Yield estimation of sugarcane based on agrometeorological-spectral models
This work has the objective to assess the performance of a yield estimation model for sugarcane (Succharum officinarum). The model uses orbital gathered spectral data along with yield estimated from an agrometeorological model. The test site includes the sugarcane plantations of the Barra Grande Plant located in Lencois Paulista municipality in Sao Paulo State. Production data of four crop years were analyzed. Yield data observed in the first crop year (1983/84) were regressed against spectral and agrometeorological data of that same year. This provided the model to predict the yield for the following crop year i.e., 1984/85. The model to predict the yield of subsequent years (up to 1987/88) were developed similarly, incorporating all previous years data. The yield estimations obtained from these models explained 69, 54, and 50 percent of the yield variation in the 1984/85, 1985/86, and 1986/87 crop years, respectively. The accuracy of yield estimations based on spectral data only (vegetation index model) and on agrometeorological data only (agrometeorological model) were also investigated.