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All sourcesNASA NTRSDOE OSTI
NASA NTRS2000

Failure Modes and Effects Analysis (FMEA): A Bibliography

Failure modes and effects analysis (FMEA) is a bottom-up analytical process that identifies process hazards, which helps managers understand vulnerabilities of systems, as well as assess and mitigate risk. It is one of several engineering tools and techniques available to program and project managers aimed at increasing the likelihood of safe and successful NASA programs and missions. This bibliography references 465 documents in the NASA STI Database that contain the major concepts, failure modes or failure analysis, in either the basic index of the major subject terms.

Source record↗
NASA NTRS2019

Verification Benchmarks and Validation of MAT261 for High Energy Dynamic Impact Applications

Advanced computational methods for composite structures can enable smarter testing and potentially certification by analysis. These methods, known as progressive damage and failure analysis (PDFA) methods, can predict lamina level mechanics including failure and subsequent propagation. When introduced into a commercial off the shelf finite element solver such as ABAQUS, LS-DYNA, or ANSYS, it enables end users to effectively exercise PDFA methods; however, it requires an understanding of the assumed mechanics and underlying coded response. In this paper, verification benchmarks developed under the NASA Advanced Composite Consortium for a class of PDFA methods known as continuum damage mechanics approaches are applied to the native LS-DYNA material model MAT261. As a result of the verification, an instability was discovered and subsequently corrected with an engineering solution. The results of the preliminary MAT261 simulations for high energy dynamic impact and the engineering solution are compared and a discussion about the significance is presented.

Molitor, Matthew↗
NASA NTRS1983

A review of modern approaches to fatigue reliability analysis and design

Metal fatigue is a principal mode of failure in components of mechanical systems. But fatigue design factors (e.g., stress, fatigue strength) are subject to considerable uncertainty. Therefore, relative to fatigue, reliability methods are appropriate for purposes of safety checking of designs, risk assessment, failure analysis, and development of code statements. Described herein are four methods which can be effectively employed for fatigue reliability analysis, (1) Monte Carlo methods, (2) the lognormal format, (3) the Weibull format, (4) the Rackwitz-Fiessler algorithm. Examples of the application of each are presented. In summary, no general reliability method can be recommended for all situations involving fatigue. The approach has to be tailored to the problem.

Wirsching, P. H.↗
NASA NTRS2014

Support of LAVA Integration and Testing

The Lunar Advanced Volatile Analysis (LAVA) subsystem is a part of the Regolith and Environment Science & Oxygen and Lunar Volatile Analysis (RESOLVE) Payload that will fly to the lunar pole on the Resource Prospector Mission (RPM) in 2019. The purpose of the mission is to characterize the water on the surface and subsurface of the moon in various locations in order to map the distribution. This characterization of water will help to understand how feasible water is as a resource that can be used for drinking water, breathable air, and propellants in future missions. This paper describes the key support activities performed during a 10 week internship; specifically, troubleshooting the Near Infrared Spectrometer for the Surge Tank (NIRST) instrument count loss, contributing to a clamp to be used in the installation of Resistive Temperature Detectors (RTDs) to tubing, performing a failure analysis of the LAVA Fluid Subsystem (FSS), and finalizing trade studies for release.

Trade Study↗
NASA NTRS2001

Report of the Odyssey FPGA Independent Assessment Team

An independent assessment team (IAT) was formed and met on April 2, 2001, at Lockheed Martin in Denver, Colorado, to aid in understanding a technical issue for the Mars Odyssey spacecraft scheduled for launch on April 7, 2001. An RP1280A field-programmable gate array (FPGA) from a lot of parts common to the SIRTF, Odyssey, and Genesis missions had failed on a SIRTF printed circuit board. A second FPGA from an earlier Odyssey circuit board was also known to have failed and was also included in the analysis by the IAT. Observations indicated an abnormally high failure rate for flight RP1280A devices (the first flight lot produced using this flow) at Lockheed Martin and the causes of these failures were not determined. Standard failure analysis techniques were applied to these parts, however, additional diagnostic techniques unique for devices of this class were not used, and the parts were prematurely submitted to a destructive physical analysis, making a determination of the root cause of failure difficult. Any of several potential failure scenarios may have caused these failures, including electrostatic discharge, electrical overstress, manufacturing defects, board design errors, board manufacturing errors, FPGA design errors, or programmer errors. Several of these mechanisms would have relatively benign consequences for disposition of the parts currently installed on boards in the Odyssey spacecraft if established as the root cause of failure. However, other potential failure mechanisms could have more dire consequences. As there is no simple way to determine the likely failure mechanisms with reasonable confidence before Odyssey launch, it is not possible for the IAT to recommend a disposition for the other parts on boards in the Odyssey spacecraft based on sound engineering principles.

Mayer, Donald C.↗
NASA NTRS1978

Some failure modes and analysis techniques for terrestrial solar cell modules

Analysis data are presented on failed/defective silicon solar cell modules of various types and produced by different manufacturers. The failure mode (e.g., internal short and open circuits, output power degradation, isolation resistance degradation, etc.) are discussed in detail and in many cases related to the type of technology used in the manufacture of the modules; wherever applicable, appropriate corrective actions are recommended. Consideration is also given to some failure analysis techniques that are applicable to such modules, including X-ray radiography, capacitance measurement, cell shunt resistance measurement by the shadowing technique, steady-state illumination test station for module performance illumination, laser scanning techniques, and the SEM.

Shumka, A.↗
NASA NTRS1982

Evaluation of high temperature structural adhesives for extended service

The evaluation, selection, and demonstration of structural adhesive systems for supersonic cruise research applications, and establishment of environmental durability of selected systems for up to 20,000 hours is described. Ten candidate adhesives were initially evaluated. During screening and evaluation, these candidates were narrowed to three of the most promising for environmental durability testing. The three adhesives were LARC-13, PPQ, and NR056X. The LARC-13 was eliminated because of a lack of stability at 505 K. The NRO56X was removed from the market. The LARC-TPI was added after preliminary evaluation and an abbreviated screening test. Only PPQ and LARC-TPI remained as the reasonable candidates late into the durability testing. Large area bond panels were fabricated to demonstrate the processibility of the selected systems. Specifications were prepared to assure control over critical material and process parameters. Surface characterization concentrated primarily upon titanium surface treatments of 10 volt chronic acid anodize, 5 volt chromic acid anodize and PASA-JELL. Failure analysis was conducted on lap shear adhesive bond failures which occurred in PPQ and LARC-13 test specimens after 10,000 hours at 505 K.

Hill, S. G.↗
NASA NTRS1995

Mechanical properties testing and results for thermal barrier coatings

Thermal Barrier Coatings (TBC's) provide a significant challenge in the evaluation of their mechanical properties in ways that provide data that is not specimen dependent. The paper reviews various developments of the principal author over the past several years for both plasma sprayed and physical vapor deposited (PVD) materials, as well as new data on the fatigue behavior of one material system. The test methods that have been employed address tensile and compressive modulus and ultimate strength, tensile and compressive fatigue strength, and interfacial strength. This testing is now underway. Property testing is especially difficult for TBC's owing to the limitation on fabrication thickness of the coating. Bending tests are not used as these tests do not provide sufficiently uniform states of strain for property evaluations. Test specimens with uniform states of axial stress have been devised for each material system. The results show that the material property results between various experimenters and experimental methods are not yet consistent. However, the results provide critical design data at a suitable level of accuracy for life prediction. The paper will review both tensile and compressive mechanical testing of uniaxial specimens showing property dependencies on material density and temperatures for both material systems. Successful test results for both tensile and compressive fatigue loadings will be given. The test data shows that the fatigue strength of the TBC's is highly stress dependent in both loading conditions and is likely to depend on stress range and not mean stress. The fatigue strength of the plasma sprayed TBC's appears to increase with elevated temperatures in a range of temperatures below the creep activation temperature for the materials. The plasma sprayed TBC materials have been confirmed to have cyclic hysteresis at all temperature levels down to room temperature. Limited failure analysis data for various specimens suggest that the failure modes are driven by normal geometric discontinuities in the TBC's.

Cruse, T. A.↗
NASA NTRS2006

Metallurgical Design and Development of NASA Crawler/Transporter Tread Belt Shoe Castings

The NASA Crawler/Transporters (CT-1 and CT-2) used to transport the Space Shuffles are one of the largest tracked vehicles in existence today. Two of these machines have been used to move space flight vehicles at Kennedy Space Center since the Apollo missions of the 1960's and relatively few modifications have been made to keep them operational. In September of 2003 during normal Crawler/Transporter operations cracks were observed along the roller pad surfaces of several tread belt shoes. Further examination showed 20 cracked shoes on CT-1 and 40 cracked shoes on CT-2 and a formal failure analysis investigation was undertaken while the cracked shoes were replaced. Six shoes were cross-sectioned with the fracture surfaces exposed and it was determined that the cracks were due to fatigue that initiated on the internal casting web channels at pre-existing casting defects and propagated through thickness both transgranularly and intergranularly between internal shrinkage cavities, porosity, and along austenitic and ferritic grain boundaries. The original shoes were cast during the 1960's using a modified 861330 steel with slightly higher levels of chromium, nickel and molybdenum followed by heat treatment to achieve a minimum tensile strength of 11 Oksi. Subsequent metallurgical analysis of the tread belt shoes after multiple failures showed excessive internal defects, alloy segregation, a nonuniform ferritic/ bainitic/martensitic microstructure, and low average tensile properties indicative of poor casting and poor heat-treatment. As a result, NASA funded an initiative to replace all of the tread belt shoes on both crawler/transporters along with a redesign of the alloy, manufacturing, and heat-treatment to create a homogeneous cast structure with uniform mechanical and metallurgical properties. ME Global, a wholly owned subsidiary of ME Elecmetal based in Minneapolis, MN was selected as manufacturing and design partner to develop the new shoes and this paper describes the research, development, and manufacturing that resulted in the successful delivery of 1044 new Crawler/Transporter tread belt shoes all meeting rigid metallurgical and mechanical design criteria derived from finite element modeling of the stress loads required for safe space shuttle transport.

Parker, Donald S.↗
NASA NTRS2014

Reliability Growth in Space Life Support Systems

A hardware system's failure rate often increases over time due to wear and aging, but not always. Some systems instead show reliability growth, a decreasing failure rate with time, due to effective failure analysis and remedial hardware upgrades. Reliability grows when failure causes are removed by improved design. A mathematical reliability growth model allows the reliability growth rate to be computed from the failure data. The space shuttle was extensively maintained, refurbished, and upgraded after each flight and it experienced significant reliability growth during its operational life. In contrast, the International Space Station (ISS) is much more difficult to maintain and upgrade and its failure rate has been constant over time. The ISS Carbon Dioxide Removal Assembly (CDRA) reliability has slightly decreased. Failures on ISS and with the ISS CDRA continue to be a challenge.

life support↗
NASA NTRS1976

On the thermoelastic analysis of solar cell arrays and related material properties

Accurate prediction of failure of solar cell arrays requires accuracy in the computation of thermally induced stresses. This was accomplished by using the finite element technique. Improved procedures for stress calculation were introduced together with failure criteria capable of describing a wide range of ductile and brittle material behavior. The stress distribution and associated failure mechanisms in the N-interconnect junction of two solar cell designs were then studied. In such stress and failure analysis, it is essential to know the thermomechanical properties of the materials involved. Measurements were made of properties of materials suitable for the design of lightweight arrays: microsheet-0211 glass material for the solar cell filter, and Kapton-H, Kapton F, Teflon, Tedlar, and Mica Ply PG-402 for lightweight substrates. The temperature-dependence of the thermal coefficient of expansion for these materials was determined together with other properties such as the elastic moduli, Poisson's ratio, and the stress-strain behavior up to failure.

Salama, M. A.↗
NASA NTRS2007

Probabilistic Analysis for Comparing Fatigue Data Based on Johnson-Weibull Parameters

Probabilistic failure analysis is essential when analysis of stress-life (S-N) curves is inconclusive in determining the relative ranking of two or more materials. In 1964, L. Johnson published a methodology for establishing the confidence that two populations of data are different. Simplified algebraic equations for confidence numbers were derived based on the original work of L. Johnson. Using the ratios of mean life, the resultant values of confidence numbers deviated less than one percent from those of Johnson. It is possible to rank the fatigue lives of different materials with a reasonable degree of statistical certainty based on combined confidence numbers. These equations were applied to rotating beam fatigue tests that were conducted on three aluminum alloys at three stress levels each. These alloys were AL 2024, AL 6061, and AL 7075. The results were analyzed and compared using ASTM Standard E739-91 and the Johnson-Weibull analysis. The ASTM method did not statistically distinguish between AL 6010 and AL 7075. Based on the Johnson-Weibull analysis confidence numbers greater than 99 percent, AL 2024 was found to have the longest fatigue life, followed by AL 7075, and then AL 6061. The ASTM Standard and the Johnson-Weibull analysis result in the same stress-life exponent p for each of the three aluminum alloys at the median or L(sub 50) lives.

Hendricks, Robert C.↗
NASA NTRS1986

Reinforcement of composite laminate free edges with U-shaped caps

Generalized plane strain finite element analysis is used to predict reduction of interlaminar normal stresses when a U-shaped cap is bonded to the edge of a laminate. Three-dimensional composite material failure criteria are used in a progressive laminate failure analysis to predict failure loads of laminates with different edge cap designs. In an experimental program, symmetric 11-layer graphite-epoxy laminates with a one-layer cap of Kevlar-epoxy cloth are shown to be 130 to 140 percent stronger than uncapped laminates under static tensile and tension-tension fatigue loading. In addition, the coefficient of variation of the static tensile failure load decreases from 24 to 8 percent when edge caps are added. The predicted failure load calculated with the finite element results is 10 percent lower than the actual failure load. For both capped and uncapped laminates, actual failure loads are much lower than those predicted using classical lamination theory stresses and a two-dimensional failure criterion. Possible applications of the free edge reinforcement concept are described, and future research is suggested.

Howard, W. E.↗
NASA NTRS2011

Reliability Evaluation of Base-Metal-Electrode Multilayer Ceramic Capacitors for Potential Space Applications

Base-metal-electrode (BME) ceramic capacitors are being investigated for possible use in high-reliability spacelevel applications. This paper focuses on how BME capacitors construction and microstructure affects their lifetime and reliability. Examination of the construction and microstructure of commercial off-the-shelf (COTS) BME capacitors reveals great variance in dielectric layer thickness, even among BME capacitors with the same rated voltage. Compared to PME (precious-metal-electrode) capacitors, BME capacitors exhibit a denser and more uniform microstructure, with an average grain size between 0.3 and 0.5 m, which is much less than that of most PME capacitors. BME capacitors can be fabricated with more internal electrode layers and thinner dielectric layers than PME capacitors because they have a fine-grained microstructure and do not shrink much during ceramic sintering. This makes it possible for BME capacitors to achieve a very high capacitance volumetric efficiency. The reliability of BME and PME capacitors was investigated using highly accelerated life testing (HALT). Most BME capacitors were found to fail with an early avalanche breakdown, followed by a regular dielectric wearout failure during the HALT test. When most of the early failures, characterized with avalanche breakdown, were removed, BME capacitors exhibited a minimum mean time-to-failure (MTTF) of more than 105 years at room temperature and rated voltage. Dielectric thickness was found to be a critical parameter for the reliability of BME capacitors. The number of stacked grains in a dielectric layer appears to play a significant role in determining BME capacitor reliability. Although dielectric layer thickness varies for a given rated voltage in BME capacitors, the number of stacked grains is relatively consistent, typically around 12 for a number of BME capacitors with a rated voltage of 25V. This may suggest that the number of grains per dielectric layer is more critical than the thickness itself for determining the rated voltage and the life expectancy of the BME capacitor. The leakage current characterization and the failure analysis results suggest that most of these early avalanche failures are due to the extrinsic minor construction defects introduced during fabrication of BME capacitors. The concentration of the extrinsic defects must be reduced if the BME capacitors are considered for high reliability applications. There are two approaches that can reduce or prevent the occurrence of early failure in BME capacitors: (1) to reduce the defect concentration with improved processing control; (2) to prevent the use of BME capacitors under harsh external stress levels so that the extrinsic defects will never be triggered for a failure. In order to do so appropriate dielectric layer thickness must be determined for a given rated voltage.

Liu, David (Donhang)↗