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At least 37 records · Page 2

Timing measurement apparatus

Methods, devices and systems for providing accurate measurements of timing errors using optical techniques are described. An example timing measurement device includes an optical hybrid that receives two optical pulse trains and produces two or more phase shifted optical outputs. The timing measurement device further includes two or more optical filters that receive the outputs of the optical hybrid to produce multiple pulse signals with distinctive frequency bands. The device also includes one or more photodetectors and analog-to-digital converters to receive to produce electrical signals in the digital domain corresponding to the optical outputs of the hybrid. A timing error associated with the optical pulse trains can be determined using the electrical signals in digital domain based on a computed phase difference between a first frequency band signal and a second frequency band signal and a computed frequency difference between the first frequency band signal and the second frequency band.

DeVore, Peter Thomas Setsuda

Double-Knudsen-Cell Apparatus Measures Alloy-Component Activities

Double-Knudsen-cell apparatus provides molecular beam from selected one of two Knudsen cells. Both cells maintained at same temperature. Molecular beam directed into mass spectrometer for measurement of vapor pressure of selected material component. Designed to minimize undesired thermal gradients, provides appropriate translation to place selected cell in position for sampling, and minimizes mixing of molecular beams from cells.

Jacobson, Nathan S.

Apparatus Measures Friction In Vacuum Or Pressurized Gas

Friction-testing apparatus in small test chamber contains special atmosphere, which could include vacuum or pressurized gas. Provides readings indicative of friction between pin specimen and plate specimen sliding under pin in reciprocating linear motion. Pin and plate specimens made of same or different material.

Trevathan, Joseph R.

Electromechanical Apparatus Measures Residual Stress

Nondestructive test exploits relationship between stress and eddy-current-probe resistance. Yields data on residual stress or strain in metal tension/compression specimen (stress or strain remaining in specimen when no stress applied from without). Apparatus is assembly of commercial equipment: tension-or-compression testing machine, eddy-current probe, impedance gain-and-phase analyzer measuring impedance of probe coil, and desktop computer, which controls other equipment and processes data received from impedance gain-and-phase analyzer.

Chern, Engmin J.

Geodetic distance measuring apparatus

A mode locked laser system including a laser device and its peripheral components is utilized for deriving two mutually phase locked optical wavelength signals and one phase locked microwave CW signal which respectively traverse the same distance measurement path. Preferably the optical signals are comprised of pulse type signals. Phase comparison of the two optical wavelength pulse signals is used to provide a measure of the dry air density while phase comparison of one of the optical wavelength pulse signals and the microwave CW signal is used to provide a measure of the wet or water vapor density of the air. From these measurements is computed in means of the distance to be measured corrected for the atmospheric dry and water vapor densities in the measurement path.

Abshire, J. B.

Improved Thermal-Diffusivity-Measuring Apparatus

Accuracy at high temperature improved. Furnace heats specimen to experimental temperature, and flash tube raises specimen temperature by small amount and for short time so diffusivity (composite property of heat capacity and conductivity) determined. Specimen mount ensures minimum heat loss during temperature-rise measurement. Measurement temperatures up to 1,000 degrees C realized with fused-quartz light pipe and up to 1,600 degrees C with sapphire light pipe.

Wood, C.

Time domain phase measuring apparatus

The phase and/or period stability of a device is determined by connecting the device in one orthogonal arm of a phase detector having a mixer. In the other arm is an adjustable, variable phase shift device. The output of the mixer is fed through an active low pass filter to derive a DC voltage indicative of the phase shift. The variable phase device is adjusted so that the DC voltage will nullify the phase shift of the tested device under normal conditions. The DC voltage level is converted into a time interval indicative of the phase change of the tested device by determining when the level equals the amplitude of a low frequency ramp voltage. The interval between adjacent equality points can be measured or the period between a reference point on the ramp voltage and the quality be measured.

Reinhardt, V. S.

Apparatus for measuring current flow Patent

Electric current measuring apparatus design including saturable core transformer and energy storage device to avoid magnetizing current errors from transformer output winding

Paulkovich, J.

Apparatus for measuring high frequency currents

An apparatus for measuring high frequency currents includes a non-ferrous core current probe that is coupled to a wide-band transimpedance amplifier. The current probe has a secondary winding with a winding resistance that is substantially smaller than the reactance of the winding. The sensitivity of the current probe is substantially flat over a wide band of frequencies. The apparatus is particularly useful for measuring exposure of humans to radio frequency currents.

Hagmann, Mark J.