DOE OSTI · 2569348
Dark-field X-ray microscopy with structured illumination for three-dimensional imaging
Abstract
Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotational setups and extended acquisition times. To address these challenges, we introduce a structured illumination technique optimized for 3D imaging of ordered materials at sub-micrometer length scales. Our approach employs a coded aperture to spatially modulate the incident X-ray beam, enabling 3D structural reconstruction from images captured at various aperture positions. Unlike current 3D imaging approaches, which often rely on rotational or rastering methods, our technique uses scanning X-ray silhouettes of the coded aperture for depth resolution along the diffraction axis. This eliminates the need for sample rotation or rastering, resulting in a highly stable and efficient imaging modality. We validated the efficacy of this approach through experimental imaging of an isolated twin domain within a bulk single crystal of an iron pnictide using a dark-field X-ray microscope. This advancement aligns with the enhanced brightness upgrades of modern synchrotron radiation facilities, unlocking new possibilities for high-resolution imaging of ordered materials.
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Gürsoy, Doğa [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)] (ORCID:0000000200808101), Yay, Kaan Alp [Stanford Univ., CA (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Institute for Materials and Energy Science (SIMES)] (ORCID:0000000240786613), Kisiel, Elliot [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Univ. of California, San Diego, CA (United States)] (ORCID:0000000171755820), Wojcik, Michael [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)] (ORCID:000000031257870X), Sheyfer, Dina [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)] (ORCID:0000000341893899), Last, Arndt [Karlsruhe Inst. of Technology (KIT) (Germany)] (ORCID:0000000306589664), Highland, Matthew [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)], Fisher, Ian Randal [Stanford Univ., CA (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Stanford Institute for Materials and Energy Science (SIMES)] (ORCID:0000000212787862), Hruszkewycz, Stephan [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000293949252), Islam, Zahir [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)]. 2025-01-22. Dark-field X-ray microscopy with structured illumination for three-dimensional imaging. https://doi.org/10.1038/s42005-025-01952-2
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