DOE OSTI · 2585493
ECE 4396 (Final Report)
Abstract
In the summer of 2025, I was fortunate enough intern at Sandia National Laboratories in Albuquerque, New Mexico. I was hired into the Southwest Analysis Laboratories for Semiconductor Advancement (SALSA) intern program. In this internship, I applied my knowledge and skills in electrical engineering to conduct hardware failure analysis. I utilized various failure analyze techniques involving the use of Infrared Thermography (IRT) and Laser Scanning Microscopy (LSM) to test different Application-Specific Integrated Circuits (ASIC) chips that are available in the public market.
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Fuentes, Luis Angel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]. 2025-08-01. ECE 4396 (Final Report). https://doi.org/10.2172/2585493
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