Swept frequency technique for dispersion measurement of microstrip lines
Microstrip lines used in microwave integrated circuits are dispersive. Because a microstrip line is an open structure, the dispersion can not be derived with pure TEM, TE, or TM mode analysis. Dispersion analysis has commonly been done using a spectral domain approach, and dispersion measurement has been made with high Q microstrip ring resonators. Since the dispersion of a microstrip line is fully characterized by the frequency dependent phase velocity of the line, dispersion measurement of microstrip lines requires the measurement of the line wavelength as a function of frequency. In this paper, a swept frequency technique for dispersion measurement is described. The measurement was made using an automatic network analyzer with the microstrip line terminated in a short circuit. Experimental data for two microstrip lines on 10 and 30 mil Cuflon substrates were recorded over a frequency range of 2 to 20 GHz. Agreement with theoretical results computed by the spectral domain approach is good. Possible sources of error for the discrepancy are discussed.