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At least 271 records · Page 15

An efficient explicit implementation of a near-optimal quantum algorithm for simulating linear dissipative differential equations

We propose an efficient block-encoding technique for the implementation of the Linear Combination of Hamiltonian Simulations (LCHS) for simulating dissipative initial-value problems. This algorithm approximates a target nonunitary operator as a weighted sum of Hamiltonian evolutions, thereby emulating a dissipative problem by mixing various time scales. We introduce an efficient encoding of the LCHS into a quantum circuit based on a simple coordinate transformation that turns the dependence on the summation index into a trigonometric function. Classically, this method is equivalent to the use of a highly accurate Fejér-Clenshaw-Curtis quadrature formula. Quantumly, this significantly simplifies block-encoding of a dissipative problem and allows one to perform an exponential number of Hamiltonian simulations by a single Quantum Signal Processing (QSP) circuit. The resulting LCHS circuit has high success probability and the selector scales logarithmically with the number of terms in the LCHS sum and linearly with time. Careful analysis of error convergence proves that this method is more efficient than other LCHS circuits that have recently appeared in the literature. We verify the quantum circuit and its scaling by simulating it on a digital emulator of fault-tolerant quantum computers and, as a test problem, solve the advection-diffusion equation. The proposed algorithm can be used for simulating a wide class of nonunitary initial-value problems including the Liouville equation with added dissipation and linear embeddings of nonlinear systems, such as the Koopman-von Neumann and Carleman embeddings.

Novikau, I [Lawrence Livermore National Laboratory↗

Diagnostic reasoning in digital systems

Described is an efficient method for fault diagnosis in digital systems based on the technique of reasoning. The methodology operates on the observed erroneous behavior and the structure of the system. The behavior consists of the error(s) observed on the circuit's output lines and specific values on the circuit's input lines. The techniques described improve on previously published research on diagnostic reasoning in two ways. Previous work has stressed system independent techniques which could be used to diagnose any faulty system whose structure can be represented. By concentrating on the specific case of diagnosing faulty digital circuits, it is possible to simplify the representation of the structure of the system. This representation, in the form of an AND/OR fault tree, efficiently abstracts the structure of a faulty digital system. More importantly, a method for partitioning the digital system is introduced which can considerably reduce the runtime complexity of a diagnosis.

Thearling, Kurt Henry↗

Automated management of power systems

APSM (Automated Power System Management) is a technology readiness program underway to develop, evaluate, and demonstrate various techniques involved in power system monitoring, as well as computational and control functions. The demonstration breadboard consists of the Viking Orbiter '75 power subassembly breadboard modified to incorporate dedicated microprocessors and digital interface circuits, as well as test support equipment for both spacecraft and ground computer simulation, fault simulation, and data acquisition.

Imamura, M. S.↗

Test Pattern for IC's

Random-fault densities measured in array of standard structures. Test pattern is array of standard circuit elements built into circuit chip along with, or in lieu of, integrated circuit objective process. Measurements on ray made and interpreted so fabrication process can be corrected as necessary.

Griswold, T. W.↗

Kilovolt dc solid state remote power controller development

The experience gained in developing and applying solid state power controller (SSPC) technology at high voltage dc (HVDC) potentials and power levels of up to 25 kilowatts is summarized. The HVDC switching devices, power switching concepts, drive circuits, and very fast acting overcurrent protection circuits were analyzed. A 25A bipolar breadboard with Darlington connected switching transistor was built. Fault testing at 900 volts was included. A bipolar transistor packaged breadboard design was developed. Power MOSFET remote power controller (RPC) was designed.

Mitchell, J. T.↗

DC wiring system grounding and ground fault protection issues for central station photovoltaic power plants

The DC wiring system for a photovoltaic power plant presents a number of unique challenges to be overcome by the plant designers. There are a number of different configurations that the grounding of the DC wiring system can take, and the choice will affect the number and type of protective devices required to ensure safety of personnel and protection of equipment. The major grounding and fault protection considerations that must be taken into account when selecting the basic overall circuit configuration are summarized. The inherent advantages and disadvantages of each type of circuit grounding (resistance or solid) along with the personnel safety and equipment protection issues for each of these grounding methods are presented.

Simburger, E. J.↗

Fundamentals of Digital Engineering: Designing for Reliability

The concept of designing for reliability will be introduced along with a brief overview of reliability, redundancy and traditional methods of fault tolerance is presented, as applied to current logic devices. The fundamentals of advanced circuit design and analysis techniques will be the primary focus. The introduction will cover the definitions of key device parameters and how analysis is used to prove circuit correctness. Basic design techniques such as synchronous vs asynchronous design, metastable state resolution time/arbiter design, and finite state machine structure/implementation will be reviewed. Advanced topics will be explored such as skew-tolerant circuit design, the use of triple-modular redundancy and circuit hazards, device transients and preventative circuit design, lock-up states in finite state machines generated by logic synthesizers, device transient characteristics, radiation mitigation techniques. worst-case analysis, the use of timing analyzer and simulators, and others. Case studies and lessons learned from spaceflight designs will be given as examples

Katz, R.↗

Small Radioisotope Power System Testing at NASA Glenn Research Center

In April 2009, NASA Glenn Research Center (GRC) formed an integrated product team (IPT) to develop a Small Radioisotope Power System (SRPS) utilizing a single Advanced Stirling Convertor (ASC) with passive balancer. A single ASC produces approximately 80 We making this system advantageous for small distributed lunar science stations. The IPT consists of Sunpower, Inc., to provide the single ASC with a passive balancer, The Johns Hopkins University Applied Physics Laboratory (JHUAPL) to design an engineering model Single Convertor Controller (SCC) for an ASC with a passive balancer, and NASA GRC to provide technical support to these tasks and to develop a simulated lunar lander test stand. The single ASC with a passive balancer, simulated lunar lander test stand, and SCC were delivered to GRC and were tested as a system. The testing sequence at GRC included SCC fault tolerance, integration, electromagnetic interference (EMI), vibration, and extended operation testing. The SCC fault tolerance test characterized the SCCs ability to handle various fault conditions, including high or low bus power consumption, total open load or short circuit, and replacing a failed SCC card while the backup maintains control of the ASC. The integrated test characterized the behavior of the system across a range of operating conditions, including variations in cold-end temperature and piston amplitude, including the emitted vibration to both the sensors on the lunar lander and the lunar surface. The EMI test characterized the AC and DC magnetic and electric fields emitted by the SCC and single ASC. The vibration test confirms the SCCs ability to control the single ASC during launch. The extended operation test allows data to be collected over a period of thousands of hours to obtain long term performance data of the ASC with a passive balancer and the SCC. This paper will discuss the results of each of these tests.

Vibration↗

Field Programmable Gate Array Failure Rate Estimation Guidelines for Launch Vehicle Fault Tree Models

Today's launch vehicles complex electronic and avionics systems heavily utilize Field Programmable Gate Array (FPGA) integrated circuits (IC) for their superb speed and reconfiguration capabilities. Consequently, FPGAs are prevalent ICs in communication protocols such as MILSTD- 1553B and in control signal commands such as in solenoid valve actuations. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.

Al Hassan, Mohammad↗

Stirling Convertor Controller Development at NASA Glenn Research Center

For nearly two decades, NASA Glenn Research Center (GRC) has been supporting the development of Radioisotope Power Systems (RPS). NASA desires higher conversion efficiency RPS options that are reliable and robust with long life design. Dynamic conversion, such as Stirling and Brayton, offer the potential for higher conversion efficiencies than current RPS but have yet to be demonstrated in a flight application. The RPS program sent out a solicitation to investigate options for dynamic conversion technologies. As a result of this solicitation, four dynamic power convertor (DPC) technologies were selected for design and three are proceeding to the fabrication phase of prototype dynamic convertors. One lesson learned from the Advanced Stirling Radioisotope Generator (ASRG) project is that controller development should be coordinated with the development of a dynamic convertor. As a result of this, NASA GRC has been utilizing hardware from past Stirling convertor projects including that of the ASRG to support controller development for the DPC's. NASA GRC has developed a strong knowledge base on both analog and digital Stirling dynamic power convertor controllers and will continue to expand and apply that knowledge to the DPC's. Over the past 15 years, controllers were developed at GRC, at Lockheed Martin (LM) and by the Johns Hopkins University/Applied Physics Laboratory (JHU/APL). Various generations of the controllers have been developed as lessons were learned through various component and system level tests. Some of the tests performed were fault tolerance, flight acceptance vibration, electromagnetic interference (EMI), spacecraft integration, and extended operation. The fault tolerance test characterized the controller's ability to handle various fault conditions, including high or low bus power consumptions, total open load or short circuit, and replacing a failed controller card while the backup maintains control of the Stirling convertor. The vibration test confirms the controller's ability to control an ASC during launch. The EMI test characterized the AC and DC magnetic and electric fields emitted by the single ASC and if the controller has an impact on the radiated EMI. Spacecraft integration testing in the Radioisotope Power Systems System Integration Laboratory (RSIL) provided insight into the electrical interactions between the representative RPS, its associated control schemes, and realistic electric system loads. The extended operation test allows data to be collected over a period of thousands of hours to obtain long term performance data of the system. This paper describes the history of controller development at NASA GRC, tests performed on these controllers, and lessons learned.

Dugala, Gina M.↗

Stirling Convertor Controller Development at NASA Glenn Research Center

Over the past decade, NASA Glenn Research Center (GRC) has been supporting the development of Radioisotope Power Systems (RPS). NASA desires higher conversion efficiency RPS options that are reliable and robust with long life design. Dynamic conversion, such as Stirling and Brayton, offer the potential for higher conversion efficiencies but have yet to be demonstrated in a flight application. The RPS program sent out a solicitation to investigate options for dynamic conversion technologies. As a result of this solicitation, four dynamic power convertor (DPC) technologies were selected for design and fabrication of a prototype dynamic convertor. One lesson learned from the Advanced Stirling Radioisotope Generator (ASRG) project is that controller development should start early in the development of a dynamic convertor. As a result of this, NASA GRC has been utilizing hardware from past Stirling convertor projects including that of the ASRG to support controller development for the DPC's. NASA GRC has developed a strong knowledge base on both analog and digital Stirling dynamic power convertor controllers and will continue to expand and apply that knowledge to the four DPC's. Over the past 15 years, controllers were developed in-house at GRC, at Lockheed Martin Coherent Technologies (LMCT) and by the Johns Hopkins University/Applied Physics Laboratory (JHU/APL). Various generations of the controllers, have been developed as lessons were learned through various component and system level tests. Some of the tests performed were fault tolerance, qualification vibration level, electromagnetic interference, Radioisotope Power System Systems Integration (RSIL) tests, and extended operation. The fault tolerance test characterized the controller's ability to handle various fault conditions, including high or low bus power consumptions, total open load or short circuit, and replacing a failed controller card while the backup maintains control of the ASC. The vibration test confirms the controller's ability to control an ASC during launch. The EMI test characterized the AC and DC magnetic and electric fields emitted by the single ASC and if the controller has an impact on the radiated EMI. RSIL testing provided insight into the electrical interactions between the representative RPS, its associated control schemes, and realistic electric system loads. The extended operation test allows data to be collected over a period of thousands of hours to obtain long term performance data of the system. This paper describes the history of controller development at NASA GRC, tests performed on these controllers, and lessons learned.

Dugala, Gina M.↗

Stirling Convertor Controller Development at NASA Glenn Research Center

For nearly two decades, NASA Glenn Research Center has been supporting the development of radioisotope power systems (RPS). NASA desires higher conversion efficiency RPS options that are reliable and robust with long-life design. Dynamic conversion, such as Stirling and Brayton, offer the potential for higher conversion efficiencies than current RPS but have yet to be demonstrated in a flight application. The RPS program sent out a solicitation to investigate options for dynamic conversion technologies. As a result of this solicitation, four dynamic power convertor (DPC) technologies were selected for design and three are proceeding to the fabrication phase of prototype dynamic convertors. One lesson learned from the Advanced Stirling Radioisotope Generator (ASRG) project is that controller development should be coordinated with the development of a dynamic convertor. As a result of this, Glenn has been utilizing hardware from past Stirling convertor projects, including that of the ASRG, to support controller development for the DPCs. Glenn has developed a strong knowledge base on both analog and digital Stirling DPC controllers and will continue to expand and apply that knowledge to the DPCs. Over the past 15 years, controllers were developed at Glenn, at Lockheed Martin (LM), and by the Johns Hopkins University Applied Physics Laboratory (APL). Various generations of the controllers have been developed as lessons were learned through various component- and system-level tests. Some of the tests performed were fault tolerance, flight acceptance vibration, electromagnetic interference (EMI), spacecraft integration, and extended operation. The fault tolerance test characterized the controller’s ability to handle various fault conditions, including high or low bus power consumption, total open load or short circuit, and replacing a failed controller card while the backup maintains control of the Stirling convertor. The vibration test confirms the controller’s ability to control an Advanced Stirling Convertor (ASC) during launch. The EMI test characterized the alternating-current (AC) and direct-current (DC) magnetic and electric fields emitted by the single ASC and if the controller has an impact on the radiated EMI. Spacecraft integration testing in the Radioisotope Power Systems (RPS), System Integration Laboratory (RSIL) provided insight into the electrical interactions between the representative RPS, its associated control schemes, and realistic electric system loads. The extended operation test allows data to be collected over a period of thousands of hours to obtain long-term performance data of the system. This paper describes the history of controller development at Glenn, tests performed on these controllers, and lessons learned.

Dugala, Gina M.↗

Thermal verification testing of commercial printed-circuit boards for spaceflight

A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Temperature definition and vibration tests are performed next. Final assembly testing is performed to simulate the Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation. Verification is successful when all components and final assemblies have passed each test. This method was very successful in verifying that commercial printed-circuit boards will survive in the Shuttle environment.

Foster, William M., II↗

Field Programmable Gate Array Failure Rate Estimation Guidelines for Launch Vehicle Fault Tree Models

Today's launch vehicles complex electronic and avionic systems heavily utilize the Field Programmable Gate Array (FPGA) integrated circuit (IC). FPGAs are prevalent ICs in communication protocols such as MIL-STD-1553B, and in control signal commands such as in solenoid/servo valves actuations. This paper will demonstrate guidelines to estimate FPGA failure rates for a launch vehicle, the guidelines will account for hardware, firmware, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC, FPGA memory and clock. The firmware portion will provide guidelines on the high level FPGA programming language and ways to account for software/code reliability growth. The radiation portion will provide guidelines on environment susceptibility as well as guidelines on tailoring other launch vehicle programs historical data to a specific launch vehicle.

Al Hassan, Mohammad↗

A Parametric Reduced-Order Model for Inverter Short-Circuit Response in Protection Studies

This paper presents a reduced-order model (ROM) for grid-following (GFL) inverters that reproduces inverter fault current trajectories, including sub transients, transient, and steady-state phases, across a range of fault types, locations, and pre-fault operating points. . The proposed model is developed by: Constructing the positive- and negative-sequence current with parameterization fitted by large data training and fitting Validating using EMT simulation against EMT full model and demonstrating the ROM's capability to capture fault current magnitude, phase angle, and oscillatory transients. Building a standard EMT simulation platform library component for easy configuration and application.

24 POWER TRANSMISSION AND DISTRIBUTION↗

Decentralized Microgrid Protection Through Relative Fault Direction Classification: Preprint

Protection in inverter-based resources (IBRs) dominated microgrids generally face significant challenges due to the low fault current and inconsistent fault behaviors from IBRs. Recently, machine learning-based approaches have attracted considerable attention to address these challenges. This paper introduces a novel decentralized protection strategy for microgrids. The proposed method decomposes the protection challenge into several distributed learning tasks, enabling individual relays to autonomously determine the direction of faults using a binary classification framework based on support vector machine (SVM) algorithms. Following the distributed fault direction estimation, classifier outcomes are shared among neighboring relays, facilitating a local decision-making process to ascertain the presence of faults within the neighborhood. Finally, a tripping signal is generated based on the classifier results of each relay to operate the circuit breaker. To test and validate this approach, a 100% renewable microgrid model is simulated in MATLAB/Simulink. In the numerical analysis, the application of SVM classifiers in our approach yields impressive results: an average relay classification accuracy of 98%, and a 96% accuracy in circuit breaker control. These findings highlight the potential of machine-learning-based approaches in enhancing the efficiency and reliability of microgrid protection systems.

decentralized algorithm↗

T-Type Modular DC Circuit Breaker (T-Breaker) for Future DC Networks

The developed T-Type Modular DC Circuit Breaker (T-Breaker) technology offers an all-in-one solution to challenges in DC networks. This includes swift fault detection and protection, power transient stability, and power quality improvement, achieved through the utilization of wide bandgap (WBG) power semiconductors and energy storage devices. The T-Breaker not only facilitates rapid fault current detection and interruption but also implements fault current limiting through active insertion of storage devices or by operating WBG devices in the saturation region. Additionally, with the assistance of energy storage devices, potential overvoltage issues on power devices induced by control signal misalignment can be mitigated. The T-Breaker can be regulated to perform shunt current injection/absorption using the vertical arm and series voltage insertion via the horizontal arm, thereby enhancing DC system stability during voltage or load power fluctuation transients. The OSU team and Raytheon team actively worked together on designing, fabricating, assembling, and testing of two T-Breaker prototypes. The first prototype is rated at 1 kV, 500 A with half-bridge (unipolar) structure to validate the T-Breaker concept. The second prototype is rated at 20 kV, 50 A with full-bridge (bipolar) topology which can reach an efficiency of 99.977%, realize a power density of 60.2 MW/m3, and eliminate the 500-A fault current with a fault response time of around 20 µs. The prototypes show great feasibility of adopting this technology in multiple applications including electrified aircraft, super charging stations, data centers, etc.

24 POWER TRANSMISSION AND DISTRIBUTION↗

Built-In Diagnostics (BID) Of Equipment/Systems

Diagnostician(TM)-on-Chip (DOC) technology identifies faults and commands systems reconfiguration. Smart microcontrollers operating in conjunction with other system-control circuits, command self-correcting system/equipment actions in real time. DOC microcontroller generates commands for associated built-in test equipment to stimulate unit of equipment diagnosed, collects and processes response data obtained by built-in test equipment, and performs diagnostic reasoning on response data, using diagnostic knowledge base derived from design data.

Granieri, Michael N.↗