compared to SSB-bound DNA substrate of identical length. Truncated SSB containing only the DNA binding domain could also support the stimulation of AlkB activity, suggesting the importance of SSB-DNA interaction for AlkB function. Using 70-mer oligonucleotide containing single N{sup 3}meC we demonstrate that SSB-AlkB interaction promotes faster repair of the methyl DNA adducts.
60 APPLIED LIFE SCIENCES↗
Nonhomologous end-joining uses distinct mechanisms to repair each strand of a double strand break
Abstract Nonhomologous end-joining repairs chromosomal double strand breaks, but it is unknown whether both strands are repaired by this pathway, and if one strand break’s repair path impacts the other. Here, we show that nonhomologous end-joining employs both of two a priori possible strategies. Strand breaks that can be directly ligated are joined near-simultaneously, with no effect of one strand break’s repair path on the other. More complex end structures require obligatorily ordered repair. The first strand to be repaired is used as template for repair of the opposite/second strand break, with the latter repair reaction occurring fastest when also coupled to nonhomologous end-joining. Enforced asymmetry in repair of each strand break can extend to the gap-filling polymerase employed, and whether the polymerases incorporate RNA or DNA. Our results resolve questions about pathway mechanism and identify a requirement for flexibility of the nonhomologous end-joining machinery for efficient repair of both strand breaks within diverse cellular double strand breaks.
Luthman, Adam J.↗
Involvement of DNA-PK(sub cs) in DSB Repair Following Fe-56 Ion Irradiation
When cells are exposed to radiation, cellular lesions are induced in the DNA including double strand breaks (DSBs), single strand breaks and clustered DNA damage, which if not repaired with high fidelity may lead to detrimental biological consequences. Complex DSBs are induced by ionizing radiation and characterized by the presence of base lesions close to the break termini. They are believed to be one of the major causes of the biological effects of IR. The complexity of DSBs increases with the ionization density of the radiation and these complex DSBs are distinct from the damage induced by sparsely ionizing gamma-radiation. It has been hypothesized that complex DSBs produced by heavy ions in space pose problems to the DNA repair machinery. We have used imm uno-cyto-chemical staining of phosphorylated histone H2AX (gamma-H2AX) foci, as a marker of DSBs. We have investigated the formation and loss of gamma-H2AX foci and RAD51 foci (a protein involved in the homologous recombination pathway) in mammalian cells induced by low fluences of low-LET gamma-radiation and high-LET Fe-56 ions (1GeV/n, 151 keV/micron LET). M059J and M059K cells, which are deficient and proficient in DNA-PK(sub cs) activity respectively, were used to examine the role of DNA-PK(sub cs), a key protein in the non-homologous end joining (NHEJ) pathway of DSB repair, along with HF19 human fibroblasts. Followi ng irradiation with Fe-56 ions the rate of repair was slower in M059J cells compared with that in M059K, indicating a role for DNA-PK(sub cs) in the repair of DSB induced by Fe-56 ions. However a small percentage of DSBs induced are rejoined within 5 h although many DSBs still persist up to 24 h. When RAD51 was examined in M059J/K cells, RAD51 foci are visible 24 hours after irradiation in approximately 40% of M059J cells compared with <5% of M059K cells indicating that persistent DSBs or those formed at stalled replication forks recruit RAD51 in DNA-PK(sub cs) deficient cells. Following 1 Gy gamma-radiation the induction of gamma-H2AX foci is similar in M059J and M059K cells. However, the repair rate of DSBs is slower in M059J cells than in M059K as shown previously but faster than seen with DSB induced by 56Fe ions. Vanillin, an inhibitor of DNA-PK(sub cs), reduces significantly the rate of DSB repair in HF19 cells following 1 Gy gamma-radiation but at 0.25 Gy gamma-irradiation the rate of DSB repair is similar in the presence or absence vanillin, thus suggesting the repair of a sub-set of DSBs induced by low dose, low-LET radiation does not require DNA-PK(sub cs). This sub-set of DSBs is formed in lower yield with high LET radiation. T he complexity of DNA DSBs induced by HZE radiation will be discussed in terms of reduced repair efficiency and provide scope to model different sub-classes of DSBs as precursors that may lead to the detrimental health effects of HZE radiation.
O'Neill, Peter↗
Meteorite Sample Section Repair at NASA Johnson Space Center
Introduction: Meteorite thin and thick sections are routinely shipped from NASA Johnson Space Center to fulfill sample allocation requests from principle investigators around the world. Sections are also re-turned to JSC when researchers are finished studying them since, in most cases, they can be reused for other studies. The sections are very fragile unfortunately, and sometimes return to us needing repairs. The fol-lowing should give you an idea of how we repair sections here in the very lab where they were created. NOTE: Please do not attempt to repair ANSMET meteorite sections that are in your possession. We will perform the repairs for you at NASA JSC if you send the section back to us. Section Delamination: The majority of the meteorite sections that we produce here are secured to the glass slide using a high quality, two-part epoxy. Occasionally, we are asked to use superglue if the researcher wishes to dismount the section from the slide. Both epoxy and superglue are excellent adhesives, but they both tend to embrittle with time which results in delamination from the slide. Exposure to vacuum can also degrade the adhesion between the sample section and the glass slide. Repeated handling of the slide edges can accelerate delamination and, as a preventive measure, the outer 1-2 mm of epoxy is trimmed from newly created sections at JSC. If conductive tapes (copper, carbon, etc.) are used on the section during analysis, great care must be taken in removing the tape so that the epoxy is not pulled up with it. If in doubt, the tape can be left on the section when it is returned to JSC. Before we perform any repairs to sample sections, carbon, gold, or other coatings are removed. We accomplish this using a slurry of 0.05 micron alumina and 190 proof ethyl alcohol applied to a felt polishing pad fitted to a rotating lap wheel. Coatings are re-moved in this manner from all sections that are re-turned to JSC. The extent of the delamination determines how we proceed with the section repair. If the meteorite sample area of the section is not disturbed, then we carefully remove the delaminated epoxy. This is done using a binocular microscope with a 6X zoom, cut-proof gloves, and a very sharp, single edged razor blade. We cut the delaminated epoxy with the blade angled away from the sample area and using very light pressure. The trimmed section is then cleaned in an ultrasonic bath of 200 proof ethyl alcohol for no more than 10 seconds and carefully dried using a lint-free clean room wipe. The section is then placed into a lab oven at 110o F in preparation for epoxy. We mix the resin and hardener components of the low viscosity epoxy and very small amounts are applied to the cut edges of the section using a needle probe and the binocular microscope. Warming the epoxy helps secure the existing section by filling any voids between the glass slide and the section. After the new epoxy cures, we give the section a light polish on a lap wheel fitted with cotton polishing paper that is charged with 1 micron diamond paste. If the section has delaminated to the point of sample area being lifted from the glass, then it may be irreparable. We employ the above technique along with clamping the section in a Teflon pad arrangement in order to flatten the sample while the epoxy cures. Otherwise, the sample will tend to curl. This works to some degree, but once the sample area curls, it seldom re-turns to the original flatness without cracking or bending. Canada Balsam and Crystalbond: We repair damaged sections that had originally been prepared using Canada Balsam or Crystalbond adhesives through the gradual application of heat. We take great care with these samples since these bonding materials tend to get brittle with age. The section is heated in gradual steps (40-50o F per hour) to the melting point of the adhesive. We repair the sample while the adhesive is fluid and then the section is cooled in the same gradual manner in which it was heated. Slide Cracks and Breaks: Accidents happen. Especially with something as small and fragile as a thin/thick section. We all know someone who has driven a microscope objective into a section. As bad as the damage may look, the section can be repaired in most instances. NOTE: Please do not try to tape or glue section pieces back together prior to returning the dam-aged section. This practice usually renders the section irreparable. If the glass slide is cracked but the section is still in one piece, we repair it by infilling the crack with the low viscosity epoxy mentioned earlier. If the slide is in pieces, we can reassemble it with epoxy on a new backer slide. This is a tricky task as the pieces need to be in the correct plane with respect to each other, especially if the sample area is split among several pieces.
Meteorite↗