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At least 307 records · Page 17

Optical path control in the MAM testbed

Future space-based optical interferometers will require control of the optical path delay to accomplish some or all of the three objectives: balancing the optical path in the two arms to within a tolerance corresponding to the coherence length of the star light being observed, modulating the optical path in order to observe the phase of the star light interference fringe, and modulating the path length in order to reduce the effect of cyclic errors in the laser metrology system used to measure the optical path length in the two arms of the interferometer.

optical interferometers optical path MAM testbed M↗

Super-resolution surface slope metrology of x-ray mirrors

We present experimental, analytical, and numerical methods developed for reconstruction (deconvolution) of one-dimensional (1D) surface slope profiles over the spatial frequency range where the raw data are significantly perturbed due to the limited resolution of the measurement instrument. We characterize the spatial resolution properties of a profiler with the instrument's transfer function (ITF). To precisely measure the ITF, we apply a recently developed method utilizing test surfaces with 1D linear chirped height profiles of constant slope amplitude. Based on the results of the ITF calibration, we determine parameters of an analytical model for the ITF that is used in the original reconstruction software. Here, we treat surface slope metrology data obtained with the Optical Surface Measuring System (OSMS), using as a sensor an electronic autocollimator (AC) ELCOMAT-3000. The spatial resolution of the OSMS is limited by the size of the AC light-beam-collimating aperture. For the purposes of this investigation, the OSMS is equipped with a circular aperture with a diameter of 2.5 mm. This is a typical arrangement of most AC-based slope profilers developed for surface slope metrology of state-of-the-art x-ray mirrors. Using the example of surface slope metrology of two state-of-the-art elliptically shaped x-ray focusing mirrors, we demonstrate that the developed data reconstruction procedure allows us to significantly improve the accuracy of surface slope metrology with the OSMS over the spatial wavelength range from ~1.6 mm to 7 mm. Thus, the amplitude of the quasi-periodic error characteristic of the deterministic polishing process used appears to be higher by a factor of~2 than is apparent from the rough metrology data. Underestimation of the surface slope errors in this spatial wavelength range can lead to serious errors in the expected performance of x-ray mirrors in synchrotron beamlines, especially at modern light sources utilizing coherent x rays, where the perturbations can lead to increased speckle-like intensity variation.

47 OTHER INSTRUMENTATION↗

Development Towards a Space Qualified Laser Stabilization System in Support of Space-Based Optical Interferometers

We report on the development, functional performance and space-qualification status of a laser stabilization system supporting a space-based metrology source used to measure changes in optical path lengths in space-based stellar interferometers. The Space Interferometry Mission (SIM) and Deep Space 3 (DS-3) are two missions currently funded by the National Aeronautics and Space Administration (NASA) that are space-based optical interferometers. In order to properly recombine the starlight received at each telescope of the interferometer it is necessary to perform high resolution laser metrology to stabilize the interferometer. A potentially significant error source in performing high resolution metrology length measurements is the potential for fluctuations in the laser gauge itself. If the laser frequency or wavelength is changing over time it will be misinterpreted as a length change in one of the legs of the interferometer. An analysis of the frequency stability requirement for SIM resulted in a fractional frequency stability requirement of square root (S(sub y)(f)) = <2 x 10(exp -12)/square root(Hz) at Fourier frequencies between 10 Hz and 1000 Hz. The DS-3 mission stability requirement is further increased to square root (S(sub y)(f)) = <5 x 10(exp -14)/Square root(Hz) at Fourier frequencies between 0.2 Hz and 10 kHz with a goal of extending the low frequency range to 0.05 Hz. The free running performance of the Lightwave Electronics NPRO lasers, which are the baseline laser for both SIM and DS-3 vary in stability and we have measured them to perform as follows (9 x l0(exp -11)/ f(Hz))(Hz)/square root(Hz)) = <( square root (S(sub y)(f)) = <(1.3 x l0(exp -8)/ f(Hz))/Square root(Hz). In order to improve the frequency stability of the laser we stabilize the laser to a high finesse optical cavity by locking the optical frequency of the laser to one of the transmission modes of the cavity. At JPL we have built a prototype space-qualifiable system meeting the stability requirements of SIM, which has been delivered to one of the SIM testbeds. We have also started on the development of a system to meet the stability needs of DS-3.

Seidel, David J.↗

The 4-meter lunar engineering telescope

The 16-meter diffraction limited lunar telescope incorporates a primary mirror with 312 one-meter segments; 3 nanometer active optics surface control with laser metrology and hexapod positioners; a space frame structure with one-millimeter stability; and a hexapod mount for pointing. The design data needed to limit risk in this development can be obtained by building a smaller engineering telescope on the moon with all of the features of the 16-meter design. This paper presents a 4.33-meter engineering telescope concept developed by the Summer 1990 Student Program of the NASA/JHU Space Grant Consortium Lunar Telescope Project. The primary mirror, made up of 18 one-meter hexagonal segments, is sized to provide interesting science as well as engineering data. The optics are configured as a Ritchey-Chretien with a coude relay to the focal plane beneath the surface. The optical path is continuously monitored with 3-nanometer precision interferometrically. An active optics processor and piezoelectric actuators operate to maintain the end-to-end optical configuration established by wave front sensing using a guide star. The mirror segments, consisting of a one-centimeter thick faceplate on 30-cm deep ribs, maintain the surface figure to a few nanometers under lunar gravity and thermal environment.

Peacock, Keith↗

Transmission Telescope Optical Dynamic Alignment

The Integrated Radio Optical Communication System (iROC) is designed to transmit data between Mars and Earth by means of radio waves at 32.67 GHz (Ka Band) and laser beam at 1550 nm, both transmitted via a combined teletenna. The iROC terminal will provide ‘beaconless’ operations to allow full function from the outer planets. In order to point without the aid of an uplink beacon, the proof of concept presented here is addressing the need for an accurate determination and control of the relative position of the laser beam with respect to a reference star. The experiment presented simulates a surrogate transmission telescope system in laboratory setting and presents the model used in the correction of the outgoing beam. The results of the model show a nonlinear dependence between the outgoing and the reference beam, indicating the necessity of a minimum of two metrology instruments placed along the optical system for increased pointing precision.

optical communication↗

Results from the TOM3 testbed: thermal deformation of optics at the picometer Level

We have discussed the TOM3 testbed developed to assess the thermo-opto-mechanical stability of optical assembly such as SIM's siderostat and telescope in flight-like thermal conditions. Although limited by the metrology sensor noise, test results show that optical wavefront stability of SIM's optical assembly is compatible with single micro-arcsecond astrometry.

Space Interferometer Mission (SIM)↗

Multifunctional light beam source for surface slope measuring long trace profilers

To fully exploit the advantages of fourth-generation synchrotron light sources, diffraction-limited-storage-rings (DLSR) and fully coherent free electron lasers (FELs), beamline mirrors and diffraction grating must be of exceptional quality. To achieve the required mirror and grating quality, the metrology instrumentation and methods used to characterize these challenging optics and, even more so, optical assemblies must also offer exceptional functionality and performance. One of the most widely used slope measuring instruments for characterizing x-ray optics is the long trace profiler (LTP). The easily reconfigurable mechanical design of the LTP allows optimization of the profiler arrangement to the specifics of a particular metrology task. Here, we discuss the optical schematic, design, and performance of an original multifunctional light beam source that provides functional flexibility of the LTP optical sensor. With this source, the LTP can be easily reconfigured for measurements of x-ray mirrors or diffraction gratings that have widely different source coherence requirements. Usage of a source with a low degree of coherence for mirror metrology helps to suppress the LTP systematic errors due to spurious interference effects in the LTP optical elements. A high-coherence narrow-band source is used for groove-density-distribution characterization of x-ray diffraction gratings. The systematic error and spatial resolution of the LTP with the different sources is also measured and analyzed.

Yashchuk, Valeriy V.↗

Near-field imaging of optical resonances in silicon metasurfaces using photoelectron microscopy

Precise control of light–matter interactions at the nanoscale lies at the heart of nanophotonics. However, experimental examination at this length scale is challenging since the corresponding electromagnetic near-field is often confined within volumes below the resolution of conventional optical microscopy. In semiconductor nanophotonics, electromagnetic fields are further restricted within the confines of individual subwavelength resonators, limiting access to critical light–matter interactions in these structures. In this work, we demonstrate that photoelectron emission microscopy (PEEM) can be used for polarization-resolved near-field spectroscopy and imaging of electromagnetic resonances supported by broken-symmetry silicon metasurfaces. We find that the photoemission results, enabled through an in situ potassium surface layer, are consistent with full-wave simulations and far-field reflectance measurements across visible and near-infrared wavelengths. In addition, we uncover a polarization-dependent evolution of collective resonances near the metasurface array edge taking advantage of the far-field excitation and full-field imaging of PEEM. Here, we deduce that coupling between eight resonators or more establishes the collective excitations of this metasurface. All told, we demonstrate that the high-spatial resolution hyperspectral imaging and far-field illumination of PEEM can be leveraged for the metrology of collective, non-local, optical resonances in semiconductor nanophotonic structures.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Pointing and figure control system for a space-based far-IR segmented telescope

A pointing and figure control system for two space-based far-IR telescopes, the 10-20 m Large Deployable Reflector and the 3.6 m Submillimeter Intermediate Mission, is described. The figure maintenance control system is designed to counter the optical elements translational and rotational changes induced by long-term thermal drifts that the support structure may experience. The pointing system applies optical truss to telescope pointing; a laser metrology system is used to transfer pointing informaton from an external fine guidance sensor to the telescope optical boresight, defined by the primary mirror, secondary mirror, and focal plane assembly.

Lau, Kenneth↗

Cryo Testing of tbe James Webb Space Telescope's Integrated Science Instrument Module

The Integrated Science Instrument Module (ISIM) of the James Webb Space Telescope will be integrated and tested at the Environmental Test Facilities at Goddard Space Flight Center (GSFC). The cryogenic thermal vacuum testing of the ISIM will be the most difficult and problematic portion of the GSFC Integration and Test flow. The test is to validate the coupled interface of the science instruments and the ISIM structure and to sufficiently stress that interface while validating image quality of the science instruments. The instruments and the structure are not made from the same materials and have different CTE. Test objectives and verification rationale are currently being evaluated in Phase B of the project plan. The test program will encounter engineering challenges and limitations, which are derived by cost and technology many of which can be mitigated by facility upgrades, creative GSE, and thorough forethought. The cryogenic testing of the ISIM will involve a number of risks such as the implementation of unique metrology techniques, mechanical, electrical and optical simulators housed within the cryogenic vacuum environment. These potential risks are investigated and possible solutions are proposed.

VanCampen, Julie↗

A 15 Meter Laser-Stabilized Imaging Interferometer

The Laser-Stabilized Imaging Interferometer (LASII) concept is being developed as a candidate for the next generation of optical resolution beyond Hubble Space Telescope (HST). The essential ingredients are: a rigid and stable structure to minimize mechanical and thermal distortion, active control of the optical geometry by a laser metrology system, a self-deploying structure fitting into a single launch vehicle, and ultraviolet operation. We have modified earlier design concepts to fit the scale of an intermediate sized NASA mission.

Imaging↗

The Micro-Arcsecond Metrology Testbed

The Micro-Arcsecond Metrology (MAM) testbed is a ground-based system of optical and electronic equipment for testing components, systems, and engineering concepts for the Space Interferometer Mission (SIM) and similar future missions, in which optical interferometers will be operated in outer space. In addition, the MAM testbed is of interest in its own right as a highly precise metrological system. The designs of the SIM interferometer and the MAM testbed reflect a requirement to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer with sufficient spatial resolution to generate astrometric data with angular resolution at the microarcsecond level. The internal path is to be measured by use of a small metrological laser beam of 1,319-nm wavelength, whereas the position of the starlight fringe is to be estimated by use of a charge-coupled-device (CCD) image detector sampling a large concentric annular beam. For the SIM to succeed, the optical path length determined from the interferometer fringes must be tracked by the metrological subsystem to within tens of picometers, through all operational motions of an interferometer delay line and siderostats. The purpose of the experiments performed on the MAM testbed is to demonstrate this agreement in a large-scale simulation that includes a substantial portion of the system in the planned configuration for operation in outer space. A major challenge in this endeavor is to align the metrological beam with the starlight beam in order to maintain consistency between the metrological and starlight subsystems at the system level. The MAM testbed includes an optical interferometer with a white light source, all major optical components of a stellar interferometer, and heterodyne metrological sensors. The aforementioned subsystems are installed in a large vacuum chamber in order to suppress atmospheric and thermal disturbances. The MAM is divided into two distinct subsystems: the test article (TA), which is the interferometer proper, and the inverse interferometer pseudo-star (IIPS), which synthesizes the light coming from a distant target star by providing spatially coherent wavefronts out of two mirrors, separated by the MAM baseline, that feed directly into two siderostats that are parts of the TA. The two feed mirrors of the IIPS are articulated (in translation and tilt) in order to simulate stars located at different orientations in space, while still illuminating the TA siderostats. The spectrum of the simulated starlight of the IIPS corresponds to that of a blackbody at a temperature of about 3,100 K.

Goullioud, Renaud↗

Laser Metrology for Ultra-Stable Space-Based Coronographs

Sensing starlight rejected from a coronagraph is essential in stabilizing the telescope pointing and wavefront drift, but performance is degraded for dim stars. Laser Metrology (MET) provides a different, complementary sensing method, one that can be used to measure changes in the alignment of the optics at high bandwidth, independent of the magnitude of the host star. Laser metrology measures changes in the separation of optical fiducial pairs, which can be separated by many meters. The principle of operations is similar to the laser metrology system used in LISA-Pathfinder to measure the in-orbit displacement between two test masses to a precision of ~10 picometers. In closed loop with actuators, MET actively maintains rigid body alignment of the front-end optics, thereby eliminating the dominant source of wavefront drift. In the case of a segmented, active primary mirror, MET provides six degrees of freedom sensing, replacing edge sensors. MET maintains wavefront control even during attitude maneuvers, such as slews between target stars, thereby avoiding the need to repeat time-consuming speckle suppression. These features can significantly improve the performance and observational efficiency of future large-aperture space telescopes equipped with internal coronagraphs. We evaluate MET trusses for various proposed monolithic and segmented space-based coronagraphs and present the performance requirements necessary to maintain contrast drift below 10^-11.

Moore, Dustin↗

Range-Gated Metrology: An Ultra-Compact Sensor for Dimensional Stabilization

Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. Existing sensors are large and intrusive, however, with optical heads that consist of several optical elements and require multiple optical fiber connections. The use of point-to-point laser metrology has therefore been limited to applications where only a few gauges are needed and there is sufficient space to accommodate them. Range-Gated Metrology is a signal processing technique that preserves nanometer-level or better performance while enabling: (1) a greatly simplified optical head - a single fiber optic collimator - that can be made very compact, and (2) a single optical fiber connection that is readily multiplexed. This combination of features means that it will be straightforward and cost-effective to embed tens or hundreds of compact metrology gauges to stabilize a large structure. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.

laser metrology↗

Synchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM 2+ :ZnSe optical fibers

High pressure chemical vapor deposition (HPCVD) has shown to be a promising method for producing Cr 2+ :ZnSe and Fe 2+ :ZnSe mid-IR optical fiber lasers. The oxidation state of the dopants and their spatial homogeneity are critical for the characterization of effective fiber laser performance; however, this is challenging for small fiber cores and small doping concentrations. We demonstrate using synchrotron micro X-ray fluorescence (XRF) mapping to study the distribution of the dopants throughout the fiber cross-sections. Furthermore, we study the local chemical environment of these unique fiber structures using micro X-ray near edge absorption spectroscopy (XANES). Our study reveals that transition metal doped ZnSe deposited using HPCVD has nanoscale dopant aggregation although the material is chemically identical to the commercially produced diffusion doped laser crystals, as indicated by the presence +2 oxidation state of the dopants. This work demonstrates the power of synchrotron-based X-ray techniques for use as metrology tools for improving the performance of laser materials in fiber geometry.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Metrology of Large Parts

As discussed in the first chapter of this book, there are many different methods to measure a part using optical technology. Chapter 2 discussed the use of machine vision to measure macroscopic features such as length and position, which was extended to the use of interferometry as a linear measurement tool in chapter 3, and laser or other trackers to find the relation of key points on large parts in chapter 4. This chapter looks at measuring large parts to optical tolerances in the sub-micron range using interferometry, ranging, and optical tools discussed in the previous chapters. The purpose of this chapter is not to discuss specific metrology tools (such as interferometers or gauges), but to describe a systems engineering approach to testing large parts. Issues such as material warpage and temperature drifts that may be insignificant when measuring a part to micron levels under a microscope, as will be discussed in later chapters, can prove to be very important when making the same measurement over a larger part. In this chapter, we will define a set of guiding principles for successfully overcoming these challenges and illustrate the application of these principles with real world examples. While these examples are drawn from specific large optical testing applications, they inform the problems associated with testing any large part to optical tolerances. Manufacturing today relies on micrometer level part performance. Fields such as energy and transportation are demanding higher tolerances to provide increased efficiencies and fuel savings. By looking at how the optics industry approaches sub-micrometer metrology, one can gain a better understanding of the metrology challenges for any larger part specified to micrometer tolerances. Testing large parts, whether optical components or precision structures, to optical tolerances is just like testing small parts, only harder. Identical with what one does for small parts, a metrologist tests large parts and optics in particular to quantify their mechanical properties (such as dimensions, mass, etc); their optical prescription or design (i.e. radius of curvature, conic constant, vertex location, size); and their full part shape. And, just as with small parts, a metrologist accomplishes these tests using distance measuring instruments such as tape measures, inside micrometers, coordinate measuring machines, distance measuring interferometers; angle measuring instruments such as theodolites, autocollimators; and surface measuring instruments including interferometers, stylus profilers, interference microscopes, photogrammetric cameras, or other tools. However, while the methodology may be similar, it is more difficult to test a large object for the simple reason that most metrologists do not have the necessary intuition. The skills used to test small parts or optics in a laboratory do not extrapolate to testing large parts in an industrial setting any more than a backyard gardener might successfully operate a farm. But first, what is a large part? A simple definition might be the part's size or diameter. For optics and diffuse surface parts alike, the driving constraint is ability to illuminate the part's surface. For reflective convex mirrors, large is typically anything greater than 1 meter. But, for refractive optics, flats or convex mirrors, large is typically greater than 0.5 meter. While a size definition is simple, it may be less than universal. A more nuanced definition might be that a large part is any component which cannot be easily tested in a standard laboratory environment, on a standard vibration isolated table using standard laboratory infrastructure. A micro-switch or a precision lens might be easily measured to nanometer levels under a microscope in a lab, but a power turbine spline or a larger telescope mirror will not fit under that microscope and may not even fit on the table.

Stahl, H. Philip↗

FPGA-Based Networked Phasemeter for a Heterodyne Interferometer

A document discusses a component of a laser metrology system designed to measure displacements along the line of sight with precision on the order of a tenth the diameter of an atom. This component, the phasemeter, measures the relative phase of two electrical signals and transfers that information to a computer. Because the metrology system measures the differences between two optical paths, the phasemeter has two inputs, called measure and reference. The reference signal is nominally a perfect square wave with a 50- percent duty cycle (though only rising edges are used). As the metrology system detects motion, the difference between the reference and measure signal phases is proportional to the displacement of the motion. The phasemeter, therefore, counts the elapsed time between rising edges in the two signals, and converts the time into an estimate of phase delay. The hardware consists of a circuit board that plugs into a COTS (commercial, off-the- shelf) Spartan-III FPGA (field-programmable gate array) evaluation board. It has two BNC inputs, (reference and measure), a CMOS logic chip to buffer the inputs, and an Ethernet jack for transmitting reduced-data to a PC. Two extra BNC connectors can be attached for future expandability, such as external synchronization. Each phasemeter handles one metrology channel. A bank of six phasemeters (and two zero-crossing detector cards) with an Ethernet switch can monitor the rigid body motion of an object. This device is smaller and cheaper than existing zero-crossing phasemeters. Also, because it uses Ethernet for communication with a computer, instead of a VME bridge, it is much easier to use. The phasemeter is a key part of the Precision Deployable Apertures and Structures strategic R&D effort to design large, deployable, segmented space telescopes.

Rao, Shanti↗

LOITA: Lunar Optical/Infrared Telescope Array

LOITA (Lunar Optical/Infrared Telescope Array) is a lunar-based interferometer composed of 18 alt-azimuth telescopes arranged in a circular geometry. This geometry results in excellent uv coverage and allows baselines up to 5 km long. The angular resolution will be 25 micro-arcsec at 500 nm and the main spectral range of the array will be 200 to 1100 nm. For infrared planet detection, the spectral range may be extended to nearly 10 mu m. The telescope mirrors have a Cassegrain configuration using a 1.75 m diameter primary mirror and a 0.24 m diameter secondary mirror. A three-stage (coarse, intermediate, and fine) optical delay system, controlled by laser metrology, is used to equalize path lengths from different telescopes to within a few wavelengths. All instruments and the fine delay system are located within the instrument room. Upon exiting the fine delay system, all beams enter the beam combiner and are then directed to the various scientific instruments and detectors. The array instrumentation will consist of CCD detectors optimized for both the visible and infrared as well as specially designed cameras and spectrographs. For direct planet detection, a beam combiner employing achromatic nulling interferometry will be used to reduce star light (by several orders of magnitude) while passing the planet light. A single telescope will be capable of autonomous operation. This telescope will be equipped with four instruments: wide field and planetary camera, faint object camera, high resolution spectrograph, and faint object spectrograph. These instruments will be housed beneath the telescope. The array pointing and control system is designed to meet the fine pointing requirement of one micro-arcsec stability and to allow precise tracking of celestial objects for up to 12 days. During the lunar night, the optics and the detectors will be passively cooled to 70-80 K temperature. To maintain a continuous communication with the earth a relay satellite placed at the L4 libration point will be used in conjunction with the Advanced Tracking and Data Relay Satellite System (ATDRSS). Electrical power of about 10 kW will be supplied by a nuclear reactor based on the SP-100 technology. LOITA will be constructed in three phases of six telescopes each. The total mass of the first operational phase is estimated at 58,820 kg. The cost of the fully operational first phase of the observatory is estimated at $8.9 billion. LOITA's primary objectives will be to detect and characterize planets around nearby stars (up to ten parsec away), study physics of collapsed stellar objects, solar/stellar surface features and the processes in nuclear regions of galaxies and quasars. An interferometric array such as LOITA will be capable of achieving resolutions three orders of magnitude greater than Hubble's design goal. LOITA will also be able to maintain higher signal to noise ratios than are currently attainable due to long observation times available on the moon.

Source record↗