Measurement of birefringence for optical recording disk substrates
The birefringence of bare and coated substrates for magneto-optical recording is experimentally investigated using ellipsometry at the wavelengths of 632.8 nm and 780 nm. The rotation and ellipticity of the polarization state of the reflected or transmitted light is measured for different incident angles and different orientations of the incident linear polarization. The measured data is then fitted by a computer program which solves the Maxwell equations for the plane-wave propagation in a multilayer structure and minimizes the error between the measured and calculated data by adjusting the unknown parameters of the multilayer. This approach enables us to determine orientations of the three principal axes in the substrate and the corresponding refractive indices. A special feature of our ellipsometers is that a glass hemisphere is placed in contact with the substrate, which eliminates the refraction of the incident light and enables a maximum propagation angle of 70 degrees (with respect to the normal) in the substrate. This increases the sensitivity of the measurement. Certain anomalies were observed, which we believe are associated with the presence of grooves on these substrates.