DOE OSTI · 3364876
A foundation model for non-destructive defect identification from vibrational spectra
Abstract
Defects are ubiquitous in solids and strongly influence materials’ functional properties. However, non-destructive characterization and quantification of defects, especially when multiple types coexist, remain a long-standing challenge. Here, we introduce DefectNet, a foundation machine learning model that predicts the chemical identity and concentration of substitutional point defects with multiple coexisting elements directly from vibrational spectra, specifically phonon density-of-states (PDoS). Trained on over 16,000 simulated spectra from 2,000 semiconductors, DefectNet employs a tailored attention mechanism to identify up to six distinct defect elements at concentrations ranging from 0.2% to 25%. The model generalizes well to unseen crystals across 56 elements and can be fine-tuned on experimental data. Validation using inelastic scattering measurements of SiGe alloys and MgB 2 superconductor demonstrates its accuracy and transferability. Furthermore, our work establishes vibrational spectroscopy as a viable, non-destructive probe for bulk point defect quantification, and highlights the promise of foundation models in data-driven defect engineering.
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Cheng, Mouyang [Massachusetts Institute of Technology, Cambridge, MA (United States)], Fu, Chu-Liang [Massachusetts Institute of Technology, Cambridge, MA (United States)], Yu, Bowen [Massachusetts Institute of Technology, Cambridge, MA (United States)], Rha, Eunbi [Massachusetts Institute of Technology, Cambridge, MA (United States)], Chotrattanapituk, Abhijatmedhi [Massachusetts Institute of Technology, Cambridge, MA (United States)], Abernathy, Douglas L. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Cheng, Yongqiang [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Li, Mingda [Massachusetts Institute of Technology, Cambridge, MA (United States)] (ORCID:0000000270556368). 2026-03-30. A foundation model for non-destructive defect identification from vibrational spectra. https://doi.org/10.1016/j.matt.2026.102728
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