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At least 235 records · Page 13

Camera Calibration and Alignment Metrology at Johnson Space Center’s Electro-Optics Laboratory

It is increasingly common to see spacecraft equipped with cameras for the purpose of navigation. Images are either sent to Earth or processed autonomously on-board to provide information about the vehicle’s position, velocity, and/or attitude. These can be images of stars or celestial bodies for absolute navigation, or images of another spacecraft for relative navigation. While monocular cameras do not provide range information, the images they capture can be processed to determine bearing vectors to target objects within the camera’s field of view. For a camera to be effective in navigation, it must be carefully calibrated and aligned. This involves accurately modeling the optical effects that govern the projection of line-of-sight directions onto the camera’s pixels and determining the camera’s orientation relative to the spacecraft’s reference frame. Engineers at Johnson Space Center’s Electro-Optics Lab regularly perform camera inspection, calibration, and alignment metrology. This was done for the Orion Optical Navigation (OpNav) Camera, the Orion Docking Camera (DCAM), and for numerous cameras belonging to commercial partners. The nature of optical navigation means that cameras must be well-calibrated and their attitude well understood to provide high accuracy bearing measurements to the navigation filter. The stringent accuracy requirements for Orion could not have been met using traditional checkerboard camera calibration or by simply relying on design drawings. This paper details the hardware, software, techniques, and algorithms used by the EOL team to achieve this level of accuracy.

Paul McKee↗

High Throughput In-Line Coating Metrology Development for Solid Oxide Fuel Cell Manufacturing

Coatings play key roles in solid oxide fuel cell (SOFC) stack durability. For example, diffusion barrier coatings on Cr-containing interconnect and balance of plant (BOP) components protect electrodes from Cr poisoning over the long operational lifetimes (>10,000 hours) of the fuel cell stack. Common defects in coatings, such as cracks, pinholes, and porosity, result in a failure to protect the electrodes, resulting in shorter operational lifetime and thus higher cost. It is very unlikely, even in the best coating process, that all these defects can be mitigated, hence identifying critical defects in parts, and removing defective parts from production before they can damage the stack, becomes paramount. Furthermore, these quality control techniques must be operational in the production/assembly line (in-line), i.e., high throughput and non-destructive, and cost effective. Redox Power Systems, LLC (Redox) together with the National Renewable Energy Laboratory (NREL) developed much needed high throughput, in-line metrology techniques for protective coatings. The overall goal of the project is to lower cost while increasing robustness, reliability, and endurance of SOFC stacks. To accomplish this, we had several objectives, including: to identify key coating and substrate defects that lead to coating failure through the use of detailed characterization methods (e.g., microscopy, XRD, EDS, electrochemistry); to assess capabilities of in-line metrology techniques, e.g., optical profilometry (Redox) and thermography (NREL), to probe these defects, or evidence thereof; demonstrate long-term performance of “defect-free” protective coatings, as identified by in-line metrology, in solid oxide fuel cell (SOFC) stack operation. In the first part of this project, the ability to identify key defects expected to lead to coating and SOFC degradation using in-line metrology tools were evaluated. Coated interconnect samples with controlled defect types and populations were tested under conditions similar to SOFC operation, followed by detailed post-test analysis to reveal the defects responsible for observed degradation. In the second part of the project, the optimal in-line metrology techniques and methodologies were used to map the defect distribution in full-size interconnects with critical defects intentionally allowed to exist in some cases. These interconnects underwent SOFC testing for extended periods (up to ~3,000 hours) followed by post-test analysis to evaluate the effectiveness of in-line metrology techniques in mitigating MCO coating related degradation. Key accomplishments in this project included the following: Demonstrated ASR of < 0.05 ohm-cm 2 at 650 °C for 1,000 hours with low defect (determined by in-line metrology) interconnect samples (average ASR=37 milliohms-cm 2 after over 1,000 hours). Demonstrated that low defect coatings on interconnects (as screened using in-line metrology) have low volatilization of chromium at ~650 °C for 1,000 hours as detected using Cr-getter material (< 5 at% increase above baseline); 1022 hour duration tests under humidified, elevated temperature (750 °C rather than 650 °C) compared a base case against different coating thicknesses. Demonstrated capability to identify initial key defects of interest with in-line metrology techniques using up to 8 cm by 10 cm having coatings with and without intentional defects of interest using thermal imaging and optical profilometry. Correlated key defects identified using metrology techniques with observed coating performance (e.g., ASR and Cr volatility). Conducted several 4 cm by 4 cm cell tests using MCO-interconnects that were pre-screened using some of the metrology techniques developed in the project (e.g., optical profilometry). An analysis of ASR measurements were able to show that defect-free coatings resulted in the anticipated performance in the cell tests.

01 COAL, LIGNITE, AND PEAT↗

NASA Tech Briefs, July 2008

Topics covered include: Torque Sensor Based on Tunnel-Diode Oscillator; Shaft-Angle Sensor Based on Tunnel-Diode Oscillator; Ground Facility for Vicarious Calibration of Skyborne Sensors; Optical Pressure-Temperature Sensor for a Combustion Chamber; Impact-Locator Sensor Panels; Low-Loss Waveguides for Terahertz Frequencies; MEMS/ECD Method for Making Bi(2-x)Sb(x)Te3 Thermoelectric Devices; Low-Temperature Supercapacitors; Making a Back-Illuminated Imager with Back-Side Contact and Alignment Markers; Compact, Single-Stage MMIC InP HEMT Amplifier; Nb(x)Ti(1-x)N Superconducting-Nanowire Single-Photon Detectors; Improved Sand-Compaction Method for Lost-Foam Metal Casting; Improved Probe for Evaluating Compaction of Mold Sand; Polymer-Based Composite Catholytes for Li Thin-Film Cells; Using ALD To Bond CNTs to Substrates and Matrices; Alternating-Composition Layered Ceramic Barrier Coatings; Variable-Structure Control of a Model Glider Airplane; Axial Halbach Magnetic Bearings; Compact, Non-Pneumatic Rock-Powder Samplers; Biochips Containing Arrays of Carbon-Nanotube Electrodes; Nb(x)Ti(1-x)N Superconducting-Nanowire Single-Photon Detectors; Neon as a Buffer Gas for a Mercury-Ion Clock; Miniature Incandescent Lamps as Fiber-Optic Light Sources; Bidirectional Pressure-Regulator System; and Prism Window for Optical Alignment. Single-Grid-Pair Fourier Telescope for Imaging in Hard-X Rays and gamma Rays Range-Gated Metrology with Compact Optical Head Lossless, Multi-Spectral Data Compressor for Improved Compression for Pushbroom-Typetruments.

Source record↗

Glass sample characterization

The development of in-house integrated optical performance modelling capability at MSFC is described. This performance model will take into account the effects of structural and thermal distortions, as well as metrology errors in optical surfaces to predict the performance of large an complex optical systems, such as Advanced X-Ray Astrophysics Facility. The necessary hardware and software were identified to implement an integrated optical performance model. A number of design, development, and testing tasks were supported to identify the debonded mirror pad, and rebuilding of the Technology Mirror Assembly. Over 300 samples of Zerodur were prepared in different sizes and shapes for acid etching, coating, and polishing experiments to characterize the subsurface damage and stresses produced by the grinding and polishing operations.

Ahmad, Anees↗

Rules for Optical Testing

Based on 30 years of optical testing experience, a lot of mistakes, a lot of learning and a lot of experience, I have defined seven guiding principles for optical testing - regardless of how small or how large the optical testing or metrology task: Fully Understand the Task, Develop an Error Budget, Continuous Metrology Coverage, Know where you are, Test like you fly, Independent Cross-Checks, Understand All Anomalies. These rules have been applied with great success to the inprocess optical testing and final specification compliance testing of the JWST mirrors.

Stahl, H. Philip↗

Ambient Optomechanical Alignment and Pupil Metrology for the Flight Instruments Aboard the James Webb Space Telescope

The James Webb Space Telescope science instruments are in the final stages of being integrated into the Integrated Science Instrument Module (ISIM) element. Each instrument is tied into a common coordinate system through mechanical references that are used for optical alignment and metrology within ISIM after element-level assembly. In addition, a set of ground support equipment (GSE) consisting of large, precisely calibrated, ambient, and cryogenic structures are used as alignment references and gauges during various phases of integration and test (I&T). This GSE, the flight instruments, and ISIM structure feature different types of complimentary metrology targeting. These GSE targets are used to establish and track six degrees of freedom instrument alignment during I&T in the vehicle coordinate system (VCS). This paper describes the optomechanical metrology conducted during science instrument integration and alignment in the Spacecraft Systems Development and Integration Facility (SSDIF) cleanroom at NASA Goddard Space Flight Center (GSFC). The measurement of each instrument's ambient entrance pupil location in the telescope coordinate system is discussed. The construction of the database of target locations and the development of metrology uncertainties is also discussed.

Optomechanical Alignment↗

SIM testbed 3 real-time control software

SIM System Testbed 3 (STB3) features three optical interferometers sharing a common baseline, as a dynamic representation of the SIM instrument. An artificial star feeding the interferometers is installed on a separate optics bench. All three interferometers use photons captured by avalanche photo diodes (APDs) to measure the position and quality of fringes, and additional pointing precision is achieved by fast steering mirrors (FSMs) that keep the star images centered on the beam combining optics using a CCD camera. Each interferometer uses internal metrology to measure changes in its optical pathlength. External metrology beams measure changes in the baseline vector. This system acquires and tracks white light fringes with one interferometer, while the other two acquire and track laser light fringes representing the bright guide stars that will be used by SIM. The white light source represents a dim star that cannot supply enough photons for the Science interferometer to lock onto fringes in closed-loop mode; instead it operates open-loop, using pathlength corrections fed to it from the two guide interferometers and the external metrology subsystem to reject disturbances and maintain the fringes. This tracking mode is known as Pathlength Feed Forward (PFF). The precise real-time behavior required to achieve this result is implemented by a complex set of interacting software control loops. This paper describes how these loops take advantage of the benefits of the RTC Core architecture, and how they work together to accomplish STB3's objectives.

interferometry↗

Endoscopic measurement using radial metrology with digital correlation

Radial metrology combines standard optical measurement techniques with a unique panoramic annular lens (PAL) system to study material properties and deformations on the inner surfaces of the cavities found, for example, inside pipes, tubes, and boreholes. A PAL profilometer using speckle metrology is analyzed and the equations obtained from the analysis are used to calibrate the PAL profilometer when it is used to profile the inner surface of a cylindrical pipe and to measure the deformation of the pipe when it is subjected to diametral compression.

Matthys, Donald R.↗

Surface characterization and testing II; Proceedings of the Meeting, San Diego, CA, Aug. 10, 11, 1989

Various papers on surface characterization and testing are presented. Individual topics addressed include: simple Hartmann test data interpretation, optimum configuration of the Offner null corrector, system for phase-shifting interferometry in the presence of vibration, fringe variation and visibility in speckle-shearing interferometry, functional integral representation of rough surfaces, calibration of surface heights in an interferometric optical profiler, image formation in common path differential profilometers, SEM of optical surfaces, measuring surface profiles with scanning tunneling microscopes, surface profile measurements of curved parts, high-resolution optical profiler, scanning heterodyne interferometer with immunity from microphonics, real-time crystal axis measurements of semiconductor materials, radial metrology with a panoramic annular lens, surface analysis for the characterization of defects in thin-film processes, Spacelab Optical Viewport glass assembly optical test program for the Starlab mission, scanning differential intensity and phase system for optical metrology.

Greivenkamp, John E.↗

Structural considerations for fabrication and mounting of the AXAF HRMA optics

A methodology is described which minimizes optics distortion in the fabrication, metrology, and launch configuration phases. The significance of finite element modeling and breadboard testing is described with respect to performance analyses of support structures and material effects in NASA's AXAF X-ray optics. The paper outlines the requirements for AXAF performance, optical fabrication, metrology, and glass support fixtures, as well as the specifications for mirror sensitivity and the high-resolution mirror assembly. Analytical modeling of the tools is shown to coincide with grinding and polishing experiments, and is useful for designing large-area polishing and grinding tools. Metrological subcomponents that have undergone initial testing show evidence of meeting force requirements.

Cohen, Lester M.↗

Optical Performance Modeling of FUSE Telescope Mirror

We describe the Metrology Data Processor (METDAT), the Optical Surface Analysis Code (OSAC), and their application to the image evaluation of the Far Ultraviolet Spectroscopic Explorer (FUSE) mirrors. The FUSE instrument - designed and developed by the Johns Hopkins University and launched in June 1999 is an astrophysics satellite which provides high resolution spectra (lambda/Delta(lambda) = 20,000 - 25,000) in the wavelength region from 90.5 to 118.7 nm The FUSE instrument is comprised of four co-aligned, normal incidence, off-axis parabolic mirrors, four Rowland circle spectrograph channels with holographic gratings, and delay line microchannel plate detectors. The OSAC code provides a comprehensive analysis of optical system performance, including the effects of optical surface misalignments, low spatial frequency deformations described by discrete polynomial terms, mid- and high-spatial frequency deformations (surface roughness), and diffraction due to the finite size of the aperture. Both normal incidence (traditionally infrared, visible, and near ultraviolet mirror systems) and grazing incidence (x-ray mirror systems) systems can be analyzed. The code also properly accounts for reflectance losses on the mirror surfaces. Low frequency surface errors are described in OSAC by using Zernike polynomials for normal incidence mirrors and Legendre-Fourier polynomials for grazing incidence mirrors. The scatter analysis of the mirror is based on scalar scatter theory. The program accepts simple autocovariance (ACV) function models or power spectral density (PSD) models derived from mirror surface metrology data as input to the scatter calculation. The end product of the program is a user-defined pixel array containing the system Point Spread Function (PSF). The METDAT routine is used in conjunction with the OSAC program. This code reads in laboratory metrology data in a normalized format. The code then fits the data using Zernike polynomials for normal incidence systems or Legendre-Fourier polynomials for grazing incidence systems. It removes low order terms from the metrology data, calculates statistical ACV or PSD functions, and fits these data to OSAC models for the scatter analysis. In this paper we briefly describe the laboratory image testing of FUSE spare mirror performed in the near and vacuum ultraviolet at John Hopkins University and OSAC modeling of the test setup performed at NASA/GSFC. The test setup is a double-pass configuration consisting of a Hg discharge source, the FUSE off-axis parabolic mirror under test, an autocollimating flat mirror, and a tomographic imaging detector. Two additional, small fold flats are used in the optical train to accommodate the light source and the detector. The modeling is based on Zernike fitting and PSD analysis of surface metrology data measured by both the mirror vendor (Tinsley) and JHU. The results of our models agree well with the laboratory imaging data, thus validating our theoretical model. Finally, we predict the imaging performance of FUSE mirrors in their flight configuration at far-ultraviolet wavelengths.

Saha, Timo T.↗

Formation Flying of Components of a Large Space Telescope

A conceptual space telescope having an aperture tens of meters wide and a focal length of hundreds of meters would be implemented as a group of six separate optical modules flying in formation: a primary-membrane-mirror module, a relay-mirror module, a focal-plane-assembly module containing a fast steering mirror and secondary and tertiary optics, a primary-mirror-figure-sensing module, a scanning-electron-beam module for controlling the shape of the primary mirror, and a sunshade module. Formation flying would make it unnecessary to maintain the required precise alignments among the modules by means of an impractically massive rigid structure. Instead, a control system operating in conjunction with a metrology system comprising optical and radio subsystems would control the firing of small thrusters on the separate modules to maintain the formation, thereby acting as a virtual rigid structure. The control system would utilize a combination of centralized- and decentralized-control methods according to a leader-follower approach. The feasibility of the concept was demonstrated in computational simulations that showed that relative positions could be maintained to within a fraction of a millimeter and orientations to within several microradians.

Mettler, Edward↗

Absolute Distance Measurement with the MSTAR Sensor

The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beamlaunching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances.

modulation sideband technology for absolute rangin↗

Fast quantum interferometry at the nanometer and attosecond scales with energy-entangled photons

In classical optical interferometry, loss and background complicate achieving fast nanometer-resolution measurements with illumination at low light levels. Conversely, quantum two-photon interference is unaffected by loss and background, but nanometer-scale resolution is physically difficult to realize. As a solution, we enhance two-photon interference with highly nondegenerate energy entanglement featuring photon frequencies separated by 177 THz. We observe measurement resolution at the nanometer (attosecond) scale with only O(10 4 ) photon pairs, despite the presence of background and loss. Our nondestructive thickness measurement of a metallic thin film agrees with atomic force microscopy, which often achieves better resolution via destructive means. With contactless, nondestructive measurements in seconds or faster, our instrument enables metrological studies in optically challenging contexts where background, loss, or photosensitivity are factors.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Long-life 3-axis satellite attitude sensing, phase 1

The purpose was to investigate the feasibility of new, moderate-cost, high reliability navigation sensors for high-altitude satellites, using stellar sources to obviate the use of gyroscopic devices. The primary investigation focused on the need for developing a star tracker model to replace an old star tracker which is still needed for current probe and satellite programs. One innovative element of the proposed star tracker was the design, development, and testing of technology components related to a phase scrambler plate. The purpose of the phase scrambler plate is to convert the impulse response of the optical system from a point image to a uniformly bright, square, angularly large, in-focus image of the star source. A collimated star source was built and tested. A breadboard star tracker with an 8 x 8 degree field of view was designed and built. It was tested in normal quad-cell mode (without the phase scrambler plate) and with the phase scrambler plate. Although the phase scrambler plate was crudely made, the performance of the star tracker breadboard was greatly improved using the phase scrambler plate, instead of system defocus. If further developed, the phase scrambler plate may be added as a low-cost retroconversion to any objective lens to greatly improve quad-cell or CCD array tracking; applications include star trackers, laser metrology, laser machining optics, and surveying instrumentation.

Arild, Tor↗