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At least 217 records · Page 12
All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

A Simplified Model of VIPER Thermal Management System. Part II: Integrated Vehicle

NASA’s Volatiles Investigating Polar Exploration Rover (VIPER) thermal management system (TMS) relies on four loop heat pipes (LHPs) to transport electronic waste heat to the vehicle cooling radiative surface and avoid overheating. The TMS has also ten constant conductance heat pipes (CCHPs) dedicated to balance the thermal load within the internal environment where the avionics boxes are mounted, also called warm electronic box (WEB), and to transport the heat from two of the science payload instruments. The TMS also uses two thermal straps to thermally link the batteries to the WEB. These thermal components, in addition to heaters, thermostat, multi-layer insulation (MLIs), and isolators forms the core of the VIPER TMS. The complex heat transport balance managed by the TMS is challenging to characterize and model. The more fidelity and granularity of a model, the more costly the computational resources needed and the longer the simulation and modeling time. When the priority is to provide quick but reliable assessments of the thermal performance or real time thermal feedback for training of console operators, simplified modeling tools are needed. To satisfy that need, this paper describes the effort to develop and correlate a model of VIPER TMS based on control volume approach. The correlation effort in particular focuses on hibernation, cold thermal balance, and hot thermal balance data from the integrated vehicle thermal vacuum (TVAC) test. Thus, the correlated model captures the heat leaks during hibernations and the performance at two extremes, bounding, operating scenarios.

Loop Heat Pipe↗
NASA NTRSDate not supplied

A Simplified Model of VIPER Thermal Management System. Part II: Integrated Vehicle

NASA’s Volatiles Investigating Polar Exploration Rover (VIPER) thermal management system (TMS) relies on four loop heat pipes (LHPs) to transport electronic waste heat to the vehicle cooling radiative surface and avoid overheating. The TMS has also ten constant conductance heat pipes (CCHPs) dedicated to balance the thermal load within the internal environment where the avionics boxes are mounted, also called warm electronic box (WEB), and to transport the heat from two of the science payload instruments. The TMS also uses two thermal straps to thermally link the batteries to the WEB. These thermal components, in addition to heaters, thermostat, multi-layer insulation (MLIs), and isolators forms the core of the VIPER TMS. The complex heat transport balance managed by the TMS is challenging to characterize and model. The more fidelity and granularity of a model, the more costly the computational resources needed and the longer the simulation and modeling time. When the priority is to provide quick but reliable assessments of the thermal performance or real time thermal feedback for training of console operators, simplified modeling tools are needed. To satisfy that need, this paper describes the effort to develop and correlate a model of VIPER TMS based on control volume approach. The correlation effort in particular focuses on hibernation, cold thermal balance, and hot thermal balance data from the integrated vehicle thermal vacuum (TVAC) test. Thus, the correlated model captures the heat leaks during hibernations and the performance at two extremes, bounding, operating scenarios.

Thermal Modeling↗
NASA NTRS2026

AC and DC Fault Management for Megawatt Electrified Aircraft Electrical Powertrains Task 3: Lifetime and Reliability of Electrical Insulators

This research project was a collaborative investigation between researchers at the RTX Technology Research Center (RTRC) and the University of Texas at Austin and made a significant contribution to enabling electric aircraft. The transport of electric power between the points of generation and use requires power cables. These cables must be smaller, lighter and provide a more predictable life than power cables used in stationary applications. Consequently, this investigation provided heretofore unavailable information supporting the safety and reliability of smaller lighter power cables for electrified aircraft. In addition, the research identified key additional engineering data needed to support quantitative reliability assessments. Important advances included: • Demonstrated that at least one manufacturer can make a novel, smaller, lighter power cable that is free from serious defects. • Developed and published an appropriate analytical construct to describe the life of this novel cable. This is a necessary step for use in aviation where the understanding of remaining life is critical. • Demonstrated thermal-mechanical aging that suggested 1000+ flights before the thermal-mechanical processes produced defects large enough that the defect growth was accelerated electrically. • Showed that electrical aging took place at two rates. The first possibly lasting weeks to months and the second possibly days to weeks. If robust, this provides a good diagnostic for cable replacement. • Demonstrated that the traditional electrical testing of cable materials using manufactured voids can be misleading due to the size of the voids. Emerging laser drilling technology permitted demonstration that the physics of failure in realistically small voids is different from that in the unrealistically large voids used in earlier research, which is very important for high-quality, high-performance, small aircraft cables. Although this project represents a significant contribution to the specifics of cable aging in the aircraft environment, important additional research remains to be completed, including: • Non-uniform thermal cycling by applying the heat from the center conductor to maximize thermal stress next to the core area where the electric gradient is the strongest. This builds on the uniform thermal cycling that has been completed. • The augmentation of the thermal-mechanical failure rate by electrical processes. Better understanding of these time constants strongly affects the ability to predict life. • Termination design: Terminations provide not only electrical reflection potential, but a location for a series arc fault and an area where ozone can diffuse into the center conductor and negatively affect cable insulation. • The abrasion and ozone resistance of the cable jacket. • Pressure cycling as an accelerant of thermal, mechanical, and/or electrical aging. • Possible methods for online PD detection and offline PD localization

model↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
NASA NTRS1997

A Comprehensive Reliability Methodology for Assessing Risk of Reusing Failed Hardware Without Corrective Actions with and Without Redundancy

This paper deals with the development of a reliability methodology to assess the consequences of using hardware, without failure analysis or corrective action, that has previously demonstrated that it did not perform per specification. The subject of this paper arose from the need to provide a detailed probabilistic analysis to calculate the change in probability of failures with respect to the base or non-failed hardware. The methodology used for the analysis is primarily based on principles of Monte Carlo simulation. The random variables in the analysis are: Maximum Time of Operation (MTO) and operation Time of each Unit (OTU) The failure of a unit is considered to happen if (OTU) is less than MTO for the Normal Operational Period (NOP) in which this unit is used. NOP as a whole uses a total of 4 units. Two cases are considered. in the first specialized scenario, the failure of any operation or system failure is considered to happen if any of the units used during the NOP fail. in the second specialized scenario, the failure of any operation or system failure is considered to happen only if any two of the units used during the MOP fail together. The probability of failure of the units and the system as a whole is determined for 3 kinds of systems - Perfect System, Imperfect System 1 and Imperfect System 2. in a Perfect System, the operation time of the failed unit is the same as that of the MTO. In an Imperfect System 1, the operation time of the failed unit is assumed as 1 percent of the MTO. In an Imperfect System 2, the operation time of the failed unit is assumed as zero. in addition, simulated operation time of failed units is assumed as 10 percent of the corresponding units before zero value. Monte Carlo simulation analysis is used for this study. Necessary software has been developed as part of this study to perform the reliability calculations. The results of the analysis showed that the predicted change in failure probability (P(sub F)) for the previously failed units is as high as 49 percent above the baseline (perfect system) for the worst case. The predicted change in system P(sub F) for the previously failed units is as high as 36% for single unit failure without any redundancy. For redundant systems, with dual unit failure, the predicted change in P(sub F) for the previously failed units is as high as 16%. These results will help management to make decisions regarding the consequences of using previously failed units without adequate failure analysis or corrective action.

Putcha, Chandra S.↗
NASA NTRS2021

Reliability and Safety Assessment of Urban Air Mobility Concept Vehicles

The following work was commissioned by the National Aeronautics and Space Administration (NASA) to guide industry and future regulation related to urban air mobility (UAM). Prior studies compared the relative safety of NASA concept vehicles, Figure ES1, designed for UAM and provided recommendations for industry research, aircraft architectural improvements, and regulatory updates. After the prior study completed, the European Aviation Safety Agency (EASA) released regulatory guidance in the form of a special condition (SC), SC-VTOL-01, for multirotors with distributed propulsion and flight controls (DPFC). The objective of the current work was to develop DPFC architectures that will comply with SC-VTOL-01. Vehicle designs, DPFC architectures, and stability & control (S&C) models were developed to find limitations and trends to guide industry. To guide this task, NASA developed quad, hex, and an octorotor to better define vehicle attributes and trade space. Aircraft for study included electric, hybrid-electric, and turboshaft powerplants and collective and RPM control schemes. Assessments are in terms of the safety level achieved, and/or aircraft component/features needed to meet SC-VTOL-01. The most challenging criteria being the catastrophic failure rate, ≤10-9 catastrophic failures per flight hour, and that no single failures may result in a catastrophic event. A disciplined process was followed, similar to that in Aerospace Recommended Practice (ARP) 4761. A preliminary system safety assessment (PSSA) leveraged prior work as a basis of creating failure rate budgets for system design teams. System designs were updated and iterated upon, working with reliability and safety subject matter experts to develop SC-VTOL-01 compliant designs. Design changes were reflected in updated PSSAs for initial verification of compliance. The DPFC architecture was broken into four system design teams, the (1) flight control system (FCS), (2) drive and power system, (3) thermal management system (TMS), and (4) electrical power and distribution system. The FCS including elements necessary to control the aircraft, drive and power including elements necessary to generate and transmit shaft power, the TMS including elements necessary to maintain temperature limits in all operating environments, and electrical pow-er and distribution including equipment necessary to store and transmit electrical energy. Results found that all aircraft evaluated may have paths to comply with SC-VTOL-01, Figure ES2. However, S&C models showed large power transients that must be addressed and PSSA results show that future work is needed in single load path structures, high voltage power storage and distribution, and in motor/rotor overspeed protection.

Boeing↗
NASA NTRS2004

Reliability-Based Life Assessment of Stirling Convertor Heater Head

Onboard radioisotope power systems being developed and planned for NASA's deep-space missions require reliable design lifetimes of up to 14 yr. The structurally critical heater head of the high-efficiency Stirling power convertor has undergone extensive computational analysis of operating temperatures, stresses, and creep resistance of the thin-walled Inconel 718 bill of material. A preliminary assessment of the effect of uncertainties in the material behavior was also performed. Creep failure resistance of the thin-walled heater head could show variation due to small deviations in the manufactured thickness and in uncertainties in operating temperature and pressure. Durability prediction and reliability of the heater head are affected by these deviations from nominal design conditions. Therefore, it is important to include the effects of these uncertainties in predicting the probability of survival of the heater head under mission loads. Furthermore, it may be possible for the heater head to experience rare incidences of small temperature excursions of short duration. These rare incidences would affect the creep strain rate and, therefore, the life. This paper addresses the effects of such rare incidences on the reliability. In addition, the sensitivities of variables affecting the reliability are quantified, and guidelines developed to improve the reliability are outlined. Heater head reliability is being quantified with data from NASA Glenn Research Center's accelerated benchmark testing program.

Shah, Ashwin R.↗
NASA NTRS2021

Reliability and Safety Assessment of Urban Air Mobility Concept Vehicles

The primary objective of this research effort is to identify failure modes and hazards associated with several configurations of multicopter concept vehicles supplied by NASA. Functional hazard analyses (FHA) and failure modes and effects criticality analyses (FMECA) are performed for each of the eight vehicle configurations under review. Conceptual design of notional powertrain configurations (turboshaft, electric, hybrid electric), notional thrust control systems (rpm control and collective control), and navigation control systems for the concept vehicles were to support the reliability and safety analysis and to assess whether a mission can be completed safely. Two kinds of analyses are performed: static safety analysis which enable the quantification of the likelihood of individual events, and dynamic safety analyses which allows the investigation of multiple time-dependent failures. Their objective is to quantify the likelihood of catastrophic failures.

Urban Air Mobility↗
NASA NTRS1991

System reliability and risk assessment task goals and status

The major focus for continued development of the Numerical Evaluation of Stochastic Structures Under Stress (NESSUS) codes is in support of system testing and certification of advanced propulsion systems. Propulsion system testing has evolved over the years from tests designed to show success, to tests designed to reveal reliability issues before service use. Such test conditions as performance envelope corners, high rotor imbalance, power dwells, and overspeed tests are designed to shake out problems that can be associated with low and high cycle fatigue, creep, and stress rupture, bearing durability, and the like. Subsystem testing supports system certification by standing as an early evaluation of the same durability and reliability concerns as for the entire system. The NESSUS software system is being further developed to support the definition of rigorous subsystem and system test definition and reliability certification. The principal technical issues are outlined which are related to system reliability, including key technology issues such as failure mode synergism, sequential failure mechanisms, and fault tree definition.

Cruse, T. A.↗
NASA NTRS2014

Constructing the "Best" Reliability Data for the Job

Modern business and technical decisions are based on the results of analyses. When considering assessments using "reliability data", the concern is how long a system will continue to operate as designed. Generally, the results are only as good as the data used. Ideally, a large set of pass/fail tests or observations to estimate the probability of failure of the item under test would produce the best data. However, this is a costly endeavor if used for every analysis and design. Developing specific data is costly and time consuming. Instead, analysts rely on available data to assess reliability. Finding data relevant to the specific use and environment for any project is difficult, if not impossible. Instead, we attempt to develop the "best" or composite analog data to support our assessments. One method used incorporates processes for reviewing existing data sources and identifying the available information based on similar equipment, then using that generic data to derive an analog composite. Dissimilarities in equipment descriptions, environment of intended use, quality and even failure modes impact the "best" data incorporated in an analog composite. Once developed, this composite analog data provides a "better" representation of the reliability of the equipment or component can be used to support early risk or reliability trade studies, or analytical models to establish the predicted reliability data points. Data that is more representative of reality and more project specific would provide more accurate analysis, and hopefully a better final decision.

DeMott, D. L.↗
NASA NTRS2014

Constructing the Best Reliability Data for the Job

Modern business and technical decisions are based on the results of analyses. When considering assessments using "reliability data", the concern is how long a system will continue to operate as designed. Generally, the results are only as good as the data used. Ideally, a large set of pass/fail tests or observations to estimate the probability of failure of the item under test would produce the best data. However, this is a costly endeavor if used for every analysis and design. Developing specific data is costly and time consuming. Instead, analysts rely on available data to assess reliability. Finding data relevant to the specific use and environment for any project is difficult, if not impossible. Instead, we attempt to develop the "best" or composite analog data to support our assessments. One method used incorporates processes for reviewing existing data sources and identifying the available information based on similar equipment, then using that generic data to derive an analog composite. Dissimilarities in equipment descriptions, environment of intended use, quality and even failure modes impact the "best" data incorporated in an analog composite. Once developed, this composite analog data provides a "better" representation of the reliability of the equipment or component can be used to support early risk or reliability trade studies, or analytical models to establish the predicted reliability data points. Data that is more representative of reality and more project specific would provide more accurate analysis, and hopefully a better final decision.

Kleinhammer, R. K.↗
NASA NTRS1975

Assessment of NDE reliability data

Twenty sets of relevant nondestructive test (NDT) reliability data were identified, collected, compiled, and categorized. A criterion for the selection of data for statistical analysis considerations was formulated, and a model to grade the quality and validity of the data sets was developed. Data input formats, which record the pertinent parameters of the defect/specimen and inspection procedures, were formulated for each NDE method. A comprehensive computer program was written and debugged to calculate the probability of flaw detection at several confidence limits by the binomial distribution. This program also selects the desired data sets for pooling and tests the statistical pooling criteria before calculating the composite detection reliability. An example of the calculated reliability of crack detection in bolt holes by an automatic eddy current method is presented.

Yee, B. G. W.↗
NASA NTRS1976

Assessment of NDE Reliability Data

Twenty sets of relevant Nondestructive Evaluation (NDE) reliability data have been identified, collected, compiled, and categorized. A criterion for the selection of data for statistical analysis considerations has been formulated. A model to grade the quality and validity of the data sets has been developed. Data input formats, which record the pertinent parameters of the defect/specimen and inspection procedures, have been formulated for each NDE method. A comprehensive computer program has been written to calculate the probability of flaw detection at several confidence levels by the binomial distribution. This program also selects the desired data sets for pooling and tests the statistical pooling criteria before calculating the composite detection reliability. Probability of detection curves at 95 and 50 percent confidence levels have been plotted for individual sets of relevant data as well as for several sets of merged data with common sets of NDE parameters.

Yee, B. G. W.↗
NASA NTRS1984

Methods for assessing the structural reliability of brittle materials

Failure from contact-induced surface flaws is considered along with controlled indentation flaws for construction of toughness and fatigue master maps, fatigue properties of ceramics with natural and controlled flaws, and a statistical analysis of size and stress state effects on the strength of an alumina ceramic. Attention is also given to dynamic and static fatigue of a machinable glass ceramic, the effect of multiregion crack growth on proof testing, and a fracture mechanics analysis of defect sizes. Other topics explored are related to the effect of temperature and humidity on delayed failure of optical glass fibers, subthreshold indentation flaws in the study of fatigue properties of ultrahigh-strength glass, the lifetime prediction for hot-pressed silicon nitride at high temperatures, static fatigue in high-performance ceramics, and requirements for flexure testing of brittle materials.

Freiman, S. W.↗