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DOE OSTI · 3684064

Growth of deuterium supersaturated surface layer with increasing ion flux and fluence in plasma-exposed tungsten

Založnik, Anže [Univ. of California, San Diego, CA (United States)] (ORCID:0000000234887370)·Chromiński, Witold [Warsaw Univ. of Technology (Poland)] (ORCID:0000000253457667)·Ciupiński, Łukasz [Warsaw Univ. of Technology (Poland)] (ORCID:0000000245363177)·Wieciński, Piotr [Warsaw Univ. of Technology (Poland)] (ORCID:000000024527692X)·Schwarz-Selinger, Thomas [Max Planck Institute for Plasma Physics, Garching (Germany)] (ORCID:0000000174612817)·Nishijima, Daisuke [Univ. of California, San Diego, CA (United States)] (ORCID:0000000231194827)·Patino, Marlene I. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000226227110)·Simmonds, Michael J. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000322384386)·Tynan, George R. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000174614871)·Baldwin, Matthew J. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000163352255)
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Abstract

Deuterium supersaturated surface layer (DSSL) in tungsten, a few nm thick layer exhibiting extremely high deuterium content (> 5%), has been studied as a function of deuterium plasma ion flux and fluence. Tungsten samples were exposed at 400 K and deuterium ion energy of ∼ 60 eV. The deuterium ion flux spanned over an order of magnitude, being 7.3 × 10 20 , 4.2 × 10 21 , and 3.8 × 10 22 D/m 2 . The fluence ranged from 3.4 × 1024 to 3.4 × 1025 D/m2. The samples and their deuterium content were analyzed by nuclear reaction analysis (NRA), scanning transmission electron microscopy (STEM), and thermal desorption spectroscopy (TDS). The largest thickness of DSSL was found to be around 10.5 nm and was observed in the case of the highest exposure flux and fluence, whereas the layer was only about 3.8 nm thick in the case of the lowest value of the two parameters. The thickness of the DSSL was found to monotonically increase with both deuterium flux and fluence. Finally, similar to the thickness, the estimated D concentration seems to follow the same trend, increasing from the lowest value of around 3 at.% to the highest value of around 5 at.%.

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Založnik, Anže [Univ. of California, San Diego, CA (United States)] (ORCID:0000000234887370), Chromiński, Witold [Warsaw Univ. of Technology (Poland)] (ORCID:0000000253457667), Ciupiński, Łukasz [Warsaw Univ. of Technology (Poland)] (ORCID:0000000245363177), Wieciński, Piotr [Warsaw Univ. of Technology (Poland)] (ORCID:000000024527692X), Schwarz-Selinger, Thomas [Max Planck Institute for Plasma Physics, Garching (Germany)] (ORCID:0000000174612817), Nishijima, Daisuke [Univ. of California, San Diego, CA (United States)] (ORCID:0000000231194827), Patino, Marlene I. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000226227110), Simmonds, Michael J. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000322384386), Tynan, George R. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000174614871), Baldwin, Matthew J. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000163352255). 2026-05-01. Growth of deuterium supersaturated surface layer with increasing ion flux and fluence in plasma-exposed tungsten. https://doi.org/10.1016/j.jnucmat.2026.156604

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