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At least 37 records · Page 2

A novel sector mass spectrograph design for high-order coded aperture Mass Spectrometry with stigmatic aberration correction

Previous works experimentally demonstrated that the application of spatially-coded apertures to simple sector mass spectrographs can result in increased signal intensity while maintaining spectral resolution comparable to that of a conventional slit aperture.[Chen, E.X., et al.: J Am Soc Mass Spectr. 26, 1633 (2015)][Russell, Z.E., et al.: J Am Soc Mass Spectr. 26, 248 (2015)] This spatial coding technique was later applied to a double-focusing Mattauch-Herzog mass spectrograph, and shown to be generally compatible with the architecture.[Russell, Z.E., et al.: J Am Soc Mass Spectr. 27, 1 (2016)] However, the achieved signal gain was limited by the spatial size of the electric sector gap. In this work, we introduce a modified version of the Mattauch-Herzog mass spectrograph with a wide-gap electric sector that is enabled by a novel, segmented-electrode approach, and show via simulation that this modified architecture alone (without aperture coding) achieves a 1.8x improvement in mass resolving power compared to a conventional Mattauch-Herzog spectrograph of equivalent size. Further, simulation of an aperture-coded version of the instrument supports a predicted signal strength increase of 50x with minimal loss of aperture clarity on the sensor due to the increased open area of the high-order coded aperture which can be passed.

47 OTHER INSTRUMENTATION↗

Static characterization of a highly optimized streak tube design incorporating a steering slot anode and an aberration-corrected Einzel lens

The BHx streak tube, under development at the Laboratory for Laser Energetics, incorporates a series of novel electron-optics elements to enable high fidelity measurements for high-energy-density physics experiments. The system is engineered to support a 25-mm active photocathode region compatible with sub-picosecond temporal resolution and with 70% internal photoelectron throughput. It exhibits negligible geometric distortion on a flat output screen, making it well suited for variety of measurements, such as ultrafast x-ray spectroscopy. Here, this paper presents characterization data from a prototype unit tested with an ultraviolet laser in a static deflection (non-swept) mode and shows good agreement with the predictions from numerical modeling, including focusing performance and geometric distortion measurements. Key design elements have been demonstrated and de-risked, laying the foundation for dynamic deflection testing. The anticipated improvements in data fidelity are expected to impact the fields as diverse as inertial confinement fusion, laboratory astrophysics, and materials science.

High energy density physics↗

Visualization of defects in single-crystal and thin-film PdCoO 2 using aberration-corrected scanning transmission electron microscopy

Single-crystal delafossite PdCoO 2 is known to have an extremely low intrinsic impurity concentration of ~0.001%, demonstrating extraordinarily high conductivity with a mean free path of ~20 μm at low temperatures. However, when grown as thin films, the resistivity at room temperature increases by a factor of 3–80 times, depending on the film thickness. Using scanning transmission electron microscopy, we identify different classes of defects for the single crystal vs epitaxial thin film. The dominant defect for single-crystal PdCoO 2 is found to be ribbonlike defects. For the thin films, we identify different types of defects arising in epitaxial thin films mainly due to substrate termination that disrupt the lateral connectivity of the conducting planes. Further, our results are consistent with the high conductivity of single crystals and increased electrical resistivity of the thin films compared to that of single crystals, suggesting that selecting a proper substrate, improving surface quality, and reducing the step density are the keys to enhance the film quality for utilizing PdCoO 2 as a platform for future applications.

36 MATERIALS SCIENCE↗

Modeling of Optical Aberration Correction using a Liquid Crystal Device

Gruneisen (sup 1-3), has shown that small, light weight, liquid crystal based devices can correct for the optical distortion caused by an imperfect primary mirror in a telescope and has discussed the efficiency of this correction. In this paper we expand on that work and propose a semi-analytical approach for quantifying the efficiency of a liquid crystal based wavefront corrector for this application.

Xinghua, Wang↗

Multi-element metasurface system for imaging in the near-infrared

Metasurfaces are optically thin 2D arrays of subwavelength scatterers that modify scalar and vector properties of incident electromagnetic fields. Metasurface lenses are of particular interest for imaging applications for their flat form factor, compatibility with CMOS fabrication processes, and potential for correcting aberrations with a small number of elements. Here, we advance this capability by realizing a millimeter-diameter, polarization-independent metalens triplet system with chromatic aberration correction over the wavelength range of 1.30–1.60 μm and monochromatic aberration correction enabling a field of view of 50°.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

Aberrations of varied line-space grazing incidence gratings in converging light beams

Analyses of the imaging properties of several designs for varied-line space gratings in converging beams of light in grazing-incidence spectrometers are presented. An explicit model is defined for the case of a plane-reflection grating intercepting light that converges and is reflected to a stigmatic point associated with the zero-order image of the grating. Smooth spatial variation of the grating constant then permits aberration correction. The aberrations are expressed as polynomials in the grating lens coordinates using power series expansions. Application of the model is illustrated in terms of aberrations experienced with the short wavelength spectrometer on the EUVE satellite. Attention is given to straight and parallel in-plane grooves, curved groove in-plane designs and off-plane grooves. Aberrations due to dispersions and misalignment are also considered.

Hettrick, M. C.↗

The correction of aberrations computed in the aperture plane of multifrequency microwave radiometer antennas

An analytical/numerical approach to identifying and correcting the aberrations introduced by a general displacement of the feed from the focal point of a single offset paraboloid antenna used in deployable radiometer systems is developed. A 15 meter reflector with 18 meter focal length is assumed for the analysis, which considers far field radiation pattern quality, focal region fields, and aberrations appearing in the aperture plane. The latter are obtained by ray tracing in the transmit mode and are expressed in terms of optical notation. Attention is given to the physical restraints imposed on corrective elements by real microwave systems and to the intermediate near field aspects of the problem in three dimensions. The subject of wave fronts and caustics in the receive mode is introduced for comparative purposes. Several specific examples are given for aberration reduction at eight beamwidths of scan at a frequency of 1.414 GHz.

Schmidt, R. F.↗

Active Correction of Aberrations of Low-Quality Telescope Optics

A system of active optics that includes a wavefront sensor and a deformable mirror has been demonstrated to be an effective means of partly correcting wavefront aberrations introduced by fixed optics (lenses and mirrors) in telescopes. It is envisioned that after further development, active optics would be used to reduce wavefront aberrations of about one wave or less in telescopes having aperture diameters of the order of meters or tens of meters. Although this remaining amount of aberration would be considered excessive in scientific applications in which diffraction-limited performance is required, it would be acceptable for free-space optical- communication applications at wavelengths of the order of 1 m. To prevent misunderstanding, it is important to state the following: The technological discipline of active optics, in which the primary or secondary mirror of a telescope is directly and dynamically tilted, distorted, and/or otherwise varied to reduce wavefront aberrations, has existed for decades. The term active optics does not necessarily mean the same thing as does adaptive optics, even though active optics and adaptive optics are related. The term "adaptive optics" is often used to refer to wavefront correction at speeds characterized by frequencies ranging up to between hundreds of hertz and several kilohertz high enough to enable mitigation of adverse effects of fluctuations in atmospheric refraction upon propagation of light beams. The term active optics usually appears in reference to wavefront correction at significantly lower speeds, characterized by times ranging from about 1 second to as long as minutes. Hence, the novelty of the present development lies, not in the basic concept of active or adaptive optics, but in the envisioned application of active optics in conjunction with a deformable mirror to achieve acceptably small wavefront errors in free-space optical communication systems that include multi-meter-diameter telescope mirrors that are relatively inexpensive because their surface figures are characterized by errors as large as about 10 waves. Figure 1 schematically depicts the apparatus used in an experiment to demonstrate such an application on a reduced scale involving a 30-cm-diameter aperture.

Hemmati, Hamid↗

Adaptive optical third-harmonic generation microscopy for in vivo imaging of tissues

Third-harmonic generation microscopy is a powerful label-free nonlinear imaging technique, providing essential information about structural characteristics of cells and tissues without requiring external labelling agents. In this work, we integrated a recently developed compact adaptive optics module into a third-harmonic generation microscope, to measure and correct for optical aberrations in complex tissues. Taking advantage of the high sensitivity of the third-harmonic generation process to material interfaces and thin membranes, along with the 1,300-nm excitation wavelength used here, our adaptive optical third-harmonic generation microscope enabled high-resolution in vivo imaging within highly scattering biological model systems. Examples include imaging of myelinated axons and vascular structures within the mouse spinal cord and deep cortical layers of the mouse brain, along with imaging of key anatomical features in the roots of the model plant Brachypodium distachyon. In all instances, aberration correction led to enhancements in image quality.

60 APPLIED LIFE SCIENCES↗

Imaging Spectrometers Using Concave Holographic Gratings

Imaging spectroscopy combines the spatial attributes of imaging with the compositionally diagnostic attributes of spectroscopy. For spacebased remote sensing applications, mass, size, power, data rate, and application constrain the scanning approach. For the first three approaches, substantial savings in mass and size of the spectrometer can be achieved in some cases with a concave holographic grating and careful placement of an order-sorting filter. A hologram etched on the single concave surface contains the equivalent of the collimating, dispersing, and camera optics of a conventional grating spectrometer and provides substantial wavelength dependent corrections for spherical aberrations and a flat focal field. These gratings can be blazed to improve efficiency when used over a small wavelength range or left unblazed for broadband uniform efficiency when used over a wavelength range of up to 2 orders. More than 1 order can be imaged along the dispersion axis by placing an appropriately designed step order-sorting filter in front of the one- or two-dimensional detector. This filter can be shaped for additional aberration corrections. The VIRIS imaging spectrometer based on the broadband design provides simultaneous imaging of the entrance slit from lambda = 0.9 to 2.6 microns (1.5 orders) onto a 128 x 128 HgCdTe detector (at 77 K). The VIRIS spectrometer was used for lunar mapping with the UH 24.in telescope at Mauna Kea Observatory. The design is adaptable for small, low mass, space based imaging spectrometers.

Gradie, J.↗

Achieving sub-0.5-angstrom–resolution ptychography in an uncorrected electron microscope

Subangstrom resolution has long been limited to aberration-corrected electron microscopy, where it is a powerful tool for understanding the atomic structure and properties of matter. Here, we demonstrate electron ptychography in an uncorrected scanning transmission electron microscope (STEM) with deep subangstrom spatial resolution down to 0.44 angstroms, exceeding the conventional resolution of aberration-corrected tools and rivaling their highest ptychographic resolutions​. Our approach, which we demonstrate on twisted two-dimensional materials in a widely available commercial microscope, far surpasses prior ptychographic resolutions (1 to 5 angstroms) of uncorrected STEMs. We further show how geometric aberrations can create optimized, structured beams for dose-efficient electron ptychography. Our results demonstrate that expensive aberration correctors are no longer required for deep subangstrom resolution.

36 MATERIALS SCIENCE↗

Focused Interest Groups Propel Innovation in the Emerging Data-Driven Hardware Ecosystem

Over the past several decades, the science of electron microscopy (EM) has risen to become one of the cornerstone approaches to understanding material structure, chemistry, and defects at exceptional spatial resolution. This rise can be attributed to the hard work of researchers and companies who have pushed the bounds of instrumentation and analysis, but it is also the result of advocacy by members of professional societies. Furthermore, such advocacy is exemplified by the Aberration Corrected EM (ACEM) focused interest group (FIG) of the Microscopy Society of America (MSA), which has played an important role in facilitating new hardware developments, promoting the exchange of ideas to catalyze discovery, and building the next generation of leaders in electron microscopy. From the early 2000s to the present, aberration correction has moved from proof-of-concept instrumentation to an established technique, providing unprecedented improvements in spatial and chemical resolution for breakthroughs in chemistry, physics, and materials science.

47 OTHER INSTRUMENTATION↗

Lattice Strain Measurement of Core@Shell Electrocatalysts with 4D Scanning Transmission Electron Microscopy Nanobeam Electron Diffraction

Strain engineering enables the direct modification of atomic bonding and is currently an active area of research aimed at improving electrocatalytic activity. However, directly measuring the lattice strain of individual catalyst nanoparticles is challenging, especially at the scale of a single unit cell. In this study, we quantitatively map the strain present in rhodium@platinum (core@shell) nanocube electrocatalysts using conventional aberration-corrected scanning transmission electron microscopy (STEM) and the recently developed technique of 4D-STEM nanobeam electron diffraction. We demonstrate that 4D-STEM combined with data preconditioning allows for quantitative lattice strain mapping with subpicometer precision and without the influence of scan distortions. When combined with multivariate curve resolution, 4D-STEM allows us to distinguish the nanocube core from the shell and to quantify the unit cell size as a function of distance from the core–shell interface. Our results demonstrate that 4D-STEM has significant precision and accuracy advantages in strain metrology of catalyst materials compared to aberration-corrected STEM imaging and is beneficial for extracting information about the evolution of strain in catalyst nanoparticles.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Optical Metrology for the Filter Set for the Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS)

The Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS) will employ a wide variety of spectral filtration components including narrow band, medium band, wide band, and far ultraviolet (FUV) long pass filters, spatially- variable filters (ramp filters), VIS/IR polarizers, NUV polarizers, FUV prisms, and a grism. These components are spread across ACS's Wide Field, High Resolution, and Solar Blind channels which provide diffraction-limited imaging of astronomical targets using aberration-correcting optics which remove most aberrations from HST's Optical Telescope Assembly (OTA). In order for ACS to be truly advanced, these filters must push the state-of-the-art in performance in a number of key areas at the same time. Important requirements which these filters must meet include outstanding transmitted wavefront, high transmittance, uniform transmittance across each filter, spectrally structure-free bandpasses, exceptionally high out of band rejection, and a high degree of parfocality. These constitute a very stringent set of requirements indeed, especially for filters which are up to 90 mm in diameter. The development of optical metrology stations used to demonstrate that each ACS filter will meet its design specifications is discussed. Of particular note are specially-designed spectral transmissometers and interferometers.

Leviton, Douglas B.↗

Atomic-Scale Characterization of Dilute Dopants in Topological Insulators via STEM–EDS Using Registration and Cell Averaging Techniques

Magnetic dopants in three-dimensional topological insulators (TIs) offer a promising avenue for realizing the quantum anomalous Hall effect (QAHE) without the necessity for an external magnetic field. Understanding the relationship between site occupancy of magnetic dopant elements and their effect on macroscopic property is crucial for controlling the QAHE. By combining atomic-scale energy-dispersive X-ray spectroscopy (EDS) maps obtained by aberration-corrected scanning transmission electron microscopy (AC-STEM) and novel data processing methodologies, including semi-automatic lattice averaging and frame registration, we have determined the substitutional sites of Mn atoms within the 1.2% Mn-doped Sb 2 Te 3 crystal. More importantly, the methodology developed in this study extends beyond Mn-doped Sb 2 Te 3 to other quantum materials, traditional semiconductors, and even electron irradiation sensitive materials.

36 MATERIALS SCIENCE↗