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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 271 records · Page 15
All sourcesNASA NTRSDOE OSTI
NASA NTRS2008

Structural Benchmark Creep Testing for the Advanced Stirling Convertor Heater Head

The National Aeronautics and Space Administration (NASA) has identified the high efficiency Advanced Stirling Radioisotope Generator (ASRG) as a candidate power source for use on long duration Science missions such as lunar applications, Mars rovers, and deep space missions. For the inherent long life times required, a structurally significant design limit for the heater head component of the ASRG Advanced Stirling Convertor (ASC) is creep deformation induced at low stress levels and high temperatures. Demonstrating proof of adequate margins on creep deformation and rupture for the operating conditions and the MarM-247 material of construction is a challenge that the NASA Glenn Research Center is addressing. The combined analytical and experimental program ensures integrity and high reliability of the heater head for its 17-year design life. The life assessment approach starts with an extensive series of uniaxial creep tests on thin MarM-247 specimens that comprise the same chemistry, microstructure, and heat treatment processing as the heater head itself. This effort addresses a scarcity of openly available creep properties for the material as well as for the virtual absence of understanding of the effect on creep properties due to very thin walls, fine grains, low stress levels, and high-temperature fabrication steps. The approach continues with a considerable analytical effort, both deterministically to evaluate the median creep life using nonlinear finite element analysis, and probabilistically to calculate the heater head s reliability to a higher degree. Finally, the approach includes a substantial structural benchmark creep testing activity to calibrate and validate the analytical work. This last element provides high fidelity testing of prototypical heater head test articles; the testing includes the relevant material issues and the essential multiaxial stress state, and applies prototypical and accelerated temperature profiles for timely results in a highly controlled laboratory environment. This paper focuses on the last element and presents a preliminary methodology for creep rate prediction, the experimental methods, test challenges, and results from benchmark testing of a trial MarM-247 heater head test article. The results compare favorably with the analytical strain predictions. A description of other test findings is provided, and recommendations for future test procedures are suggested. The manuscript concludes with describing the potential impact of the heater head creep life assessment and benchmark testing effort on the ASC program.

Krause, David L.↗
DOE OSTI2025

UV + Damp Heat Induced Power Losses in Fielded Utility N-Type Si PV Modules

A recent trend in commercial PV modules is a transition to n-type silicon cells, including passivated emitter rear totally diffused (n-PERT), tunnel oxide passivated contact (TOPCon), and silicon heterojunction (SHJ). There is evidence via lab studies that some of these cells are more susceptible to UV induced degradation (UVID), yet there is a lack of confirmation that such degradation occurs in the field. Current IEC standards designed to screen for early module failures require only minimal UV exposure (15 kWh/m2 280-400 nm, ~2-3 months equivalent outdoor exposure). Here, we investigate fielded n-PERT silicon (Si) modules from a commercial utility that show power losses of ~2%/year. We present a comprehensive picture of the physics and chemistry of degradation supported by both module and cell electronic characterization (EL, PL, IV, EQE, and DLIT) and materials-level morphological and chemical analysis (SEM, EDS, XPS, FTIR, and HPLC). All sampled site modules show short circuit current (Isc) and open circuit voltage (Voc) losses when compared to unfielded spares, with the most severely degraded also having losses in fill factor (FF). We identify two different degradation modes contributing to overall power loss: (1) external quantum efficiency (EQE) measurements show losses in the blue range of the spectra, indicative of cell surface recombination losses, and (2) variations in high series resistance (Rs) at the cell level that are correlated with compositional differences in cell metallization. Using unfielded spares, we were able to reproduce Voc, Isc, and EQE losses via a minimum UV stress of 67.5 kWh/m2 (280-400 nm), 4.5x the exposure currently required in IEC 61215-2 (MQT 10). Degradation continued with additional UV dosage equivalent to the fielded modules (405 kWh/m2 total), with power loss leveling out at an average of 6.1%. Subsequent 1000 h of 85% RH/85degrees C damp heat testing showed that cells exposed to UV underwent additional severe series resistance degradation, even those without the susceptible paste composition seen in the field, whereas non-UV exposed cells saw little change. We attribute this to higher concentrations of acetic acid generated on the UV exposed area of the module, leading to degradation of the gridline/cell interface and high Rs. This study is unique in that it reproduces field observed utility scale UVID with an accelerated test and supports the need for standards development for longer UV exposure combined with other stress factors to catch materials interplay within a module package.

14 SOLAR ENERGY↗
DOE OSTI2021

Thermo-Oxidation Analysis of Structural Adhesives: An Experimental Study

Abstract Cross-linked polymers play an important role in structural applications as adhesives. In this article, we performed an experimental study to understand the effects of high temperature i.e. thermo-oxidative aging on the mechanical behavior of polymers. Subsequently, the constitutive behavior, i.e. stress-strain relation of these adhesives before and after the accelerated aging tests were studied on samples aged at different temperature and different time durations at zero humidity. The aging conditions and periods selected for the tests have been specifically designed to simulate the effects of aging under the working conditions that the materials will be subjected to in their standard applications. The focus of this study is on the investigation of the effects of aging on the polymeric adhesives used in automotive applications. Consequently, four different polymeric adhesives (one silicone-based, two polyurethane-based, and one acrylic type), which are being used extensively in these applications, have been chosen. The quasi-static tensile loading was used on these four adhesives and the changes in the constitutive behavior were measured. The failure tensile tests as well as the cyclic tensile tests were performed in our lab using a Test-Resources tensile testing machine. The temperatures that were used in this work are 60, 80 and 95°C for varying aging periods of 24hrs, 240hrs, and 720hrs. Then, all the data was collected and consequently analyzed, and the resulting behavior was compared to that of the unaged material, showing varying results depending on the material, temperature, and aging period. Different behaviors have been observed after aging. The polymers’ behavior was expanding from no effect to significant damage caused by aging conditions. This work provides the core understanding required for modeling the material behavior during aging and lays down the groundwork for further data-infused model-free approaches.

Alazhary, Sharif↗
NASA NTRS2017

Evaluation of Series T22 Wet Tantalum Capacitors

Several types of advanced wet tantalum capacitors, and series T22 in particular, are designed without internal Teflon sealing that is used for military grade, CLR style capacitors. This raises concerns regarding hermeticity of the single seal parts and their capability to withstand high internal gas pressures that might develop during operation in space. To address these issues, T22 series capacitors rated to 50 V and 125 V were subjected to highly accelerated life testing (HALT) at 125 C and rated voltage and step stress random vibration testing (RVT). To simulate conditions of storage or operation under increased internal gas pressure, the parts were stored at temperature of 150 C for 2500 hr (HTS150). Electrical characteristics of the parts were measured through the storage testing and the hermeticity leak rate was tested before and after HTS150. To assess thermo-mechanical robustness of the part, capacitors were manually soldered onto printed wired boards (PWB) and stressed by 1000 temperature cycles between -55 C and +125 C. The effect of temperature cycling was assessed by additional HALT at different temperatures. Results show that T22 series capacitors have robust design and can satisfy requirements for space applications.

Wet tantalum capacitors↗
NASA NTRS1973

Synthetic sea water - An improved stress corrosion test medium for aluminum alloys

A major problem in evaluating the stress corrosion cracking resistance of aluminum alloys by alternate immersion in 3.5 percent salt (NaCl) water is excessive pitting corrosion. Several methods were examined to eliminate this problem and to find an improved accelerated test medium. These included the addition of chromate inhibitors, surface treatment of specimens, and immersion in synthetic sea water. The results indicate that alternate immersion in synthetic sea water is a very promising stress corrosion test medium. Neither chromate inhibitors nor surface treatment (anodize and alodine) of the aluminum specimens improved the performance of alternate immersion in 3.5 percent salt water sufficiently to be classified as an effective stress corrosion test method.

Humphries, T. S.↗
NASA NTRS2011

Effect of Reverse Bias Stress on Leakage Currents and Breakdown Voltages of Solid Tantalum Capacitors

The majority of solid tantalum capacitors are produced by high-temperature sintering of a fine tantalum powder around a tantalum wire followed by electrolytic anodization that forms a thin amorphous Ta2O5 dielectric layer and pyrolysis of manganese nitrite on the oxide to create a conductive manganese dioxide electrode. A contact to tantalum wire is used as anode terminal and to the manganese layer as a cathode terminal of the device. This process results in formation of an asymmetric Ta -- Ta2O5 -- MnO2 capacitor that has different characteristics at forward (positive bias applied to tantalum) and reverse (positive bias applied to manganese cathode) voltages. Reverse bias currents might be several orders of magnitude larger than forward leakage currents so I-V characteristics of tantalum capacitors resemble characteristics of semiconductor rectifiers. Asymmetric I-V characteristics of Ta -- anodic Ta2O5 systems have been observed at different top electrode materials including metals, electrolytes, conductive polymers, and manganese oxide thus indicating that this phenomenon is likely related to the specifics of the Ta -- Ta2O5 interface. There have been multiple attempts to explain rectifying characteristics of capacitors employing anodic tantalum pentoxide dielectrics. A brief review of works related to reverse bias (RB) behavior of tantalum capacitors shows that the mechanism of conduction in Ta -- Ta2O5 systems is still not clear and more testing and analysis is necessary to understand the processes involved. If tantalum capacitors behave just as rectifiers, then the assessment of the safe reverse bias operating conditions would be a relatively simple task. Unfortunately, these parts can degrade with time under reverse bias significantly, and this further complicates analysis of the I-V characteristics and establishing safe operating areas of the parts. On other hand, time dependence of reverse currents might provide additional information for investigation of the processes under reverse bias conditions. In practice, there were instances when, due to unforeseen events, the system operated at conditions when capacitors experience periodically a relatively small reverse bias for some time followed by normal, forward bias conditions. In such a case an assessment should be made on the degree to which these capacitors are degraded by application of low-voltage reverse bias, and whether this degradation can be reversed by normal operating conditions. In this study, reverse currents in different types of tantalum capacitors were monitored at different reverse voltages below 15%VR and temperatures in the range from room to 145 C for up to 150 hours to get better understanding of the degradation process and determine conditions favorable to the unstable mode of operation. The reversibility of RB degradation has been evaluated after operation of the capacitors at forward bias conditions. The effect of reverse bias stress (RBS) on reliability at normal operating conditions was evaluated using highly accelerated life testing at voltages of 1.5VR and 2 VR and by analysis of changes in distributions of breakdown voltages. Possible mechanisms of RB degradation are discussed.

Teverovsky, Alexander A.↗
NASA NTRS2011

Failure Modes in Capacitors When Tested Under a Time-Varying Stress

Steady step surge testing (SSST) is widely applied to screen out potential power-on failures in solid tantalum capacitors. The test simulates the power supply's on and off characteristics. Power-on failure has been the prevalent failure mechanism for solid tantalum capacitors for decoupling applications. On the other hand, the SSST can also be reviewed as an electrically destructive test under a time-varying stress. It consists of rapidly charging the capacitor with incremental voltage increases, through a low resistance in series, until the capacitor under test is electrically shorted. Highly accelerated life testing (HALT) is usually a time-efficient method for determining the failure mechanism in capacitors; however, a destructive test under a time-varying stress like SSST is even more effective. It normally takes days to complete a HALT test, but it only takes minutes for a time-varying stress test to produce failures. The advantage of incorporating specific time-varying stress into a statistical model is significant in providing an alternative life test method for quickly revealing the failure modes in capacitors. In this paper, a time-varying stress has been incorporated into the Weibull model to characterize the failure modes. The SSST circuit and transient conditions to correctly test the capacitors is discussed. Finally, the SSST was applied for testing polymer aluminum capacitors (PA capacitors), Ta capacitors, and multi-layer ceramic capacitors with both precious metal electrode (PME) and base-metal-electrodes (BME). It appears that testing results are directly associated to the dielectric layer breakdown in PA and Ta capacitors and are independent on the capacitor values, the way the capacitors being built, and the manufactures. The testing results also reveal that ceramic capacitors exhibit breakdown voltages more than 20 times the rated voltage, and the breakdown voltages are inverse proportional to the dielectric layer thickness. The possibility of ceramic capacitors in front-end decoupling applications to block the surge noise from a power supply is also discussed.

Liu, David (Donhang)↗
NASA NTRS2010

Composite Overwrapped Pressure Vessels (COPV) Stress Rupture Test: Part 2

One of the major concerns for the aging Space Shuttle fleet is the stress rupture life of composite overwrapped pressure vessels (COPVs). Stress rupture life of a COPY has been defined as the minimum time during which the composite maintains structural integrity considering the combined effects of stress levels and time. To assist in the evaluation of the aging COPVs in the Orbiter fleet an analytical reliability model was developed. The actual data used to construct this model was from testing of COPVs constructed of similar, but not exactly same materials and pressure cycles as used on Orbiter vessels. Since no actual Orbiter COPV stress rupture data exists the Space Shuttle Program decided to run a stress rupture test to compare to model predictions. Due to availability of spares, the testing was unfortunately limited to one 40" vessel. The stress rupture test was performed at maximum operating pressure at an elevated temperature to accelerate aging. The test was performed in two phases. The first phase, 130 F, a moderately accelerated test designed to achieve the midpoint of the model predicted point reliability. A more aggressive second phase, performed at 160 F, was designed to determine if the test article will exceed the 95% confidence interval ofthe model. In phase 3, the vessel pressure was increased to above maximum operating pressure while maintaining the phase 2 temperature. After reaching enough effectives hours to reach the 99.99% confidence level of the model phase 4 testing began when the temperature was increased to greater than 170 F. The vessel was maintained at phase 4 conditions until it failed after over 3 million effect hours. This paper will discuss the results of this test, it's implications and possible follow-on testing.

Russell, Richard↗
NASA NTRS2009

Composite Overwrapped Pressure Vessels (COPV) Stress Rupture Test

One of the major concerns for the aging Space Shuttle fleet is the stress rupture life of composite overwrapped pressure vessels (COPVs). Stress rupture life of a COPV has been defined as the minimum time during which the composite maintains structural integrity considering the combined effects of stress levels and time. To assist in the evaluation of the aging COPVs in the Orbiter fleet an analytical reliability model was developed. The actual data used to construct this model was from testing of COPVs constructed of similar, but not exactly same materials and pressure cycles as used on Orbiter vessels. Since no actual Orbiter COPV stress rupture data exists the Space Shuttle Program decided to run a stress rupture test to compare to model predictions. Due to availability of spares, the testing was unfortunately limited to one 40" vessel. The stress rupture test was performed at maximum operating pressure at an elevated temperature to accelerate aging. The test was performed in two phases. The first phase, 130 F, a moderately accelerated test designed to achieve the midpoint of the model predicted point reliability. The more aggressive second phase, performed at 160 F was designed to determine if the test article will exceed the 95% confidence interval of the model. This paper will discuss the results of this test, it's implications and possible follow-on testing.

Russell, Richard↗
NASA NTRS1998

Thermal High- and Low-Cycle Fatigue Behavior of Thick Thermal Barrier Coating Systems

Ceramic thermal barrier coatings have received increasing attention for advanced gas turbine and diesel engine applications because of their ability to provide thermal insulation to engine components. However, the durability of these coatings under the severe thermal cycling conditions encountered in a diesel engine (ref. 1) still remains a major issue. In this research at the NASA Lewis Research Center, a high-power laser was used to investigate the thermal fatigue behavior of a yttria-stabilized zirconia coating system under simulated diesel engine conditions. The mechanisms of fatigue crack initiation and propagation, and of coating failure under complex thermal low-cycle fatigue (LCF, representing stop/start cycles) and thermal high-cycle fatigue (HCF, representing operation at 1300 rpm) are described. Continuous wave and pulse laser modes were used to simulate pure LCF and combined LCF/HCF, respectively (ref. 2). The LCF mechanism was found to be closely related to the coating sintering and creep at high temperatures. These creep strains in the ceramic coating led to a tensile stress state during cooling, thus providing the major driving force for crack growth under LCF conditions. The combined LCF/HCF tests induced more severe coating surface cracking, microspallation, and accelerated crack growth than did the pure LCF test. HCF thermal loads also facilitated lateral crack branching and ceramic/bond coat interface delaminations. HCF is associated with the cyclic stresses originating from the high-frequency temperature fluctuation at the ceramic coating surface. The HCF thermal loads act on the crack by a wedging mechanism (ref. 1), resulting in continuous crack growth at temperature. The HCF stress intensity factor amplitude increases with the interaction depth and temperature swing, and decreases with the crack depth. HCF damage also increases with the thermal expansion coefficient and the Young's modulus of the ceramic coating (refs. 1 and 3).

Miller, Robert A.↗
DOE OSTI2020

Stabilization of light-induced effects in Si modules for IEC 61215 design qualification

Standardized testing of commercial photovoltaic modules is widely used around the world and decreases risks of module failures. Such testing also reduces financial risks for module manufacturers and customers. This work examines the expected impact of certain defects in silicon (Si) modules during standardized accelerated testing. Specifically, the behavior of boron-oxygen (BO) light-induced degradation (LID) and light- and elevated temperature-induced degradation (LeTID) are simulated during some of the stress tests in IEC 61215. LID and LeTID reaction rates at qualification temperatures are estimated from earlier published data. It is demonstrated the BO-related LID may cause some false positives and false negatives when IEC 61215 tests are performed as prescribed in the 2016 published version. Possible stabilization steps to avoid these false results are suggested. State changes for the defects causing LeTID occur much more slowly than those causing BO LID, and therefore LeTID is predicted to have a lesser impact on the IEC 61215 stress tests results.

14 SOLAR ENERGY↗
NASA NTRS1972

Cyclic creep-rupture behavior of three high-temperature alloys.

Study of some important characteristics of the cyclic creep-rupture curves for the titanium alloy 6Al-2Sn-4Zr-2Mo at 900 and 1100 F (755 and 865 K), the cobalt-base alloy L-605 at 1180 F (910 K), and for two hardness levels of 316 stainless steel at 1300 F (980 K). The cyclic creep-rupture curve relates tensile stress and tensile time-to-rupture for strain-limited cyclic loading and has been found to be independent of the total strain range and the level of compressive stress employed in the cyclic creep-rupture tests. The cyclic creep-rupture curve was always found to be above and to the right of the conventional (constant load) monotonic creep-rupture curve by factors ranging from 2 to 10 in time-to-rupture. This factor tends to be greatest when the creep ductility is large. Cyclic creep acceleration was observed in every cyclic creep-rupture test conducted. The phenomenon was most pronounced at the highest stress levels and when the tensile and compressive stresses were completely reversed. In general, creep rates were found to be lower in compression than in tension for equal true stresses. The differences, however, were strongly material-dependent.

Halford, G. R.↗
DOE OSTI2025

Operation at Reduced Atmospheric Pressure and Concept of Reliability Redundancy for Optimized Design of Insulation Systems

Electrified transportation is calling for insulation design criteria that is adequate to provide elevated levels of power density, power dynamics and reliability. Increasing voltage levels are expected to cause accelerated intrinsic and extrinsic aging effects which will not be easily predictable at the design stage due to a lack of suitable modeling. Designing reliable insulation systems would require finding solutions able to control accelerated aging due to an unpredictable increase of intrinsic stresses and the onset of extrinsic stresses as partial discharges. This paper proposes the concept of reliability redundancy for the insulation design of aerospace electrical asset components, which is also validated at lower-than-standard atmospheric pressure. The principle is that extrinsic-aging-free design might be achieved upon determining the aging stress or abnormal service stresses distribution and being sure that aging will not generate conditions that can incept extrinsic aging (partial discharges) during operation life. However, such information is never, in practice, fully available to insulation system designers. Hence, especially in critical applications such as electrified aircraft, aerospace, and combat ships a further level of reliability should be added to a partial-discharge-free design, which can consist of the use of corona-resistant materials and/or of life models able to consider the accelerated aging effect of partial discharges (or any other type of extrinsic-accelerated aging factor). Innovative life modeling considering both extrinsic and intrinsic aging stresses, insulating material testing to estimate model parameters, and a metric for quantifying the extent of corona (or partial discharge) resistance can lead to establishing feasibility and limit conditions for optimized or fully reliability-redundant design. It is shown in the paper that if an extrinsic-aging-free design is not feasible, and it is therefore replaced by a redundant design, a further level of reliability redundancy can be provided by effective condition monitoring plans.

Montanari, Gian Carlo↗
NASA NTRS1979

Study of fatigue durability of advanced composite materials under conditions of accelerated loading

The effect of temperature on the tension-tension fatigue life of the T300/5208 graphite/epoxy angle-ply laminate system was investigated in an effort to develop an acceptable and reliable method of accelerated loading. Typical S log sub 10 N curves were determined experimentally at 25 C, 75 C, and 115 C. The time-temperature superposition principle was employed to find the shift factors of uniaxial fatigue strength, and a general linear equation of S log sub 10 N for shifting purpose was established. The combined techniques of cyclic creep measurements and optical microscopy upon fatigue failure allow some assessment of the possible physical basis of S log 10 N curve shifting. Before fatigue, the laminates at all test temperatures and stress levels undergo a unique damage mechanism during fatigue loading. It is concluded that an accelerated loading method is feasible.

Shih, H. M.↗
NASA NTRS2006

An Approach to Reliability Testing of Microcircuits at Cryogenic Conditions

This viewgraph presentation reviews an approach to testing microcircuits at cryogenic temperatures. Standard testing procedures are not adequate to test microcircuits that are to operate at cryogenic temperatures. It is therefore necessary to perform analysis of operation conditions and reliability conditions for planning qualification testing of microcircuits at cryogenic temperatures. The major degradations for microcircuits operating at low temperatures depend on the number of switching cycles rather than on the duration of part operation. Therefore instead of accelerating degradation of the parts by increasing the level of stress, the possibility of which is very limited at cryogenic temperatures, the reliability testing can be based on the number of switching cycles.

Teverovsky, Alexander↗
NASA NTRS1984

Assessing photovoltaic module life from long-term environmental tests

An assessment is made of results obtained by an experimental program having as its aim the identification of critical temperature-humidity bias degradation mechanisms in solar cell modules intended to have an operating lifetime of the order of 20-30 years. These mechanisms are studied in the context of conditions encountered over the course of long term operation in various sites in the U.S. Accelerated tests for the assessment of product lifetime entail the development of a correlation between test and application conditions; this has been accomplished through an analytical procedure for the correlation of time-varying field exposures to constant-stress accelerated environments.

Otth, D. H.↗