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At least 217 records · Page 12

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NASA NTRS2018

Differential Adaptive Stress Testing of Airborne Collision Avoidance Systems

The next-generation Airborne Collision Avoidance System (ACAS X) is currently being developed and tested to replace the Traffic Alert and Collision Avoidance System (TCAS) as the next international standard for collision avoidance. To validate the safety of the system, stress testing in simulation is one of several approaches for analyzing near mid-air collisions (NMACs). Understanding how NMACs can occur is important for characterizing risk and informingdevelopment of the system. Recently, adaptive stress testing (AST) has been proposed as a way to find the most likely path to a failure event. The simulation-based approach accelerates search by formulating stress testing as a sequential decision process then optimizing it using reinforcement learning. The approach has been successfully applied to stress test a prototype of ACAS Xin various simulated aircraft encounters. In some applications, we are not as interestedin the system's absolute performance as its performance relative to another system. Such situations arise, for example, during regression testing or when deciding whether a new system should replace an existing system. In our collision avoidance application, we are interested in finding cases where ACAS X fails but TCAS succeeds in resolving a conflict. Existing approaches do not provide an efficient means to perform this type of analysis. This paper extends the AST approach to differential analysis by searching two simulators simultaneously and maximizing the difference between their outcomes. We call this approach differential adaptive stress testing (DAST). We apply DAST to compare a prototype of ACAS X against TCAS and show examples of encounters found by the algorithm.

Lee, Ritchie↗

NASA NTRS2009

Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semi-conductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. The technology dependence and the viability of this technique are qualitatively explored using a physical model describing the dose rate response and the effect of hydrogen in bipolar technologies. The model uses four core processes: 1) space charge effects, 2) free electron/hole pair recombination, hole-hydrogen defect reactions in the oxides and 4) proton depassivation of dangling bonds at the Si/SiO2 interface. Radiation hardness assurance implications are discussed.

Pease, Ron↗

NASA NTRS1969

Torsion system for creep testing with multiple stress reversals

Torsion system proves exploratory data on accelerated creep due to multiple stress reversals. Torsional testing of tubular specimens is best suited for reversed stress creep tests since large strains are obtainable while maintaining specimen geometry.

Lilienthal, P. A.↗

NASA NTRS1979

Development of an Accelerated Test Design for Predicting the Service Life of the Solar Array at Mead, Nebraska

An accelerated life test is described which was developed to predict the life of the 25 kW photovoltaic array installed near Mead, Nebraska. A quantitative model for accelerating testing using multiple environmental stresses was used to develop the test design. The model accounts for the effects of thermal stress by a relation of the Arrhenius form. This relation was then corrected for the effects of nonthermal environmental stresses, such as relative humidity, atmospheric pollutants, and ultraviolet radiation. The correction factors for the nonthermal stresses included temperature-dependent exponents to account for the effects of interactions between thermal and nonthermal stresses on the rate of degradation of power output. The test conditions, measurements, and data analyses for the accelerated tests are presented. Constant-temperature, cyclic-temperature, and UV types of tests are specified, incorporating selected levels of relative humidity and chemical contamination and an imposed forward-bias current and static electric field.

Gaines, G. B.↗

NASA NTRS2004

Preloading To Accelerate Slow-Crack-Growth Testing

An accelerated-testing methodology has been developed for measuring the slow-crack-growth (SCG) behavior of brittle materials. Like the prior methodology, the accelerated-testing methodology involves dynamic fatigue ( constant stress-rate) testing, in which a load or a displacement is applied to a specimen at a constant rate. SCG parameters or life prediction parameters needed for designing components made of the same material as that of the specimen are calculated from the relationship between (1) the strength of the material as measured in the test and (2) the applied stress rate used in the test. Despite its simplicity and convenience, dynamic fatigue testing as practiced heretofore has one major drawback: it is extremely time-consuming, especially at low stress rates. The present accelerated methodology reduces the time needed to test a specimen at a given rate of applied load, stress, or displacement. Instead of starting the test from zero applied load or displacement as in the prior methodology, one preloads the specimen and increases the applied load at the specified rate (see Figure 1). One might expect the preload to alter the results of the test and indeed it does, but fortunately, it is possible to account for the effect of the preload in interpreting the results. The accounting is done by calculating the normalized strength (defined as the strength in the presence of preload the strength in the absence of preload) as a function of (1) the preloading factor (defined as the preload stress the strength in the absence of preload) and (2) a SCG parameter, denoted n, that is used in a power-law crack-speed formulation. Figure 2 presents numerical results from this theoretical calculation.

Gyekenyesi, John P.↗

NASA NTRS1977

Lifetimes of fiber composites under sustained tensile loading

Results are presented for a study intended to summarize lifetime data on several fiber/epoxy composite materials subjected to sustained uniaxial tensile loading, to report preliminary results of an accelerated test method for predicting the life of simple composites, and to describe related work in progress on pressure vessels and other filament-wound structures. The lifetime performance of the tested composites was compared by plotting the percent of ultimate strength (applied fiber stress normalized with respect to fiber failure stress in a composite) versus lifetime. In terms of performance in long-term tensile applications, the tested composites are ranked in the following order: graphite/epoxy, Be wire/epoxy, Aramid/epoxy, and S-glass/epoxy. The accelerated test using temperature and stress to simulate the passage of time proves to be encouraging, at least in the case of the Aramid/epoxy composite. The potential of a statistical analysis based on Weibull distribution analyses or a power law relationship is demonstrated.

Chiao, T. T.↗

NASA NTRS2009

Bayes Analysis and Reliability Implications of Stress-Rupture Testing a Kevlar/Epoxy COPV using Temperature and Pressure Acceleration

Composite Overwrapped Pressure Vessel (COPVs) that have survived a long service time under pressure generally must be recertified before service is extended. Sometimes lifetime testing is performed on an actual COPV in service in an effort to validate the reliability model that is the basis for certifying the continued flight worthiness of its sisters. Currently, testing of such a Kevlar49(registered TradeMark)/epoxy COPV is nearing completion. The present paper focuses on a Bayesian statistical approach to analyze the possible failure time results of this test and to assess the implications in choosing between possible model parameter values that in the past have had significant uncertainty. The key uncertain parameters in this case are the actual fiber stress ratio at operating pressure, and the Weibull shape parameter for lifetime; the former has been uncertain due to ambiguities in interpreting the original and a duplicate burst test. The latter has been uncertain due to major differences between COPVs in the data base and the actual COPVs in service. Any information obtained that clarifies and eliminates uncertainty in these parameters will have a major effect on the predicted reliability of the service COPVs going forward. The key result is that the longer the vessel survives, the more likely the more optimistic stress ratio is correct. At the time of writing, the resulting effect on predicted future reliability is dramatic, increasing it by about one nine , that is, reducing the probability of failure by an order of magnitude. However, testing one vessel does not change the uncertainty on the Weibull shape parameter for lifetime since testing several would be necessary.

Phoenix, S. Leigh↗

DOE OSTI2023

PV encapsulant formulations and stress test conditions influence dominant degradation mechanisms

Polyethylene-based poly(ethylene-co-vinyl acetate) (EVA), polyolefin elastomer (POE), and thermoplastic polyolefin (TPO) are common polymer candidates for photovoltaic (PV) module encapsulants. The choice of encapsulant must be carefully considered in novel module designs, such as bifacial glass/glass laminates, to limit performance degradation through loss of optical transmittance, mechanical integrity, and corrosion - as well as potential-induced degradation. Encapsulant quality and resilience against environmental stressors are readily influenced by the additives in the encapsulant formulation. Here, we show that, the changes in optical transmittance after UV aging result from the discoloration caused by interactions between additives, and optical scattering from changes in the polymer crystal structure. We observed competing cross-linking and chain scission mechanisms, with their kinetics influenced by the presence of oxygen and elevated temperatures. Increasing chamber temperatures from 55 °C to 85 °C during the UV stress test amplified encapsulant discoloration and promoted polymer cross-linking, causing severe, irreversible damage that remains to be proven field relevant. Damp heat aging was found to be insufficient to produce significant encapsulant degradation; however, combining stress tests sequentially allowed detection of further degradation beyond the limitations of the damp heat test alone. Appropriate degradation screening methods are necessary to uncover potential encapsulant weaknesses.

14 SOLAR ENERGY↗

DOE OSTI2023

Reliability evaluation of DC power optimizers for photovoltaic systems: Accelerated testing at high temperatures with fixed and cyclic power stresses

Not Available

Afridi, Muhammad↗

NASA NTRS2006

Effect of High Temperature Storage in Vacuum, Air, and Humid Conditions on Degradation of Gold/Aluminum Wire Bonds in PEMs

Microcircuits encapsulated in three plastic package styles were stored in different environments at temperatures varying from 130 C to 225 C for up to 4,000 hours in some cases. To assess the effect of oxygen, the parts were aged at high temperatures in air and in vacuum chambers. The effect of humidity was evaluated during long-term highly accelerated temperature and humidity stress testing (HAST) at temperatures of 130 C and 150 C. High temperature storage testing of decapsulated microcircuits in air, vacuum, and HAST chambers was carried out to evaluate the role of molding compounds in the environmentally-induced degradation and failure of wire bonds (WB). This paper reports on accelerating factors of environment and molding compound on WB failures. It has been shown that all environments, including oxygen, moisture, and the presence of molding compounds reduce time-to-failures compared to unencapsulated devices in vacuum conditions. The mechanism of the environmental effect on KB degradation is discussed.

Teverovsky, Alexander↗

NASA NTRS2012

Towards A Model-Based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging

A remaining useful life prediction methodology for electrolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated aging test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation progression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognostics methods typically used for remaining useful life predictions in other applications.

Celaya, Jose R.↗

NASA NTRS2011

A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging

Electrolytic capacitors↗

NASA NTRS2006

Effect of Environments on Degradation of Molding Compound and Wire Bonds in PEMs

Degradation of wire bonds (WBs) is one of the major factors limiting reliability of plastic encapsulated microcircuits (PEMs) at high temperatures. Use of PEMs in military and aerospace applications requires extended and thorough evaluation of encapsulating materials and reliability of packages in harsh environments. However, the effect of environmental conditions on characteristics of molding compounds (MCs) and reliability of wire bonds has not been studied sufficiently to date. In this work, two types of PEMs in QFP-style packages have been stored in different environments at temperatures from 130 C to 225 C for up to 4,500 hours in some cases. To assess the effect of oxygen, the parts were aged at 198 C in air and vacuum chambers. The effect of humidity was evaluated during long-term highly accelerated temperature and humidity stress testing (HAST) at temperatures of 130 C and 150 C. Thermo-mechanical and thermo-gravimetrical analyses were used to evaluate the effect of environment on characteristics of molding compound used. Measurements of contact resistances of wire bonds and their mechanical strength were employed to monitor degradation of wire bonds throughout the testing. Correlation between degradation of MC and WB failures has been analyzed. The effect of environmental conditions on accelerating factors of WB failures has been assessed, and the mechanism of wire bond degradation due to the presence of moisture and oxygen is discussed.

Teverosky, Alexander↗

NASA NTRSDate not supplied

Stress Testing of Chip Aluminum Polymer Capacitors

Layered aluminum polymer capacitors (APC) may be viable replacements to current chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect on humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. In this work, seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were used to evaluate reliability of the parts under environmental stresses and highly accelerated life tests. Characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been analyzed and compared to polymer tantalum capacitors.

Alexander Teverovsky↗

NASA NTRS2011

Towards Prognostics of Electrolytic Capacitors

A remaining useful life prediction algorithm and degradation model for electrolytic capacitors is presented. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management research. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. In particular, experimental results of an accelerated aging test under electrical stresses are presented. The capacitors used in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors.

Celaya, Jose R.↗

NASA NTRS2024

Evaluation of Aluminum Polymer Capacitors for Space Applications

Layered aluminum polymer capacitors (APC) may be viable replacements to currently used chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect of humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. This work analyzes construction and characteristics of seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were analyzed. Their reliability under environmental stresses and highly accelerated life tests was assessed in the range of temperatures and voltages to determine reliability acceleration factors. For this purpose, characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been compared to polymer tantalum capacitors.

Alexander A Teverovsky↗

DOE OSTI2022

From lab to lamp: Understanding downconverter degradation in LED packages

Downconverters, primarily inorganic phosphors, are critical components in white solid-state LED-based lighting and liquid crystal display backlights. Research efforts have led to a fundamental understanding of a downconverter's absorption, photoluminescence, and efficiency as a function of composition, structure, and processing conditions. However, considerably less work has focused on the reliability of phosphors once they are incorporated into LED packages. Solving these issues is often the final step before the commercialization of new materials, but the significant resources and time required to evaluate and mitigate materials failure are rarely discussed in the literature. In this Perspective, we discuss the need for conducting downconverter reliability testing and the potential of accelerating, screening, and understanding downconverter failure modes. Our focus highlights the mechanisms of failure and discusses how this influences materials selection and the design of different LED packages. We also stress the potential for accelerated reliability testing protocols and note the potential role first-principles calculations and data-driven models could play in establishing the compositional-processing trends for different aspects of downconverter reliability. In conclusion, we close with possible research directions that could improve downconverter reliability and emphasize the importance of assessing a material's (chemical) stability where multiple manufacturing and processing steps can dictate system performance.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

NASA NTRSDate not supplied

Adaptive Stress Testing of Collision Avoidance Systems for Small UASs with Deep Reinforcement Learning

The next-generation Airborne Collision Avoidance System for smaller UASs (ACAS sXu) is currently being developed and tested by the Federal Aviation Administration (FAA) to provide detect-and-avoid capability for small unmanned aircraft operating beyond line-of-sight. Due to the complexity and safety-critical nature of the system, safety validation is important not only for the certification of the final system, but also for informing changes during the iterative development process. In this paper, we analyze a prototype of ACAS sXu in simulated aircraft encounters to discover scenarios of small near mid-air collisions (sNMACs), an important safety event in which two aircraft come closer than 50 feet horizontally and 15 feet vertically. Due to the size and complexity of the system as well as rarity of sNMAC events, traditional methods such as Monte Carlo testing often require informed setup and targeting to elicit failures. However, such a dependence on domain knowledge can be incompatible with the independent verification and validation (IV&V) process, the aim of which is to discover unforeseen issues. To address these challenges, we apply an accelerated validation method called adaptive stress testing (AST) to find the most likely sNMAC scenarios without reliance on system introspection. AST uses reinforcement learning to adapt the search towards the most promising areas of the search space as it progresses. We use a state-of-the-art deep reinforcement learning algorithm, proximate policy optimization, to more efficiently search the large and continuous state space. We find that this approach significantly improves the performance of AST compared to a prior approach based on Monte Carlo tree search. We perform experiments using AST to find sNMAC events under various encounter configurations, varying parameters pertaining to dynamics and coordination. Our experiments show AST to be very effective at finding sNMAC scenarios. We summarize our findings, presenting high-level categories of discovered sNMACs and specific examples of encounters in each category.

aircraft collision avoidance↗