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At least 253 records · Page 14

Interpenetration and deflection phenomena in collisions between supersonic, magnetized, tungsten plasma flows diagnosed using high resolution optical Thomson scattering

An optical Thomson scattering diagnostic has been used to investigate collisions between supersonic, magnetized plasma flows, in particular the transition from collisionless to collisional interaction dynamics. These flows were produced using tungsten wire array z-pinches, driven by the 1.4 MA 240 ns Magpie generator at Imperial College London. Measurements of the collective-mode Thomson scattering ion-feature clearly indicate that the ablation flows are interpenetrating at 100 ns (after current start), and this interpenetration continues until at least 140 ns. The Thomson spectrum at 150 ns shows a clear change in the dynamics of the stream interactions, transitioning towards a collisional, shock-like interaction of the streams near the axis. The Thomson scattering data also provide indirect evidence of the presence of a significant toroidal magnetic field embedded in the “precursor” plasma near the axis of the array over the period 100–140 ns; these observations are in agreement with previous measurements [Swadling et al., Phys. Rev. Lett. 113, 035003 (2014)]. The Thomson scattering measurements at 150 ns suggest that this magnetic field must collapse at around the time the dense precursor column begins to form.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Analysis of Multilayer Devices for Superconducting Electronics by High-Resolution Scanning Transmission Electron Microscopy and Energy Dispersive Spectroscopy

We used a focused ion beam to obtain cross-sectional specimens from both magnetic multilayer and Nb/Al-AlOx/Nb Josephson junction devices for characterization by scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDX). An automated multivariate statistical analysis of the EDX spectral images produced chemically unique component images of individual layers within the multilayer structures. STEM imaging elucidated distinct variations in film morphology, interface quality, and/or etch artifacts that could be correlated to magnetic and/or electrical properties measured on the same devices.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si ++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm 2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si ++ ions and 60 keV Li + ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Advances in Image-Domain Multi-Resolution and Super-Resolution Algorithms for Industrial X-Ray Computed Tomography: A Literature Survey and New Insights

Industrial X-ray Computed Tomography (XCT) is a nondestructive method for inspection and character ization of materials and parts. XCT captures images of a part from various angles, and these images are then used to construct Three-Dimensional (3D) representations of that part. This method enables assessing the quality of the parts, identifying defects and understanding their physical properties without damaging them.

36 MATERIALS SCIENCE↗