Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “memory”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 271 records · Page 15

Memory hierarchy using row-based compression

A system includes a first memory and a device coupleable to the first memory. The device includes a second memory to cache data from the first memory. The second memory includes a plurality of rows, each row including a corresponding set of compressed data blocks of non-uniform sizes and a corresponding set of tag blocks. Each tag block represents a corresponding compressed data block of the row. The device further includes decompression logic to decompress data blocks accessed from the second memory. The device further includes compression logic to compress data blocks to be stored in the second memory.

97 MATHEMATICS AND COMPUTING↗

Secure true random number generation using 1.5-T transistor flash memory

This disclosure relates generally to physically unclonable function (PUF) circuitry along with methods of generating numbers. In one embodiment, the PUF circuitry includes a memory, a memory control circuitry, and whitening circuitry. To reduce or eliminate the systematic bias from the array, whitening circuitry is configured to generate a random number comprising random number bits in response to the memory control circuit implementing at least one sequence of memory cycles on the array of the memory cells in the memory. The whitening circuitry is configured to provide the random number bits of the random number based on the variable bit states stored by the array of the memory cells. On average the whitening circuitry is configured to provide approximately half of the random number bits in the first bit state and half of random number bits in a second bit state.

97 MATHEMATICS AND COMPUTING↗

Compiler-generated memory mapping hints

According to one embodiment, a method of creating compiler-generated memory mapping hints in a computer system includes analyzing code, by a compiler of the computer system, to identify data access patterns in the code. System configuration information defining data processing system characteristics of a target system for the code is accessed. The data processing system characteristics include a plurality of processing resources and memory domain characteristics relative to the processing resources. A preferred allocation of data in memory domains of the target system is determined based on mapping the code to one or more selected processing resources and mapping the data to one or more of the memory domains based on the memory domain characteristics relative to the one or more selected processing resources. The preferred allocation is stored as compiler-generated memory mapping hints in a format accessible by a physical memory mapping resource of the target system.

97 MATHEMATICS AND COMPUTING↗

Memory synchronization filter

Data synchronization between memories of a data processing system is achieved by transferring the data blocks from a first memory to a second memory, forming a hash list from addresses of data blocks that are written to the second memory or modified in the second memory. The hash list may be to identify a set of data blocks that are possibly written to or modified. Data blocks that are possibly modified may be written back from the second memory to the first memory in response to a synchronization event. The hash list may be updated by computing, in hardware or software, hash functions of an address of the transferred or modified data block to determine bit positions to be set. The hash list may be queried by computing hash functions of an address to determine bit positions, and checking bits in the hash list at those bit positions.

97 MATHEMATICS AND COMPUTING↗

Memory cell comprising coupled Josephson junctions

Methods and apparatus are disclosed for operating a memory cell formed from the plurality of coupled Josephson junctions. The memory cell is configured such that applying an electrical signal to the junctions can cause at least one, but not all, of the junctions to change their respective phase states. Subsequent writes to the memory cell using substantially the same electrical pulse do not change the phase state of the plurality of junctions. The memory cell can be ready by providing another electrical pulse to one of the junctions and receiving an output electrical pulse generated in response by a different Josephson junction of the memory cell. A set of phase states are selected to represent the logic values that are stable across anticipated operating conditions for the memory cell. Methods of selecting electrical parameters and manufacturing memory cells are further disclosed.

97 MATHEMATICS AND COMPUTING↗

Distributed gather/scatter operations across a network of memory nodes

Devices, methods, and systems for distributed gather and scatter operations in a network of memory nodes. A responding memory node includes a memory; a communications interface having circuitry configured to communicate with at least one other memory node; and a controller. The controller includes circuitry configured to receive a request message from a requesting node via the communications interface. The request message indicates a gather or scatter operation, and instructs the responding node to retrieve data elements from a source memory data structure and store the data elements to a destination memory data structure. The controller further includes circuitry configured to transmit a response message to the requesting node via the communications interface. The response message indicates that the data elements have been stored into the destination memory data structure.

97 MATHEMATICS AND COMPUTING↗

Performance Potential of Mixed Data Management Modes for Heterogeneous Memory Systems

Many high-performance systems now include different types of memory devices within the same compute platform to meet strict performance and cost constraints. Such heterogeneous memory systems often include an upper-level tier with better performance, but limited capacity, and lower-level tiers with higher capacity, but less bandwidth and longer latencies for reads and writes. To utilize the different memory layers efficiently, current systems rely on hardware-directed, memory -side caching or they provide facilities in the operating system (OS) that allow applications to make their own data-tier assignments. Since these data management options each come with their own set of trade-offs, many systems also include mixed data management configurations that allow applications to employ hardware- and software-directed management simultaneously, but for different portions of their address space. Despite the opportunity to address limitations of stand-alone data management options, such mixed management modes are under-utilized in practice, and have not been evaluated in prior studies of complex memory hardware. In this work, we develop custom program profiling, configurations, and policies to study the potential of mixed data management modes to outperform hardware- or software-based management schemes alone. Our experiments, conducted on an Intel ® Knights Landing platform with high-bandwidth memory, demonstrate that the mixed data management mode achieves the same or better performance than the best stand-alone option for five memory intensive benchmark applications (run separately and in isolation), resulting in an average speedup compared to the best stand-alone policy of over 10 %, on average.

Effler, Chad↗

Determining diagnostic coverage for memory using redundant execution

Memory, used by a computer to store data, is generally prone to faults, including permanent faults (i.e. relating to a lifetime of the memory hardware), and also transient faults (i.e. relating to some external cause) which are otherwise known as soft errors. Since soft errors can change the state of the data in the memory and thus cause errors in applications reading and processing the data, there is a desire to characterize the degree of vulnerability of the memory to soft errors. In particular, once the vulnerability for a particular memory to soft errors has been characterized, cost/reliability trade-offs can be determined, or soft error detection mechanisms (e.g. parity) may be selectively employed for the memory. In some cases, memory faults can be diagnosed by redundant execution and a diagnostic coverage may be determined.

Bramley, Richard Gavin↗

Tolerating memory stack failures in multi-stack systems

Memory management circuitry and processes operate to improve reliability of a group of memory stacks, providing that if a memory stack or a portion thereof fails during the product's lifetime, the system may still recover with no errors or data loss. A front-end controller receives a block of data requested to be written to memory, divides the block into sub-blocks, and creates a new redundant reliability sub-block. The sub-blocks are then written to different memory stacks. When reading data from the memory stacks, the front-end controller detects errors indicating a failure within one of the memory stacks, and recovers corrected data using the reliability sub-block. The front-end controller may monitor errors for signs of a stack failure and disable the failed stack.

Mappouras, Georgios↗

Liveness as a factor to evaluate memory vulnerability to soft errors

Memory, used by a computer to store data, is generally prone to faults, including permanent faults (i.e. relating to a lifetime of the memory hardware), and also transient faults (i.e. relating to some external cause) which are otherwise known as soft errors. Since soft errors can change the state of the data in the memory and thus cause errors in applications reading and processing the data, there is a desire to characterize the degree of vulnerability of the memory to soft errors. In particular, once the vulnerability for a particular memory to soft errors has been characterized, cost/reliability trade-offs can be determined, or soft error detection mechanisms (e.g. parity) may be selectively employed for the memory. In some cases, memory faults can be diagnosed by redundant execution and a diagnostic coverage may be determined.

Bramley, Richard Gavin↗

Beyond Binary: Automated PLC Memory Forensics through RGB Image Analysis and Deep Learning

The introduction of Industry 4.0 and the evolution of industrial control systems (ICS) to adopt Internet-based technologies enhanced productivity, but have inadvertently increased their vulnerability to cyber-based malicious attacks. When an ICS system is compromised, security analysts need to identify the root cause quickly to start the recovery process and develop mitigation strategies to safeguard against future instances. Memory forensics is critical in the analysis process to ascertain what occurred. To date, approaches to analyze the persistent memory in ICS devices are limited, and almost nonexistent for volatile memory. This paper proposes an automated methodology, COMA, for PLC memory dump analysis using computer vision and deep learning techniques. Specifically, COMA converts the sequences of bytes in a PLC memory dump to RGB pixels and creates a deep learning model that learns the underlying patterns and features of pre-labeled forensic artifacts in images and segments them into distinct regions. COMA then uses the trained model to automatically segment new memory images and extract forensic artifacts. We evaluate COMA on a Schneider Electric Modicon M221 PLC involving two cyber-based attack scenarios: (i) code injection and (ii) code modification. The empirical results show that COMA can successfully detect attack artifacts in memory dumps in both scenarios.

Asmar Awad, Rima↗

Compute in‐Memory with Non‐Volatile Elements for Neural Networks: A Review from a Co‐Design Perspective

Abstract Deep learning has become ubiquitous, touching daily lives across the globe. Today, traditional computer architectures are stressed to their limits in efficiently executing the growing complexity of data and models. Compute‐in‐memory (CIM) can potentially play an important role in developing efficient hardware solutions that reduce data movement from compute‐unit to memory, known as the von Neumann bottleneck. At its heart is a cross‐bar architecture with nodal non‐volatile‐memory elements that performs an analog multiply‐and‐accumulate operation, enabling the matrix‐vector‐multiplications repeatedly used in all neural network workloads. The memory materials can significantly influence final system‐level characteristics and chip performance, including speed, power, and classification accuracy. With an over‐arching co‐design viewpoint, this review assesses the use of cross‐bar based CIM for neural networks, connecting the material properties and the associated design constraints and demands to application, architecture, and performance. Both digital and analog memory are considered, assessing the status for training and inference, and providing metrics for the collective set of properties non‐volatile memory materials will need to demonstrate for a successful CIM technology.

36 MATERIALS SCIENCE↗

Programmable Cryogenic Memory in a Ge/GeSi Heterostructure

Programmable memory components that operate optimally at cryogenic temperatures are essential for cryogenic computing architectures that seek to implement computing-in-memory. In this work, we demonstrate highly programmable memory in a Ge/GeSi heterostructure field-effect transistor (HFET). To operate, the HFET is gated to introduce positive carriers within the Ge quantum well, creating a high-conductance state. We show that this device can be set to a low-conductance state by sweeping a negative bias on the device drain, and reset it to its high-conductance state by sweeping a more positive bias on the device gate, thereby creating memory. We then determine that the device can be programmed within a 103 range of conductances using either the SET or the RESET operation. We propose that memory is achieved through charge trapping as carriers tunnel out of the quantum well, and that altering the density and spatial distribution of carriers modulates the device conductance. This mechanism exhibits endurance over 1000 cycles at temperatures ≤ 25 K, suggesting that the carrier traps are located at the oxide-semiconductor interface. As a first demonstration of programmable conductance in a Ge/GeSi HFET, this work highlights the potential of group-IV HFETs to perform as analog cryogenic memory components.

cryogenic memory↗

Enabling Scalable and Extensible Memory-mapped Datastores in Userspace

Exascale workloads are expected to incorporate data-intensive processing in close coordination with traditional physics simulations. These emerging scientific, data-analytics and machine learning applications need to access a wide variety of datastores in flat files and structured databases. Programmer productivity is greatly enhanced by mapping datastores into the application process's virtual memory space to provide a unified “in-memory” interface. Currently, memory mapping is provided by system software primarily designed for generality and reliability. However, scalability at high concurrency is a formidable challenge on exascale systems. Also, there is a need for extensibility to support new datastores potentially requiring HPC data transfer services. In this article, we present UMap , a scalable and extensible userspace service for memory-mapping datastores. Furthermore, through decoupled queue management, concurrency aware adaptation, and dynamic load balancing, UMap enables application performance to scale even at high concurrency. We evaluate UMap in data-intensive applications, including sorting, graph traversal, database operations, and metagenomic analytics. Our results show that UMap as a userspace service outperforms an optimized kernel-based service across a wide range of intra-node concurrency by 1.22-1.9 × . We performed two case studies to demonstrate UMap 's extensibility. First, a new datastore residing in remote memory is incorporated into UMap as an application-specific plugin. Second, we present a persistent memory allocator Metall built atop UMap for unified storage/memory.

97 MATHEMATICS AND COMPUTING↗

Physical insights into biological memory using phospholipid membranes

Electrical signals may propagate along neuronal membranes in the brain, thus enabling communication between nerve cells. In doing so, lipid bilayers, fundamental scaffolds of all cell membranes, deform and restructure in response to such electrical activity. These changes impact the electromechanical properties of the membrane, which then physically store biological memory. This memory can exist either over a short or long period of time. Traditionally, biological memory is defined by the strengthening or weakening of transmissions between individual neurons. In this report we show that electrical stimulation may also alter the properties of the lipid membrane, thus pointing toward a novel mechanism for memory storage. Furthermore, based on the analysis of existing electrophysiological data, we study molecular mechanisms underlying the long-term potentiation in phospholipid membranes. Finally, we examine possible relationships between the memory capacitive properties of lipid membranes, neuronal learning, and memory.

59 BASIC BIOLOGICAL SCIENCES↗

BLACKCOMB2: Hardware-software co-design for non-volatile memory in exascale systems

This work was part of a larger project, Blackcomb2, centered at Oak Ridge National Labs (Jeff Vetter PI) to investigate the opportunities for replacing or supplementing DRAM main memory with nonvolatile memory (NVmemory) in Exascale memory systems. The goal was to reduce the energy consumed by in future supercomputer memory systems and to improve their resiliency. Building on the accomplishments of the original Blackcomb Project, funded in 2010, the goal for Blackcomb2 was to identify, evaluate, and optimize the most promising emerging memory technologies, architecture hardware and software technologies, which are essential to provide the necessary memory capacity, performance, resilience, and energy efficiency in Exascale systems. Capacity and energy are the key drivers.

97 MATHEMATICS AND COMPUTING↗

Analysis of Vector Particle-In-Cell (VPIC) memory usage optimizations on cutting-edge computer architectures

Vector Particle-In-Cell (VPIC) is one of the fastest plasma simulation codes in the world, with particle numbers ranging from one trillion on the first petascale system, Roadrunner, to ten trillion particles on the more recent Blue Waters supercomputer. As supercomputers continue to grow rapidly in size, so too does the gap between computing capability and memory capability. Current memory systems limit VPIC simulations greatly as the maximum number of particles that can be simulated directly depends on the available memory. In this study, we present a suite of VPIC memory optimizations (i.e., particle weight, half-precision, and fixed-point optimizations) that enable a significant increase in the number of particles in VPIC simulations. Here, we assess the optimizations’ impact on memory and runtime performance for a suite of cutting-edge computer architectures such has the NVIDIA V100 GPU, the IBM Power9, and the Fujitsu A64FX architectures. Our optimizations enable a 31.25% reduction in memory usage and up to 40% increase in the number of particles. This paper extends our work on developing particle storage format optimizations Tan et al.

97 MATHEMATICS AND COMPUTING↗

Remarkable charge-trapping efficiency of the memory device with (TiO{sub 2}){sub 0.8}(Al{sub 2}O{sub 3}){sub 0.1} composite charge-storage dielectric

A memory device p-Si/SiO{sub 2}/(TiO{sub 2}){sub 0.8}(Al{sub 2}O{sub 3}){sub 0.1}(TAO-81)/Al{sub 2}O{sub 3}/Pt was fabricated, in which a composite of two high-k dielectrics with a thickness of 1 nm was employed as the charge-trapping layer to enhance the charge-trapping efficiency of the memory device. At an applied gate voltage of ±9 V, TAO-81 memory device shows a memory window of 8.83 V in its C-V curve. It also shows a fast response to a short voltage pulse of 10{sup −5} s. The charge-trapping capability, the endurance, and retention characteristics of TAO-81 memory device can be improved by introducing double TAO-81 charge-trapping layers intercalated by an Al{sub 2}O{sub 3} layer. The charge-trapping mechanism in the memory device is mainly ascribed to the generation of the electron-occupied defect level in the band gap of Al{sub 2}O{sub 3} induced by the inter-diffusion between TiO{sub 2} and Al{sub 2}O{sub 3}.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗