The Cryogenic, High-Accuracy, Refraction Measuring System (CHARMS): A New Facility for Cryogenic Infrared through Vacuum Far-Ultraviolet Refractive Index Measurements
The optical designs of future NASA infrared (IR) missions and instruments, such as the James Webb Space Telescope's (JWST) Near-Mixed Camera (NIRCam), will rely on accurate knowledge of the index of refraction of various IR optical materials at cryogenic temperatures. To meet this need, we have developed a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS). In this paper we discuss the completion of the design and construction of CHARMS as well as the engineering details that constrained the final design and hardware implementation. In addition, we will present our first light, cryogenic, IR index of refraction data for LiF, BaF2, and CaF2, and compare our results to previously published data for these materials.