NASA NTRS1972
Measurement of the refractive indices of 2H SiC over the wavelength range from 435.8 to 650.9 nm by the method of minimum deviation. A curve fit of the experimental data to the Cauchy dispersion equation yielded, for the ordinary index, n sub zero = 2.5513 + 25,850/lambda squared + 8.928 x 10 to the 8th power/lambda to the 4th power and, for the extraordinary index, n sub e = 2.6161 + 28,230/lambda squared + 11.490 x 10 to the 8th power/lambda to the 4th power when lambda is expressed in nm. The estimated error (standard deviation) in these values is plus or minus 0.0006 for n sub zero and plus or minus 0.0009 for n sub e. The birefringence calculated from these expressions is about 20% less than previously published values.