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Reflectometer accurately measures the reflectance of specimens in the infrared beyond 2.5 microns and under geometric conditions approximating normal irradiation and hemispherical viewing. It includes an ellipsoidal mirror, a specially coated averaging sphere associated with a detector for minimizing spatial and angular sensitivity, and an incident flux chopper.
Reflectometer, built into a microwave input system, measures the match of devices in the waveguide system of tracking receivers. Match measurements can be made on a routine calibration basis. It was installed in the S-band receiving system in the feed cone of the 210-ft antenna.
Theoretical and experimental antenna studies for reflectometer designs
Optimization of interferometer and ellipsoidal reflectometer to measure reflectance of opaque materials
High temperature directional reflectance measurements of ablative materials as function of sample temperature using paraboloid reflectometer
High temperature directional reflectance measurements of ablative materials as function of sample temperature using paraboloid reflectometer
Portable integrating sphere reflectometer, describing optical system, construction, etc
ATS 3 satellite reflectometer experiment carrying test samples to measure specular reflectance, noting silica shield effects
Reflectometer for receiver input impedance match measurement
Hypersonic reentry plasma diagnostic measurements made with four-frequency microwave reflectometer
Evaluation of solar mirror surface materials by ATS 3 reflectometer
An improved broadband impedance matching technique was developed. The technique is capable of resolving points in the waveguide which generate reflected energy. A version of the comparison reflectometer was developed and fabricated to determine the mean amplitude of the reflection coefficient excited at points in the guide as a function of distance, and the complex reflection coefficient of a specific discontinuity in the guide as a function of frequency. An impedance matching computer program was developed which is capable of impedance matching the characteristics of each disturbance independent of other reflections in the guide. The characteristics of four standard matching elements were compiled, and their associated curves of reflection coefficient and shunt susceptance as a function of frequency are presented. It is concluded that an economical, fast, and reliable impedance matching technique has been established which can provide broadband impedance matches.
An instrument has been developed to determine the reflection efficiency and scatter characteristics of optical samples at X-ray wavelengths from 1.5 to 113 A. The reflectometer operates in an oil-free vacuum chamber and measures the reflection efficiency and scatter characteristics as a function of the angle of incidence. The reflection efficiency is given for 8.34-A radiation incident on a fused silica sample finished to a flatness of one-tenth of a wavelength. The experimental reflection efficiency is compared with the theoretical data. The scatter curves are given for the direct X-ray beam and for the beam reflected from the fused silica sample at an angle of incidence of 50 arcmin. The full-width-at-half-maximum (FWHM) resolution of the instrument is approximately 13 arcsec, as determined by a least-squares smoothing of the experimental data.
A computer and data acquisition board were used to automate a Perkin-Elmer Model 13 spectrophotometer with a Hohlraum reflectivity attachment. Additional electronic circuitry was necessary for amplification, filtering, and debouncing. The computer was programmed to calculate spectral emittance from 1.7 to 14.7 micrometers and also total emittance versus temperature. Automation of the Hohlraum reflectometer reduced the time required to determine total emittance versus temperature from about three hours to about 40 minutes.
The error-producing mechanism involving secondary reflections in a dual-frequency, distance measuring reflectometer is examined analytically. Equations defining the phase, and hence distance, error are derived. The error-reducing potential of frequency-sweeping is demonstrated. It is shown that a single spurious return can be completely nullified by optimizing the sweep width.
MGS Electron Reflectometer data are used to probe the shape and variability of Mars ionosphere and to identify weak crustal magnetic fields within the Hellas basin. Additional information is contained in the original extended abstract.
Systems, methods, and devices of the various embodiments enable mitigation of the effects of birefringence in Optical Frequency Domain Reflectometer (OFDR) sensing fiber. Various embodiments enable the measurement of the polarization state of the light in a sensing fiber throughout the entire sensing cable in a highly distributed manner typical of OFDR systems. Various embodiments enable the production of a distributed fiber birefringence measurement throughout the length of an OFDR sensing fiber. Various embodiments may enable OFDR to be 100% polarization diverse, meaning that polarization effects in the fiber optic cables and sensing fiber do not negatively effect measurements. Additionally, the highly distributed measurement of the polarization state and related birefringence in a sensing fiber of the various embodiments may enable new types of measurements such as pressure, twisting, and bending along the sensing fiber.
The Lunar Flashlight (LF) mission will send a CubeSat to lunar orbit via NASA’s Space Launch System (SLS) test flight. The LF spacecraft will carry a novel instrument to quantify and map water ice harbored in the permanently shadowed craters of the lunar South Pole. The LF instrument, an active multi-band reflectometer which employs four high power diode lasers in the 1-2 μm infrared band, will measure the reflectance of the lunar surface near water ice absorption peaks. We present the detailed instrument design and system engineering required to deploy this instrument within very demanding CubeSat resource allocations.