A High-Throughput Platform for EFI Testing

Bassett, William Paul; Damm, David Lee; Knepper, Robert Alan; Tappan, Alexander Smith; Quinn, Jennifer Lyn; Lloyd, Jonathan Preston

doi:10.2172/2586053

DOE OSTI · 2586053

A High-Throughput Platform for EFI Testing

Bassett, William Paul·Damm, David Lee·Knepper, Robert Alan·Tappan, Alexander Smith·Quinn, Jennifer Lyn·Lloyd, Jonathan Preston

View original source ↗Read source document ↗Export metadata ↓

Abstract

The source did not provide an abstract. Follow the original record for more information.

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

Bassett, William Paul, Damm, David Lee, Knepper, Robert Alan, Tappan, Alexander Smith, Quinn, Jennifer Lyn, Lloyd, Jonathan Preston. 2024-08-01. A High-Throughput Platform for EFI Testing. https://doi.org/10.2172/2586053

Cite the original work for its findings. Save a collection to share your selection of sources.