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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 271 records · Page 15
All sourcesNASA NTRSDOE OSTI
DOE OSTI2022

PV Lifetime Project (2021 NREL Annual Report)

DOE's PV Lifetime project was initiated in 2016 with the goal of accurately characterizing the early-life evolution of photovoltaic (PV) field performance. Different PV cell and module technologies result in different initial performance loss rates due to effects like light-induced degradation (LID) and light & elevated temperature-induced degradation (LeTID). To accurately characterize the initial field performance loss requires the use of high-accuracy indoor IV curve measurements at standard test conditions. Therefore, PV modules involved in this study are removed from the field once or twice per year and brought indoors for measurement. Current samples deployed and monitored in this way include Jinko Solar (2016), Trina Solar (2016), Hanwha Q-Cells (2017), Panasonic (2018), LG (2018), Canadian Solar (2018), Mission Solar (2019). More recently, modules from Sunpreme (2019), and LONGi (2020) have been deployed but not yet analyzed. Overall annual performance loss rates are as follows: our first modules to be deployed (Jinko and Trina) have annual median performance loss rate between -0.4%/yr and -0.9%/yr, mainly concentrated in the first year. The QCells mono-PERC and multi-PERC modules have an annual degradation rate of -0.76%/yr and -0.69%/yr respectively, also concentrated in the first year of operation. Panasonic and LG modules displayed negligible performance loss in the past two years, at 0.1%/yr and -0.0%/yr respectively. They also were the only modules with initial IV curve measurements consistently above the nameplate rating. Possibly relatedly, these are also the only two N-type silicon module types analyzed so far. Canadian Solar multi-PERC modules demonstrated a -1.3%/yr degradation rate which actually accelerated in the past year, so this will be a module type to monitor in future years. Mission Solar modules exhibited strong recoverable performance loss, consistent with LeTID susceptibility. (The same is true for the Jinko JKM260 module type). Annual performance loss actually showed improvement in time at +0.3%/yr after 2 years in the field, although the module initially was measured at 3% below nameplate rating. These modules could therefore be experiencing a form of post-LeTID recovery. Initial measurements have been conducted on the next two module types - Sunpreme n-HIT and LONGi bifacial mono-PERC. We will report on initial year-1 performance change for these modules in the next PV Lifetime annual report. For the remaining modules, an additional year of field exposure will provide greater certainty in annual degradation rates, particularly for those with degradation concentrated in the initial year of field deployment.

14 SOLAR ENERGY↗
DOE OSTI2020

PV Fleet Performance Data Initiative (March 2020 Methodology Report)

Data for thousands of systems by multiple sources were transmitted to NREL for evaluation. Initial automated data quality assurance (QA) checks identified hundreds of systems (QA Tier 1) with high-quality meteorological and AC production data and hundreds of QA Tier 2 systems with adequate data quality. A standard RdTools analysis was conducted for these systems, evaluating performance loss on an annualized basis. To date with the systems evaluated so far, we find a median performance loss rate (aka Rd or degradation rates) for the entire fleet of -0.72%/year based on individual inverter data, which is in line with historical degradation rates previously published for modules and systems (-0.5% to -0.9% / yr, Jordan et al. 2016). A fleet-scale distribution based on revenue-grade meter data rather than inverter AC (alternating current) data yields a slightly different result. We are working to understand the difference between this result and the inverter-based result of -0.72%/year.

14 SOLAR ENERGY↗
DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗
NASA NTRS1981

FSA field test

The 12 continental remote sites were decommissioned. Testing was consolidated into a five-site network consisting of the four Southern California sites and a new Florida site. 16 kW of new state-of-the-art modules were deployed at the five sites. Testing of the old modules continued at the Goldstone site but as a low-priority item. Array testing of modules is considered. Additional new testing capabilities were added. A battery-powered array data logger is discussed. A final set of failure and degradation data was obtained from the modules.

Jaffe, P.↗
DOE OSTI2022

Impact of acetic acid exposure on metal contact degradation of different crystalline silicon solar cell technologies

Degradation due to acetic acid in photovoltaic (PV) modules has been a commonly observed phenomenon for both damp-heat exposure and outdoor operations. Acetic acid is a degradation byproduct of ethylene-vinyl acetate (EVA), a common module encapsulant. To address this issue, robust metallization pastes and cell technologies are being developed. However, it is important to assess how these technologies perform in an acetic acid environment and withstand degradation before they are implemented in the solar market. In this work, we investigate the impact of acetic acid exposure on four different cell groups: monofacial passivated emitter and rear contact (PERC) cells with advanced telluride-based front contact pastes, bifacial PERC cells with novel aluminum rear contact pastes, bifacial tunnel oxide passivated contacts (TOPCon) cells, and silicon heterojunction (SHJ) cells. These cells were exposed to acetic acid for different time increments. The recombination losses were characterized by Suns-VOC, and multi-variate regression analysis of intensity-dependent photoluminescence (PL) images with Griddler AI. Resistive losses were tracked with the transmission line method (TLM). Samples showing severe performance degradation were selected for further materials characterization to understand the root cause. Top-down and cross-sectional scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), and X-ray photoelectron spectroscopy (XPS) were performed to investigate the change in materials properties. Our study shows that the front contacts of the bifacial TOPCon cells and monofacial PERC cells were significantly affected by acetic acid exposure. Here, the SHJ cells were found to be the most stable.

14 SOLAR ENERGY↗
DOE OSTI2025

UV + Damp Heat Induced Power Losses in Fielded Utility N-Type Si PV Modules

A recent trend in commercial PV modules is a transition to n-type silicon cells, including passivated emitter rear totally diffused (n-PERT), tunnel oxide passivated contact (TOPCon), and silicon heterojunction (SHJ). There is evidence via lab studies that some of these cells are more susceptible to UV induced degradation (UVID), yet there is a lack of confirmation that such degradation occurs in the field. Current IEC standards designed to screen for early module failures require only minimal UV exposure (15 kWh/m2 280-400 nm, ~2-3 months equivalent outdoor exposure). Here, we investigate fielded n-PERT silicon (Si) modules from a commercial utility that show power losses of ~2%/year. We present a comprehensive picture of the physics and chemistry of degradation supported by both module and cell electronic characterization (EL, PL, IV, EQE, and DLIT) and materials-level morphological and chemical analysis (SEM, EDS, XPS, FTIR, and HPLC). All sampled site modules show short circuit current (Isc) and open circuit voltage (Voc) losses when compared to unfielded spares, with the most severely degraded also having losses in fill factor (FF). We identify two different degradation modes contributing to overall power loss: (1) external quantum efficiency (EQE) measurements show losses in the blue range of the spectra, indicative of cell surface recombination losses, and (2) variations in high series resistance (Rs) at the cell level that are correlated with compositional differences in cell metallization. Using unfielded spares, we were able to reproduce Voc, Isc, and EQE losses via a minimum UV stress of 67.5 kWh/m2 (280-400 nm), 4.5x the exposure currently required in IEC 61215-2 (MQT 10). Degradation continued with additional UV dosage equivalent to the fielded modules (405 kWh/m2 total), with power loss leveling out at an average of 6.1%. Subsequent 1000 h of 85% RH/85degrees C damp heat testing showed that cells exposed to UV underwent additional severe series resistance degradation, even those without the susceptible paste composition seen in the field, whereas non-UV exposed cells saw little change. We attribute this to higher concentrations of acetic acid generated on the UV exposed area of the module, leading to degradation of the gridline/cell interface and high Rs. This study is unique in that it reproduces field observed utility scale UVID with an accelerated test and supports the need for standards development for longer UV exposure combined with other stress factors to catch materials interplay within a module package.

14 SOLAR ENERGY↗
DOE OSTI2020

Dark Lock-in Thermography Identifies Solder Bond Failure as the Root Cause of Series Resistance Increase in Fielded Solar Modules

Correlating the electrical performance of photovoltaic modules to the spatially resolved photoluminescence, electroluminescence, and dark lock-in thermography (DLIT) images is an important long-term goal for developing solar cell technology. These images offer highly sophisticated and detailed information about the spatial distribution and (if imaged at successive time intervals) temporal degradation of local series and shunt resistances. There have been extensive studies to correlate these imaging techniques to local characteristics at the cell level. However, it has been difficult to extract and quantify module-level information from the techniques. In this study, we interpret module current-voltage (I-V) measurements along with corresponding DLIT images within a module-scale simulation framework, demonstrating that series resistance degradation of the module I-V characteristics, in this case, can be attributed to solder bond failures. Our simulations highlight how current crowding associated with a failed solder joint (or a section of the solder pad) translates to the characteristic point-like (asymmetric doublet) heating pattern in neighboring solder joints (or the neighboring regions of the solder pad). Overall, the correlation between series resistance and solder joint degradation could inform expedited diagnosis of field degradation of solar modules.

42 ENGINEERING↗
DOE OSTI2026

A New UV Spot Test for Quality Control

Here, we present a fast, low-cost ultraviolet (UV) spot test to screen photovoltaic modules for UV-induced degradation (UVID). The measurement is based on a fiber-coupled arc lamp that delivers a highly accelerated local UV dose-approximately five years of equivalent field exposure in less than a day. Spot-exposed areas are evaluated using electroluminescence imaging. We test a “known bad” product, which was observed to experience UVID in the field, and a “known good” product which did not exhibit UVID in the field. Results indicate that the method may be useful as a quick and relatively inexpensive quality control screening tool for customers and manufacturers.

14 SOLAR ENERGY↗
DOE OSTI2024

The "PVLib" of Degradation: PVDeg

The Photovoltaic (PV) industry constantly aims for lower costs through higher-efficiency cells, improved module designs, and improvements in durability. This leads to the use of new materials, designs, and manufacturing processes, and not always with a sufficient amount of durability testing. To help drive down costs there is a desire to create modules that will last for up to 50 years of service life. To accomplish this, every degradation mode and mechanism must be identified and either eliminated or otherwise mitigated. This involves the extrapolation of laboratory results to the field conditions. There is a need to organize the existing degradation data into an accessible format and to provide industry relevant tools for extrapolation from laboratory to field conditions. While the basic equations used to model degradation are sometimes very simple, the full analysis involves calculations are cumbersome but ubiquitous for many degradation processes. A simplified, modeling framework to accomplish these repetitive processes will facilitate the analysis to help researchers keep up with the rapid pace of technological changes. In this talk, we will describe our progress creating the open-source tool PVDeg. This tool can be used to search for and analyze degradation information and extrapolate PV module performance and durability to field exposure. PVDeg simplifies many of the common foundational computational operations for obtaining meteorological data and using it to generate a model of the PV deployment. This prediction tool repository also contains various degradation models as well as a library of material parameters suitable for estimating the durability assessment of materials and components. We use an integration pipeline approach that allows us to leverage weather data from the National Solar Radiation Database, and other weather sources, to perform geospatial degradation analysis in the US and worldwide. We hope to become a repository that can be used for weathering and degradation analysis for various applications beyond the PV industry. During the talk, we will provide the PVPMC attendees the opportunity to interact with the tool via a Google Collab tutorial they can run on their phones or laptops.

durability↗
DOE OSTI2021

Nanomechanical and Fluorescence Characterizations of Weathered PV Module Encapsulation

Nanoindentation and fluorescence spectroscopy provide spatially resolved mechanical and chemical characterization for degradation of poly (ethylene-co-vinyl acetate) (EVA) encapsulants aged under accelerated weathering and in field deployed photovoltaic (PV) modules. For the accelerated weathering tests, two different EVA formulations in the glass/EVA/glass-laminated coupons were exposed to ultraviolet (UV) light for 180 days at three different temperatures (40, 60, and 80 °C) and UV intensities (0.4, 2.2, and 2.9 W/m2/nm at 340 nm). The fluorescence spectra and moduli were uniform through the cross section of both EVA formulations at the lowest temperature and UV intensity; however, under the highest temperature and UV intensity, the UV irradiated sides showed lower moduli and higher fluorescence compared to the opposite sides. For EVA obtained from PV modules deployed 27 years in Sacramento, CA, USA, changes in fluorescence intensity across the thickness were relatively greater than changes in modulus. On the other hand, for EVA obtained from the same type of module stored in the shed for 27 years, no fluorescence was observed, and a uniform modulus was seen through the EVA layer, but with substantially higher values than those obtained from the field-deployed modules. The different extent of changes between laboratory and field exposures suggests the importance of considering effects of temperature and UV intensity for designing a reliable accelerated testing. This study uniquely demonstrates the capability of microscale characterization using nanoindentation and fluorescence microscopy to monitor mechanical and chemical degradation of EVA encapsulants in PV modules.

14 SOLAR ENERGY↗
NASA NTRS1983

Investigation of test methods, material properties, and processes for solar cell encapsulants

A study of potentially useful low cost encapsulation materials for the Flat-Plate Solar Array project is discussed. The goal is to identify, evaluate, test and recommend encapsulant materials and processes for the production of cost-effective, long life solar cell modules. Technical investigations included studies of aging and degradation of candidate encapsulation materials, continued identification of primers for durable bonding of module interfaces, continued evaluation of soil resistant treatments for the sunlit surface of the module and testing of corrosion protective coatings for use low cost mild steel substrates.

Willis, P. B.↗
NASA NTRS1986

Pilot-Tone System for Mobile Communications

In mobile communication system called tone-calibrated technique, pilot tone provides phase- and amplitude-calibration reference to enable coherent demodulation of signal at receiver despite fading. Signal received by or from mobile terminal faded due to motion of terminal and propagation of signal along multiple paths. Fading introduces random amplitude modulation and phase modulation with bandwidth of twice Doppler frequency shift. Degrading effects of multipath fading reduced. Tonecalibrated technique for use with phase-modulated data or telephony systems using Manchester digital pulse-code modulation.

Davarian, F.↗
DOE OSTI2022

Differences in Printed Contacts Lead to Susceptibility of Silicon Cells to Series Resistance Degradation

Here, in this case study, we investigate a degradation mode occurring at the cell level in fielded multi-Si modules. The modules exhibit a mix of affected and unaffected cells. Affected cells show a progressive, series-resistance-related power degradation as shown via module- and cell-level IV curves, along with electroluminescence (EL) and PL imaging at the module, cell, and cell core sample scales. Scanning electron microscopy and energy-dispersive X-ray spectroscopy reveal a difference in the oxides in the silver paste used in screen printing of the gridline contacts. The paste in the affected cells is lead rich, whereas the paste in the unaffected cells is zinc rich. This suggests that the cells were screen printed with different silver paste compositions and possibly firing conditions, and that the different composition correlates with the susceptibility to degradation. Our results indicate degradation of the contact at the oxide-silver interface, causing a severe increase in series resistance across the cell that continues to progress over time.

14 SOLAR ENERGY↗
NASA NTRS1973

Feasibility test of a solid state spin-scan photo-imaging system

The feasibility of using a solid-state photo-imaging system to obtain resolution imagery from a Pioneer-type spinning spacecraft in future exploratory missions to the outer planets is discussed. Evaluation of the photo-imaging system performance, based on electrical video signal analysis recorded on magnetic tape, shows that the signal-to-noise (S/N) ratios obtained at low spatial frequencies exceed the anticipated performance and that measured modulation transfer functions exhibited some degradation in comparison with the estimated values, primarily owing to the difficulty in obtaining a precise focus of the optical system in the laboratory with the test patterns in close proximity to the objective lens. A preliminary flight model design of the photo-imaging system is developed based on the use of currently available phototransistor arrays. Image quality estimates that will be obtained are presented in terms of S/N ratios and spatial resolution for the various planets and satellites. Parametric design tradeoffs are also defined.

Laverty, N. P.↗
NASA NTRS1982

Uses of infrared thermography in the low-cost solar array program

The Jet Propulsion Laboratory has used infrared thermography extensively in the Low-Cost Solar Array (LSA) photovoltaics program. A two-dimensional scanning infrared radiometer has been used to make field inspections of large free-standing photovoltaic arrays and smaller demonstration sites consisting of integrally mounted rooftop systems. These field inspections have proven especially valuable in the research and early development phases of the program, since certain types of module design flaws and environmental degradation manifest themselves in unique thermal patterns. The infrared camera was also used extensively in a series of laboratory tests on photovoltaic cells to obtain peak cell temperatures and thermal patterns during off-design operating conditions. The infrared field inspections and the laboratory experiments are discussed, and sample results are presented.

Glazer, S. D.↗
NASA NTRS1987

Optimal reconfiguration strategy for a degradable multimodule computing system

The present quantitative approach to the problem of reconfiguring a degradable multimode system assigns some modules to computation and arranges others for reliability. By using expected total reward as the optimal criterion, there emerges an active reconfiguration strategy based not only on the occurrence of failure but the progression of the given mission. This reconfiguration strategy requires specification of the times at which the system should undergo reconfiguration, and the configurations to which the system should change. The optimal reconfiguration problem is converted to integer nonlinear knapsack and fractional programming problems.

Lee, Yann-Hang↗
NASA NTRS2001

The Effect of Doppler Frequency Shift, Frequency Offset of the Local Oscillators, and Phase Noise on the Performance of Coherent OFDM Receivers

This paper first shows that the Doppler frequency shift affects the frequencies of the RF carrier, subcarriers, envelope, and symbol timing by the same percentage in an Orthogonal Frequency Division Multiplexing (OFDM) signal or any other modulated signals. Then the SNR degradation of an OFDM system due to Doppler frequency shift, frequency offset of the local oscillators and phase noise is analyzed. Expressions are given and values for 4-, 16-, 64-, and 256-QAM OFDM systems are calculated and plotted. The calculations show that the Doppler shift of the D3 project is about 305 kHz, and the degradation due to it is about 0.01 to 0.04 dB, which is negligible. The degradation due to frequency offset and phase noise of local oscillators will be the main source of degradation. To keep the SNR degradation under 0.1 dB, the relative frequency offset due to local oscillators must be below 0.01 for the 16 QAM-OFDM. This translates to an offset of 1.55 MHz (0.01 x 155 MHz) or a stability of 77.5 ppm (0.01 x 155 MHz/20 GHz) for the DI project. To keep the SNR degradation under 0.1 dB, the relative linewidth (0) due to phase noise of the local oscillators must be below 0.0004 for the 16 QAM-OFDM. This translates to a linewidth of 0.062 MHz (0.0004 x 155 MHz) of the 20 GHz RIF carrier. For a degradation of 1 dB, beta = 0.04, and the linewidth can be relaxed to 6.2 MHz.

Xiong, Fuqin↗
NASA NTRS2011

Relaxing USOS Solar Array Constraints for Russian Vehicle Undocking

With the retirement of Space Shuttle cargo delivery capability and the ten year life extension of the International Space Station (ISS) more emphasis is being put on preservation of the service life of ISS critical components. Current restrictions on the United States Orbital Segment (USOS) Solar Array (SA) positioning during Russian Vehicle (RV) departure from ISS nadir and zenith ports cause SA to be positioned in the plume field of Service Module thrusters and lead to degradation of SAs as well as potential damage to Sun tracking Beta Gimbal Assemblies (BGA). These restrictions are imposed because of the single fault tolerant RV Motion Control System (MCS), which does not meet ISS Safety requirements for catastrophic hazards and dictates 16 degree Solar Array Rotary Joint position, which ensures that ISS and RV relative motion post separation, does lead to collision. The purpose of this paper is to describe a methodology and the analysis that was performed to determine relative motion trajectories of the ISS and separating RV for nominal and contingency cases. Analysis was performed in three phases that included ISS free drift prior to Visiting Vehicle separation, ISS and Visiting Vehicle relative motion analysis and clearance analysis. First, the ISS free drift analysis determined the worst case attitude and attitude rate excursions prior to RV separation based on a series of different configurations and mass properties. Next, the relative motion analysis calculated the separation trajectories while varying the initial conditions, such as docking mechanism performance, Visiting Vehicle MCS failure, departure port location, ISS attitude and attitude rates at the time of separation, etc. The analysis employed both orbital mechanics and rigid body rotation calculations while accounting for various atmospheric conditions and gravity gradient effects. The resulting relative motion trajectories were then used to determine the worst case separation envelopes during the clearance analysis. Analytical models were developed individually for each stage and the results were used to build initial conditions for the following stages. In addition to the analysis approach, this paper also discusses the analysis results, showing worst case relative motion envelopes, the recommendations for ISS appendage positioning and the suggested approach for future analyses.

Menkin, Evgeny↗