Heavy Ion Testing of Freescale Nano-Crystal Nonvolatile Memory
This viewgraph presentation describes radiation tests of nanocrystal (NC) memory for space systems. A nanocrystal test chip was bombarded by heavy ions from a cyclotron.
Oldham, T. R.↗
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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Components irradiation test no. 19, gamma irradiation of 2N914, 2N918, S2N930, 2N2192 and 2N2369 transistors
Gamma radiation tests on n-p-n silicon epitaxial transistors
SILICON TRANSISTOR↗
Total-dose radiation effects data for semiconductor devices. 1985 Supplement. Volume 2, part B
Steady-state, total-dose radiation test data are provided in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 (Parts A and B) provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done steady-state 2.5-MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose. All data were generated in support of NASA space programs by the JPL Radiation Effects and Testing Group (514).
Martin, K. E.↗
Radiative, actively cooled panel tests results
The radiative, actively cooled panel designed to withstand a uniform incident heat flux of 136 kW/sq m to a 444 K surface temperature was evaluated. The test program consisted of preliminary static thermal mechanical loading and aerothermal flow tests. Test results are briefly discussed.
Shore, C. P.↗
Flat plate collector performance determined experimentally with a solar simulator
The NASA is constructing a new office building at Langley Research Center that will utilize solar energy for heating and cooling. A collector technology program being conducted at Lewis will provide the basis for selecting collectors for use at Langley. The technology program includes testing collectors in an indoor facility under simulated solar radiation. Tests have been conducted on five collectors to date and performance data are presented herein.
Vernon, R. W.↗
Flat-plate collector performance determined experimentally with a solar simulator
The NASA is constructing a new office building at Langley Research Center that will utilize solar energy for heating and cooling. A collector technology program is described which includes testing collectors in an indoor facility under simulated solar radiation. Tests have been conducted on five collectors to date and performance data are presented. The collector performance obtained with the solar simulator will be correlated with data obtained by conducting tests outdoors at Lewis.
Vernon, R. W.↗
Radiation tolerance of vertical junction solar cells
Extensive radiation testing of vertical junction (VJ) solar cells demonstrated a radiation tolerance better than both planar silicon cells and at least one type of (AlGa)As-GaAs cell. Due to tradeoffs between short circuit current and open circuit voltage, the end of life (10 to the 16th power 1 MeV electrons/sq cm) maximum power point is nearly independent of bulk resistivity between 2 and 10 ohm cm, increases slightly with increasing wafer thickness between 3 and 11 mils, and increases slightly with increasing groove depth between 1 and 3 mils.
Schelnine, A.↗
Development of Fiber-Based Laser Systems for LISA
We present efforts on fiber-based laser systems for the LISA mission at the NASA Goddard Space Flight Center. A fiber-based system has the advantage of higher robustness against external disturbances and easier implementation of redundancies. For a master oscillator, we are developing a ring fiber laser and evaluating two commercial products, a DBR linear fiber laser and a planar-waveguide external cavity diode laser. They all have comparable performance to a traditional NPRO at LISA band. We are also performing reliability tests of a 2-W Yb fiber amplifier and radiation tests of fiber laser/amplifier components. We describe our progress to date and discuss the path to a working LISA laser system design.
Numata, Kenji↗
Testing guideline for single event gate rupture (SEGR) of power MOSFETs
The purpose of this document is two-fold. First, the document lists and discusses many of the issues important to understand when testing power MOSFETs. Second, the recommended approach for using radiation test data to define the device application requirements is presented. These include SEE rate calculation, data analysis, and derating guidelines. A significant amount of work has been done on the basic effects of SEB and SEGR. References are supplied where seminal work has been done on the topic at hand. The reader is urged to review the references if the testing issues or mission application at hand are complex.
Scheick, Leif↗
Shortcomings in ground testing, environment simulations, and performance predictions for space applications
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain the data that are required to predict the performance and survivability of satellite systems for extended missions in space. The problems associated with space environmental simulations, or the lack thereof, in experiments intended to produce information to describe the degradation and behavior of parts and systems are discussed. Several types of radiation effects in semiconductor components are presented, as for example: ionization dose effects, heavy ion and proton induced Single Event Upsets (SEUs), and Single Event Transient Upsets (SETUs). Examples and illustrations of data relating to these ground testing issues are provided. The primary objective of this presentation is to alert the reader to the shortcomings, pitfalls, variabilities, and uncertainties in acquiring information to logically design electronic subsystems for use in satellites or space stations with long mission lifetimes, and to point out the weaknesses and deficiencies in the methods and procedures by which that information is obtained.
Stassinopoulos, E. G.↗
Rift Radiation Effects Program, Irradiation No. 9, Monomethyl Hydrazine
Radiation testing monomethyl hydrazine propellant for rift project
REACTOR IN-FLIGHT TEST /RIFT/ PROJECT↗
Parameter extraction from spaceborne MOSFETs
An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.
Buehler, M. G.↗
Spacecraft Communications System Verification Using On-Axis Near Field Measurement Techniques
Determination of the readiness of a spacecraft for launch is a critical requirement. The final assembly of all subsystems must be verified. Testing of a communications system can mostly be done using closed-circuits (cabling to/from test ports), but the final connections to the antenna require radiation tests. The Tropical Rainfall Measuring Mission (TRMM) Project used a readily available 'near-fleld on-axis' equation to predict the values to be used for comparison with those obtained in a test program. Tests were performed in a 'clean room' environment at both Goddard Space Flight Center (GSFC) and in Japan at the Tanegashima Space Center (TnSC) launch facilities. Most of the measured values agreed with the predicted values to within 0.5 dB. This demonstrates that sometimes you can use relatively simple techniques to make antenna performance measurements when use of the 'far field ranges, anechoic chambers, or precision near-field ranges' are neither available nor practical. Test data and photographs are provided.
Keating, Thomas↗
The Single Event Effect Characteristics of the 486-DX4 Microprocessor
This research describes the development of an experimental radiation testing environment to investigate the single event effect (SEE) susceptibility of the 486-DX4 microprocessor. SEE effects are caused by radiation particles that disrupt the logic state of an operating semiconductor, and include single event upsets (SEU) and single event latchup (SEL). The relevance of this work can be applied directly to digital devices that are used in spaceflight computer systems. The 486-DX4 is a powerful commercial microprocessor that is currently under consideration for use in several spaceflight systems. As part of its selection process, it must be rigorously tested to determine its overall reliability in the space environment, including its radiation susceptibility. The goal of this research is to experimentally test and characterize the single event effects of the 486-DX4 microprocessor using a cyclotron facility as the fault-injection source. The test philosophy is to focus on the "operational susceptibility," by executing real software and monitoring for errors while the device is under irradiation. This research encompasses both experimental and analytical techniques, and yields a characterization of the 486-DX4's behavior for different operating modes. Additionally, the test methodology can accommodate a wide range of digital devices, such as microprocessors, microcontrollers, ASICS, and memory modules, for future testing. The goals were achieved by testing with three heavy-ion species to provide different linear energy transfer rates, and a total of six microprocessor parts were tested from two different vendors. A consistent set of error modes were identified that indicate the manner in which the errors were detected in the processor. The upset cross-section curves were calculated for each error mode, and the SEU threshold and saturation levels were identified for each processor. Results show a distinct difference in the upset rate for different configurations of the on-chip cache, as well as proving that one vendor is superior to the other in terms of latchup susceptibility. Results from this testing were also used to provide a mean-time-between-failure estimate of the 486-DX4 operating in the radiation environment for the International Space Station.
Kouba, Coy↗
Lessons Learned Using COTS Electronics for the International Space Station Radiation Environment
The mantra of 'Faster, Better, Cheaper' has to a large degree been interpreted as using Commercial Off-the-Shelf (COTS) components and/or circuit boards. One of the first space applications to actually use COTS in space along with radiation performance requirements was the Expedite the Processing of Experiments to Space Station (EXPRESS) Rack program, for the International Space Station (ISS). In order to meet the performance, cost and schedule targets, military grade Versa Module Eurocard (VME) was selected as the baseline design for the main computer, the Rack Interface Controller (RIC). VME was chosen as the computer backplane because of the large variety of military grade boards available, which were designed to meet the military environmental specifications (thermal, shock, vibration, etc.). These boards also have a paper pedigree in regards to components. Since these boards exceeded most ISS environmental requirements, it was reasoned using COTS mid-grade VME boards, as opposed to designing custom boards could save significant time and money. It was recognized up front the radiation environment of ISS, while benign compared to many space flight applications, would be the main challenge to using COTS. Thus in addition to selecting vendors on how well their boards met the usual performance and environmental specifications, the board's parts lists were reviewed on how well they would perform in the ISS radiation environment. However, issues with verifying that the available radiation test data was applicable to the actual part used, vendor part design changes and the fact most parts did not have valid test data soon complicated board and part selection in regards to radiation.
Blumer, John H.↗
What's My Prior? Baby Steps Toward Big Data
After four decades of single-event effects testing, radiation engineers face pressure to find alternatives to reduce or eliminate testing costs. Many of these alternatives focus on use of archival test data to bound SEE risk for similar parts. This presentation examines the challenges and limitations of such analyses and suggests analysis techniques and goals that are likely to be most appropriate for such efforts.
statistics and probability↗
Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS)
The ISS (International Space Station) currently lacks the capability to image and chemically analyze nano-to-micron scale particles from numerous engineering systems. To identify these particles, we must wait for a re-entry vehicle to return them from low earth orbit for ground-based SEM (Scanning Electron Microscope) / EDS (Energy Dispersive X-Ray Spectroscopy) analysis. This may take months, potentially delaying the affected system. Having an EDS-equipped SEM (Mochii S) aboard the ISS will accelerate response time thereby enhancing crew and vehicle safety by rapid and accurate identification of microscopic threats, especially in time-critical situations.The Mochii S payload will be stationed in the Japanese Experiment Module (JEM) powered by 120 VAC (Volts Alternating Current) inverter and connected to station Ethernet and WiFi (Fig. 1). To date the Mochii S payload has undergone testing for command and data handling, power quality, flight vibration, and radiation testing at Johnson Space Center (JSC). Mochii's high-RPM (Revolutions Per Minute) rotating vacuum pumps and high voltage systems have been reviewed to meet safety standards by JSC (Johnson Space Center) Engineering. Topology of the system in the JEM module has been baselined by ISS Safety and JAXA (Japan Space Exploration Agency). Digital controls to and from ISS over Joint Station LAN (Local Area Network) uplink have been simulated and the latencies and data rates have been found to be sufficient for successful operation of the payload from ground.Transporting sensitive electron optical instruments aboard a rocket that sustains 7G acceleration for 8 minutes and then operating it the unique microgravity (micro-g) environment is no trivial matter. To meet strict safety requirements and increase robustness for mission success, over 500 unique verifications must be completed before the payload is certified for spaceflight. Two of which will be discussed in detail are: vibroacoustic testing and magnetic susceptibility shielding and validation.
Mochii↗
Single-Event Effect Testing of the PNI RM3100 Magnetometer for Space Applications
The results of a destructive single-event effect susceptibility radiation test of the PNI RM3100 magnetometer sensor, specifically the MagI 2 C ASIC (application-specific integrated circuit) on the sensor board are presented. The sensor is a low-resource commercial off-the-shelf (COTS) magneto-inductive magnetometer. The device was monitored for destructive events and functional interruptions during exposure to a heavy ion beam at the Lawrence Berkeley National Laboratory's 88′′ Cyclotron. The RM3100 did not experience any destructive single-event effects when irradiated to a total fluence of 1.4 × 10 7 cm −2 at an effective linear energy transfer (LET) of 76.7 MeV cm 2 mg −1 while operated at nominal voltage (3.3 V) and elevated temperature (85 ∘C). When these results are combined with previous total ionizing dose tests showing no failures up to 150 kRad (Si), we conclude that the PNI RM3100 is extremely radiation tolerant and can be used in a variety of space environments.
Mark B. Moldwin↗