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At least 199 records · Page 11

Patterning of dispenser cathode surfaces to a controlled porosity

A process to pattern slots approximately 1.25 microns in width into 25-micron-thick W films that have been deposited onto flat or concave surfaces is discussed. A 25-micron-thick W film with a high degree of (100) orientation is chemically vapor deposited (CVD) onto a flat or concave Mo mandrel. A 5-micron-thick Al film is deposited onto the CVD W, followed by 2 microns of photoresist. On concave cathodes, XeCl2 laser ablation or X-ray lithography is used to pattern the photoresist, whereas on flat cathodes deep UV lithography can be used. The patterned photoresist serves as the mask in a Cl ion-beam-assisted etching (IBAE) process to pattern the Al. An alternative process is to deposit Al2O3 films onto the W and pattern the Al2O3 using laser ablation. The W film is then patterned to 3-6-micron slot widths using IBAE + ClF3 with the patterned Al or Al2O3 as the mask. Finally, a sputter deposition step is required to close up the slots to approximately 1 micron. The process described is capable of patterning concave dispenser cathodes to a controlled and precise porosity.

Garner, Charles E.↗

Laser Light Scattering with Multiple Scattering Suppression Used to Measure Particle Sizes

Laser light scattering is the technique of choice for noninvasively sizing particles in a fluid. The members of the Advanced Technology Development (ATD) project in laser light scattering at the NASA Lewis Research Center have invented, tested, and recently enhanced a simple and elegant way to extend the concentration range of this standard laboratory particle-sizing technique by several orders of magnitude. With this technique, particles from 3 nm to 3 mm can be measured in a solution. Recently, laser light scattering evolved to successfully size particles in both clear solutions and concentrated milky-white solutions. The enhanced technique uses the property of light that causes it to form tall interference patterns at right angles to the scattering plane (perpendicular to the laser beam) when it is scattered from a narrow laser beam. Such multiple-scattered light forms a broad fuzzy halo around the focused beam, which, in turn, forms short interference patterns. By placing two fiber optics on top of each other and perpendicular to the laser beam (see the drawing), and then cross-correlating the signals they produce, only the tall interference patterns formed by singly scattered light are detected. To restate this, unless the two fiber optics see the same interference pattern, the scattered light is not incorporated into the signal. With this technique, only singly scattered light is seen (multiple-scattered light is rejected) because only singly scattered light has an interference pattern tall enough to span both of the fiber-optic pickups. This technique is simple to use, easy to align, and works at any angle. Placing a vertical slit in front of the signal collection fibers enhanced this approach. The slit serves as an optical mask, and it significantly shortens the time needed to collect good data by selectively masking out much of the unwanted light before cross-correlation is applied.

Meyer, William V.↗

Measurement of the Earth-Observer-1 Satellite X-Band Phased Array

The recent launch and successful orbiting of the EO-1 Satellite has provided an opportunity to validate the performance of a newly developed X-Band transmit-only phased array aboard the satellite. This paper will compare results of planar near-field testing before and after spacecraft installation as well as on-orbit pattern characterization. The transmit-only array is used as a high data rate antenna for relaying scientific data from the satellite to earth stations. The antenna contains distributed solid-state amplifiers behind each antenna element that cannot be monitored except for radiation pattern measurements. A unique portable planar near-field scanner allows both radiation pattern measurements and also diagnostics of array aperture distribution before and after environmental testing over the ground-integration and prelaunch testing of the satellite. The antenna beam scanning software was confirmed from actual pattern measurements of the scanned beam positions during the spacecraft assembly testing. The scanned radiation patterns on-orbit were compared to the near-field patterns made before launch to confirm the antenna performance. The near-field measurement scanner has provided a versatile testing method for satellite high gain data-link antennas.

Perko, Kenneth↗

Improvement of vertical velocity measurements, part 3.4B

Vertical velocities are assumed to be measurable with vertically pointing antenna beams. An exact horizontal levelling and good phase calibration of the radar antenna system can yield real main-beam directions which do not significantly differ from calculated patterns. It is, thus, anticipated that antenna beams can be pointed exactly vertically. Because of area size and near-field limitations, VHF radar antennas have typically beam widths of more than several degrees. It is known that most of the reflectivity structures detected by vertically beaming VHF radars in the troposphere, stratosphere and lower mesosphere are aspect-sensitive. It cannot a priori be assumed that these structures are exactly horizontal. A few examples are investigated to support this statement.

Rottger, J.↗

Curved grating fabrication techniques for concentric-circle grating, surface-emitting semiconductor lasers

We describe the fabrication and operational characteristics of a novel, surface-emitting semiconductor laser that makes use of a concentric-circle grating to both define its resonant cavity and to provide surface emission. A properly fabricated circular grating causes the laser to operate in radially inward- and outward-going circular waves in the waveguide, thus, introducing the circular symmetry needed for the laser to emit a beam with a circular cross-section. The basic circular-grating-resonator concept can be implemented in any materials system; an AlGaAs/GaAs graded-index, separate confinement heterostructure (GRINSCH), single-quantum-well (SQW) semiconductor laser, grown by molecular beam epitaxy (MBE), was used for the experiments discussed here. Each concentric-circle grating was fabricated on the surface of the AlGaAs/GaAs semiconductor laser. The circular pattern was first defined by electron-beam (e-beam) lithography in a layer of polymethylmethacrylate (PMMA) and subsequently etched into the semiconductor surface using chemically-assisted (chlorine) ion-beam etching (CAIBE). We consider issues that affect the fabrication and quality of the gratings. These issues include grating design requirements, data representation of the grating pattern, and e-beam scan method. We provide examples of how these techniques can be implemented and their impact on the resulting laser performance. A comparison is made of the results obtained using two fundamentally different electron-beam writing systems. Circular gratings with period lambda = 0.25 microns and overall diameters ranging from 80 microns to 500 microns were fabricated. We also report our successful demonstration of an optically pumped, concentric-circle grating, semiconductor laser that emits a beam with a far-field divergence angle that is less than one degree. The emission spectrum is quite narrow (less than 0.1 nm) and is centered at wavelength lambda = 0.8175 microns.

Jordan, Rebecca H.↗

The automated array assembly task of the low-cost silicon solar array project, phase 2

Several specific processing steps as part of a total process sequence for manufacturing silicon solar cells were studied. Ion implantation was identified as the preferred process step for impurity doping. Unanalyzed beam ion implantation was shown to have major cost advantages over analyzed beam implantation. Further, high quality cells were fabricated using a high current unanalyzed beam. Mechanically masked plasma patterning of silicon nitride was shown to be capable of forming fine lines on silicon surfaces with spacings between mask and substrate as great as 250 micrometers. Extensive work was performed on advances in plated metallization. The need for the thick electroless palladium layer was eliminated. Further, copper was successfully utilized as a conductor layer utilizing nickel as a barrier to copper diffusion into the silicon. Plasma etching of silicon for texturing and saw damage removal was shown technically feasible but not cost effective compared to wet chemical etching techniques.

Coleman, M. G.↗

Repetitive Q-switched operation of x-axis Nd:La2Be2O5

The repetitive Q-switched performances of an x-axis neodymium-doped lanthanum beryllate (Nd:BeL) laser and the current state-of-the-art Nd:YAG laser are compared. Output beam pulse energy, peak power, pulse width, beam divergence and mode pattern were measured for a gold-plated single elliptical cavity using a xenon flashlamp for excitation. The output of the Nd:BeL laser is found to exceed that of the Nd:YAG laser by a factor of two at Q-switched repetition rates on the order of 1 Hz, due to the smaller stimulated emission cross section of the x-axis Nd:BeL. When the repetition rate is increased to 10 Hz, the Nd:BeL output falls to a level three fifths lower than its low-rate value, while Nd:YAG output remained essentially constant. Analysis reveals that the decrease in output may be attributed to a depolarization loss due to thermally induced stress birefringence.

Tucker, A. W.↗

Integration and compaction of optical systems in the mid-infrared

Problems in the design of optical systems for use with mid-IR (MIR; 10.6-micron) lasers are reviewed. The cryogenically operated lead-chalcogenide tunable diode lasers currently used as sources emit complex far-field patterns and require sophisticated beam collection, shaping, and guide optics. Since conventional optics using large mirrors and Ge lenses are often awkward to use and sensitive to vibration, and since optical fibers for the MIR have not been perfected, current research concentrates on hollow flexible rectangular metallic pipes. These pipes are shown to provide transmission of 95 percent or better over a 1-m length, with beam shaping and polarization control. The low transmission losses and wideband IR transmission of single-crystal alkali halides suggest the feasibility of their use in MIR optical fibers and waveguides.

Yu, C.↗

Analysis of a single-fold deployable truss beam preloaded by extension of selected face diagonal members

A technique for preloading a deployable box truss beam by extension of one face diagonal per bay was studied to determine if it would result in uniform loading of truss joints without causing excessive truss deformations. Results indicate that it is possible to accomplish uniform loading in the beam region way from beam boundaries, whereas in the regions near boundaries the member loading becomes non-uniform with magnitudes greater than those in the uniform load region. Also, the type of deformation which results in the beam depends on the pattern of preloaded members.

Wu, K. C.↗

Characteristics of a two-layer electromagnetically coupled rectangular patch antenna

Experimental results on the characteristics of a two-layer electromagnetically coupled rectangular patch antenna are presented. The variations of pattern shape, 3 dB beam width, and impedance bandwidth with spacing s between the two layers are studied for s between 0 and 0.37 lambda (0). A relatively high-gain region is found for s between 0.31 lambda (0) and 0.37 lambda (0).

Lee, R. Q.↗

Analysis of a high harmonic rectangular gyrotron using ribbon beams

Cylindrical cavity structures and electron orbits; a grooved gyrotron using a ribbon beam; construction details; radiation patterns; radiation distribution; phase distribution; energy curves; and advantages are outlined. This presentation is represented by viewgraphs and charts only.

Ferendeci, Altan M.↗

A 32-GHz phased array transmit feed for spacecraft telecommunications

A 21-element phased array transmit feed was demonstrated as part of an effort to develop and evaluate state-of-the-art transmitter and receiver components at 32 and 34 GHz for future deep-space missions. Antenna pattern measurements demonstrating electronic beam steering of the two-dimensional array are reported and compared with predictions based on measured performance of MMIC-based phase shifter and amplifier modules and Vivaldi slotline radiating elements.

Lee, K. A.↗

Growing Aligned Carbon Nanotubes for Interconnections in ICs

A process for growing multiwalled carbon nanotubes anchored at specified locations and aligned along specified directions has been invented. Typically, one would grow a number of the nanotubes oriented perpendicularly to a silicon integrated-circuit (IC) substrate, starting from (and anchored on) patterned catalytic spots on the substrate. Such arrays of perpendicular carbon nanotubes could be used as electrical interconnections between levels of multilevel ICs. The process (see Figure 1) begins with the formation of a layer, a few hundred nanometers thick, of a compatible electrically insulating material (e.g., SiO(x) or Si(y)N(z) on the silicon substrate. A patterned film of a suitable electrical conductor (Al, Mo, Cr, Ti, Ta, Pt, Ir, or doped Si), having a thickness between 1 nm and 2 m, is deposited on the insulating layer to form the IC conductor pattern. Next, a catalytic material (usually, Ni, Fe, or Co) is deposited to a thickness between 1 and 30 nm on the spots from which it is desired to grow carbon nanotubes. The carbon nanotubes are grown by plasma-enhanced chemical vapor deposition (PECVD). Unlike the matted and tangled carbon nanotubes grown by thermal CVD, the carbon nanotubes grown by PECVD are perpendicular and freestanding because an electric field perpendicular to the substrate is used in PECVD. Next, the free space between the carbon nanotubes is filled with SiO2 by means of CVD from tetraethylorthosilicate (TEOS), thereby forming an array of carbon nanotubes embedded in SiO2. Chemical mechanical polishing (CMP) is then performed to remove excess SiO2 and form a flat-top surface in which the outer ends of the carbon nanotubes are exposed. Optionally, depending on the application, metal lines to connect selected ends of carbon nanotubes may be deposited on the top surface. The top part of Figure 2 is a scanning electron micrograph (SEM) of carbon nanotubes grown, as described above, on catalytic spots of about 100 nm diameter patterned by electron-beam lithography. These and other nanotubes were found to have lengths ranging from 2 to 10 m and diameters ranging from 30 to 200 nm, the exact values of length depending on growth times and conditions and the exact values of diameter depending on the diameters and thicknesses of the catalyst spots. The bottom part of Figure 2 is an SEM of an embedded array of carbon nanotubes after CMP.

Li, Jun↗

Lock-In Imaging System for Detecting Disturbances in Fluid

A lock-in imaging system is configured for detecting a disturbance in air. The system includes an airplane, an interferometer, and a telescopic imaging camera. The airplane includes a fuselage and a pair of wings. The airplane is configured for flight in air. The interferometer is operatively disposed on the airplane and configured for producing an interference pattern by splitting a beam of light into two beams along two paths and recombining the two beams at a junction point in a front flight path of the airplane during flight. The telescopic imaging camera is configured for capturing an image of the beams at the junction point. The telescopic imaging camera is configured for detecting the disturbance in air in an optical path, based on an index of refraction of the image, as detected at the junction point.

Park, Yeonjoon↗

Method for nanoscale spatial registration of scanning probes with substrates and surfaces

Embodiments in accordance with the present invention relate to methods and apparatuses for aligning a scanning probe used to pattern a substrate, by comparing the position of the probe to a reference location or spot on the substrate. A first light beam is focused on a surface of the substrate as a spatial reference point. A second light beam then illuminates the scanning probe being used for patterning. An optical microscope images both the focused light beam, and a diffraction pattern, shadow, or light backscattered by the illuminated scanning probe tip of a scanning probe microscope (SPM), which is typically the tip of the scanning probe on an atomic force microscope (AFM). Alignment of the scanning probe tip relative to the mark is then determined by visual observation of the microscope image. This alignment process may be repeated to allow for modification or changing of the scanning probe microscope tip.

Wade, Lawrence A.↗

Improved Phase-Mask Fabrication of Fiber Bragg Gratings

An improved method of fabrication of Bragg gratings in optical fibers combines the best features of two prior methods: one that involves the use of a phase mask and one that involves interference between the two coherent laser beams. The improved method affords flexibility for tailoring Bragg wavelengths and bandwidths over wide ranges. A Bragg grating in an optical fiber is a periodic longitudinal variation in the index of refraction of the fiber core. The spatial period (Bragg wavelength) is chosen to obtain enhanced reflection of light of a given wavelength that would otherwise propagate relatively unimpeded along the core. Optionally, the spatial period of the index modulation can be made to vary gradually along the grating (such a grating is said to be chirped ) in order to obtain enhanced reflection across a wavelength band, the width of which is determined by the difference between the maximum and minimum Bragg wavelengths. In the present method as in both prior methods, a Bragg grating is formed by exposing an optical fiber to an ultraviolet-light interference field. The Bragg grating coincides with the pattern of exposure of the fiber core to ultraviolet light; in other words, the Bragg grating coincides with the interference fringes. Hence, the problem of tailoring the Bragg wavelength and bandwidth is largely one of tailoring the interference pattern and the placement of the fiber in the interference pattern. In the prior two-beam interferometric method, a single laser beam is split into two beams, which are subsequently recombined to produce an interference pattern at the location of an optical fiber. In the prior phase-mask method, a phase mask is used to diffract a laser beam mainly into two first orders, the interference between which creates the pattern to which an optical fiber is exposed. The prior two-beam interferometric method offers the advantage that the period of the interference pattern can be adjusted to produce gratings over a wide range of Bragg wavelengths, but offers the disadvantage that success depends on precise alignment and high mechanical stability. The prior phase-mask method affords the advantages of compactness of equipment and relative insensitivity to both misalignment and vibration, but does not afford adjustability of the Bragg wavelength. The present method affords both the flexibility of the prior two-beam interferometric method and the compactness and stability of the prior phase-mask method. In this method (see figure), a laser beam propagating along the x axis is normally incident on a phase mask that lies in the (y,z) plane. The phase of light propagating through the mask is modulated with a spatial periodicity, p, along the y axis chosen to diffract the laser light primarily to first order at the angle . (The zero-order laser light propagating along the x axis can be used for alignment and thereafter suppressed during exposure of the fiber.) The diffracted light passes through a concave cylindrical lens, which converts the flat diffracted wave fronts to cylindrical ones, as though the light emanated from a line source. Then two parallel flat mirrors recombine the diffracted beams to form an interference field equivalent to that of two coherent line sources at positions A and B (virtual sources). The interference pattern is a known function of the parameters of the apparatus and of position (x,y) in the interference field. Hence, the tilt, wavelength, and chirp of the Bragg grating can be chosen through suitable adjustments of the apparatus and/or of the position and orientation of the optical fiber. In particular, the Bragg wavelength can be adjusted by moving the fiber along the x axis, and the bandwidth can be modified over a wide range by changing the fiber tilt angle or by moving the phase mask and/or the fiber. Alignment is easy because the zero-order beam defines the x axis. The interference is relatively stable and insensitive to the mechanical vibration because of the gh symmetry and compactness of the apparatus, the fixed positions of the mirrors and lens, and the consequent fixed positions of the two virtual line sources, which are independent of the translations of the phase mask and the laser relative to the lens.

Grant, Joseph↗