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At least 199 records · Page 11

Implementation of a 1550-nm laser system for beam characterization at the Argonne Wakefield Accelerator

Accurately recording an electron bunch’s longitudinal profile is an important diagnostic for wakefield accelerators employing shaped bunches to increase transformer ratios. Electro-optic sampling of terahertz radiation from the bunch is an attractive approach due to its non-destructive nature. In preparation for future characterization experiments, the Argonne Wakefield Accelerator test facility has recently installed a 1550 nm laser system, including the necessary support systems to synchronize with the photoinjector laser system at 81.25 MHz. We report here on the initial installation and synchronization demonstrations.

Ody, Alexander [Argonne, PHY]↗

Ranging system which compares an object reflected component of a light beam to a reference component of the light beam

A system is described for measuring the distance to an object by comparing a first component of a light pulse that is reflected off the object with a second component of the light pulse that passes along a reference path of known length, which provides great accuracy with a relatively simple and rugged design. The reference path can be changed in precise steps so that it has an equivalent length approximately equal to the path length of the light pulse component that is reflected from the object. The resulting small difference in path lengths can be precisely determined by directing the light pulse components into opposite ends of a detector formed of a material that emits a second harmonic light output at the locations where the opposite going pulses past simultaneously across one another.

Mclauchlan, J. M.↗