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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Exposure of Highly Reflective Far-Ultraviolet Coatings to LEO Environment for TRL Advancement for the Habitable Worlds Observatory

Over the past several years, our team at the NASA Goddard Space Flight Center (GSFC), in collaboration with the Jet Propulsion Laboratory (JPL) and the Naval Research Laboratory (NRL), have developed several new protected Al coating technologies with improved Far-Ultraviolet (FUV) reflectance performance and more robust environmental stability. These include Al protected with lithium-based fluoride (LiF) coatings such as hot deposited LiF (eLiF), XeF 2 -passivated LiF coatings (XeLiF), Li 3 AlF 6 overcoats, AlF 3 (plasma passivated), and XeF 2 passivated MgF 2 coatings (XeMgF 2 ). However, despite these developments, relatively little experimental information exists regarding the long-term stability of these coatings after simultaneous exposure to the Low Earth Orbit (LEO) environment. To evaluate their environmental durability and advance their Technology Readiness Level (TRL), representative samples of these coating technologies, Al+XeLiF, Al+eLiF, Al+Li 3 AlF 6 , Al+AlF 3 , Al+XeMgF 2 , and bare Al as reference samples, were flown onboard the International Space Station (ISS) as part of the Materials International Space Station Experiment 20 (MISSE-20). The MISSE platform is operated by Aegis Aerospace for relatively long-duration (e.g. 6 months) external exposure experiments in a space environment. The coatings were deposited on ULE and Zerodur substrates, and witness samples deposited on the same coatings runs, but on glass slides were left on Earth as control. A subset of the flight samples were fitted with MgF 2 windows to reduce direct exposure to atomic oxygen (AO) and charged particles, and still let through UV and other types of radiation on these samples. After approximately 6 months of exposure in the forward-facing (RAM) direction, the samples were returned to Earth and characterized by performing FUV/NUV/VIS/NIR reflectance measurements to quantify degradation, spectroscopic ellipsometry to evaluate coating thickness and optical constants, atomic force microscopy (AFM) to quantify surface roughness evolution during the flight in the ISS. The MgF 2 protective windows were also analyzed through FUV transmission measurements. Comparison with the witness samples left on the ground and with the flown bare Al samples (with just the naturally occurring Al 2 O 3 layer) provided a quantitative assessment of coating thickness variations, optical performance degradation, and morphological changes induced by prolonged exposure to the LEO environment.

Far Ultraviolet (FUV)↗
NASA NTRS1964

Copper-Wire-Card Detectors

Card Design - Each copper-wire-card detector consisted of a winding of fine wire mounted to a 1.45- by 7 .00-inch rectangular card. Two wire sizes were used - 2-mil and 3-mil (fourteen 2-mil cards and thirty-two 3-mil cards). The total exposed effective area was about 1.2 square feet (0.11 square meters). A sketch of a detector is shown in figure X-1. These detectors are similar to the detectors flown on previous satellites. Quadrant Design - The 36 cards are arranged in four groups of 12 cards each with four pairs of 3-mil cards in parallel and four single 2-mil cards in parallel. Each group is mounted on a fiber-glass support that can readily be removed from the payload for repairs or replacements with appropriate spares. Individual cards can be replaced readily if necessary. The assembly of the quadrants is shown in figure II-2. Temperature-Balance Experiment - The grids for the temperature-balance experiment were wound with insulated wire. The thermal balance of such a winding has been examined under conditions approximating flight environment. One card of 3-mil wire with a thermistor attached was enclosed in a bell jar and exposed to the sun after evacuation. External radiation was reduced by shading the bell jar except for a window which allowed the sun's rays to strike the winding. The temperature of the thermistor was recorded at intervals. Figure X-2 shows that the temperature does not rise beyond 65° C in 20 minutes of continuous exposure to the sun. Complementary tests made by Dr. Roger E. Gaumer of Lockheed Aircraft Corp. give a ratio of absorptivity to emissivity of 1 for this type of enamel insulated wire. Compensation for Resistance Changes - Temperatures at the wire-card surfaces were expected to extend from -10° C to a maximum of 60° C. Since copper has a thermal coefficient of resistance of 0.33 percent per °C, the resistance of the wire would change 22 percent and a compensator had to be provided. A 100-ohm thermistor with a negative coefficient of -3-9 percent per °C was selected, wired in parallel with a 300-ohm fixed resistor and installed in series with each 2-mil card and with each pair of 3-mil cards. The effective resistance of 2-mil and 3-mil compensated cards is shown in figure X-3 for various temperatures and compared with the resistance of uncompensated copper. The increase in resistance from 20° C to 60° C is 12 ohms or 2.7 percent. Below 20° C the effective resistance also increases and the curve is similar to that obtained for high temperatures.

Detector↗
NASA NTRS2006

Nitrile/Buna N Material Failure Assessment for an O-Ring used on the Gaseous Hydrogen Flow Control Valve (FCV) of the Space Shuttle Main Engine

After the rollout of Space Shuttle Discovery in April 2005 in preparation for return-to-flight, there was a failure of the Orbiter (OV-103) helium signature leak test in the gaseous hydrogen (GH2) system. Leakage was attributed to the Flow Control Valve (FCV) in Main Engine 3. The FCV determined to be the source of the leak for OV-103 is designated as LV-58. The nitrile/Buna N rubber O-ring seal was removed from LV-58, and failure analysis indicated radial cracks providing leak paths in one quadrant. Cracks were eventually found in 6 of 9 FCV O-rings among the three Shuttle Orbiters, though none were as severe as those for LV-58, OV-103. Testing by EM10 at MSFC on all 9 FCV O- rings included: laser dimensional, Shore A hardness and properties from a dynamic mechanical analyzer (DMA) and an Instron tensile machine. The following test data was obtained on the cracked quadrant of the LV-58, OV-103 O-ring: (1) the estimated compression set was only 9.5%, compared to none for the rest of the O-ring; (2) Shore A hardness for the O.D. was higher by almost 4 durometer points than for the rest of the O-ring; and (3) DMA data showed that the storage/elastic modulus E was almost 25% lower than for the rest of the O-ring. Of the 8 FCV O-rings tested on an Instron, 4 yielded tensile strengths that were below the MIL spec requirement of 1350 psi-a likely influence of rubber cracking. Comparisons were made between values of modulus determined by DNA (elastic) and Instron (Young s). Each nitrile/Buna N O-ring used in the FCV conforms to the MIL-P-25732C specification. A number of such O-rings taken from shelf storage at MSFC and Kennedy Space Center (KSC) were used to generate a reference curve of DMA glass transition temperature (Tg) vs. shelf storage time ranging from 8 to 26 years. A similar reference curve of TGA onset temperature (of rubber weight loss) vs. shelf storage time was also generated. The DMA and TGA data for the used FCV O-rings were compared to the reference curves. Correlations were also made between the DMA modulus (at 22 C) and Shore A hardness for all 9 of the FCV O-rings used among the three Shuttle Orbiters. The radial cracking in the FCV O-rings was determined to be due to ozone attack, as nitrile/Buna N rubber is susceptible to such attack. Nitrile/Buna N material under MIL-P25732C should be used in a hydraulic fluid environment to help protect it from cracking. However, the FCV O-rings were used in an air only environment. The FCV design has as much as a 9-mil gap that allows the O.D. of the O-ring to be directly exposed to ozone, pressurized air and some elevated temperatures, accelerating the weathering process that leads to O-ring cracking. Space Shuttle flights will likely not continue past 2010. Therefore, Shuttle management decided to continue using the nitrile/Buna N material for the FCVs, but have each O-ring replaced after 3 years to minimize any chances for crack initiation.

Doug Wingard↗