Simultaneous x-ray diffraction measurements of nine pressure calibrants to 140 GPa
Accurate pressure calibration is fundamental to quantitative high-pressure science, yet inconsistencies among widely used secondary pressure scales persist. In this work, we report simultaneous synchrotron x-ray diffraction meatogether in diamond anvil cells to 140 GPa. This simultaneous-measurement strategy minimizes transitive errors and run-to-run inconsistencies inherent to paired-measurement approaches, yielding direct experimental volume-volume (V-V) relations among the calibrants. These V-V relations link the compression state of each phase to that of every other phase measured in the same experiment. By anchoring these V-V relations to the reduced 300 K equation of state (EOS) of copper derived from ramp-compression measurements, we derive an internally consistent set of Cu-referenced pressure scales via Vinet EOS fits. Because the primary experimental result is the V-V dataset, it provides an EOS-independent constraint that can be rereferenced if primary standards are revised. The dataset further enables a direct experimental cross-check of consistency between the adopted reduced 300 K Cu EOS and the corresponding reduced 300 K ramp-derived EOSs for Pt, Au, Ta, and hcp-Fe under a fixed V-V constraint. The residuals quantify small, material-dependent mismatches between each phase EOS and the Cu reference EOS.