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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
NASA NTRS1998

On-Orbit Teflon(trademark) FEP Degradation

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon(trademark) FEP (fluorinated ethylene propylene), used as the outer layer of the multi-layer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon(trademark) FEP sample evaluation and additional testing of pristine Teflon(trademark) FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations, and that the damage increased with the combined total dose of electrons, protons, UV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the Teflon(trademark) FEP.

Townsend, Jacqueline A.↗
NASA NTRS1998

On-Orbit Teflon FEP Degradation

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon' FEP (fluorinated ethylene propylene), used as the outer layer of the multi-layer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon FEP sample evaluation and additional testing of pristine Teflon FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations, and that the damage increased with the combined total dose of electrons, protons, LTV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the Teflon FEP.

Townsend, Jacqueline A.↗
NASA NTRS1998

On-Orbit Teflon(R) FEP Degradation

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon(R) FEP (fluorinated ethylene propylene), used as the outer layer of the multi-layer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon(R) FEP sample evaluation and additional testing of pristine Teflon(R) FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations, and that the damage increased with the combined total dose of electrons, protons, UV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the Teflon(R) FEP.

Townsend, Jacqueline A.↗
NASA NTRS1988

Hubble Space Telescope Metallized Teflon(registered trademark) FEP Thermal Control Materials: On-Orbit Degradation and Post-Retrieval Analysis

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon(Registered Trademark) FEP (fluorinated ethylene propylene), used as the outer layer of the multilayer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon(Registered Trademark) FEP sample evaluation and additional testing of pristine Teflon(Registered Trademark) FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations , and that the damage increased with the combined total dose of electrons, protons, UV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the retrieved Teflon(Registered Trademark) FEP.

Townsend, Jacqueline A.↗
NASA NTRS1999

On-Orbit Teflon(trademark) FEP Degradation

During the Hubble Space Telescope (HST) Second Servicing Mission (SM2), degradation of unsupported Teflon(trademark) FEP (fluorinated ethylene propylene), used as the outer layer of the multi-layer insulation (MLI) blankets, was evident as large cracks on the telescope light shield. A sample of the degraded outer layer was retrieved during the mission and returned to Earth for ground testing and evaluation. The results of the Teflon(trademark) FEP sample evaluation and additional testing of pristine Teflon FEP led the investigative team to theorize that the HST damage was caused by thermal cycling with deep-layer damage from electron and proton radiation which allowed the propagation of cracks along stress concentrations, and that the damage increased with the combined total dose of electrons, protons, UV and x-rays along with thermal cycling. This paper discusses the testing and evaluation of the Teflon(trademark) FEP.

Townsend, Jacqueline↗
DOE OSTI2023

Atomic-scale modeling of C/N kinetic stability descriptors for PGM-free electrocatalysts at finite temperatures

The durability of platinum group metal-free (PGM-free) electrocatalysts is a major barrier to their usage in polymer electrolyte fuel cell cathodes. C and N removal from active sites may play an important role in the catalyst’s ability to maintain high activity. While C degradation mechanisms are kinetically controlled, previous studies have focused on thermodynamic descriptors. In this work, we develop a temperature-dependent kinetic descriptor of C and N stability using an electron beam-damage model. Our approach considers the electron beam energy threshold (EBET) describing the knock-on displacement of C and N atoms as a stability descriptor for atomic structures. The stability of different sites is calculated to be different showing this approach can discriminate between similar sites with varied configurations. Additionally, we provide important insight regarding TEM beam damage of proposed active sites. We calculate 60 keV electrons can damage some proposed active site structures even at room temperature.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2015

Dislocation core structures in Si-doped GaN

Aberration-corrected scanning transmission electron microscopy was used to investigate the core structures of threading dislocations in plan-view geometry of GaN films with a range of Si-doping levels and dislocation densities ranging between (5 ± 1) × 10{sup 8} and (10 ± 1) × 10{sup 9} cm{sup −2}. All a-type (edge) dislocation core structures in all samples formed 5/7-atom ring core structures, whereas all (a + c)-type (mixed) dislocations formed either double 5/6-atom, dissociated 7/4/8/4/9-atom, or dissociated 7/4/8/4/8/4/9-atom core structures. This shows that Si-doping does not affect threading dislocation core structures in GaN. However, electron beam damage at 300 keV produces 4-atom ring structures for (a + c)-type cores in Si-doped GaN.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2014

Conditioning of BPM pickup signals for operations of the Duke storage ring with a wide range of single-bunch current

The Duke storage ring is a dedicated driver for the storage ring based oscillator free-electron lasers (FELs), and the High Intensity Gamma-ray Source (HIGS). Furthermore, it is operated with a beam current ranging from about 1 mA to 100 mA per bunch for various operations and accelerator physics studies. High performance operations of the FEL and γ-ray source require a stable electron beam orbit, which has been realized by the global orbit feedback system. As a critical part of the orbit feedback system, the electron beam position monitors (BPMs) are required to be able to precisely measure the electron beam orbit in a wide range of the single-bunch current. However, the high peak voltage of the BPM pickups associated with high single-bunch current degrades the performance of the BPM electronics, and can potentially damage the BPM electronics. A signal conditioning technique using low pass filters is developed to reduce the peak voltage to protect the BPM electronics, and to make the BPMs capable of working with a wide range of single-bunch current. Simulations and electron beam based tests are performed. The results show that the Duke storage ring BPM system is capable of providing precise orbit measurements to ensure highly stable FEL and HIGS operations.

43 PARTICLE ACCELERATORS↗
NASA NTRS1984

Equivalent electron fluence for solar proton damage in GaAs shallow junction cells

The short-circuit current reduction in GaAs shallow junction heteroface solar cells was calculated according to a simplified solar cell damage model in which the nonuniformity of the damage as a function of penetration depth is treated explicitly. Although the equivalent electron fluence was not uniquely defined for low-energy monoenergetic proton exposure, an equivalent electron fluence is found for proton spectra characteristic of the space environment. The equivalent electron fluence ratio was calculated for a typical large solar flare event for which the proton spectrum is PHI(sub p)(E) = A/E(p/sq. cm) where E is in MeV. The equivalent fluence ratio is a function of the cover glass shield thickness or the corresponding cutoff energy E(sub c). In terms of the cutoff energy, the equivalent 1 MeV electron fluence ratio is r(sub p)(E sub c) = 10(9)/E(sub c)(1.8) where E(sub c) is in units of KeV.

Wilson, J. W.↗
DOE OSTI2014

SU-E-T-283: Research of the Irradiation Damage to the Skin Cell by the Contaminative Electron in External Radiotherapy

Purpose: To investigate the micro-damage mechanism of the contaminative electron to the skin cell in external radiotherapy, the cell damage yield was simulated. Methods: The physical interaction and the energy deposited events of contaminative electrons in the cell DNA were modeled based on Geant4-DNA low energy physical model. The densitybased cluster mining algorithm was used to analyze the micro-damage yield and obtain its detailed compositive information. By taking the irradiation sensitive parameter and the clinical feature dose threshold of the skin cell into consideration, the damage features of the low energy contaminative electron to the skin cell were studied. The DSB and SSB yield and ratio, the cluster size and the root mean square radius, the cell SF and the lethal coefficient ε of the complex cDSB were researched. Results: For some very low energy electrons such as 20keV and 100keV, the cluster size can be more than 5 SSBs. The irradiation protection will be more crucial for the later response and the high α tissue. The lethal coefficient ε of the complex cDSB will increase with the incident electron number and the accumulative dose increasing for the dose square term in LQ model. However, the ε increment will increase 3%∼15% when the incident electron increases up to 100000. Conclusion: The simulation of the direct physical damage of the cell can be adjusted by a probability parameter to offset the simulation of the indirect biochemical damage. Thus the micro-damage mechanism of the contaminative electron to the skin cell can be detected at a certain extent by Monte Carlo physical simulation. This damage model of the low energy electron to DNA and these simulated results could be used to evaluate the damage effect of the low energy contaminative electron to the skin cells in the external radiotherapy. Strategic Priority Research Program of the Chinese Academy of Sciences (XDA03040000), Fundamental Research Funds for the Central Universities (2012HGXJ0057,2013HGXJ0193), Seed Foundation of Hefei University of Technology (2012HGZY0007) and Hefei University of Technology undergraduate innovative experiment project(2012CXCY431)

60 APPLIED LIFE SCIENCES↗
DOE OSTI2016

A coupled effect of nuclear and electronic energy loss on ion irradiation damage in lithium niobate

Understanding irradiation effects induced by elastic energy loss to atomic nuclei and inelastic energy loss to electrons in a crystal, as well as the coupled effect between them, is a scientific challenge. Damage evolution in LiNbO 3 irradiated by 0.9 and 21 MeV Si ions at 300 K has been studied utilizing Rutherford backscattering spectrometry in channeling mode. During the low-energy ion irradiation process, damage accumulation produced due to elastic collisions is described utilizing a disorder accumulation model. Moreover, low electronic energy loss is shown to induce observable damage that increases with ion fluence. For the same electronic energy loss, the velocity of the incident ion could affect the energy and spatial distribution of excited electrons, and therefore effectively modify the diameter of the ion track. Furthermore, nonlinear additive phenomenon of irradiation damage induced by high electronic energy loss in pre-damaged LiNbO 3 has been observed. The result indicates that pre-existing damage induced from nuclear energy loss interacts synergistically with inelastic electronic energy loss to promote the formation of amorphous tracks and lead to rapid phase transformation, much more efficient than what is observed in pristine crystal solely induced by electronic energy loss. As a result, this synergistic effect is attributed to the fundamental mechanism that the defects produced by the elastic collisions result in a decrease in thermal conductivity, increase in the electron-phonon coupling, and further lead to higher intensity in thermal spike from intense electronic energy deposition along high-energy ion trajectory.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
DOE OSTI2025

Synthesis and characterization of electron beam irradiation-induced damage in polycrystalline metal thin films

High-energy physics research, industrial sterilizing, and material processing depend extensively on electron beam accelerators. Exit windows are crucial components of such electron accelerator systems, maintaining vacuum integrity inside the machine while providing mechanical strength, thermal stability, and radiation resistance at the beam-target interface. In this study, thin metallic films of Ni, Ti, Cr, and V were explored for use in electron beam exit windows, and their properties were compared with the properties of their bulk counterparts. Simulation results of metal foils predicted Ti to exhibit less beam power dissipation compared to Ni. However, Ni possesses superior mechanical and structural properties compared to Ti. The performance of these films under electron beam irradiation was examined by depositing thin layers of these films on silicon and metallic substrates using magnetron sputtering and exposing them to e-beam irradiation in a controlled setup. The deposited films were subjected to a dose of approximately 66 kGy at a beam energy of 10 MeV and characterized prior to and postexposure to the beam using field emission scanning electron microscopy, atomic force microscopy, x-ray diffraction (XRD), and nanoindentation. Particular emphasis was given to characteristics like the grain structure, surface morphology, dislocation density, and hardness. XRD patterns revealed irradiation-induced changes in peak intensities, while the crystallinity remained largely unchanged. Nanoindentation results showed that the pristine and irradiated Ti and Ni films were twice as hard when compared to bulk Ti and Ni samples, regardless of the substrate type used (Si or bulk Ti, or Ni). These results emphasize the superior mechanical properties of thin metal films compared to their bulk counterparts. In conclusion, this study advances the optimization of thin film materials for robust and efficient e-beam applications, ensuring improved durability and operational reliability.

AFM↗
NASA NTRS1975

Damage coefficients in low resistivity silicon

Electron and proton damage coefficients are determined for low resistivity silicon based on minority-carrier lifetime measurements on bulk material and diffusion length measurements on solar cells. Irradiations were performed on bulk samples and cells fabricated from four types of boron-doped 0.1 ohm-cm silicon ingots, including the four possible combinations of high and low oxygen content and high and low dislocation density. Measurements were also made on higher resistivity boron-doped bulk samples and solar cells. Major observations and conclusions from the investigation are discussed.

Srour, J. R.↗
DOE OSTI2013

Note: Transient negative ions as initiators of oxygen fixation in <20 eV electron-irradiated DNA

This note represents a significant addition to our previous manuscript [N. Mirsaleh-Kohan, A. D. Bass, P. Cloutier, S. Massey, and L. Sanche, J. Chem. Phys. 136, 235104 (2012)] where we demonstrated that enhancements in the electron stimulated desorption yields of O{sup −} and OH{sup −} from O{sub 2} exposed DNA samples were due to the reactions of O{sub 2} with electron-induced damage sites within the DNA. Here, we investigate the attachment of O{sub 2} to electron-irradiated DNA as a function of electron energy and find a local maximum for O{sub 2} attachment to DNA at ∼11.4 eV. This reaction is likely initiated by the production of transient negative ions that dissociate to form RCH{sub x−1}{sup •} radicals. This work is thus relevant to our understanding of how O{sub 2} modulates radiation induced damage in cellular DNA and upon the question of the radio-sensitization of cells during, for example, radiotherapy.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗