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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 199 records · Page 11
All sourcesNASA NTRSDOE OSTI
DOE OSTI2020

Reproducing the 'Framing' by a Sequential Stress Test

The 'Framing' (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this 'Framing' indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.

14 SOLAR ENERGY↗
DOE OSTI2015

Theory and simulation of quasilinear transport from external magnetic field perturbations in a DIII-D plasma

The linear response profiles for the 3D perturbed magnetic fields, currents, ion velocities, plasma density, pressures, and electric potential from low-n external resonant magnetic field perturbations (RMPs) are obtained from the collisional two-fluid M3D-C1 code [N. M. Ferraro and S. C. Jardin, J. Comput. Phys. 228, 7742 (2009)]. A newly developed post-processing RMPtran code computes the resulting quasilinear E×B and magnetic (J×B) radial transport flows with respect to the unperturbed flux surfaces in all channels. RMPtran simulations focus on ion (center of mass) particle and transient non-ambipolar current flows, as well as the toroidal angular momentum flow. The paper attempts to delineate the RMP transport mechanisms that might be responsible for the RMP density pump-out seen in DIII-D [M. A. Mahdavi and J. L. Luxon, Fusion Sci. Technol. 48, 2 (2005)]. Experimentally, the starting high toroidal rotation does not brake to a significantly lower rotation after the pump-out suggesting that convective and E×B transport mechanisms dominate. The direct J×B torque from the transient non-ambipolar radial current expected to accelerate plasma rotation is shown to cancel much of the Maxwell stress J×B torque expected to brake the plasma rotation. The dominant E×B Reynolds stress accelerates rotation at the top of the pedestal while braking rotation further down the pedestal.

Waltz, R. E. (ORCID:0000000252034830)↗
DOE OSTI2023

Advanced Module Architecture for Reduced Costs, High Durability and Significantly Improved Manufacturability (Final Report)

This project demonstrated a new module architecture (referred to herein as Glass/Glass) using silicone edge seals and an interlayer polymer that reduces manufacturing costs, significantly streamlines manufacturing processes, and reduces cap-ex costs while improving module reliability. A prototype manufacturing process to fabricate this new module architecture was demonstrated with a significantly improved process cycle time for the lamination step from the current industry standard of 13.5 minutes to approximately 30 seconds for each of the individual edge seal and internal polymer application steps. Samples are fabricated, strenuously stressed, and characterized to quantify the cost benefits, hardware capacities and accelerated stress performance of the new architecture. These results are being compared to a standard, laminated baseline architecture using a Glass/EVA/Glass or Glass/Thermoplastic/Glass design that traditionally has high moisture vapor transmission rates (MVTR).

14 SOLAR ENERGY↗
DOE OSTI2026

Measuring the Stress Factors for Photovoltaic (PV) Backsheet Degradation

Back sheet failure has resulted in power loss and large-scale recall of photovoltaic modules, resulting in billions of dollars in lost revenue. The light exposure on the backside of a photovoltaic module comes primarily from reflected light which alters the distribution of natural sunlight. Because of this, modelling the backside exposure and duplicating the exposure is much more difficult than modeling the frontside exposure. This project aims to study how various back sheets and junction box materials degrade under different conditions and to develop Python code to help model and predict degradation. The stress factors for back-sheet degradation must be quantified to extrapolate accelerated stress tests to the field. Test samples were placed in the A3, A4, and A5 conditions, as defined in IEC 62788-7-2, to assess the temperature and humidity dependence of ultraviolet (UV) induced degradation. We are utilizing a custom chamber with exposure from 0.5 UV-suns to 5 UV-suns to understand the dependence of degradation on light intensity. A group of samples put in the A3 condition had glass filters with 50% UV cut-offs of 320 nm, 335 nm, and 360 nm to assess the wavelength dependence of UV degradation. All this data is necessary to assess the impact of non-standard UV light exposure. The material evaluation tests include gloss measurements, attenuated total internal reflectance Fourier transform infrared spectroscopy (ATR-FTIR), UV-visible reflectance/transmittance utilizing a Cary Ci7000 spectrophotometer, and a nano-indenter for surface hardness and modulus measurements. Alongside the experimental work, there is a computational effort using raytracing and Python open-source tools in PVDeg , PVLib, and Bifacial_Radiance. This code will create specific exposure scenarios and enable the evaluation of chamber degradation relative to field degradation. Equation 1 is a strawman equation used to model degradation on the backside of a PV module. We will create simplified code, based on the results of ray-tracing calculations, which uses a view factor approach to provide fast calculations for the most common exposure scenarios.

14 SOLAR ENERGY↗
DOE OSTI2020

Changes in SSL Device Efficiency and Optical Performance Under Accelerated Aging Conditions

Lighting application efficiency (LAE) describes the efficient delivery of light from the light source to the lighted task and is viewed as a new frontier—increasing energy savings with solid-state lighting (SSL) technologies. The framework for LAE that is proposed by the U.S. Department of Energy (DOE) consists of four major elements: light source efficiency, optical delivery efficiency, spectral efficiency, and intensity effectiveness. This report focuses on a sampling of the available SSL products that can be broadly defined as having modified spectral output because the method of spectra modification has a significant impact on light source efficiency and long-term optical delivery and spectral efficiencies. This report focused on the changes in light source, optical delivery, and spectral efficiencies that occur during aging of SSL devices. An accelerated stress test (AST) regiment was developed for the devices under test (DUTs) examined in this report to provide insights into how the performance of SSL devices change with aging. The AST protocols demonstrate that the SSL products discussed in this report often reduce light source efficiency to achieve different spectral characteristics. In addition, aging of the optical components (e.g., lenses, solder masks) in SSL devices can produce increased light absorption, which negatively impacts optical delivery efficiency and light source efficiency. The modified spectral outputs of the selected SSL products discussed in this report come in a variety of form factors and achieve enhanced optical performance by using a variety of methods. All of the products examined in this study use mid-power light-emitting diodes (MP-LEDs), although the number, configuration, phosphor content, and light-emitting diode (LED) pump of the MP-LEDs differ. Product MS-1 is a 60-watt (W) replacement A19 lamp with a hermetically sealed glass globe, which contains an embedded optical filter to absorb green and yellow emissions, thereby creating a “sunlike” modified spectrum. Product MS-2 is a 60-W replacement A19 lamp with 30 MP-LEDs, and it uses a violet LED pump, along with green and red phosphor emissions, to produce a “healthy” spectrum. This spectrum omits blue emissions in an effort to reduce melanopic lux. Product MS-3 is an LED module consisting of 21 MP-LEDs that use a violet LED pump, along with blue, green, and red phosphors, to produce a “sunlike” spectrum. Products MS-4 and MS-5 are both 6-inch (in) downlights that use a manual switching mechanism so that users can select application-specific correlated color temperatures before installation. Products MS-4 and MS-5 both contain two LED primaries (2,700 Kelvin [K] and 5,000 K) for spectral tuning. Product MS-4 contains 12 MP-LEDs for each LED primary, and Product MS-5 contains 10 MP-LEDs for each LED primary. This report summarizes the overall findings from up to 8,000 hours (hrs) of AST on the lamp DUTs (Products MS-1 and MS-2); up to 5,000 hrs of AST on the LED light engine DUTs (Product MS-3); and up to 7,000 hrs of AST on the downlight DUTs (Products MS-4 and MS-5). The AST procedures used in this study included a room temperature operational life (RTOL) test, an operational life test conducted at 45 degrees Celsius (°C; 45OL) test, an operational life test conducted at 75°C (75OL), a wet high-temperature operational life test performed at 65°C and 90% relative humidity (6590), and a wet high-temperature operational life test performed at 75°C and 75% relative humidity (7575). The AST procedures used for Products MS-1 and MS-2 were RTOL, 45OL, and 6590. The AST procedures used for Products MS-3, MS-4, and MS-5 were RTOL, 75OL, and 7575. During the ASTs described herein, separate populations of each product (three DUTs in each population for Products MS-1, MS-2, MS-4, and MS-5; four DUTs in each population for Product MS-3) were subjected to power cycling of 1 hr on and 1 hr off. The key findings from this study include the following. Enhanced optical performance came at the cost of reduced light source efficiency for the lamps and light engines examined in this study. The optical filter used to produce a “sunlike” spectrum for Product MS-1 reduced light source efficiency by 26%, from 113 lumens per watt (lm/W) to 85 lm/W. Products MS-2 and MS-3 that used a violet-pumped LED to achieve “healthy” and “sunlike” enhanced optical performance, respectively, suffered the largest reduction in initial light source efficiency (49 lm/W for Product MS-2 and 68 lm/W for Products MS-3) perhaps because of the use of violet LED as the optical pump. Product MS-2 also had the poorest color fidelity because of undersaturation of blues and oversaturation of greens and yellows. Chromaticity maintenance of the products in this study was generally good, with parametric failure only occurring for one product at one AST condition (i.e., Product MS-3 at 7575). The chromaticity shift for Product MS-3 in 7575 test conditions resulted from reduced emissions of the broad green and red phosphors used to mimic sunlight in the 500–750 nanometer (nm) range. As a result of these phosphor emission losses, chromaticity shifted toward the more stable violet-pumped LED and blue phosphor. Although chromaticity maintenance was acceptable for most products tested, different chromaticity shift mechanisms were observed for temperature and humidity tests compared with temperature alone for Products MS-1, MS-2, and MS-3. For Product MS-1, a relative increase in green emissions was observed with humidity, which may indicate humidity-accelerated degradation of the optical filter at green wavelengths (optical delivery efficiency reduction) or degradation of the emitters in the red region (spectral efficiency reduction). The violet-pumped products (i.e., MS-2 and MS-3) exhibited different chromaticity shift behavior in the temperature-humidity environments, with Product MS-2 shifting generally yellow because of photo-induced oxidation of the plastic globe (i.e., a reduction of optical delivery efficiency) and Product MS-3 shifting toward violet and blue emitters because of faster loss of emission from green and red phosphors (i.e., a reduction in spectral efficiency). Because of an initial drop in power consumption, the light source efficiency of downlights (Products MS-4 and MS-5) increased at RTOL throughout the test duration. The light source efficiency initially increased during 75OL until a decay in luminous flux maintenance (LFM) dominated light source efficiency, whereas the light source efficiency decreased for the entire 7575 test duration. It was found that increasing the ambient environment of an SSL device from 25°C to 75°C decreases the LFM by 2.7 to 5.5, depending on design of the SSL device. Adding humidity to the system (75OL to 7575) was found to decrease LFM by another factor of approximately 3.0. A common location of failure was identified for the downlights (Products MS-4 and MS-5) operated in the 7575 environment. This failure abruptly occurred between 3,000 to 5,000 hrs of testing on the film capacitor of the electromagnetic interference (EMI) filter near the diode bridge for 11 of the 12 downlights. It is likely that this failure was caused by a combination of the high electrical voltage across the capacitor, the location of the capacitor near the heat sources (e.g., transformers, diode bridges, power resistors), and the high stress environment of 7575. Longer test times are needed to fully understand the LFM, luminous efficacy changes, and chromaticity shifts for some of the products. Because of the high reliability, light source efficiency, and spectral tuning capabilities of LEDs, the expectations of LAE for SSL products are greatly increased over traditional lighting products. The data gathered in this report begin to provide an understanding of the tradeoffs that current SSL products undergo when optimizing the different efficiency elements of LAE. As discussed in this report, the findings from the tests conducted show that the optimization of spectral efficiency can come at the cost of initial light source efficiency. Furthermore, the introduction of violet LEDs can promote long-term optical delivery efficiency degradation, and the introduction of optical filters or new phosphors can lead to unwanted spectral efficiency changes because the ratio of phosphor emitters changes with aging. The data presented in this report also identified a common failure location in 6-in downlights. The results regarding long-term behavior of the modified spectra devices studied provide valuable information about changes to the light source, spectral, and optical delivery efficiencies as the devices age. This information can be used to improve future SSL designs.

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATI↗
NASA NTRS1972

Splanchnic blood flow and plus or minus Gx acceleration.

Experimental data show that there is a neurogenic response to acceleration stress in the front to back direction and that this response is intensified during higher accelerative forces. The afferent limb of this response is unknown but possibilities are suggested. The integrated response at high acceleration levels might serve to conserve oxygen during the stress time. The effector limb is the constriction of less critical vascular beds to preserve blood flow to the heart and brain. The concomitant increase in vagal activity causes a slowing down of the heart.

Stone, H. L.↗
NASA NTRS1980

Contact integrity testing of stress-tested silicon terrestrial solar cells

A test procedure was developed and applied to terrestrial silicon solar cells in order to determine the effect of accelerated environmental and time-temperature aging on metal contact integrity. Quantities of cells of four different manufacturers were given the contact integrity test after being subjected to accelerated stress tests that included forward bias-temperature, thermal cycle and thermal shock, power cycle, and bias-temperature humidity tests at two temperature-humidity levels. Significant effects due to certain stress tests were found for some cell types. It is concluded that cells fabricated using plated nickel/solder metallization showed significantly more serious contact integrity degradation than silver-metallized cells.

Prince, J. L.↗
DOE OSTI2017

Modeling the impact of thermal effects on luminous flux maintenance for SSL luminaires

Meeting the longevity requirements of solid-state lighting (SSL) devices places extreme demands on the materials and designs that are used in SSL luminaires. Therefore, understanding the aging characteristics of lens, reflectors, and other materials is essential to projecting the long-term performance of LED-based lighting systems. Overlooking these factors at either the design or product specification stage can result in premature failure of the device due to poor luminous flux maintenance and/or excessive chromaticity shifts. This paper describes a methodology for performing accelerated stress testing (AST) on materials intended for use in SSL luminaires. This test methodology, which consists of elevated temperature and humidity conditions, produces accelerated aging data that can be correlated to expected performance under normal luminaire operating conditions. The correlations can then be leveraged to produce models of the changes in the optical properties of key materials including transmittance versus wavelength of lenses and reflectance versus wavelength for housings and other reflectors. This information has been collected into a lumen maintenance decision support tool (LM-DST) and together with user supplied inputs (e.g., expected operation conditions) can provide guidance on lifetime expectations of SSL luminaires. This approach has been applied to a variety of materials commonly found in SSL luminaires including acrylics, polycarbonates, and silicones used for lenses and paints, coatings, films, and composites used for reflectors.

36 MATERIALS SCIENCE↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
DOE OSTI2019

Efficient thermo-mechanical simulation approaches for arc-and-wire based additive manufacturing

This study aims at the thermo-mechanical features inherent with the arc and wire metal deposition process to advance the structural simulation of additive manufacturing. Simulation approaches including iterative substructure method (ISM), dynamic mesh refining method (DMRM), and graphics processing unit (GPU) based explicit FEM code (GPU code) were developed for accelerating stress analysis and compared in terms of efficiency and accuracy. ISM and DMRM both take advantage of the strong nonlinearity phenomenon near the moving heat source, by reducing the global iterations and refining the local mesh respectively. The explicit FEM code was accelerated by a mass scaling technique based on the inherent strain concept. Two large parts by wire and arc additive manufacturing were analyzed, and the numerical results agreed very well with each other. The predicted distortion and residual stresses in the deposited layers were validated by experimental measurement. Compared with commercial software ABAQUS, the novel approaches reduced the computation cost substantially without compromising on accuracy. GPU code shows the highest computation efficiency (x30~70), while DMRM and ISM has an acceleration factor of x9 and x3 respectively. Owing to the minimum model simplification, such advanced simulation approaches will be very useful for structural analysis of additive manufacturing with complex deposition paths and product geometry.

Huang, Hui↗
DOE OSTI2019

Use of indentation to study the degradation of photovoltaic backsheets

The ability of electrical insulating materials within a module to act as insulators is a key safety requirement for photovoltaic (PV) technology. Presently, however, the durability of backsheets may not be readily assessed. For example, the mechanical tensile test continues to be developed, and its use has not been validated such that a technically based pass/fail criteria may be established. This study examines the use of simple indentation methods, including durometer hardness and instrumented indentation, as a means to quantitively assess the degradation of PV backsheets. Characteristics including: hardness, modulus, load/displacement profile, creep hold response, and residual impression are explored in an empirical study. Glass/encapsulant/backsheet mini-modules constructed using backsheets including: polyamide (PA), poly(ethylene terephthalate) (PET), polyvinyl fluoride (PVF) laminate ('TPE'), and polyvinylidene fluoride (PVDF) were examined. An M-type durometer as well as Berkovich and cube-corner tips were used in the indentation experiments. Additional characterizations were performed to interpret the indentation measurements including: surface roughness measurements using atomic force microscopy (AFM), a chemical integrity study using Fourier-transform infrared spectroscopy (FTIR), and phase-transition measurements using differential scanning calorimetry (DSC). The results are analyzed in the context of the combined accelerated stress test (C-AST) also explored in this study. Instrumented indentation (i.e., using a Berkovich tip) was able to distinguish between backsheets and quantify the effects of accelerated testing (including up to 60%, 25%, and 20% change in hardness, modulus, and creep displacement, respectively). The embrittlement of the backsheets was not readily assessable using cube-corner indentation. Cracking of the known-bad polyamide backsheet was observed from the C-AST, which was not observed to result from steady state UV weathering.

14 SOLAR ENERGY↗
DOE OSTI2024

Highly accelerated life testing (HALT): A review from a statistical perspective

Despite its use in one form or another for at least four decades, HALT and related techniques [e.g., highly accelerated-stress screening (HASS) and stress audits (HASA)] are not well understood within the statistical community and remain controversial. This largely reflects a conflict in motivation between engineers, testing under harsh conditions to discover and eliminate failure modes, and statisticians, taking a more cautious approach to develop quantitative estimates of parameters such as mean time between failures (MTBF). Here, this review article will clarify HALT concepts and methods and explain where it fits within the universe of methods that involve the application of accelerating factors to compress the time required to evaluate or enhance product reliability. A major distinction is between methods such as HALT, a high-stress test-analyze-fix-test iterative process directed at improving reliability by discovering and fixing weak points in a design, and quantitative accelerated life testing (QALT), whose goal is the estimation of product life for a fixed design. We discuss methods such as physics of failure that offer some hope of bridging the gap between the qualitative nature of HALT, and purely quantitative statistical methods. We present a variety of engineering applications of HALT including metal fatigue, piping and pressure vessels, structural damage, radiation damage, and rotating machinery. We also discuss potential synergies between HALT and QALT, such as rapid identification, through HALT, of failure modes requiring quantitative analysis. For further study, extensive references to the applicable literature are provided as well as an appendix that describes related methods.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS1972

Advance techniques for monitoring human tolerance to +Gz accelerations.

Standard techniques for monitoring the acceleration-stressed human subject have been augmented by measuring (1) temporal, brachial and/or radial arterial blood flow, and (2) indirect systolic and diastolic blood pressure at 60-sec intervals. Results show that the response of blood pressure to positive accelerations is complex and dependent on an interplay of hydrostatic forces, diminishing venous return, redistribution of blood, and other poorly defined compensatory reflexes.

Pelligra, R.↗
NASA NTRS1984

Assessing photovoltaic module life from long-term environmental tests

An assessment is made of results obtained by an experimental program having as its aim the identification of critical temperature-humidity bias degradation mechanisms in solar cell modules intended to have an operating lifetime of the order of 20-30 years. These mechanisms are studied in the context of conditions encountered over the course of long term operation in various sites in the U.S. Accelerated tests for the assessment of product lifetime entail the development of a correlation between test and application conditions; this has been accomplished through an analytical procedure for the correlation of time-varying field exposures to constant-stress accelerated environments.

Otth, D. H.↗
NASA NTRS2006

Accelerated Life Structural Benchmark Testing for a Stirling Convertor Heater Head

For proposed long-duration NASA Space Science missions, the Department of Energy, Lockheed Martin, Infinia Corporation, and NASA Glenn Research Center are developing a high-efficiency, 110 W Stirling Radioisotope Generator (SRG110). A structurally significant limit state for the SRG110 heater head component is creep deformation induced at high material temperature and low stress level. Conventional investigations of creep behavior adequately rely on experimental results from uniaxial creep specimens, and a wealth of creep data is available for the Inconel 718 material of construction. However, the specified atypical thin heater head material is fine-grained with a heat treatment that limits precipitate growth, and little creep property data for this microstructure is available in the literature. In addition, the geometry and loading conditions apply a multiaxial stress state on the component, far from the conditions of uniaxial testing. For these reasons, an extensive experimental investigation is ongoing to aid in accurately assessing the durability of the SRG110 heater head. This investigation supplements uniaxial creep testing with pneumatic testing of heater head-like pressure vessels at design temperature with stress levels ranging from approximately the design stress to several times that. This paper presents experimental results, post-test microstructural analyses, and conclusions for four higher-stress, accelerated life tests. Analysts are using these results to calibrate deterministic and probabilistic analytical creep models of the SRG110 heater head.

Krause, David L.↗
DOE OSTI2018

Enabling reliability assessments of pre-commercial perovskite photovoltaics with lessons learned from industrial standards [Enabling reliability of pre-commercial perovskite photovoltaics with lessons learned from industrial standards]

Here, photovoltaic modules are expected to operate in the field for more than 25 years, so reliability assessment is critical for the commercialization of new photovoltaic technologies. In early development stages, understanding and addressing the device degradation mechanisms are the priorities. However, any technology targeting large-scale deployment must eventually pass industry-standard qualification tests and undergo reliability testing to validate the module lifetime. In this Perspective, we review the methodologies used to assess the reliability of established photovoltaics technologies and to develop standardized qualification tests. We present the stress factors and stress levels for degradation mechanisms currently identified in pre-commercial perovskite devices, along with engineering concepts for mitigation of those degradation modes. Recommendations for complete and transparent reporting of stability tests are given, to facilitate future inter-laboratory comparisons and to further the understanding of field-relevant degradation mechanisms, which will benefit the development of accelerated stress tests.

14 SOLAR ENERGY↗