SEARCH · Engineering Papers

Results for “Defect detection”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 307 records · Page 17

All sources NASA NTRS DOE OSTI

NASA NTRS1973

Precise measurement of charged defects in III-V compounds (supplement 2)

Experimental methods and related theory which will permit the measurement of low concentrations of vacancies and other defects in III-V compound semiconductors are discussed. Once the nature of these defects has been determined, this information can be incorporated into a transport theory for devices constructed from these materials, and experiments conducted to test the theory. The vacancies and other defects in the III-V compounds are detected by measurement of the nuclear magnetic resonance (NMR) line width. Most of the III-V compounds have at least one isotope with a nuclear quadrupole moment. In a crystal with a cubic crystal field (characteristic of most III-V compounds) there is no quadrupole splitting of the Zeeman resonance line. However, a defect removes the cubic symmetry locally and causes splitting which result in a change of the NMR width. This change can be used to detect the presence of vacancies.

Soest, J. F.↗

NASA NTRS2006

Identification Of Cells With A Compact Microscope Imaging System With Intelligent Controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking mic?oscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to autofocus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously.

McDowell, Mark↗

NASA NTRS2006

Operation of a Cartesian Robotic System in a Compact Microscope with Intelligent Controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking microscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to autofocus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously.

McDowell, Mark↗

NASA NTRS2007

Tracking of cells with a compact microscope imaging system with intelligent controls

A Microscope Imaging System (CMIS) with intelligent controls is disclosed that provides techniques for scanning, identifying, detecting and tracking microscopic changes in selected characteristics or features of various surfaces including, but not limited to, cells, spheres, and manufactured products subject to difficult-to-see imperfections. The practice of the present invention provides applications that include colloidal hard spheres experiments, biological cell detection for patch clamping, cell movement and tracking, as well as defect identification in products, such as semiconductor devices, where surface damage can be significant, but difficult to detect. The CMIS system is a machine vision system, which combines intelligent image processing with remote control capabilities and provides the ability to auto-focus on a microscope sample, automatically scan an image, and perform machine vision analysis on multiple samples simultaneously.

McDowell, Mark↗

NASA NTRS2007

Tracking of Cells with a Compact Microscope Imaging System with Intelligent Controls

McDowell, Mark↗

NASA NTRS2014

Thermal Inspection of Composite Honeycomb Structures

Composite honeycomb structures continue to be widely used in aerospace applications due to their low weight and high strength advantages. Developing nondestructive evaluation (NDE) inspection methods are essential for their safe performance. Pulsed thermography is a commonly used technique for composite honeycomb structure inspections due to its large area and rapid inspection capability. Pulsed thermography is shown to be sensitive for detection of face sheet impact damage and face sheet to core disbond. Data processing techniques, using principal component analysis to improve the defect contrast, are presented. In addition, limitations to the thermal detection of the core are investigated. Other NDE techniques, such as computed tomography X-ray and ultrasound, are used for comparison to the thermography results.

Zalameda, Joseph N.↗

NASA NTRS1988

Locating Residual Wax In Coolant Channels

Neutron inspection finds deposits and defects invisible to x rays. Neutron radiography detects many low-density materials even when surrounded by larger quantities of denser materials. Materials with similar properties and densities often appear quite different when viewed by neutron radiography. Technique gives comprehensive view of hidden channels.

Guthrie, Douglas M.↗

NASA NTRS1992

An energy analysis of crack-initiation and arrest in epoxy

The objective of this work is to study fracture processes such as crack initiation and arrest in epoxy. A compact tension specimen with displacement-controlled loading is employed to observe multiple crack initiations and arrests. The energy release rate at crack initiation is significantly higher than that at crack arrest, as has been observed elsewhere. In this study, the difference between these energy release rates is found to depend on specimen size (scale effect), and is quantitatively related to the fracture surface morphology. The scale effect, similar to that in strength theory, is conventionally attributed to the statistics of defects which control the fracture process. Triangular shaped ripples, deltoids, are formed on the fracture surface of the epoxy during the slow sub-critical crack growth, prior to the smooth mirrorlike surface characteristic of fast cracks. The deltoids are complimentary on the two crack faces which excludes any inelastic deformation from consideration. The deltoids are analogous to the ripples created on a river surface downstream from a small obstacle. However, in spite of the expectation based on this analogy and the observed scale effect, there are no 'defects' at the apex of the deltoids detectable down to the 0.1 micron level. This suggests that the formation of deltoids during the slow process of subcritical crack growth is an intrinsic feature of the fracture process itself, triggered by inhomogeneity of material on a submicron scale. This inhomogeneity may be related to a fluctuation in the cross-link density of the epoxy.

Chudnovsky, A.↗

NASA NTRS1994

Optical surface contouring for non-destructive inspection of turbomachinery

Detection of stress cracks and other surface defects during maintenance and in-service inspection of propulsion system components, including turbine blades and combustion compartments, is presently performed visually. There is a need for a non-contact, miniaturized, and fully fieldable instrument that may be used as an automated inspection tool for inspection of aircraft engines. During this SBIR Phase 1 program, the feasibility of a ruggedized optical probe for automatic and nondestructive inspection of complex shaped objects will be established. Through a careful analysis of the measurement requirements, geometrical and optical constraints, and consideration of issues such as manufacturability, compactness, simplicity, and cost, one or more conceptual optical designs will be developed. The proposed concept will be further developed and a prototype will be fabricated during Phase 2.

Modarress, Dariush↗

NASA NTRS2017

Magnetic Field Sensing with 4H SiC Diodes: N vs P Implantation

We explore the magnetic sensing capabilities of two 4H-SiC n+p diodes fabricated by NASA Glenn which only differ in the implanted ion species, nitrogen and phosphorus, and the implant activation annealing time. We use low- and high-field electrically detected magnetic resonance (EDMR) to investigate the defect structure used to sense magnetic fields as well as to evaluate the sensitivity. In addition, we expose these devices to high energy electron radiation to evaluate the defect sensing capability in a harsh radiation environment. The results from this work will allow us to tailor our processing methods to design a more optimal 4H-SiC pn diode for magnetic field sensing in harsh environments.

Cochrane, Corey J.↗

NASA NTRS1979

Definition of mutually optimum NDI and proof test criteria for 2219 aluminum pressure vessels. Volume 3: Applications to rail defect evaluation

The technique for inspection of railroad rails containing transverse fissure defects was discussed. Both pulse-echo and pitch-catch inspection techniques were used. The pulse-echo technique results suggest that a multiple-scan approach using varying angles of inclination, three-surface scanning, and dual-direction traversing may offer promise of characterization of transverse defects. Because each scan is likely to produce a reflection indicating only a portion of the defect, summing of the individual reflections must be used to obtain a reasonably complete characterization of the defect. The ability of the collimated pitch-catch technique to detect relatively small amounts of flaw growth was shown. The method has a problem in characterizing the portions of the defect near the top surface or web intersection. The work performed was a preliminary evaluation of the prospects for automated mapping of rail flaws.

Schwartzberg, F. R.↗

NASA NTRS1999

Nondestructive Detection of Cracks in Ceramics Using Vicinal Illumination

Cracks and other defects in ceramic materials can be difficult or impossible to examine and photograph due to the extreme lack of contrast. A method for inspecting translucent ceramics using scattered light, also known as vicinal illumination, will be described. This method has been known in the ceramics industry for quite some time, but is not well known in the testing and failure analysis community. Electronics applications include substrates, packages, multilayer capacitors, and thin film resistors. Ceramic materials are used in electronic applications as microcircuit packages and substrates which carry signals and power between microcircuits. Fine cracks in ceramic materials can result in mechanical failures, electrical failures, and loss of hermeticity. Often, fine cracks are difficult or impossible to detect using standard nondestructive inspection techniques such as visual inspection, ultrasonic inspection, or vapor crack detection. Dye penetrant inspection is usually effective, but contaminates the part, which is unacceptable for space flight hardware. One effective nondestructive inspection method of detecting cracks involves examining the way in which light scatters through the ceramic material when viewed with a standard bright field reflected light microscope. This method, termed vicinal illumination, has been used for detecting cracks during failure analyses of several part types, and screening of space flight hardware. The technique has proven effective on several different types of ceramic materials as well. A related method for use with dark field equipment has also been used to successfully locate otherwise invisible cracks.

Hull, Scott M.↗

NASA NTRS1991

Assessment of probability of detection of delaminations in fiber-reinforced composites

Delamination is one of the critical defects in composite materials and structures. An ultrasonic C-scan imaging technique which maps out the acoustic impedance mismatched areas with respect to the sample coordinates, is particularly well suited for detecting and characterizing delaminations in composites. To properly interpret the results, it is necessary to correlate the indications with the detection limits and probability of detection (POD) of the ultrasonic C-scan imaging technique. The baseline information on the assessment of POD of delaminations in composite materials and structures is very beneficial to the evaluation of spacecraft materials. In this study, we review the principle of POD, describe the laboratory set-up and procedure, and present the experimental results as well as assessment of POD of delaminations in fiber reinforced composite panels using ultrasonic C-scan techniques.

Chern, E. J.↗

NASA NTRS2012

Investigation of a Moire Based Crack Detection Technique for Propulsion Health Monitoring

The development of techniques for the health monitoring of the rotating components in gas turbine engines is of major interest to NASA s Aviation Safety Program. As part of this on-going effort several experiments utilizing a novel optical Moir based concept along with external blade tip clearance and shaft displacement instrumentation were conducted on a simulated turbine engine disk as a means of demonstrating a potential optical crack detection technique. A Moir pattern results from the overlap of two repetitive patterns with slightly different periods. With this technique, it is possible to detect very small differences in spacing and hence radial growth in a rotating disk due to a flaw such as a crack. The experiment involved etching a circular reference pattern on a subscale engine disk that had a 50.8 mm (2 in.) long notch machined into it to simulate a crack. The disk was operated at speeds up to 12 000 rpm and the Moir pattern due to the shift with respect to the reference pattern was monitored as a means of detecting the radial growth of the disk due to the defect. In addition, blade displacement data were acquired using external blade tip clearance and shaft displacement sensors as a means of confirming the data obtained from the optical technique. The results of the crack detection experiments and its associated analysis are presented in this paper.

Woike, Mark R.↗

NASA NTRS1988

A New Tool for Quality Control

Diffracto, Ltd. is now offering a new product inspection system that allows detection of minute flaws previously difficult or impossible to observe. Called D-Sight, it represents a revolutionary technique for inspection of flat or curved surfaces to find such imperfections as dings, dents and waviness. System amplifies defects, making them highly visible to simplify decision making as to corrective measures or to identify areas that need further study. CVA 3000 employs a camera, high intensity lamps and a special reflective screen to produce a D- Sight image of light reflected from a surface. Image is captured and stored in a computerized vision system then analyzed by a computer program. A live image of surface is projected onto a video display and compared with a stored master image to identify imperfections. Localized defects measuring less than 1/1000 of an inch are readily detected.

Source record↗

NASA NTRS1988

AVIRIS spectra of California wetlands

Spectral data gathered by the AVIRIS from wetlands in the Suisun Bay area of California on 13 October 1987 were analyzed. Spectra representing stands of numerous vegetation types (including Sesuvium verrucosum, Scirpus acutus and Scirpus californicus, Xanthium strumarium, Cynadon dactylon, and Distichlis spicata) and soil were isolated. Despite some defects in the data, it was possible to detect vegetation features such as differences in the location of the chlorophyll red absorption maximum. Also, differences in cover type spectra were evident in other spectral regions. It was not possible to determine if the observed features represent noise, variability in canopy architecture, or chemical constituents of leaves.

Gross, Michael F.↗

NASA NTRS1993

Industrial Inspection System

Lixi, Inc. has built a thriving business on NASA-developed x-ray technology. The Low Intensity X-ray Imaging scope (LIXI) was designed to use less than one percent of radiation required by conventional x-ray devices. It is portable and can be used for a variety of industrial inspection systems as well as medical devices. A food processing plant uses the new LIXI Conveyor system to identify small bone fragments in chicken. The chicken packages on a conveyor belt enter an x-ray chamber and the image is displayed on a monitor. Defects measuring less than a millimeter can be detected. An important advantage of the system is its ability to inspect 100 percent of the product right on the production line.

Source record↗

NASA NTRS2006

The Evolution of Nondestructive Evaluation Methods for the Space Shuttle External Tank Thermal Protection System

Three nondestructive evaluation methods are being developed to identify defects in the foam thermal protection system (TPS) of the Space Shuttle External Tank (ET). Shearography is being developed to identify shallow delaminations, shallow voids and crush damage in the foam while terahertz imaging and backscatter radiography are being developed to identify voids and cracks in thick foam regions. The basic theory of operation along with factors affecting the results of these methods will be described. Also, the evolution of these methods from lab tools to implementation on the ET will be discussed. Results from both test panels and flight tank inspections will be provided to show the range in defect sizes and types that can be readily detected.

Walker, James L.↗