Automating Bug Report Classification with Few Shot Learning

Abstract

Orthogonal defect classification (ODC) is a method used to categorize software defects, providing valuable insights into the development process. This study focuses on automating the classification of software bug reports into different ODC defect types using few shot learning, a machine learning approach that requires minimal labeled data. Previous research has manually classified bug reports or used traditional machine learning algorithms like linear support vector machine, achieving limited success. Our approach uses few shot learning to improve classification accuracy and efficiency. The results show a harmonic mean of recall and precision (i.e., the F1 score) of around 0.6 which is a performance improvement over previous methods. The results highlight the potential benefit of few shot learning techniques and their application in enhancing the safety and reliability of nuclear digital instrumentation and control (DI&C) systems. Future work will explore incorporating advanced techniques to supplement the model's training data and achieve better results.