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At least 253 records · Page 14

All sources NASA NTRS DOE OSTI

DOE OSTI2012

Arc spray termination of extended foil capacitors

Twin wire arc spray is evaluated as a termination method for the fabrication of extended foil wound capacitors. A full design of experiments is performed, analyzing various spray processing conditions and their effects on relevant electrical performance. Cross sectional metallography and electrical testing are used to evaluate potential damage caused by the deposition process as well as the overall quality of the finished capacitor sprayed under different conditions. Major findings are consistent with previously published work indicating that arc spray is a viable candidate for terminating foil capacitors.

Hall, Aaron Christopher↗

DOE OSTI2013

Capacitor discharge pulse analysis.

Capacitors used in firing sets and other high discharge current applications are discharge tested to verify performance of the capacitor against the application requirements. Parameters such as capacitance, inductance, rise time, pulse width, peak current and current reversal must be verified to ensure that the capacitor will meet the application needs. This report summarizes an analysis performed on the discharge current data to extract these parameters by fitting a second-order system model to the discharge data and using this fit to determine the resulting performance metrics. Details of the theory and implementation are presented. Using the best-fit second-order system model to extract these metrics results in less sensitivity to noise in the measured data and allows for direct extraction of the total series resistance, inductance, and capacitance.

Baker, Michael Sean↗

NASA NTRS1974

Evaluation of wet tantalum capacitors after exposure to extended periods of ripple current, volume 1

The application of tantalum capacitors in the Viking Lander includes both dc voltage and ripple current electrical stress, high temperature during nonoperating times (sterilization), and high vibration and shock loads. The capacitors must survive these severe environments without any degradation if reliable performance is to be achieved. A test program was established to evaluate both wet-slug tantalum and wet-foil capacitors under conditions accurately duplicating actual Viking applications. Test results of the electrical performance characteristics during extended periods of ripple current, the characteristics of the internal silver migration as a function for extended periods of ripple current, and the existence of any memory characteristics are presented.

Watson, G. W.↗

NASA NTRS1974

Tantalum capacitor behavior under fast transient overvoltages

Tantalum capacitors were tested to determine failure time when subjected to short-duration, high-voltage surges caused by lightning strikes. Lightning is of concern to NASA because of possible damage to critical spacecraft circuits. The test was designed to determine the minimum time for tantalum capacitor failure and the amount of overvoltage a capacitor could survive, without permanent damage, in 100 microseconds. All tested exhibited good recovery from the transient one-shot pulses with no failure at any voltage, forward or reverse, in less than 25 microseconds.

Zill, J. A.↗

NASA NTRS1975

Evaluation of wet tantalum capacitors after exposure to extended periods of ripple current, volume 2

The application of tantalum capacitors in the Viking Lander includes dc voltage and ripple current electrical stress, high temperature during nonoperating times (sterilization), and high vibration and shock loads. The capacitors must survive these severe environments without any degradation if reliable performance is to be achieved. A test program was established to evaluate both wet-slug tantalum and wet-foil capacitors under conditions accurately duplicating actual Viking applications. Test results of the electrical performance characteristics during extended periods of ripple current, the characteristics of the internal silver migration as a function of extended periods of ripple current, and the existence of any memory characteristics are presented.

Ward, C. M.↗

NASA NTRS1976

Technological development of high energy density capacitors

A study was conducted to develop cylindrical wound metallized film capacitors rated 2 micron F 500 VDC that had energy densities greater than 0.1J/g. Polysulfone (PS) and polyvinylidene (PVF2) were selected as dielectrics. Single film PS capacitors of 0.2J/g (uncased) were made of 3.75 micron material. Single film PVF2 capacitors of 0.19J/g (uncased) were made of 6.0 micron material. Corona measurements were made at room temperature, and capacitance and dissipation factor measurements were made over the ranges 25 C to 125 C and 120 Hz to 100 kHz. Nineteen of twenty PVF2 components survived a 2500 hour dc plus ac life test. Failure analyses revealed most failures occurred at wrinkles, but some edge failures were also seen. A 0.989g case was designed. When the case was combined with the PVF2 component, a finished energy density of 0.11J/g was achieved.

Parker, R. D.↗

NASA NTRS1977

The tantalum-cased tantalum capacitor

Tantalum-cased tantalum capacitors were tested with regard to temperature stability, capacitance ratio, surge current capabilities, shock, vibration, and thermal shock. They were found to be superior to the conventional wet slug tantalum capacitor cased in silver, since they are more resistant to sulfuric acid. The tantalum-cased tantalum capacitors are widely accepted for use in critical electronic equipment because of their excellent performance and reliability.

Moynihan, J. D.↗

NASA NTRS1978

Regulated high efficiency, lightweight capacitor-diode multiplier dc to dc converter

A voltage multiplier having a capacitor-diode voltage multiplying network is disclosed which is fed with voltage pulses from a dc source through a first switching means. Pulses of a second polarity are also supplied through a second switching means to the input of the capacitor-diode voltage multiplier from a second dc source whose voltage is adjustable to change the voltage of the pulses of second polarity. The switching means are alternately rendered conducting by signals from a control circuit. The second dc source may be controlled by a voltage comparator which compares the output voltage of the capacitor-diode voltage multiplier to the reference source.

Harrigill, W. T., Jr.↗

NASA NTRS1981

Unstable insulation resistance in ceramic capacitors

The effects of low and varying values of insulation resistance (IR) and their significance in the cause of failure in ceramic capacitors were investigated. Two specific instances involving hardware failure involving ceramic capacitors were examined. It is shown that monolithic, multilayer ceramic capacitors may exhibit low and unstable IR at low voltages, or exhibit no voltage. Other significant results are reported.

Holladay, A. M.↗

NASA NTRS1981

Influence of current needs on the advancement of aluminum electrolytic capacitors

The need for cost effective, high performance, long life capacitors with improved reliability is discussed. It is shown that a low cost, miniature aluminum capacitor, with improved reliability and proven life, can be produced with existing technology. It is further shown that the capacitor can be specified for 125 C life and shelf test requirements, and meet established standards for their parametric performance.

Moresi, J. A.↗

NASA NTRS1985

Capacitor-Test System

Polycarbonate film capacitors tested for leakage paths with microprocessor controlled multiplexer test sequence. Microprocessor based capacitor test system simultaneously monitors 80 capacitors.

Ott, F. M.↗

NASA NTRS1983

High-current, high-frequency capacitors

The NASA Lewis high-current, high-frequency capacitor development program was conducted under a contract with Maxwell Laboratories, Inc., San Diego, California. The program was started to develop power components for space power systems. One of the components lacking was a high-power, high-frequency capacitor. Some of the technology developed in this program may be directly usable in an all-electric airplane. The materials used in the capacitor included the following: the film is polypropylene, the impregnant is monoisopropyl biphenyl, the conductive epoxy is Emerson and Cuming Stycast 2850 KT, the foil is aluminum, the case is stainless steel (304), and the electrode is a modified copper-ceramic.

Renz, D. D.↗

NASA NTRS1983

Material considerations for high frequency, high power capacitors

Dielectric materials chosen for use in this high frequency, high power capacitor must endure hard vacuum conditions, high currents (up to 125 A rms), and frequencies up to 40 kHz. Temperature requirements for this type of capacitor are that capacitor operation must be efficient up to 125 C. A more stringent requirement for the sold dielectric is that the temperature coefficient of dissipation factor should indicate self stabilization well below 125 C. In addition, the dielectric temperature coefficient of capacitance should be negative.

White, W.↗

NASA NTRS1986

Determining Internal Connections in Capacitors

Simple electrical test shows which terminals connected to outer capacitor foil. Test makes it unnecessary to resort to X-ray inspection to distinguish terminals. When outer foil of capacitor is attached to ungrounded signal-generator output lead, oscilloscope displays higher waveform amplitude. When outer foil is joined to grounded signalgenerator output lead, waveform amplitude is lower. Test also used to determine internal connections in multiple-element capacitors.

Ott, F. M.↗

NASA NTRS1984

MOSFET and MOS capacitor responses to ionizing radiation

The ionizing radiation responses of metal oxide semiconductor (MOS) field-effect transistors (FETs) and MOS capacitors are compared. It is shown that the radiation-induced threshold voltage shift correlates closely with the shift in the MOS capacitor inversion voltage. The radiation-induced interface-state density of the MOSFETs and MOS capacitors was determined by several techniques. It is shown that the presence of 'slow' states can interfere with the interface-state measurements.

Benedetto, J. M.↗

NASA NTRS1986

Capacitor-type micrometeoroid detectors

The metal oxide semiconductor (MOS) capacitor micrometeroid detector consists of a thin dielectric capacitor fabricated on a silicon wafer. In operation, the device is charged to a voltage level sufficiently near breakdown that micrometeoroid impacts will cause dielectric deformation or heating and subsequent arc-over at the point of impact. Each detector is capable of recording multiple impacts because of the self-healing characteristics of the device. Support instrumentation requirements consist of a voltage source and pulse counters that monitor the pulse of recharging current following every impact. An investigation has been conducted in which 0.5 to 5 micron diameter carbonized iron spheres traveling at velocities of 4 to 10 Km/sec were impacted on to detectors with either a dielectric thickness of 0.4 or 1.0 micron. This study demonstrated that an ion microprobe tuned to sufficiently high resolution can detect Fe remaining on the detector after the impact. Furthermore, it is also possible to resolve Fe ion images free of mass interferences from Si, for example, giving its spatial distribution after impact. Specifically this technique has shown that significant amounts of impacting particles remain in the crater and near it which can be analyzed for isotopic content. Further testing and calibration could lead to quantitive analysis. This study has shown that the capacitor type micrometeroid detector is capable of not only time and flux measurements but can also be used for isotopic analysis.

Wortman, J. J.↗

NASA NTRS1989

Low-Inductance Capacitor For Low Temperatures

Planar capacitor made on epoxy/fiberglass printed-circuit board. Planar design and flat copper plates ensure low inductance and low series resistance. Planar construction minimized effects of thermal contraction, and epoxy/fiberglass substrate ensured high breakdown voltage. Design is simple, and this type of capacitor easy for any printed-circuit-board facility to fabricate. Design suitable for any small-capacitance, high-voltage capacitor, whether operating at low or high temperature.

Rhodes, David B.↗

NASA NTRS1991

Ferroelectric Memory Capacitors For Neural Networks

Thin-film ferroelectric capacitors proposed as nonvolatile analog memory devices. Intended primarily for use as synaptic connections in electronic neural networks. Connection strengths (synaptic weights) stored as nonlinear remanent polarizations of ferroelectric films. Ferroelectric memory and interrogation capacitors combined into memory devices in vertical or lateral configurations. Photoconductive layer modulated by light provides variable resistance to alter bias signal applied to memory capacitor. Features include nondestructive readout, simplicity, and resistance to ionizing radiation. Interrogated without destroying stored analog data. Also amenable to very-large-scale integration. Allows use of ac coupling, eliminating errors caused by dc offsets in amplifier circuits of neural networks.

Thakoor, Sarita↗