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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
NASA NTRS1996

Microprocessor controlled portable TLD system

An up-to-date microprocessor controlled thermoluminescence dosemeter (TLD) system for environmental and space dose measurements has been developed. The earlier version of the portable TLD system, Pille, was successfully used on Soviet orbital stations as well as on the US Space Shuttle, and for environmental monitoring. The new portable TLD system, Pille'95, consists of a reader and TL bulb dosemeters, and each dosemeter is provided with an EEPROM chip for automatic identification. The glow curve data are digitised and analysed by the program of the reader. The measured data and the identification number appear on the LED display of the reader. Up to several thousand measured data together with the glow curves can be stored on a removable flash memory card. The whole system is supplied either from built-in rechargeable batteries or from the mains of the space station.

NASA Discipline Radiation Health↗
NASA NTRS2003

Single-event upset in advanced commercial power PC microprocessors

Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.

single-event upset advanced commercial power PC pr↗
NASA NTRS2006

A Low Noise, Microprocessor-Controlled, Internally Digitizing Rotating-Vane Electric Field Mill for Airborne Platforms

This paper reports on a new generation of aircraft-based rotating-vane style electric field mills designed and built at NASA's Marshall Spaceflight Center. The mills have individual microprocessors that digitize the electric field signal at the mill and respond to commands from the data system computer. The mills are very sensitive (1 V/m per bit), have a wide dynamic range (115 dB), and are very low noise (+/-1 LSB). Mounted on an aircraft, these mills can measure fields from +/-1 V/m to +/-500 kV/m. Once-per-second commanding from the data collection computer to each mill allows for precise timing and synchronization. The mills can also be commanded to execute a self-calibration in flight, which is done periodically to monitor the status and health of each mill.

Bateman, M. G.↗
NASA NTRS2006

Modular, Microprocessor-Controlled Flash Lighting System

A microprocessor-controlled lighting system generates brief, precisely timed, high-intensity flashes of light for scientific imaging at frame rates up to about 1 kHz. The system includes an array of light-emitting diodes (LEDs) that are driven in synchronism with an externally generated timing signal (for example, a timing signal generated by a video camera). The light output can be varied in peak intensity, pulse duration, pulse delay, and pulse rate, all depending on the timing signal and associated externally generated control signals. The array of LEDs comprises as many as 16 LED panels that can be attached together. Each LED panel is a module consisting of a rectangular subarray of 10 by 20 LEDs of advanced design on a printed-circuit board in a mounting frame with a power/control connector. The LED panels are controlled by an LED control module that contains an AC-to-DC power supply, a control board, and 8 LED-panel driver boards. In prior LED panels, the LEDs are packaged at less than maximum areal densities in bulky metal housings that reduce effective active areas. In contrast, in the present LED panels, the LEDs are packed at maximum areal density so as to afford 100-percent active area and so that when panels are joined side by side to form the array, there are no visible seams between them and the proportion of active area is still 100 percent. Each panel produces an illuminance of .5 x 10( exp 4) lux at a distance of 5.8 in. (approx.1.6 cm). The LEDs are driven according to a pulse-width-modulation control scheme that makes it safe to drive the LEDs beyond their rated steady-state currents in order to generate additional light during short periods. The drive current and the pulse-width modulation for each LED panel can be controlled independently of those of the other 15 panels. The maximum allowable duration of each pulse of drive current is a function of the amount of overdrive, the total time to be spent in overdrive operation, and the limitations of the LEDs. The system is configured to limit the overdrive according to values specific to each type of LED in the array. These values are coded into firmware to prevent inadvertent damage to the LED panels.

Kiefer, Dwayne↗
NASA NTRS2012

Controller Chips Preserve Microprocessor Function

Above the Atlantic Ocean, off the coast of Brazil, there is a dip in the Earth s surrounding magnetic field called the South Atlantic Anomaly. Here, space radiation can reach into Earth s upper atmosphere to interfere with the functioning of satellites, aircraft, and even the International Space Station. "The South Atlantic Anomaly is a hot spot of radiation that the space station goes through at a certain point in orbit," Miria Finckenor, a physicist at Marshall Space Flight Center, describes, "If there s going to be a problem with the electronics, 90 percent of that time, it is going to be in that spot." Space radiation can cause physical damage to microchips and can actually change the software commands in computers. When high-energy particles penetrate a satellite or other spacecraft, the electrical components can absorb the energy and temporarily switch off. If the energy is high enough, it can cause the device to enter a hung state, which can only be addressed by restarting the system. When space radiation affects the operational status of microprocessors, the occurrence is called single event functional interrupt (SEFI). SEFI happens not only to the computers onboard spacecraft in Earth orbit, but to the computers on spacecraft throughout the solar system. "One of the Mars rovers had this problem in the radiation environment and was rebooting itself several times a day. On one occasion, it rebooted 40 times in one day," Finckenor says. "It s hard to obtain any data when you have to constantly reboot and start over."

Source record↗
NASA NTRS2015

Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.

Guertin, Steven M.↗
NASA NTRS2019

Proton Testing of AMD Ryzen 3 1200 Microprocessors

Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 1200 microprocessor. Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

single event functional interrupt (SEFI)↗
NASA NTRS2019

Proton Testing of AMD Ryzen 3 2200G Microprocessors

Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 2200G microprocessor with integrated graphics. Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

radiation tesing↗
NASA NTRS2004

Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors

Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.

Farmanesh, F. F.↗
NASA NTRS2019

Radiation specification and testing of heterogenous microprocessor SOCs

Modern commercial microprocessor devices include multiple processor architectures, buses, basic peripherals, and application hardware such as Graphics Processing Units (GPUs) and Digital Signal Processors (DSPs) in one device. Developing RHBD versions of similar devices risks sacrificing processing performance for system-wide radiation requirements. The heterogenous structure of modern commercial system on a chip (SOC) devices, in design and performance goals for subsystems, suggests a similar approach to specifying Radiation Hardened by Design (RHBD) requirements.

Ballast, Jon↗
DOE OSTI2021

Information Leakage Analysis using a Co-design-Based Fault Injection Technique on a RISC-V Microprocessor

The RISC-V instruction set architecture open licensing policy has spawned a hive of development activity, making a range of implementations publicly available. The environments in which RISC-V operates have expanded correspondingly, driving the need for a generalized approach to evaluating the reliability of RISC-V implementations under adverse operating conditions or after normal wear-out periods. Fault injection (FI) refers to the process of changing the state of registers or wires, either permanently or momentarily, and then observing execution behavior. The analysis provides insight into the development of countermeasures that protect against the leakage or corruption of sensitive information which might occur because of unexpected execution behavior. In this paper, we develop a hardware-software co-design architecture that enables fast, configurable fault emulation and utilize it for information leakage and data corruption analysis. Modern System-on-chip FPGAs enable building an evaluation platform where control elements run on a processor(s) (PS) simultaneously with the target design running in the programmable logic (PL). Software components of the FI system introduce faults and report execution behavior. A pair of RISC-V FI-instrumented implementations are created and configured to execute the Advanced Encryption Standard and Twister algorithms. Key and plaintext information leakage and degraded pseudo-random sequences are both observed in the output for a subset of the emulated faults.

42 ENGINEERING↗
NASA NTRS2016

Radiation Failures in Intel 14nm Microprocessors

In this study the 14 nm Intel Broadwell 5th generation core series 5005U-i3 and 5200U-i5 was mounted on Dell Inspiron laptops, MSI Cubi and Gigabyte Brix barebones and tested with Windows 8 and CentOS7 at idle. Heavy-ion-induced hard- and catastrophic failures do not appear to be related to the Intel 14nm Tri-Gate FinFET process. They originate from a small (9 m 140 m) area on the 32nm planar PCH die (not the CPU) as initially speculated. The hard failures seem to be due to a SEE but the exact physical mechanism has yet to be identified. Some possibilities include latch-ups, charge ion trapping or implantation, ion channels, or a combination of those (in biased conditions). The mechanism of the catastrophic failures seems related to the presence of electric power (1.05V core voltage). The 1064 nm laser mimics ionization radiation and induces soft- and hard failures as a direct result of electron-hole pair production, not heat. The 14nm FinFET processes continue to look promising for space radiation environments.

Microprocessors↗
NASA NTRS2001

Single-event upset in the PowerPC750 microprocessor

In this paper we report results of single-event tests of the PowerPC750 from Motorola and IBM, which are identical designs which are manufactured with advanced processes that uses a minimum feature size of 0.29 and 0.28 mu m, respectively.

single↗