Source of Scatter in the Creep Lives of NiAl(Hf) Single Crystals Revealed
In recent years, there has been an increased emphasis in developing NiAl-based alloys for high- temperature applications in aircraft engines. In comparison to commercial superalloys, binary NiAl has a higher melting temperature, lower density, larger thermal conductivity, and better oxidation resistance. These properties make it a desirable material to replace superalloys as blades and vanes in aircraft engines. Despite this attractive combination of properties, binary NiAl cannot be used as a reliable structural material because of its low-temperature brittleness and poor high-temperature creep strength. GE Aircraft Engines in Cincinnati, Ohio, has recently developed NiAl(Hf) alloys that have creep strengths comparable to commercial superalloys while maintaining the other desirable properties of binary NiAl. The microstructures of these alloys consist of finely distributed G-phase (Ni_(16)Hf_(6)Si_(7)) precipitates, which strengthen the NiAl matrix. However, while the creep properties of these alloys were being evaluated, considerable scatter was observed in the creep lives of specimens tested under identical stress and temperature conditions. Although these alloys had nominally the same composition, the test specimens were obtained from four different ingots (A, B, C, and D) that had been heat treated under similar conditions. The NASA Lewis Research Center began the present study at the request of GE Aircraft Engines under a Space Act Agreement to identify the source of this scatter.