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NASA NTRS2008

Metrology Optical Power Budgeting in SIM Using Statistical Analysis Techniques

The Space Interferometry Mission (SIM) is a space-based stellar interferometry instrument, consisting of up to three interferometers, which will be capable of micro-arc second resolution. Alignment knowledge of the three interferometer baselines requires a three-dimensional, 14-leg truss with each leg being monitored by an external metrology gauge. In addition, each of the three interferometers requires an internal metrology gauge to monitor the optical path length differences between the two sides. Both external and internal metrology gauges are interferometry based, operating at a wavelength of 1319 nanometers. Each gauge has fiber inputs delivering measurement and local oscillator (LO) power, split into probe-LO and reference-LO beam pairs. These beams experience power loss due to a variety of mechanisms including, but not restricted to, design efficiency, material attenuation, element misalignment, diffraction, and coupling efficiency. Since the attenuation due to these sources may degrade over time, an accounting of the range of expected attenuation is needed so an optical power margin can be book kept. A method of statistical optical power analysis and budgeting, based on a technique developed for deep space RF telecommunications, is described in this paper and provides a numerical confidence level for having sufficient optical power relative to mission metrology performance requirements.

stellar interferometry↗

NASA NTRS1989

On-orbit Metrology and Calibration Requirements for Space Station Activities Definition Study

The Space Station is the focal point for the commercial development of space. The long term routine operation of the Space Station and the conduct of future commercial activities suggests the need for in-space metrology capabilities analogous when possible to those on-Earth. The ability to perform periodic calibrations and measurements with proper traceability is imperative for the routine operation of the Space Station. An initial review, however, indicated a paucity of data related to metrology and calibration requirements for in-space operations. This condition probably exists because of the highly developmental aspect of space activities to date, their short duration, and nonroutine nature. The on-orbit metrology and calibration needs of the Space Station were examined and assessed. In order to achieve this goal, the following tasks were performed: an up-to-date literature review; identification of on-orbit calibration techniques; identification of sensor calibration requirements; identification of calibration equipment requirements; definition of traceability requirements; preparation of technology development plans; and preparation of the final report. Significant information and major highlights pertaining to each task is presented. In addition, some general (generic) conclusions/observations and recommendations that are pertinent to the overall in-space metrology and calibration activities are presented.

Cotty, G. M.↗

NASA NTRS1966

Apollo Metrology Program

This paper introduces the metrology requirements in the recently published Apollo Program handbook, NHB 5400.2, entitled, 'Apollo Metrology Requirements Manual.' The major elements and control practices required for a comprehensive metrology system are identified. The elements are presented to you with sufficient detail of control practices to provide the scope of a total metrology program. The Manual is for implementation by the Apollo Space Flight Centers, their testing sites and contractors. The benefits of implementing these requirements are equally applicable to any Government or industry standards and calibration laboratory operations.

Porter, W. A.↗

NASA NTRS1999

A Multichannel Averaging Phasemeter for Picometer Precision Laser Metrology

The Micro-Arcsecond Metrology (MAM) team at the Jet Propulsion Laboratory has developed a precision phasemeter for the Space Interferometry Mission (SIM). The current version of the phasemeter is well-suited for picometer accuracy distance measurements and tracks at speeds up to 50 cm/sec, when coupled to SIM's 1.3 micron wavelength heterodyne laser metrology gauges. Since the phasemeter is implemented with industry standard FPGA chips, other accuracy/speed trade-off points can be programmed for applications such as metrology for earth-based long-baseline astronomical interferometry (planet finding), and industrial applications such as translation stage and machine tool positioning. The phasemeter is a standard VME module, supports 6 metrology gauges, a 128 MHz clock, has programmable hardware averaging, and a maximum range of 232 cycles (2000 meters at 1.3 microns).

Halverson, Peter G.↗

NASA NTRS2004

Incoming Metrology of Segmented X-Ray Mandrels at MSFC

The Constellation-X Spectroscopy X-ray telescope (SXT) is designed to be built from X-ray optic segments. The X-ray segments will be fabricated from the segmented mandrels using a replication process. The purpose of the incoming metrology is to map the surface of the mandrels, so the performance of the X-ray optics produced can be predicted. Three Constellation-X segmented mandrels have been delivered to MSFC for incoming metrology. The segmented mandrels are 30-degree sections of a cylindrical surface and have diameters of 1.0 m, 1.2 m and 1.6 m. The maximum dimensions of the optical surface are 1.0 m axial length and 0.5 m azimuthal segment length. The metrology of the mandrels consists of the measurement of their slope differences, roundness, absolute radius, axial profile and microroughness. Accuracy goals for each type of measurement and the accuracy of the instruments used for the measurements will be discussed. The results of the mandrel metrology together with the performance predictions will be presented.

Gubarev, Mikhail↗

NASA NTRS2004

Optical Metrology for the Segmented Optics on the Constellation-X Spectroscopy X-Ray Telescope

We present the metrology requirements and metrology implementation necessary to prove out the reflector technology for the Constellation X(C-X) spectroscopy X-ray telescope (SXT). This segmented, 1.6m diameter highly nested Wolter-1 telescope presents many metrology and alignment challenges. In particular, these mirrors have a stringent imaging error budget as compared to their intrinsic stiffness; This is required for Constellation-X to have sufficient effective area with the weight requirement. This has implications for the metrology that can be used. A variety of contract and noncontact optical profiling and interferometric methods are combined to test the formed glass substrates before replication and the replicated reflector segments.The reflectors are tested both stand-alone and in-situ in an alignment tower.Some of these methods have not been used on prior X-ray telescopes and some are feasible only because of the segmented approach used on the SXT. Methods discussed include high precision coordinate measurement machines using very low force or optical probe axial interferometric profiling azimuthal circularity profiling and use of advanced null optics such as conical computer generated hologram (CGHs).

Content, David↗

NASA NTRS2009

Metrology System for a Large, Somewhat Flexible Telescope

A proposed metrology system would be incorporated into a proposed telescope that would include focusing optics on a rigid bench connected via a deployable mast to another rigid bench holding a focal-plane array of photon counting photodetectors. Deformations of the deployable mast would give rise to optical misalignments that would alter the directions (and, hence, locations) of incidence of photons on the focal plane. The metrology system would measure the relative displacement of the focusing- optics bench and the focal-plane array bench. The measurement data would be used in post-processing of the digitized photodetector outputs to compensate for the mast-deformation-induced changes in the locations of incidence of photons on the focal plane, thereby making it possible to determine the original directions of incidence of photons with greater accuracy. The proposed metrology system is designed specifically for the Nuclear Spectroscopic Telescope Array (NuSTAR) a proposed spaceborne x-ray telescope. The basic principles of design and operation are also applicable to other large, somewhat flexible telescopes, both terrestrial and spaceborne. In the NuSTAR, the structural member connecting the optical bench and the photodetector array would be a 10-m-long deployable mast, and there is a requirement to keep errors in measured directions of incidence of photons below 10 arc seconds (3 sigma). The proposed system would include three diode lasers that would be mounted on the focusing-optics bench. For clarity, only one laser is shown in the figure, which is a greatly simplified schematic diagram of the system. Each laser would be aimed at a position-sensitive photodiode that would be mounted on the detector bench alongside the aforementioned telescope photodetector array. The diode lasers would operate at a wavelength of 830 nm, each at a power of 200 mW. Each laser beam would be focused to a spot of .1-mm diameter on the corresponding position-sensitive photodiode. To reduce the effect of sunlight on the measurements, a one-stage light baffle and an 830-nm transmission filter of 10-nm bandwidth would be placed in front of the position- sensitive photodiode. For each metrology reading, the output of the position-sensitive detector would be sampled and digitized twice: once with the lasers turned on, then once with the lasers turned off. The data from these two sets of samples would be subtracted from each other to further reduce the effects of sun glints or other background light sources.

Liebe, Carl Christian↗

NASA NTRS2011

Metrology of IXO Mirror Segments

For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements.

Chan, Kai-Wing↗

DOE OSTI2026

Advancing extreme pulsed lasers through measurements: summary of the pulsed laser metrology workshop

In this report we present consensus findings produced during the pulsed laser metrology (PLM) workshop (Boulder, CO, USA, August 2025). The workshop was a meeting of 35 scientists from private industry, academia, and U.S. government to compile a list of the metrology needs to support extreme pulsed laser development and implementation. We define ‘extreme pulsed lasers’ loosely as those with peak powers above 1 TW or multi-Joule pulse energies. Such lasers are being increasingly used and investigated for use in high energy particle acceleration, short wavelength radiation generation, laser-based fusion, etc. The rapid growth of these fields and the proliferation of extreme lasers for these applications, coupled with the extreme electric fields they generate and relative scarcity of such lasers, presents unique challenges to accuracy in their measurement. The PLM workshop was a two-day event designed to hear from users, developers, and researchers on the current state of optical metrology associated with these extreme pulsed lasers. The goal was to identify the most important measurement challenges limiting development and implementation of these lasers in practical applications. We report here the conclusions and recommendations of this workshop. The hope is that this document will become the first of many iterations which track the status of measurement needs supporting extreme pulsed lasers.

Lasers↗

DOE OSTI2026

Comprehensive assessment of metrology techniques for heliostat efficiency and performance evaluation

Concentrating solar power plants, specifically central receiver type systems and their heliostat field, are struggling with negative reputation in the USA, due to perceived underperformance and reliability issues. This is in part due to a lack of standards for performance assessment as well as overly simplified techno-economical models. A better understanding of influences and losses along the solar radiation path from the sun, across the solar collector to the receiver, increases the fidelity of heliostat efficiency assessment as well as solar field performance predictions. Such data are currently scarce and require a complete set of metrology capabilities to evaluate direct solar irradiance, sun shape, atmospheric attenuation, reflectance, collector shape, slope errors and total beam dispersion. In preparation for establishing a 3rd party metrology platform in collaboration with Sandia National Labs, NLR conducted a scoping study on available metrology. We present an extensive overview of techniques and commercial systems for each category. Our work includes an analysis to increase understanding of strengths and limitations of the many techniques used for surface shape and slope measurement. This applies to a controlled, indoor or outdoor laboratory environment assessing a single heliostat.

14 SOLAR ENERGY↗

DOE OSTI2025

Current-based metrology with two-terminal mesoscopic conductors

The traditional approach to quantum parameter estimation focuses on the quantum state, deriving fundamental bounds on precision through the quantum Fisher information. In most experimental settings, however, performing arbitrary quantum measurements is highly unfeasible. In open quantum systems, an alternative approach to metrology involves the measurement of stochastic currents flowing from the system to its environment. However, the present understanding of current-based metrology is mostly limited to Markovian master equations. Considering a parameter estimation problem in a two-terminal mesoscopic conductor, we identify the key elements that determine estimation precision within the Landauer-Büttiker formalism. Crucially, this approach allows us to address arbitrary coupling and temperature regimes. Furthermore, we obtain analytical results for the precision in linear-response and zero-temperature regimes. For the specific parameter estimation task that we consider, we demonstrate that the boxcar transmission function is optimal for current-based metrology in all parameter regimes.

Landauer formula↗

NASA NTRS2004

Kite: Status of the External Metrology Testbed for SIM

Kite is a system level testbed for the External Metrology system of the Space Interferometry Mission (SIM). The External Metrology System is used to track the fiducial that are located at the centers of the interferometer's siderostats. The relative changes in their positions needs to be tracked to tens of picometers in order to correct for thermal measurements, the Kite testbed was build to test both the metrology gauges and out ability to optically model the system at these levels. The Kite testbed is an over-constraint system where 6 lengths are measured, but only 5 are needed to determine the system. The agreement in the over-constrained length needs to be on the order of 140 pm for the SIM Wide-Angle observing scenario and 8 pm for the Narrow-Angle observing scenario. We demonstrate that we have met the Wide-Angle goal with our current setup. For the Narrow-Angle case, we have only reached the goal for on-axis observations. We describe the testbed improvements that have been made since our initial results, and outline the future Kite changes that will add further effects that SIM faces in order to make the testbed more SIM like.

metrology↗

NASA NTRS2005

Mask Design for the Space Interferometry Mission Internal Metrology

This slide presentation reviews the mask design used for the internal metrology of the Space Interferometry Mission (SIM). Included is information about the project, the method of measurements with SIM, the internal metrology, numerical model of internal metrology, wavefront examples, performance metrics, and mask design

interferometry↗

NASA NTRS2016

Performance of the Primary Mirror Center-of-curvature Optical Metrology System During Cryogenic Testing of the JWST Pathfinder Telescope

The James Webb Space Telescope (JWST) primary mirror (PM) is 6.6 m in diameter and consists of 18 hexagonal segments, each 1.5 m point-to-point. Each segment has a six degree-of-freedom hexapod actuation system and a radius-of-curvature (RoC) actuation system. The full telescope will be tested at its cryogenic operating temperature at Johnson Space Center. This testing will include center-of-curvature measurements of the PM, using the Center-of-Curvature Optical Assembly (COCOA) and the Absolute Distance Meter Assembly (ADMA). The COCOA includes an interferometer, a reflective null, an interferometer-null calibration system, coarse & fine alignment systems, and two displacement measuring interferometer systems. A multiple-wavelength interferometer (MWIF) is used for alignment & phasing of the PM segments. The ADMA is used to measure, and set, the spacing between the PM and the focus of the COCOA null (i.e. the PM center-of-curvature) for determination of the ROC. The performance of these metrology systems was assessed during two cryogenic tests at JSC. This testing was performed using the JWST Pathfinder telescope, consisting mostly of engineering development & spare hardware. The Pathfinder PM consists of two spare segments. These tests provided the opportunity to assess how well the center-of-curvature optical metrology hardware, along with the software & procedures, performed using real JWST telescope hardware. This paper will describe the test setup, the testing performed, and the resulting metrology system performance. The knowledge gained and the lessons learned during this testing will be of great benefit to the accurate & efficient cryogenic testing of the JWST flight telescope.

optical testing↗

NASA NTRSDate not supplied

XV-15 Tilt Rotor Research Aircraft Photogrammetry and Metrology Measurement

A new measurement capability was created by combining photogrammetry and metrology techniques to accurately measure one half of the XV-15 Tilt Rotor Research Aircraft at the Smithsonian’s Udvar-Hazy museum. The challenges imposed by the fuselage and surrounding environment at Udvar-Hazy were overcome by careful application of photogrammetry and metrology techniques. Data analyses and processing included the use of multiple reverse engineering programs to accurately generate a complete 3-dimensional water-tight geometry of the aircraft and rotor blade. This paper describes the photogrammetry and metrology measurement systems, technology and hardware set-up, data analysis and processing methods, future work, and lessons learned. In addition, selected measurement results of the fuselage and rotor blade are presented.

XV-15↗

DOE OSTI2025

Ground Truth for CSP Mirror Metrology (Full-Length)

The high optical accuracy required for concentrating solar power (CSP) systems in turn requires accurate metrology to assess mirror optical parameters during design, manufacturing, and operation. To meet this need, researchers have developed a variety of CSP optical metrology systems, which include complex calculations and calibration terms. This raises the question: How do we know these methods’ accuracy? One approach is to compare metrology system measurements against a ground truth reference.

14 SOLAR ENERGY↗

DOE OSTI2026

Low-Temperature Plasma-Based Metrology of Lithium-Ion Battery Electrode Materials (CRADA Final Report)

As part of the Cyclotron Road program, SirenOpt Inc. evaluated its low-temperature plasma-based metrology sensor prototype for measuring multiple critical properties of lithium-ion battery electrode materials in parallel and in real-time. Cost-effective, minimal-waste manufacturing of high-performance battery electrode materials will be vital for achieving society’s net-zero carbon emission goals. Because existing electrode metrology sensors cannot operate within most sections of manufacturing lines, manufacturers often complete hundreds of processing steps before they can test their products and detect problems. When manufacturers perform these offline tests, they typically only test a small portion of the manufactured products. Current electrode manufacturing thus often yields many low-quality products, or off-spec products that must be thrown away all together. For example, at least 6% of the total lithium-ion battery manufacturing cost (i.e., over $250 million/year for the average gigafactory) is devoted to processing defective electrodes that are not scrapped until performance tests are failed during late-stage quality control checks. Electrode variability also leads manufacturers to build extra cells into battery packs to reduce the risk of poor performance. For example, many electric vehicle (EV) manufacturers include up to 10% more cells than needed, which substantially increases the cost and weight of the final EV product. The SirenOpt sensor can potentially enable early detection of poorly manufactured electrodes and allow them to be removed earlier from manufacturing lines, which can save battery manufacturers (hundreds of) millions of dollars per year. The sensor can further be used to improve product quality by accelerating R&D and process optimization, improving quality control, and enabling real-time process control. Overall, a real-time, in-situ metrology strategy can create unprecedented opportunities for implementation of smart manufacturing practices and advanced quality and process control solutions to realize higher battery electrode throughput and performance.

25 ENERGY STORAGE↗

NASA NTRS1984

NASA metrology information system: A NEMS subsystem

the NASA Metrology Information Systems (NMIS) is being developed as a standardized tool in managing the NASA field Center's instrument calibration programs. This system, as defined by the NASA Metrology and Calibration Workshop, will function as a subsystem of the newly developed NASA Equipment Management System (NEMS). The Metrology Information System is designed to utilize and update applicable NEMS data fields for controlled property and to function as a stand alone system for noncontrolled property. The NMIS provides automatic instrument calibration recall control, instrument historical performance data storage and analysis, calibration and repair labor and parts cost data, and instrument user and location data. Nineteen standardized reports were developed to analyze calibration system operations.

German, E. S., Jr.↗