Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “extreme ultraviolet”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 253 records · Page 14
All sourcesNASA NTRSDOE OSTI
DOE OSTI2025

Open-source simulation program for extreme ultraviolet and soft x-ray sources based on high-harmonic generation

Light sources based on high-harmonic generation (HHG) underpin ultrafast spectroscopy experiments across a large range of photon energies, spanning from the extreme ultraviolet to the soft x-ray. To this day, their design, implementation, and improvement presens unique challenges, but can be aided by numerical tools. Here we present a new simulation program designed for this purpose, which takes both macroscopic and microscopic aspects of high-harmonic generation into account and is therefore applicable across the broad range of parameters which HHG based light sources are today utilized. The program is validated by comparison with published experimental results and by calculating harmonic emission in four common experimental configurations.

Femtosecond lasers↗
NASA NTRS2001

SOLAR-B Mission Extreme Ultraviolet (EUV) Imaging Spectrometer (EIS) Instrument Components

This Monthly Progress Report covers the reporting period through June 2001, Phase C/D, Detailed Design and Development Through Launch Plus Thirty Days, for selected components and subsystems of the Extreme ultraviolet Imaging Spectrometer (EIS) instrument, hereafter referred to as EIS Instrument Components. This document contains the program status through the reporting period and forecasts the status for the upcoming reporting period.

Doschek, George A.↗
DOE OSTI2023

Tangential extreme ultraviolet and soft x-ray diagnostic system for time-resolved temperature measurement on the High Beta Tokamak-Extended Pulse

The High Beta Tokamak-Extended Pulse has recently incorporated a tangential multi-energy extreme ultraviolet and soft x-ray diagnostic system. This system enables measurements of the electron temperature and the examination of mode dynamics within the tokamak. While other systems have been built for poloidal views over similar temperature ranges, this is the first multi-energy tangential-view system designed to work in a temperature range below 200 eV in a tokamak. To facilitate these measurements, a filter wheel comprising five distinct groups of dual-filters has been developed and implemented. By employing a combination of 0.1 μm aluminum and 0.2 μm titanium filters, the system allows estimation of electron temperature profiles through reconstruction of the emission profile using the standard “double-foil” technique. The influence of impurities and filter oxide layers on measurement outcomes is examined. Results reveal that, while the absolute electron temperature values may exhibit some deviations, key characteristics like the electron temperature profile shape and inversion radius during sawtooth events remain consistent. This consistency confirms the system’s suitability for core plasma studies. This system has proven effective in detecting and analyzing internal magnetohydrodynamic phenomena, such as sawteeth.

Instruments & Instrumentation↗
NASA NTRS2001

SOLAR-B Mission Extreme Ultraviolet (EUV) Imaging Spectrometer (EIS) Instrument Components

This Monthly Progress Report covers the reporting period July 2001 of the Detailed Design and Development through Launch plus Thirty Days, Phase C/D, for selected components and subsystems of the Extreme Ultraviolet Imaging Spectrometer (EIS) instrument, hereafter referred to as EIS Instrument Components. This document contains the program status through the reporting period and forecasts the status for the upcoming reporting period.

Doschek, George A.↗
NASA NTRS2002

Solar-B Mission Extreme Ultraviolet (EUV) Imaging Spectrometer (EIS) Instrument Components

This Monthly Progress Report covers the reporting period August 2002 of the Detailed Design and Development through Launch plus Thirty Days, Phase C/D, for selected components and subsystems of the Extreme ultraviolet Imaging Spectrometer (EIS) instrument, hereafter referred to as EIS Instrument Components. This document contains the program status through the reporting period and forecasts the status for the upcoming reporting period.

Doschek, George A.↗
NASA NTRS1982

IUE spectra of Feige 4, a suspected source of extreme-ultraviolet radiation

IUE spectra are presented for Feige 4, a DB-type white dwarf. The observed energy distribution is in good agreement with that predicted by a model atmosphere with an effective temperature of 15,500 K and having extremely low hydrogen and metal abundances. These results are evidence against Feige 4 being the source of the apparent extreme-ultraviolet signal detected by Prognoz 6.

Holm, A. V.↗
NASA NTRS1985

Boron and silicon - Filters for the extreme ultraviolet

Thin films of boron and silicon have been developed using electron beam deposition. The transmissions of these filters were measured from soft X-ray wavelengths to the far ultraviolet and at optical wavelengths. The boron filter transmission peaks near 66 A and the silicon filter peaks near 136 A as expected on theoretical grounds, but the extreme ultraviolet bandpass is narrower than expected. The peak transmission of these filters does not change with time, but the width of the silicon filter bandpass is reduced slightly as the filter ages.

Labov, S.↗
NASA NTRS1993

Extreme Ultraviolet Explorer deep survey observations of a large flare on AU Microscopii

We have made the first extended observation of a stellar flare in the EUV with 100 s time resolution. The flare was detected on AU Mic by the Extreme Ultraviolet Explorer satellite at 12:38 UT on 1992 July 15 during a 4 d observation from 1992 July 14 to 18. This was a large flare detected in the Lexan/boron (65-190 A) band with an observed peak count rate of 7.0 +/- 0.5 counts/s, corresponding to a peak luminosity of 10 exp 30 erg/s in the Lexan/boron bandpass. This is significantly above the measured quiescent level of 0.4 +/- 0.2 counts/s. The flare consisted of a sharp peak lasting about 2 hr, followed by a decaying tail that lasted more than a day. The total EUV energy of the event is estimated to be 3 x 10 exp 34 ergs. A second, smaller flare was also observed and is described. We conclude that the large emission measures on order of 6 x 10 exp 53/cu cm are due to large volumes with characteristic length scales of order the stellar radius. We compare these EUV observations with stellar flare observations in other bandpasses and estimate the likelihood of seeing similar flares in future observations.

Cully, Scott L.↗
NASA NTRS1993

Extreme Ultraviolet Explorer observations of the RS Canum Venaticorum systems AR Lacertae and II Pegasi

We report observations of two RS CVn systems, II Peg and AR Lac, which were calibration targets during the in-orbit checkout phase of the Extreme Ultraviolet Explorer (EUVE). We have determined count rates, and, based on these count rates, preliminary emission measure analyses have been done. The Lexan/boron band count rates were 0.0849 +/- 0.0023 counts/s for AR Lac and 0.218 +/- 0.031 counts/s for II Peg during its quiescent state. Temperatures and emission measures derived from the EUVE data are consistent with previously published values. We also report a flare seen during the II Peg observations which has characteristics similar to previously observed flares on II Peg. During the flare the Lexan/boron count rate increased by at least a factor of 2.5, and the minimum total duration was about 34,000 s (about 9.4 hr).

Petterer, R. J.↗
NASA NTRS2012

The Extreme-ultraviolet Emission from Sun-grazing Comets

The Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory has observed two Sun-grazing comets as they passed through the solar atmosphere. Both passages resulted in a measurable enhancement of extreme-ultraviolet (EUV) radiance in several of the AIA bandpasses.We explain this EUV emission by considering the evolution of the cometary atmosphere as it interacts with the ambient solar atmosphere. Molecules in the comet rapidly sublimate as it approaches the Sun. They are then photodissociated by the solar radiation field to create atomic species. Subsequent ionization of these atoms produces a higher abundance of ions than normally present in the corona and results in EUV emission in the wavelength ranges of the AIA telescope passbands.

Comets↗
NASA NTRS1995

Medium-resolution studies of extreme-ultraviolet emission from CO by electron impact

We report medium-resolution (0.025 nm full width at half maximum (FWHM)) electron impact-induced emission spectra of CO for 20, 100, and 200 eV impact energies. The emission spectra correspond to the extreme ultraviolet transitions from the B (sup 1)Sigma(sup +)(0), and E (sup 1)Pi(0) vibronic states to the X (sup 1)Sigma(sup +)(0) ground state. The present measurements are carried out at 20 times higher spectral resolution (to separate the many blended components) compared to our previous measurements, which were at a spectral resolution of 0.5 nm FWHM. The emission cross sections corresponding to the B (sup 1)Sigma(sup +)(0) yields X (sup 1)Sigma(sup +)(0), C (sup 1)Sigma(sup +)(0) yields X (sup 1)Sigma(sup +)(0), and E (sup 1)Pi(0) yields X (sup 1)Sigma(sup +)(0) resonance transitions were measured. In addition, excitation functions (0-1 keV) extending well into the Born region have been measured for the strong transitions (B (sup 1)Sigma(sup +)(0) yields X (sup 1)Sigma(sup +)(0) and C (sup 1)Sigma(sup +)(0)) and oscillator strengths have been determined, using a modified Born approximation analytic fit to the measured excitation function.

Kanik, Isik↗
DOE OSTI2025

Bismuth-oxo Clusters for Next Generation Extreme Ultraviolet Light Photolithography

Photolithography is the primary technique used for the patterning of semiconducting materials for chip manufacturing; however, as requisite pattern dimensions and feature sizes continue to decrease, state-of-the-art lithographic methods now require the use of 13.5 nm extreme ultraviolet (EUV) light. The shift toward these higher energy wavelengths of light has resulted in a need for new single component materials, with high EUV absorption cross sections and high etch resistance. Herein, we report the exploration of Bi 9 O 7 (hfac) 13 as the first bismuth oxo cluster based EUV photoresist. It was determined this material has an exceptional EUV linear absorption coefficient (24 μm –1 ), nearly an order of magnitude larger than commercially available chemically amplified resists (CARs) (∼5 μm –1 ). Additionally, the resist was determined to be highly sensitive to EUV exposure and displayed a dose-to-gel of 10 mJ/cm 2 , undergoing ligand decomposition during exposure and cross-linking during the postexposure bake, which was supported by FTIR and residual gas analysis. In conclusion, this class of bismuth-oxo cluster resists can lead to the development of more efficient, effective and safe EUV resist materials required for next-generation photolithography.

MacKenzie, Harvey K. [Univ. of Victoria, BC (Canad↗
NASA NTRS1989

Medium-resolution studies of extreme ultraviolet emission from N2 by electron impact - Vibrational perturbations and cross sections of the c4-prime 1Sigma(+)u and b-prime 1Sigma(+)u states

In a crossed-beam experiment the electron-impact-induced fluorescence spectrum of N2 in the extreme ultraviolet is studied at a spectral resolution of up to 0.03 nm. The optically thin experiment obtained the highest-resolution electron-impact emission spectrum of the Rydberg and valence states of N2. The spectral measurements provide the emission cross sections of each of the vibrational transitions of the Carroll-Yoshino and the Birge-Hopfield-II band systems. Laboratory vibrational-excitation cross sections arising from the mutual perturbation of the c4-prime 1Sigma(+)u and b-prime 1Sigma(+)u states by homogeneous configuration interactions are measured from 10 to 400 eV, and a modified Born approximation analytic model is given for them. The analysis leads to accurate band-system oscillator strengths. The relative emission and excitation cross sections each of the vibrational levels are compared. In addition, low-resolution measurements of the cross section of the atomic dissociation fragments (NI, NII, NIII) from 40 to 102 nm are made, and medium-resolution measurements are made of the emission cross section of the c4 1Pi(u), c5-prime 1Sigma(+)u, c5 1Pi(u), and c6-prime 1Sigma(+)u to X 1Sigma(+)g (0,0) transitions.

Ajello, Joseph M.↗
NASA NTRS1995

New model of iron spectra in the extreme ultraviolet and application to SERTS and EUV observations: A solar active region and capella

We report new predictions for the EUV spectral emission of FeIX-FeXXIV, based on data now available from the Solar EUV Rocket Telescope and Spectrograph (SERTS) and the Extreme Ultraviolet Explorer (EUVE) spectrometers. The iron spectral emission model is the first result of a larger effort to revise the Raymond & Smith model and to update the atomic rates. We present here predicted emissivities for selected densities and temperatures applicable to various astrophysical plasmas. Comparisons of our predicted spectra with two recent observations provide important tests of the atomic data. They also test to some extent some basic assumptions of coronal emission codes: optically thin spectral lines and ionization equilibrium.

Brickhouse, N. S.↗
NASA NTRS2012

The Extreme Ultraviolet (EUV) Instrument for the MAVEN Mission

The Mars Atmosphere and Volatile Evolution Mission (MAVEN) will explore the variability in the planet's upper atmosphere and ionosphere that is dominated by interactions with the sun, specifically the high-energy photons in the soft X-ray and extreme ultraviolet wavelengths as well as interactions with the solar wind. Scientists will use MAVEN data to determine the current loss rate of volatile compounds from the Mars atmosphere, then extrapolate back in time in order to give historical estimations of state of the Mars atmosphere and climate, its ability to sustain liquid water, and the potential for the Martian habitability. The EUV instrument is critical in measuring the Space Weather driver of this atmospheric variability. It will directly observe a three EUV wavelength ranges and their variability due to solar flares (time scales of seconds to hours) as well as active region evolution (months), which will then act as proxies for a model to determine the entire 0.1-200 nm solar spectrum at all times during the MAVEN mission. These EUV measurements and models results will compliment the other instruments that will provide direct in-situ as well as remote sensing observations of the Martian atmospheric response to this solar driver. This presentation will be an introduction of this instrument and its science measurements and goals to the larger community, as well as a status report on its progress.

Chamberlin, Phillip C.↗
NASA NTRS1982

Extreme ultraviolet imaging spectrometer for thermospheric emissions

One of the instruments that has been developed to fly on the Space Shuttle is the Imaging Spectrometric Observatory, an array of five imaging spectrometers to cover the 300-12,000-A wavelength range. In this paper the spectrometer designed to operate in the extreme ultraviolet is described. The instrument is intended for studies of the thermosphere and magnetosphere and support of various plasma experiments to be performed from the Shuttle. The design is modular so that various components such as gratings and detectors can be changed and optimized for a range of specific studies following the first survey mission. The detector is an intensified 2-D CCD which permits simultaneous spectral and spatial imaging. The spectral multiplexing gives the spectrometer a considerable speed advantage. The instrument has a small field of view and is thus capable of obtaining much needed scale height information on the atmospheric EUV emissions. Operating from the Shuttle, global and temporal coverage will be obtained, and the EUV data will be enhanced by the simultaneously acquired UV, visible, and near-IR observations.

Torr, M. R.↗