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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 235 records · Page 13

Radiation Engineering for Designers

This tutorial provides an overview of the natural space radiation environment, an introduction to radiation effect types, an overview of EEE parts selection, scrubbing, and radiation mitigation, and an introduction to radiation testing.

radiation effects↗

Resistance and Cooling Power of Various Radiators

This reports combines the wind tunnel results of radiator tests made at the Navy Aerodynamical Laboratory in Washington during the summers of 1921, 1925, and 1926. In all, 13 radiators of various types and capacities were given complete tests for figure of merit. Twelve of these were tested for resistance to water flow and a fourteenth radiator was tested for air resistance alone, its heat dissipating capacity being known. All the tests were conducted in the 8 by 8 foot tunnel, or in its 4 by 8 foot restriction, by the writer and under conditions as nearly the same as possible. That is to say, as far as possible, the general arrangement and condition of the apparatus, the observation intervals, the ratio of water flow per unit of cooling surface, the differential temperatures, and the air speeds were the same for all.

Smith, R H↗

In-Situ Testing Methods for Mixed-Mode Harsh Environments

Future NASA missions are driving a need for instrumentation and space electronics that will operate at extreme temperatures, with low mass and extended deployments. This need results in devices that will experience dose damage at both low and high temperatures that will suppress annealing and induce accelerated wear out issues. Therefore, the ability to perform radiation tests on devices at temperature is critical. This paper analyses the methods and process to enable these test as developed at the JPL Dynamitron Facility. Since electronics are the radiation source for this facility, the steps to ensure parity with cobalt-60 testing are discussed. Also discussed are the implications for system level testing and mixed radiation mode testing for highly integrated and scaled devices.

Scheick, Leif Z↗

Deep Space Test Bed for Radiation Studies

The Deep Space Test-Bed (DSTB) Facility is designed to investigate the effects of galactic cosmic rays on crews and systems during missions to the Moon or Mars. To gain access to the interplanetary ionizing radiation environment the DSTB uses high-altitude polar balloon flights. The DSTB provides a platform for measurements to validate the radiation transport codes that are used by NASA to calculate the radiation environment within crewed space systems. It is also designed to support other Exploration related investigations such as measuring the shielding effectiveness of candidate spacecraft and habitat materials, testing new radiation monitoring instrumentation and flight avionics and investigating the biological effects of deep space radiation. We describe the work completed thus far in the development of the DSTB and its current status.

Adams, James H.↗

Antifuse FPGA for Space Applications

This paper presents viewgraphs of Antifuse FPGA (Field Programmable Gate Array) for Space Applications. The topics include: 1) A32140DX TID Test; 2) A1280XL Proton Test; 3) SEU (Single Event Upsets) Rate Calculation; 4) Recent Products Test; 5) A1460A TID (Traveling Ionospheric Disturbances) Test; 6) I100 Proton Test; 7) 100/RHI100 SEU Test; 8) I100/RH100 TID Test; 9) A1020S TID Test; 10) TID Charge Pump Failure; 11) Radiation Testing; and SEE (Single Event Effects) Test Setup.

Wang, Jih-Jong↗

Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal

Electronic parts (integrated circuits) have grown in complexity such that determining all failure modes and risks based on single particle event radiation testing is impossible. In this presentation, the authors will present why this is so and provide some realism on what this means to FPGAs. Its all about understanding actual risks and not making assumptions.

radiation testing↗

Degradation of Precision Reference Devices in Space Environments

This paper presents radiation test results for several different precision voltage devices. Their degradation is compared to that expected for the basic bandgap reference circuit, which is used as a theoretical benchmark, and uses only npn transistorss.

Precision↗

Lifecycle Management of Nuclear Security Radiation Detection Systems: Testing and Evaluation

The lifecycle of radiation detection systems functioning within a State’s Nuclear Security Detection Architecture encompasses all activities associated with acquisition, deployment, and eventual disposal. Throughout a system’s lifecycle, testing and evaluation activities are needed to ensure requirements are continually met, as underscored by recent experiences.This paper provides:1.A discussion of reasons why testing should be part of the radiation detection equipment lifecycle before, during, and after acquisition.2.A general process for determining applicable evaluation methods.3.A discussion of issues related to integrating testing and evaluation into procurement and operational processes and mitigation strategies.

Harris, Tyrone↗

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Field Programmable Gate Array (FPGA)↗

Self-powered Through-wall communication for dry cask storage monitoring

Many nuclear facilities, such as spent fuel storage dry casks and nuclear reactor pressure vessels, are entirely sealed by metal layers to prevent harmful radiation. For safety and security operations, the temperature, pressure, radiation, and humidity inside the vessel needs to be closely monitored. However, no practical technology is currently available to realize the through-wall data communication and monitoring for these vessels due to the inside harsh environment of high temperature and nuclear radiation. In this paper, an innovative self-powered wireless through-wall data communication system for the nuclear environment is presented, which demonstrates a successful solution to such challenges. The presented system is composed of four modules, i.e., energy harvester with power management circuits, ultrasound wireless communication using high-temperature piezoelectric transducers, electronic circuits for sensing and data transmission, and radiation shielding for electronics. Here, constitutive functions of each module were firstly designed and followed by the system integration. Experiments were conducted subsequently to validate the designed functions and evaluate the performance of the integrated system. Results showed that the average power of over 40 mW was harvested from the thermal flow inside the nuclear spent fuel canisters which could provide enough energy to operate the sensing and data communication systems. The gamma radiation test results showed that the thermoelectric energy harvester and ultrasound transceivers can withstand radiation dosing over 100 Mrad. Furthermore, temperature shock tests demonstrated that the entire system including the shielded electronics can survive and maintain their functionalities at temperatures as high as 195°C. Under the in-lab mocked-up high temperature conditions and radiation shielding, the proposed system is foreseen to survive and operate stably for fifty years inside a nuclear spent fuel canister, and send the frequency modulated data out of the canister for 3 s in every 10 min.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Total-dose radiation effects data for semiconductor devices. 1985 Supplement. Volume 2, part B

Steady-state, total-dose radiation test data are provided in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 (Parts A and B) provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done steady-state 2.5-MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose. All data were generated in support of NASA space programs by the JPL Radiation Effects and Testing Group (514).

Martin, K. E.↗