DOE OSTI · 3025674
Superlattice reflection signatures of the insulator–metal transition in V 3 O 5 thin films
Abstract
Nanoelectronic systems that are inspired by the brain are increasingly looking to insulator–metal transition (IMT) materials as they can mimic the response characteristics of neurons to temperature changes so that these can be used in robotic and computational applications. V 3 O 5 has an insulator–metal transition at ∼430 or ∼80 K higher than VO 2 and provides a unique high-temperature opportunity for these types of applications. Here, in this work, we track the structural evolution of V 3 O 5 thin films across the IMT through conventional selected-area electron diffraction (SAED) and four-dimensional scanning TEM (4D-STEM), correlated with temperature-dependent resistance measurements. SAED patterns show reversible evidence of superlattice reflections associated with the IMT—present below T IMT and absent above it—consistent with the accompanying drop in resistance. At room temperature, nanobeam electron diffraction patterns further reveal three local configurations: (i) type I regions with clean patterns lacking superlattice reflections and spot splitting; (ii) type II regions exhibiting rows of superlattice reflections and split spots indicative of crystallographic variants; and (iii) type III regions with negligible superlattice reflections but larger spot splitting suggestive of overlapping domains of insulating and conducting phases likely driven by local lattice distortions. Upon heating, the superlattice reflections disappear between 413 and 453 K, concurrent with the resistance drop at T IMT , consistent with the emergence of a conducting phase. The overall diffraction geometry remains essentially unchanged up to 573 K, implying that relative domain orientations persist through the transition. These observations reveal nanoscale structural heterogeneity in V 3 O 5 thin films across the IMT and inform operation in regimes where mixed-phase textures are expected. A plausible indexing framework rationalizing the observed geometries is presented in the Discussion section, alongside its limitations and alternative interpretations.
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Islam, Md Shafiqul [Univ. of Puerto Rico, Mayaguez (Puerto Rico)] (ORCID:0000000324724225), Pofelski, Alexandre [Brookhaven National Laboratory (BNL), Upton, NY (United States); McMaster Univ., Hamilton, ON (Canada)] (ORCID:0000000246539197), Rivera-Robles, Yarimar [Univ. of Puerto Rico, Mayaguez (Puerto Rico)] (ORCID:0000000264021180), Kisslinger, Kim [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000265287044), Camino, Fernando [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000305752976), Rúa, Armando [Univ. of Puerto Rico, Mayaguez (Puerto Rico)] (ORCID:000000020962371X). 2026-03-09. Superlattice reflection signatures of the insulator–metal transition in V 3 O 5 thin films. https://doi.org/10.1063/5.0313649
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