Instrument design and test results of the new all-reflection spatial heterodyne spectrometer
An all-reflection spatial heterodyne spectrometer (SHS) has been recently developed. The advantages over conventional high-resolution grating spectrometers are that the SHS requires no mechanical scanning, a self-compensating optical design permits easy alignment, and it is much smaller than other spectrometers of comparable resolution. Since all beam-splits and recombinations occur by reflection off of a diffraction grating, the interferometer is capable of operating well into the extreme ultraviolet (EUV) and possibly into the soft X-ray region. A description of the design and the characteristics of the instrument is presented. Also, test results, including sample interferograms as well as their Fourier-transformed spectra, at both visible and UV wavelengths are shown. Finally, we report on future developments and possible applications.