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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
NASA NTRS2002

Designing Crane Controls with Applied Mechanical and Electrical Safety Features

The use of overhead traveling bridge cranes in many varied applications is common practice. In particular, the use of cranes in the nuclear, military, commercial, aerospace, and other industries can involve safety critical situations. Considerations for Human Injury or Casualty, Loss of Assets, Endangering the Environment, or Economic Reduction must be addressed. Traditionally, in order to achieve additional safety in these applications, mechanical systems have been augmented with a variety of devices. These devices assure that a mechanical component failure shall reduce the risk of a catastrophic loss of the correct and/or safe load carrying capability. ASME NOG-1-1998, (Rules for Construction of Overhead and Gantry Cranes, Top Running Bridge, and Multiple Girder), provides design standards for cranes in safety critical areas. Over and above the minimum safety requirements of todays design standards, users struggle with obtaining a higher degree of reliability through more precise functional specifications while attempting to provide "smart" safety systems. Electrical control systems also may be equipped with protective devices similar to the mechanical design features. Demands for improvement of the cranes "control system" is often recognized, but difficult to quantify for this traditionally "mechanically" oriented market. Finite details for each operation must be examined and understood. As an example, load drift (or small motions) at close tolerances can be unacceptable (and considered critical). To meet these high functional demands encoders and other devices are independently added to control systems to provide motion and velocity feedback to the control drive. This paper will examine the implementation of Programmable Electronic Systems (PES). PES is a term this paper will use to describe any control system utilizing any programmable electronic device such as Programmable Logic Controllers (PLC), or an Adjustable Frequency Drive (AID) 'smart' programmable motion controller. Therefore the use of the term Programmable Electronic Systems (PES) is an encompassing description for a large spectrum of programmable electronic control devices.

Lytle, Bradford P.↗
NASA NTRS2003

A Framework for Intelligent Rocket Test Facilities with Smart Sensors

A long-term center goal at the John C. Stennis Space Center (SSC) is the formulation and implementation of a framework for an Intelligent Rocket Test Facility (IRTF), which incorporates distributed smart sensor elements. The IRTF is to provide reliable, high-confident measurements. Specific objectives include: 1. Definition of a framework and architecture that supports implementation of highly autonomous methodologies founded on basic physical principles and embedded knowledge. 2. Modeling of autonomous sensors and processes as self-sufficient, evolutionary elements. 3. Development of appropriate communications protocols to enable the complex interactions that must take place to allow timely and high-quality flow of of information among all the autonomous elements of the system. 4. Development of lab-scale prototypes of key system elements. Though our application is next-generation rocket test facilities, applications for the approach are much wider and include monitoring of shuttle launch operations, air and spacecraft operations and health monitoring, and other large-scale industrial system operations such as found in processing and manufacturing plans. Elements of prototype IRTF have been implemented in preparation for advanced development and validation using rocket test stand facilities as SSC. This work has identified issues that are important to further development of complex network and should be of interest to other working with sensor networks.

Figueroa, Fernando↗
NASA NTRS2010

A Study on Advanced Lithium-Based Battery Cell Chemistries to Enhance Lunar Exploration Missions

NASAs Exploration Technology Development Program (ETDP) Energy Storage Project conducted an advanced lithium-based battery chemistry feasibility study to determine the best advanced chemistry to develop for the Altair Lunar Lander and the Extravehicular Activities (EVA) advanced Lunar surface spacesuit. These customers require safe, reliable batteries with extremely high specific energy as compared to state-of-the-art. The specific energy goals for the development project are 220 watt-hours per kilogram (Wh/kg) delivered at the battery-level at 0 degrees Celsius ( C) at a C/10 discharge rate. Continuous discharge rates between C/5 and C/2, operation between 0 and 30 C and 200 cycles are targeted. Electrode materials that were considered include layered metal oxides, spinel oxides, and olivine-type cathode materials, and lithium metal, lithium alloy, and silicon-based composite anode materials. Advanced cell chemistry options were evaluated with respect to multiple quantitative and qualitative attributes while considering their projected performance at the end of the available development timeframe. Following a rigorous ranking process, a chemistry that combines a lithiated nickel manganese cobalt oxide Li(LiNMC)O2 cathode with a silicon-based composite anode was selected as the technology that can potentially offer the best combination of safety, specific energy, energy density, and likelihood of success.

Reid, Concha M.↗
NASA NTRS2013

The Challenges of Credible Thermal Protection System Reliability Quantification

The paper discusses several of the challenges associated with developing a credible reliability estimate for a human-rated crew capsule thermal protection system. The process of developing such a credible estimate is subject to the quantification, modeling and propagation of numerous uncertainties within a probabilistic analysis. The development of specific investment recommendations, to improve the reliability prediction, among various potential testing and programmatic options is then accomplished through Bayesian analysis.

Green, Lawrence L.↗
NASA NTRS2004

Qualification and Reliability for MEMS and IC Packages

Advanced IC electronic packages are moving toward miniaturization from two key different approaches, front and back-end processes, each with their own challenges. Successful use of more of the back-end process front-end, e.g. microelectromechanical systems (MEMS) Wafer Level Package (WLP), enable reducing size and cost. Use of direct flip chip die is the most efficient approach if and when the issues of know good die and board/assembly are resolved. Wafer level package solve the issue of known good die by enabling package test, but it has its own limitation, e.g., the I/O limitation, additional cost, and reliability. From the back-end approach, system-in-a-package (SIAP/SIP) development is a response to an increasing demand for package and die integration of different functions into one unit to reduce size and cost and improve functionality. MEMS add another challenging dimension to electronic packaging since they include moving mechanical elements. Conventional qualification and reliability need to be modified and expanded in most cases in order to detect new unknown failures. This paper will review four standards that already released or being developed that specifically address the issues on qualification and reliability of assembled packages. Exposures to thermal cycles, monotonic bend test, mechanical shock and drop are covered in these specifications. Finally, mechanical and thermal cycle qualification data generated for MEMS accelerometer will be presented. The MEMS was an element of an inertial measurement unit (IMU) qualified for NASA Mars Exploration Rovers (MERs), Spirit and Opportunity that successfully is currently roaring the Martian surface

inertial measurement unit↗
NASA NTRS1986

Software reliability - Measures and effects in flight critical digital avionics systems

The paper discusses software reliability as it applies particularly to design and evaluation of flight-critical digital avionics systems. Measures of software reliability, measurement methods and reliability (macro-) models are discussed. Recent work assessing their accuracy in predicting software errors in 'fly-by-wire' Newtonian applications is presented. Additional, detailed topics are discussed including software error distributions (e.g. catastrophic vs. noncatastrophic) and the effects of system growth/maturity on reliability improvement. In practical flight-critical digital applications, software reliability improvement is sought through use of parallel, redundant software (i.e. N-version programming) or backup software that can be invoked in the event of (primary) software failure. Achievable reliability levels are however highly sensitive to common-mode specification and programming errors. Recent data correlating these errors with net software reliability are discussed.

Dunn, William R.↗
NASA NTRS1983

Design of the hybrid automated reliability predictor

The design of the Hybrid Automated Reliability Predictor (HARP), now under development at Duke University, is presented. The HARP approach to reliability prediction is characterized by a decomposition of the overall model into fault-occurrence and fault-handling sub-models. The fault-occurrence model is a non-homogeneous Markov chain which is solved analytically, while the fault-handling model is a Petri Net which is simulated. HARP provides automated analysis of sensitivity to uncertainties in the input parameters and in the initial state specifications. It then produces a predicted reliability band as a function of mission time, as well as estimates of the improvement (narrowing of the band) to be gained by a specified amount of reduction in uncertainty.

Geist, R.↗
NASA NTRS1993

SP-100 control drive assembly development

The SP-100 is an electrical generating nuclear power system for space operation. This paper describes the nuclear reactor control systems and the methods used to assure reliable performance for the 10-year design life. Reliable performance is achieved by redundancy and by selecting highly reliable components and design features. Reliability is quantified by analysis using established reliability data. Areas lacking reliability data are identified for development testing. A specific development test description is provided as an example to demonstrate how this process is meeting the system reliability goals.

Gleason, Thomas↗
NASA NTRS2007

Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors

Solid tantalum capacitors are widely used in space applications to filter low-frequency ripple currents in power supply circuits and stabilize DC voltages in the system. Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. This is due to a short-circuit failure mode, which might be damaging to a power supply, and also to the capability of tantalum capacitors with manganese cathodes to self-ignite when a failure occurs in low-impedance applications. During such a failure, a substantial amount of energy is released by exothermic reaction of the tantalum pellet with oxygen generated by the overheated manganese oxide cathode, resulting not only in destruction of the part, but also in damage of the board and surrounding components. A specific feature of tantalum capacitors, compared to ceramic parts, is a relatively large value of capacitance, which in contemporary low-size chip capacitors reaches dozens and hundreds of microfarads. This might result in so-called surge current or turn-on failures in the parts when the board is first powered up. Such a failure, which is considered as the most prevalent type of failures in tantalum capacitors [I], is due to fast changes of the voltage in the circuit, dV/dt, producing high surge current spikes, I(sub sp) = Cx(dV/dt), when current in the circuit is unrestricted. These spikes can reach hundreds of amperes and cause catastrophic failures in the system. The mechanism of surge current failures has not been understood completely yet, and different hypotheses were discussed in relevant literature. These include a sustained scintillation breakdown model [1-3]; electrical oscillations in circuits with a relatively high inductance [4-6]; local overheating of the cathode [5,7, 8]; mechanical damage to tantalum pentoxide dielectric caused by the impact of MnO2 crystals [2,9, 10]; or stress-induced-generation of electron traps caused by electromagnetic forces developed during current spikes [11]. A commonly accepted explanation of the surge current failures is that at unlimited current supply during surge current conditions, the self-healing mechanism in tantalum capacitors does not work, and what would be a minor scintillation spike if the current were limited, becomes a catastrophic failure of the part [l, 12]. However, our data show that the scintillation breakdown voltages are significantly greater that the surge current breakdown voltages, so it is still not clear why the part, which has no scintillations, would fail at the same voltage during surge current testing (SCT).

Teverovsky, Alexander↗
NASA NTRS1981

Hierarchical specification of the SIFT fault tolerant flight control system

The specification and mechanical verification of the Software Implemented Fault Tolerance (SIFT) flight control system is described. The methodology employed in the verification effort is discussed, and a description of the hierarchical models of the SIFT system is given. To meet the objective of NASA for the reliability of safety critical flight control systems, the SIFT computer must achieve a reliability well beyond the levels at which reliability can be actually measured. The methodology employed to demonstrate rigorously that the SIFT computer meets as reliability requirements is described. The hierarchy of design specifications from very abstract descriptions of system function down to the actual implementation is explained. The most abstract design specifications can be used to verify that the system functions correctly and with the desired reliability since almost all details of the realization were abstracted out. A succession of lower level models refine these specifications to the level of the actual implementation, and can be used to demonstrate that the implementation has the properties claimed of the abstract design specifications.

Melliar-Smith, P. M.↗
NASA NTRS1989

The role of NDE in ceramic turbine engine component development

A systematic approach to the use of nondestructive evaluation (NDE) throughout the ceramic engine component development cycle is necessary to achieve the high reliability required for turbine engine applications. Specifically, NDE techniques must be developed and applied to component design, development, fabrication, and test to ensure adequate materials characterization. This approach has the potential of reducing ceramic component cost by optimizing the initial design and eliminating unacceptable components early in the fabrication cycle. Although research NDE techniques have been developed that have the potential to solve the problems of ceramic component inspection, systematic application of these NDE techniques for inspection and process control has not yet occurred. The application of NDE techniques for both material characterization and flaw detection is discussed as well as an approach for applying NDE throughout the fabrication process to achieve highly reliable ceramic components.

Minter, Janet↗
NASA NTRS1989

VLSI Universal Noiseless Coder

Proposed universal noiseless coder (UNC) compresses stream of data signals for efficient transmission in channel of limited bandwidth. Noiseless in sense original data completely recoverable from output code. System built as very-large-scale integrated (VLSI) circuit, compressing data in real time at input rates as high as 24 Mb/s, and possibly faster, depending on specific design. Approach yields small, lightweight system operating reliably and consuming little power. Constructed as single, compact, low-power VLSI circuit chip. Design of VLSI circuit chip made specific to code algorithms. Entire UNC fabricated in single chip, worst-case power dissipation less than 1 W.

Rice, Robert F.↗
NASA NTRS1967

Chemical Method of Urine Volume Measurement

A system has been developed and qualified as flight hardware for the measurement of micturition volumes voided by crewmen during Gemini missions. This Chemical Urine Volume Measurement System (CUVMS) is used for obtaining samples of each micturition for post-flight volume determination and laboratory analysis for chemical constituents of physiological interest. The system is versatile with respect to volumes measured, with a capacity beyond the largest micturition expected to be encountered, and with respect to mission duration of inherently indefinite length. The urine sample is used for the measurement of total micturition volume by a tracer dilution technique, in which a fixed, predetermined amount of tritiated water is introduced and mixed into the voided urine, and the resulting concentration of the tracer in the sample is determined with a liquid scintillation spectrometer. The tracer employed does not interfere with the analysis for the chemical constituents of the urine. The CUVMS hardware consists of a four-way selector valve in which an automatically operated tracer metering pump is incorporated, a collection/mixing bag, and tracer storage accumulators. The assembled system interfaces with a urine receiver at the selector valve inlet, sample bags which connect to the side of the selector valve, and a flexible hose which carries the excess urine to the overboard drain connection. Results of testing have demonstrated system volume measurement accuracy within the specification limits of +/-5%, and operating reliability suitable for system use aboard the GT-7 mission, in which it was first used.

QUANTITATIVE ANALYSIS↗
NASA NTRS1981

Market assessment of photovoltaic power systems for agricultural applications in Nigeria

The market potential for stand-alone photovoltaic systems in agriculture was studied. Information is presented on technical and economically feasible applications, and assessments of the business, government and financial climate for photovoltaic sales. It is concluded that the market for stand-alone systems will be large because of the availability of captial and the high premium placed on high reliability, low maintenance power systems. Various specific applications are described, mostly related to agriculture.

Staples, D.↗
NASA NTRS1988

Composite structural materials

A decade long program to develop critical advanced composite technology in the areas of physical properties, structural concept and analysis, manufacturing, reliability, and life predictions is reviewed. Specific goals are discussed. The status of the chemical vapor deposition effects on carbon fiber properties; inelastic deformation of metal matrix laminates; fatigue damage in fibrous MMC laminates; delamination fracture toughness in thermoplastic matrix composites; and numerical analysis of composite micromechanical behavior are presented.

Loewy, Robert G.↗
NASA NTRS1995

Biomorphic architectures for autonomous Nanosat designs

Modern space tool design is the science of making a machine both massively complex while at the same time extremely robust and dependable. We propose a novel nonlinear control technique that produces capable, self-organizing, micron-scale space machines at low cost and in large numbers by parallel silicon assembly. Experiments using biomorphic architectures (with ideal space attributes) have produced a wide spectrum of survival-oriented machines that are reliably domesticated for work applications in specific environments. In particular, several one-chip satellite prototypes show interesting control properties that can be turned into numerous application-specific machines for autonomous, disposable space tasks. We believe that the real power of these architectures lies in their potential to self-assemble into larger, robust, loosely coupled structures. Assembly takes place at hierarchical space scales, with different attendant properties, allowing for inexpensive solutions to many daunting work tasks. The nature of biomorphic control, design, engineering options, and applications are discussed.

Hasslacher, Brosl↗
NASA NTRS2000

Reliability Modeling of Microelectromechanical Systems Using Neural Networks

Microelectromechanical systems (MEMS) are a broad and rapidly expanding field that is currently receiving a great deal of attention because of the potential to significantly improve the ability to sense, analyze, and control a variety of processes, such as heating and ventilation systems, automobiles, medicine, aeronautical flight, military surveillance, weather forecasting, and space exploration. MEMS are very small and are a blend of electrical and mechanical components, with electrical and mechanical systems on one chip. This research establishes reliability estimation and prediction for MEMS devices at the conceptual design phase using neural networks. At the conceptual design phase, before devices are built and tested, traditional methods of quantifying reliability are inadequate because the device is not in existence and cannot be tested to establish the reliability distributions. A novel approach using neural networks is created to predict the overall reliability of a MEMS device based on its components and each component's attributes. The methodology begins with collecting attribute data (fabrication process, physical specifications, operating environment, property characteristics, packaging, etc.) and reliability data for many types of microengines. The data are partitioned into training data (the majority) and validation data (the remainder). A neural network is applied to the training data (both attribute and reliability); the attributes become the system inputs and reliability data (cycles to failure), the system output. After the neural network is trained with sufficient data. the validation data are used to verify the neural networks provided accurate reliability estimates. Now, the reliability of a new proposed MEMS device can be estimated by using the appropriate trained neural networks developed in this work.

Perera. J. Sebastian↗