2D monochromatic x-ray imaging for beam monitoring of an x-ray free electron laser and a high-power femtosecond laser
Single-shot simultaneous beam monitoring of an x-ray free electron laser (XFEL) and a high-power femtosecond laser is demonstrated using 2D monochromatic Kα imaging. In a pump-probe experiment carried out at the Matter in Extreme Conditions end-station of the Linac Coherent Light Source, a thin solid titanium foil irradiated by a 25-TW relativistic intensity laser for fast electron isochoric heating was probed by a 7.0 keV XFEL beam for x-ray Thomson scattering measurements. Using a spherical crystal imager (SCI), the spatial overlap of the beams was examined by measuring 4.5 keV titanium Kα x rays produced by laseraccelerated fast electrons and the x-ray beam. Changes in XFEL-induced Kα emission patterns were observed down to a ~20×40 μm2 rectangular shape as the beam was focused. Laser-only and two-beam shots reveal that large spatial offsets of laser-induced Kα spots in a horizontal direction is attributed to imprecise target positioning rather than shot-to-shot laser pointing variations. As a consequence, successful beam overlapping was observed on ~58% of all two-beam shots for 10 μm thick samples. The Kα measurements also show a linear relationship between total Kα yields and integrated x-ray scattering signals. Monochromatic xray imaging with SCI could be used as an on-shot beam pointing diagnostic in XFEL-laser or multiple short-pulse laser experiments.