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At least 199 records · Page 11

Specification of Surface Roughness Over Oceans in the GLAS Fourth Order GCM

The surface roughness height z sub 0 is a parameter which measures the effect of surface irregularities on the mean profiles which occur in the atmospheric surface layer. Over land surfaces, z sub 0 is a function of soil composition, plant canopy type and distribution and other factors such as buildings and structures. Over open water, z sub 0 depends only on the distribution of waves, wavelets and other surface irregularities. These, in turn, are thought to be determined by the mean wind within the surface layer. Large and Pond have derived an empirical relationship between the mean wind speed U sub 10 at the ten meter level over open water and the neutral drag coefficient C sub DN. Their relationship covers the range U sub 10 or = M/S. Earlier, Kondo had computed a relationship between U sub 10 and C sub DN on the basis of laboratory observations which extended down to the range of infinitely small wind speeds. An interpretation between the relationships of Large and Pond for large wind speed and of Kondo for small wind speed is presented.

Helfand, H. M.↗

Surface Roughness Calculations of Additively Manufactured Cylinders via X-Ray Computed Tomography

X-ray Computed Tomography (X-ray CT) is an analytical technique used in materials science to non–destructively characterize features in variety of materials like polymers, metals, composites, and explosives. It also has the capability of imaging additively manufactured, machined and assembled parts and processes. The non-destructive imaging allows for the analysis of features (voids and cracks), which give a fundamental understanding of material characteristics. Additionally, X-ray CT can obtain accurate measurements of dimensional and topographic variations as a result of different stimuli, and assess accuracy of material production. This study will focus on parts manufactured via metal additive manufacturing (AM). Although, AM produces parts faster and easier, the printing process can produce defects (pores and surface roughness) that undermine the part’s mechanical properties. The analysis of 3D printed objects has a strength in analysis in that the material has an STL file from which the item was printed, which is not available in many manufactured materials (i.e. foams) due to stochastic structures. For this study, the print accuracy of several 3D printed cylinders will be assessed via X-ray CT to determine optimal printing parameters for parts with less defects and stronger mechanical properties. This will be accomplished by having the original STL file serve as the baseline surface to compute difference in the CT rendering to calculate surface roughness for each cylinders.

36 MATERIALS SCIENCE↗

Experimental Investigation of the Problem of Surface Roughness

Based on the universal laws of turbulent velocity distribution at rough and smooth walls, there is in the present work presented a method that allows surface roughness tests and in particular, measurements on the roughness of ship surfaces to be carried out in a much simpler manner. The types of roughness investigated were in the form of flat, rough plates installed in a square-section rectangular channel, the other three walls always being smooth. Twenty-one plates of various roughness were investigated, the roughness elements being the following: spheres of diameter 0.41 and 0.21, respectively, spherical segments, cones, and "short" and "long" angles.

Schlichting, H↗

Predictive numerical modeling of plasma-induced surface roughness and wettability evolution in LM-PAEK/CF tape

Plasma surface modification effectively enhances adhesion in thermoplastic composites, yet its impacts on high-performance polymers like low-melting polyaryletherketone (LM-PAEK) remain inadequately quantified. Here, this study integrates experimental analysis and numerical modeling to characterize surface roughness and wettability changes in LM-PAEK/carbon fiber composites treated with atmospheric plasma. Atomic Force Microscopy quantified surface topography (n = 10 per condition for contact angles), while static contact-angle assessments measured wettability. Roughness rapidly increased from ∼0.2 nm to 1.6 nm, and contact angle reduced from ∼90° to 24°, both stabilizing after 25–30 s of exposure. A semi-empirical, physics-informed framework was calibrated to these data, coupling surface chemistry via the Owens–Wendt decomposition with topography via the Wenzel roughness factor, and evaluated using out-of-sample (cross-validated) tests, while static contact angle assessments measured wettability. Numerical predictions matched experimental results closely (RMSE <5%, R 2 > 0.95). Incorporating material-specific parameters, the calibrated model supports plasma-treatment optimization and provides quantitative guidance for improving interfacial adhesion in thermoplastic composite manufacturing.

Atomic Force Microscopy↗

A multi-frequency measurement of thermal microwave emission from soils: The effects of soil texture and surface roughness

An experiment on remote sensing of soil moisture content was conducted over bare fields with microwave radiometers at the frequencies of 1.4 GHz, 5 GHz, and 10.7 GHz during July - September of 1981. Three bare fields with different surface roughnesses and soil textures were prepared for the experiment. Ground truth acquisition of soil temperatures and moisture contents for 5 layers down to the depths of 15 cm was made concurrently with radiometric measurements. The experimental results show that the effect of surface roughness is to increase the soils' brightness temperature and to reduce the slope of regression between brightness temperature and moisture content. The slopes of regression for soils with different textures are found to be comparable, and the effect of soil texture is reflected in the difference of regression line intercepts at brightness temperature axis. The result is consistent with laboratory measurement of soils' dielectric permittivity. Measurements on wet smooth bare fields give lower brightness temperatures at 5 GHz than at 1.4 GHz.

Wang, J. R.↗

Effect of surface roughness on characteristics of spherical shock waves

An investigation has been conducted on a small-scale test layout in which direct observation of the shock wave movement with time could be made in order to determine the effects of surface roughness on the characteristics of spherical shock waves. Data were obtained with 15-gram pentolite charges at four heights of burst, both for a smooth surface and for a surface completely covered with pyramid-shaped roughness elements. The observations resulted in determinations of shock peak overpressure and Mach stem height as a function of distance for each test. Comparison of the smooth-surface data with those obtained for the extremely rough condition showed a small net effort of roughness on the shock peak overpressures at the surface for all burst heights, the effect being to lower the overpressures. The effect of surface roughness on the Mach stem formation and growth was to delay the formation at the greatest charge height and to lower the height of the Mach stem for all heights.Comparison of the free-air shock peak overpressures with larger scale data showed good similarity of the overpressure-distance relationships. The data did not fit a geometrical similarity parameter for the path of the triple point at different heights of burst suggested by other investigators. A simple similarity parameter (relating the horizontal distance to the theoretical point of Mach formation) was found which showed only a small influence of burst height on the path of the triple point. While the data presented provide knowledge of the effect of many surface-roughness elements on the overall shock characteristics, the data do not provide insight into the details of the air-flow characteristics along the surface, nor the relative contribution of individual roughness elements to the results obtained.

Huber, Paul W↗

Simultaneous Retrieval of Surface Roughness Parameters for Bare Soils From Combined Active–Passive Microwave SMAP Observations

An active–passive microwave retrieval algorithm for simultaneous determination of soil surface roughness parameters [vertical root-mean-square (RMS) height ( s ) and horizontal correlation length ( l )] is presented for bare soils. The algorithm is based on active–passive microwave covariation, including the improved Integral Equation Method (I(exp 2) EM), and is tested with global soil moisture active passive (SMAP) observations. The estimated retrieval results for s and l are overall consistent with values in the literature, indicating the validity of the proposed algorithm. Sensitivity analyses showed that the developed roughness retrieval algorithm is independent of permittivity for E(sub s) > 10 [-]. Furthermore, the physical model basis of this approach (I(exp 2) EM) allows the application of different autocorrelation functions (ACF), such as Gaussian and exponential ACFs. Global roughness retrieval results confirm bare areas in deserts such as Sahara or Gobi. However, the type of ACF used within roughness parameter estimation is important. Retrieval results for the Gaussian ACF describe a rougher surface than retrieval results for the exponential ACF. No correlations were found between roughness results and the amount of precipitation or the soil texture, which could be due to the coarse spatial resolution of the SMAP data. The extension of this approach to vegetated soils is planned as an add-on study.

Correlation length↗

Effects of Surface Roughness on the Electrochemical Reduction of CO 2 over Cu

We have investigated the role of surface roughening on the CO 2 reduction reaction (CO 2 RR) over Cu. The activity and product selectivity of Cu surfaces roughened by plasma pretreatment in Ar, O 2 , or N 2 were compared with that of electrochemically polished Cu samples. Differences in total and product current densities, the ratio of current densities for HER (the hydrogen evolution reaction) to CO 2 RR, and the ratio of current densities for C 2+ to C 1 products depend on the electrochemically active surface and are nearly independent of plasma composition. Theoretical analysis of an electropolished and roughened Cu surface reveals a higher fraction of undercoordinated Cu sites on the roughened surface, sites that bind CO preferentially. Roughened surfaces also contain square sites similar to those on a Cu(100) surface but with neighboring step sites, which adsorb OC-COH, a precursor to C 2+ products. Here, these findings explain the increases in the formation of oxygenates and hydrocarbons relative to CO and the ratio of oxygenates to hydrocarbons observed with increasing surface roughness.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

The effects of soil moisture, surface roughness, and vegetation on L-band emission and backscatter

Measurements performed with SIR-B at 1.28 GHz and an airborne multiple-beam push-broom radiometer at 1.4 GHz over agricultural fields near Fresno, California are examined. A theoretical model (Kirchhoff approximation) was used to assess the effects of surface roughness and vegetation (alfalfa and lettuce) with respect to the responses of microwave emission and backscatter to soil-moisture variations. It is found that the surface roughness plays a dominant role compared to the vegetation cover in the microwave backscatter.

Wang, James R.↗

Ronchi test applied to measurement of surface roughness

Ronchi test is applied to measure microscopic variations in surface roughness or flatness of metallized test specimens. Light is projected through a diffraction grating onto the test specimen, and the light reflected from the specimen is viewed or photographed through the grating.

Gallay, H. M.↗

Electromagnetic wave scattering at near-grazing incidence from a gently undulating, rough surface

Models to estimate the reflection coefficient of a statistically rough surface, for example the works of Beckmann, Smith, and Vesecky are discussed. Bistatic radar experiments carried out during the Apollo 16 mission provide a data set with which to compare theoretical models and experimental data. These bistatic S-band radar experiments provide experimental estimates of the Moon's bistatic, forward scatter, reflection coefficient for grazing angles of 2.5 to 78 deg. Theoretical expressions for the reflection coefficient are developed for comparison with these experimental data. At grazing angles below 10 deg the models of Smith and Vesecky compare favorably with the data. Beckmann's model falls significantly more rapidly with decreasing grazing angle than does the data.

Vesecky, J. F.↗

In-situ quantification of the surface roughness for facile fabrications of atomically smooth thin films

Here in this work we present an in-situ technique to quantify the layer-by-layer roughness of thin films and heterostructures by measuring the spectral profile of the reflection high-energy electron diffraction (RHEED). The characteristic features of the diffraction spot, including the vertical to lateral size ratio c/b and the asymmetrical ratio c 1 /c 2 along the vertical direction, are found to be quantitatively dependent on the surface roughness. The quantitative relationships between them are established and discussed for different incident angles of high-energy electrons. As an example, the surface roughnesses of LaCoO 3 films grown at different temperatures are obtained using such an in-situ technique, which are confirmed by the ex-situ atomic force microscopy. Moreover, the in-situ measured layer-by-layer roughness oscillations of two LaCoO 3 films are demonstrated, revealing drastically different information from the intensity oscillations. The experiments assisted with the in-situ technique demonstrate an outstanding high resolution down to similar to ~0.1 Å. Therefore, the new quantitative RHEED technique with real-time feedbacks significantly escalates the thin film synthesis efficiency, especially for achieving atomically smooth surfaces and interfaces. It opens up new prospects for future generations of thin film growth, such as the artificial intelligence-assisted thin film growth.

77 NANOSCIENCE AND NANOTECHNOLOGY↗