The effect of slight surface roughness on emittance
Effect of slight surface roughness on thermal emission
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Effect of slight surface roughness on thermal emission
Time variation of total hemispherical emission of polished platinum surfaces at high temperatures
Effects of evaporation rate and oxygen pressure on characteristics of silicon oxide films, and angular reflectance of metals determined by optical constants
Rotating cylinder equipment for measuring total and spectral normal emission of metals and nonmetals over temperature range of 1200 to 1800 deg K
Hemispherical spectral emission of ablation chars, carbon, and zirconium oxide formed during reentry
Apparatus for measuring emission of organic materials
Heat conductive loss along supporting wires, air conductive loss in evacuated chamber - loss corrections for hemispherical emission measurements by decay method
Application of temperature rate measurements to determination of thermal emission of spacecraft temperature control surfaces
Effect of absorptance/emittance ratio on storage of cryogenic propellants in deep space
Electroluminescent materials for spacecraft temperature control
Development of space stable thermal control coatings
Space-stable temperature control coatings - paints with low solar absorption/emittance ratios
Control of spacecraft internal temperature using movable shutters reflecting diffusely
Measurement techniques for determining emissions of satellite temperature control coatings or skin materials
Stray radiation error reduction in spectral emmittance measurements for diffusely reflecting materials
Thermal radiation parameter measurements of coating materials, using steady state heat balance method
Control of spacecraft internal temperature, using movable shutters reflecting diffusely
Optical characteristics of vapor deposited coating systems for thermal control of spacecraft structural surface