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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 217 records · Page 12
All sourcesNASA NTRSDOE OSTI
NASA NTRS2000

Energetic Ion Interactions with the Galilean Satellites

The principal research tasks of this investigation are: (1) specification of the energetic (keV to MeV) ion environments upstream of the four Galilean satellites and (2) data analysis and numerical modeling of observed ion interactions with the satellites. Differential flux spectra are being compiled for the most abundant ions (protons, oxygen, and sulfur) from measurements at 20 keV to 100 MeV total energy by the Energetic Particle Detector (EPD) experiment and at higher ion energies by the Heavy Ion Counter (HIC) experiment. Runge-Kutta and other numerical techniques are used to propagate test particles sampled from the measured upstream spectra to the satellite surface or spacecraft through the local magnetic and corotational electric field environment of each satellite. Modeling of spatial variations in directional flux anisotropies measured during each close flyby provides limits on atomic charge states for heavy (O, S) magnetospheric ions and on internal or induced magnetic fields of the satellites. Validation of models for magnetic and electric field configurations then allows computation of rates for ion implantation, sputtering, and energy deposition into the satellite surfaces for further modeling of observable chemical changes induced by irradiation. Our ongoing work on production of oxidants and other secondary species by ice irradiation on Europa's surface has significant applications, already acknowledged in current literature, to astrobiological evolution. Finally, the work will improve understanding of energetic ion sources and sinks at the satellite orbits for improved modeling of magnetospheric transport processes. The scope of the research effort mainly includes data from the primary Galileo mission (1995-1997) but may also include some later data where directly relevant (e.g., comparison of J0 and I27 data for Io) to the primary mission objectives. Funding for this contract also includes partial support for our related education and public outreach activity, 'Interaction of Magnetospheric Particles Applied to Classroom Teaching (IMPACT).'

Cooper, John F.↗
DOE OSTI2020

Study of Heavy Flavor Mesons and Flavor-Tagged Jets with the CMS Detector

The goal of this research program is to implement heavy flavor meson triggers in heavy-ion collisions for the Compact Muon Solenoid (CMS) experiment at the Large Hadron Collider (LHC) at CERN, including algorithm design, timing studies, offline validation, and online performance monitoring. The physics analyses which can be achieved by data from these new triggers is to address one of the most important questions in the field: parton flavor dependence of jet-quenching for the understanding of the transport properties of the Quark-Gluon Plasma. This program will allow CMS to collect the highest statistics heavy flavor meson and jet data ever recorded in heavy-ion colliders. The program includes two objectives: (1) Build and maintain the heavy flavor meson and jet triggers for heavy-ion collisions and deploy the trigger algorithms for 2015-2018 PbPb and pPb run at the LHC; (2) Perform heavy flavor meson and jet physics analyses, which can be used to study the parton flavor dependence of jet quenching, to extract the elastic energy loss coefficient of the QGP, and to test whether massive quarks also participate in collective expansion dynamics in heavy-ion collisions. With the heavy flavor physics trigger developed in this project, a competitive heavy flavor physics program in heavy-ion collisions has been established in CMS. This program allows studies of the fully reconstructed and flavor identified charm, beauty, and exotic hadrons that cover the widest transverse momentum range. The novel measurements supported by the award provide new constraints on the size of the flavor dependence of parton energy loss, the value of the in-medium charm quark diffusion coefficient, the mechanism of charm and beauty quark hadronization, and provide new insights to the nature of the X(3872) hadron.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS1994

Radiation-Protected Protocols For Self-Testing Of Microcircuits

Ionizing radiation need not trigger unintended self-testing. Protocols installed in certain microcircuits permitting functional self-testing do not consider possibility of inadvertent triggering by protons or energetic heavy ions in space or satellite orbit. Recommended devices be rendered immune to so-called single event effects of energetic ions in cosmic rays, flares, or trapped-charge belts surrounding Earth and some other planets. Proposed pair of stimuli be applied to device in specified manner to start self-test. Protocol can require two or more stimuli at single node, or pair of stimuli at two nodes, or some more complicated combination.

Nichols, Donald K.↗
NASA NTRS2011

Pulsed Laser System to Simulate Effects of Cosmic Rays in Semiconductor Devices

Spaceflight system electronic devices must survive a wide range of radiation environments with various particle types including energetic protons, electrons, gamma rays, x-rays, and heavy ions. High-energy charged particles such as heavy ions can pass straight through a semiconductor material and interact with a charge-sensitive region, generating a significant amount of charge (electron-hole pairs) along their tracks. These excess charges can damage the device, and the response can range from temporary perturbations to permanent changes in the state or performance. These phenomena are called single event effects (SEE). Before application in flight systems, electronic parts need to be qualified and tested for performance and radiation sensitivity. Typically, their susceptibility to SEE is tested by exposure to an ion beam from a particle accelerator. At such facilities, the device under test (DUT) is irradiated with large beams so there is no fine resolution to investigate particular regions of sensitivity on the parts. While it is the most reliable approach for radiation qualification, these evaluations are time consuming and costly. There is always a need for new cost-efficient strategies to complement accelerator testing: pulsed lasers provide such a solution. Pulsed laser light can be utilized to simulate heavy ion effects with the advantage of being able to localize the sensitive region of an integrated circuit. Generally, a focused laser beam of approximately picosecond pulse duration is used to generate carrier density in the semiconductor device. During irradiation, the laser pulse is absorbed by the electronic medium with a wavelength selected accordingly by the user, and the laser energy can ionize and simulate SEE as would occur in space. With a tightly focused near infrared (NIR) laser beam, the beam waist of about a micrometer can be achieved, and additional scanning techniques are able to yield submicron resolution. This feature allows mapping of all of the sensitive regions of the studied device with fine resolution, unlike heavy ion experiments. The problematic regions can be precisely identified, and it provides a considerable amount of information about the circuit. In addition, the system allows flexibility for testing the device in different configurations in situ.

Aveline, David C.↗
DOE OSTI2025

Achieving a large transverse emittance ratio in the Relativistic Heavy Ion Collider: Beam experiments, analytical estimates, and implications for the Electron-Ion Collider

The Electron-Ion Collider (EIC), to be built at Brookhaven National Laboratory, will collide a polarized high-energy electron beam with polarized proton and light ion beams in the center-of-mass energy range of 20–140 GeV, achieving a maximum peak luminosity of up to 1 × 10 34 cm − 2 s − 1 for the proton and electron collisions. To achieve such a high luminosity, the EIC will employ small, flat beams at the interaction point, which requires a transverse emittance ratio of about 11:1. Since 2017, we have carried out a series of beam experiments to test the feasibility of achieving such a large emittance ratio in the Relativistic Heavy Ion Collider (RHIC). Thanks to the existing stochastic cooling and decoupling feedback system in RHIC, we successfully demonstrated a large transverse emittance ratio of 11:1 with gold ion beams in 2023. In this article, we will present more details and data analysis for these experiments, along with analytical estimates and numerical multiparticle simulations, and provide an outlook for future EIC coupling compensation. Published by the American Physical Society 2025

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS2021

Linear Systems LSK389 and LSK489 Dual N-Channel JFET Amplifier Total Ionizing Dose and Single-Event Effects Test Report

The purpose of these tests was to characterize the susceptibility of the LSK389 and LSK489 Dual N-Channel JFET from Linear Systems to Single-Event Latchup due to heavy ions and to Total Ionizing Dose (TID) degradation at -65 °C and intermediate dose rate. The test was carried out to assess suitability of the amplifiers for the Ocean Color instrument (OCI) on the Plankton, Aerosol, Cloud, ocean Ecosystem (PACE) spacecraft.

Ray Ladbury↗
NASA NTRS2011

Variable Depth Bragg Peak Method for Single Event Effects Testing

Traditionally, accelerator SEE testing is accomplished by removing the tops of packages so that the IC chips are accessible to heavy ions. However, ICs in some advanced packages cannot be de-lidded so a different approach is used that involves grinding and/or chemically etching away part of the package and the chip from the back side. The parts are then tested from the back side with ions having sufficient range to reach the sensitive volume. More recently, the entire silicon substrate in an SOI/SRAM was removed, making it possible to use low-energy ions with shorter ranges. Where removal of part of the package is not possible, facilities at Michigan State, NASA Space Radiation Laboratory, GANIL (France) and GSI (Germany) offer high-energy heavy ions with long ranges so that the ions can reach the devices' sensitive volumes without much change in the LET. Unfortunately, a run will typically involve only one ion species having a single energy and LET due to the long time it takes to tune a new energy. The Variable Depth Bragg Peak (VDBP) method is similar to the above method in that it involves the use of high-energy heavy ions that are able to pass through the packaging material and reach the device, obviating the need to remove the package. However, the method provides a broad range of LETs from a single ion by inserting degraders in the beam that modify the ion energy and, therefore, the LET. The crux of the method involves establishing a fiduciary point for degrader thickness, i.e., where the Bragg peak is located precisely at the sensitive volume in the device, for which the measured SEU cross-section and the ion LET are both also maxima and can be calculated using a Monte-Carlo program, TRIM. Once the fiduciary point has been established, calibrated high density polyethylene (HDPE) degraders are inserted into or removed from the beam to vary the ion LET at the device in a known manner. After each change of degrader thickness, the SEU cross-section is measured and the corresponding LET calculated from the change in degrader thickness. That information is used to generate a plot of cross-section as a function of ion LET. The advantages of this approach are that the part does not have to be de-lidded and a broad range of LETs is available from a single heavy ion without having to go to non-normal angles of incidence to change the "effective" LET. As we will show, it is possible to obtain an entire curve of cross-section versus LET using just two or three ions. Fig. 1 shows curves of cross-section vs LET for a Freescale 4 Mbit SOI/SRAM measured at the 88" Cyclotron at Berkeley and at NSRL. The open symbols are the data obtained from Berkeley for top-side and back-side irradiation. The solid data points are for the data obtained at NSRL using a device for which the package was intact. The data are for Iron and Gold and cover a range of LETs from 4 MeV.cm2/mg to 84 MeV.cm2/mg. The agreement between the data obtained from Berkeley and from NSRL is excellent, demonstrating that the VDBP method is capable of providing accurate values of cross-section versus LET, at least for the 4 Mbit SRAM. Details of the technique will be included in the final presentation.

Buchner, S.↗
NASA NTRS2003

Single Event Effects Testing of the Linfinity SG1525A Pulse Width Modulator Controller

Pulse Width Modulator (PWM) Controllers are the heart of switching power supply systems in development today. The PWMs considered here have the same integration advantages as many other controllers but it also includes the interface drivers for the follow-on power Field Effect Transistors (FET). Previous work on these types of devices looked into the required test methodologies [ 11 and the impact of radiation on the soft start and shutdown circuits of typically incorporated in the technology [2]. Taking advantage of this previous work this study was undertaken to determine the single event destructive and transient susceptibility of the Linfinity SG1525A Pulse Width Modulator Controller. The device was monitored for transient interruptions in the output signals and for destructive events induced by exposing it to a heavy ion beam at the Texas A&M University Cyclotron Single Event Effects Test Facility. After exposing these devices to the beam, a new upset mode has been identified that can lead to catastrophic power supply system failure if this event would occur while drive power FETs off the two device outputs. The devices and the test methods used will be described first. This will be followed by a brief description of the data collected to date (not all data can be presented with the length constraints of the summary) and a summary of the key results.

Howard, J. W., Jr.↗
NASA NTRS1985

Rolling contact fatigue life of chromium ion plated 440C bearing steel

Rolling contact fatigue (RCF) test specimens of heat treated 440C bearing steel were chromium ion plated in thicknesses from 0.1 to 8.0 micron and tested in RCF tester using 700 ksi maximum Hertzian stress. Heavy coatings, greater than about 5 micron in thickness, peeled off or spalled readily, whereas thin coatings, less than 3 micron thick, were tenacious and did not come off. Furthermore, significant improvement in RCF life was obtained with thin chromium ion plated test specimens. The average increase in B10 life was 75% compared with unplated 440C. These preliminary results indicate that ion plating is a promising way to improve bearing life.

Bhat, B. N.↗
NASA NTRS1976

Evaluation of clad scintillating light pipes

Arrays of fibers made of scintillating material were used as position-sensitive detectors or hodoscopes for beam-finding at ion accelerators. Experiments were made with alpha's from an Am241 source incident upon one end of the fiber, the other end being viewed with a photomultiplier tube. The scintillation light was not detected in any of the fibers tested beyond about 5 cm. The effective useful lengths for detection of relativistic heavy ions were given.

Source record↗
DOE OSTI2024

In-medium changes of nucleon cross sections tested in neutrino-induced reactions

Historically, studied in the context of heavy-ion collisions, the extent to which free nucleon-nucleon cross sections are modified in-medium remains undetermined by these data sets. Therefore, we investigate the impact of N N in-medium modifications on neutrino-nucleus cross section predictions using the GiBUU transport model. We find that including an in-medium lowering of the N N cross section and density dependence on Δ excitation improves agreement with MicroBooNE neutrino-argon scattering data. This is observed for both proton and neutral pion spectra in charged-current muon neutrino and neutral-current single pion production data sets. The impact of collision broadening of the Δ resonance is also investigated. The absence of Δ broadening is slightly favored, but the larger uncertainties on the pion production data prevent definitive conclusions. Published by the American Physical Society 2024

Bogart, B. (ORCID:0000000305588934)↗
NASA NTRS2009

Radiation tests of highly scaled high density commercial nonvolatile NAND flash memories update 2009

Heavy ion single-event measurements on a variety of high density commercial NAND flash memories are reported. Three single event effect (SEE) phenomena are examined: single effect upsets (SEUs), single event functional interrupts (SEFIs), and catastrophic loss of ability to erase and program the device. Also, radiation results of multilevel flash technology are compared with results from single-level flash technology. These commercial high density memories appear to be much less susceptible to SEE and have better TID response compared to older generations of flash memories. The single-level devices are less sensitive to SEUs than multi-level devices. The charge pump in this study survived up to 600 krads. A new high current phenomenon in high density NAND flash memories is also discussed.

Nguyen, Duc N.↗
NASA NTRS2014

Verification of Dosimetry Measurements with Timepix Pixel Detectors for Space Applications

The current capabilities of modern pixel-detector technology has provided the possibility to design a new generation of radiation monitors. Timepix detectors are semiconductor pixel detectors based on a hybrid configuration. As such, the read-out chip can be used with different types and thicknesses of sensors. For space radiation dosimetry applications, Timepix devices with 300 and 500 microns thick silicon sensors have been used by a collaboration between NASA and University of Houston to explore their performance. For that purpose, an extensive evaluation of the response of Timepix for such applications has been performed. Timepix-based devices were tested in many different environments both at ground-based accelerator facilities such as HIMAC (Heavy Ion Medical Accelerator in Chiba, Japan), and at NSRL (NASA Space Radiation Laboratory at Brookhaven National Laboratory in Upton, NY), as well as in space on board of the International Space Station (ISS). These tests have included a wide range of the particle types and energies, from protons through iron nuclei. The results have been compared both with other devices and theoretical values. This effort has demonstrated that Timepix-based detectors are exceptionally capable at providing accurate dosimetry measurements in this application as verified by the confirming correspondence with the other accepted techniques.

Kroupa, M.↗