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At least 253 records · Page 14

Development of techniques and associated instrumentation for high temperature emissivity measurements

The progress during the sixth quarterly period is reported on construction and assembly of a test facility to determine the high temperature emittance properties of candidate thermal protection system materials for the space shuttle. This facility will provide simulation of such reentry environment parameters as temperature, pressure, and gas flow rate to permit studies of the effects of these parameters on the emittance stability of the materials. Also reported are the completed results for emittance tests on a set of eight Rene 41 samples and one anodized titanium alloy sample which were tested at temperatures up to 1600 F in vacuum. The data includes calorimetric determinations of total hemispherical emittance, radiometric determinations of total and spectral normal emittance, and pre- and post-test room temperature reflectance measurements.

Cunnington, G. R.↗

Development of techniques and associated instrumentation for high temperature emissivity measurements

The calibrating and testing procedures for the radiometric emittance measurement apparatus are described. Test results are given for the NBS platinum-rhodium standard (SRM No. 1409), the NBS oxidized Kanthal standard, and the oxidized Rene 41 materials. Results indicate that with the platinum-rhodium standard the measurement system compared with the NBS data to within 0.02 for both total and spectral normal emitttance. Data from the Kanthal strip was consistently higher than NBS values. For oxidized Rene 41, no significant changes in as prepared emittance was observed. The emittance was stable for temperatures up to 1150 K.

Cunnington, G. R.↗

Development of techniques for advanced optical contamination measurement with internal reflection spectroscopy, phase 2, volume 2

Attenuated total reflectance spectra of individual contaminants in space simulation chambers are presented as well as spectra of mixtures and figures exhibiting the effects of film thickness on reflectance spectra. Detailed calibration spectra were made for three selected concentrations (film thickness) for two contaminants and for one concentration for all contaminants.

Hayes, J. D.↗